TW200942802A - Birefringence measuring device, birefringence measuring method, film producing system and film producing method - Google Patents

Birefringence measuring device, birefringence measuring method, film producing system and film producing method

Info

Publication number
TW200942802A
TW200942802A TW98109316A TW98109316A TW200942802A TW 200942802 A TW200942802 A TW 200942802A TW 98109316 A TW98109316 A TW 98109316A TW 98109316 A TW98109316 A TW 98109316A TW 200942802 A TW200942802 A TW 200942802A
Authority
TW
Taiwan
Prior art keywords
measuring part
measured
water rate
film producing
birefringence measuring
Prior art date
Application number
TW98109316A
Other languages
Chinese (zh)
Other versions
TWI453396B (en
Inventor
Bungo Shigeta
Kousuke Ikehata
Takahiro Inamura
Original Assignee
Fujifilm Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujifilm Corp filed Critical Fujifilm Corp
Publication of TW200942802A publication Critical patent/TW200942802A/en
Application granted granted Critical
Publication of TWI453396B publication Critical patent/TWI453396B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G01N21/23—Bi-refringence
    • C—CHEMISTRY; METALLURGY
    • C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08J—WORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
    • C08J5/00—Manufacture of articles or shaped materials containing macromolecular substances
    • C08J5/18—Manufacture of films or sheets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/44—Resins; Plastics; Rubber; Leather
    • G01N33/442—Resins; Plastics

Landscapes

  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • Manufacturing & Machinery (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Medicinal Chemistry (AREA)
  • Food Science & Technology (AREA)
  • Materials Engineering (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Polymers & Plastics (AREA)
  • Organic Chemistry (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Manufacture Of Macromolecular Shaped Articles (AREA)

Abstract

The present invention is provided to measure the birefringence characteristic of a film accurately in manufacturing process, and feedback it to the process factors. The water rate of a test piece 16 is measured by water rate measuring part 81; the thickness of the test piece 16 is measured by thickness measuring part 81; the birefringence characteristic of the test piece 16 is measured by first polarization characteristic measuring part 11 and second polarization characteristic measuring part 17. The retardation of the test piece 16 is calculated out from the measuring results of the first polarization characteristic measuring part 11 and the second polarization characteristic measuring part 17 by axis/retardation calculating means 61. Furthermore, the water rate measured by the water rate measuring part 81 is standardized with the thickness measured by the thickness measuring part 82, and feeding back to the process factors is carried out, by means of the correlation formula of water rate and retardation measured previously, based on correction of the retardation calculated.
TW98109316A 2008-03-24 2009-03-23 Birefringence measuring device, birefringence measuring method, film producing system and film producing method TWI453396B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2008075733A JP5123016B2 (en) 2008-03-24 2008-03-24 Birefringence measuring apparatus, birefringence measuring method, film production system, and film production method

Publications (2)

Publication Number Publication Date
TW200942802A true TW200942802A (en) 2009-10-16
TWI453396B TWI453396B (en) 2014-09-21

Family

ID=41193112

Family Applications (1)

Application Number Title Priority Date Filing Date
TW98109316A TWI453396B (en) 2008-03-24 2009-03-23 Birefringence measuring device, birefringence measuring method, film producing system and film producing method

Country Status (4)

Country Link
JP (1) JP5123016B2 (en)
KR (1) KR101619821B1 (en)
CN (1) CN101545853A (en)
TW (1) TWI453396B (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012251860A (en) * 2011-06-02 2012-12-20 Sumitomo Chemical Co Ltd Optical measuring apparatus, optical measuring method and method for manufacturing optical film by using optical measuring method
JP5508352B2 (en) * 2011-07-05 2014-05-28 富士フイルム株式会社 Optical characteristic measuring method and apparatus
JP6641682B2 (en) * 2014-10-15 2020-02-05 日本ゼオン株式会社 Optical film phase difference measuring method, optical film manufacturing method, optical film phase difference measuring apparatus, and optical film manufacturing apparatus
JP6535799B1 (en) * 2018-08-27 2019-06-26 日東電工株式会社 Method for producing stretched resin film, method for producing polarizer, and device for producing stretched resin film

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3358099B2 (en) * 1994-03-25 2002-12-16 オムロン株式会社 Optical sensor device
JP3442179B2 (en) * 1995-02-21 2003-09-02 積水化学工業株式会社 Phase difference measurement device
JPH0989721A (en) * 1995-09-20 1997-04-04 Kao Corp Method for measuring birefringence of polycarbonate resin
JPH11326190A (en) * 1998-03-19 1999-11-26 Toray Ind Inc Retardation measuring device, birefringence measuring device, and method of manufacturing plastic film provided with the device
JP2001004535A (en) * 1999-06-21 2001-01-12 Kanegafuchi Chem Ind Co Ltd Retardation measurement method and system
JP2002122734A (en) * 2000-10-16 2002-04-26 Fuji Photo Film Co Ltd Film for polarizing plate
JP3797477B2 (en) * 2001-11-01 2006-07-19 横河電機株式会社 Thickness and moisture measuring method and thickness and moisture measuring device
JP2006084268A (en) * 2004-09-15 2006-03-30 Konica Minolta Opto Inc Measurement method and production management method
JP2007168425A (en) * 2005-11-22 2007-07-05 Fujifilm Corp Method for producing thermoplastic resin film
JP2007285871A (en) * 2006-04-17 2007-11-01 Fujifilm Corp Birefringence measuring device
JP2008068498A (en) * 2006-09-13 2008-03-27 Fujifilm Corp Cellulose acylate film and method for producing the same

Also Published As

Publication number Publication date
KR20090101825A (en) 2009-09-29
CN101545853A (en) 2009-09-30
JP5123016B2 (en) 2013-01-16
JP2009229278A (en) 2009-10-08
KR101619821B1 (en) 2016-05-11
TWI453396B (en) 2014-09-21

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees