TW200942802A - Birefringence measuring device, birefringence measuring method, film producing system and film producing method - Google Patents

Birefringence measuring device, birefringence measuring method, film producing system and film producing method

Info

Publication number
TW200942802A
TW200942802A TW98109316A TW98109316A TW200942802A TW 200942802 A TW200942802 A TW 200942802A TW 98109316 A TW98109316 A TW 98109316A TW 98109316 A TW98109316 A TW 98109316A TW 200942802 A TW200942802 A TW 200942802A
Authority
TW
Taiwan
Prior art keywords
measuring part
measured
water rate
film producing
birefringence measuring
Prior art date
Application number
TW98109316A
Other languages
English (en)
Other versions
TWI453396B (zh
Inventor
Bungo Shigeta
Kousuke Ikehata
Takahiro Inamura
Original Assignee
Fujifilm Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujifilm Corp filed Critical Fujifilm Corp
Publication of TW200942802A publication Critical patent/TW200942802A/zh
Application granted granted Critical
Publication of TWI453396B publication Critical patent/TWI453396B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G01N21/23—Bi-refringence
    • C—CHEMISTRY; METALLURGY
    • C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08J—WORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
    • C08J5/00—Manufacture of articles or shaped materials containing macromolecular substances
    • C08J5/18—Manufacture of films or sheets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/44—Resins; Plastics; Rubber; Leather
    • G01N33/442—Resins; Plastics

Landscapes

  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • Manufacturing & Machinery (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Medicinal Chemistry (AREA)
  • Food Science & Technology (AREA)
  • Materials Engineering (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Polymers & Plastics (AREA)
  • Organic Chemistry (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Manufacture Of Macromolecular Shaped Articles (AREA)
TW98109316A 2008-03-24 2009-03-23 雙折射測定裝置、雙折射測定方法、薄膜生產系統及薄膜生產方法 TWI453396B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2008075733A JP5123016B2 (ja) 2008-03-24 2008-03-24 複屈折測定装置、複屈折測定方法、フイルム生産システムおよびフイルム生産方法

Publications (2)

Publication Number Publication Date
TW200942802A true TW200942802A (en) 2009-10-16
TWI453396B TWI453396B (zh) 2014-09-21

Family

ID=41193112

Family Applications (1)

Application Number Title Priority Date Filing Date
TW98109316A TWI453396B (zh) 2008-03-24 2009-03-23 雙折射測定裝置、雙折射測定方法、薄膜生產系統及薄膜生產方法

Country Status (4)

Country Link
JP (1) JP5123016B2 (zh)
KR (1) KR101619821B1 (zh)
CN (1) CN101545853A (zh)
TW (1) TWI453396B (zh)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012251860A (ja) * 2011-06-02 2012-12-20 Sumitomo Chemical Co Ltd 光学測定装置、光学測定方法および同測定方法を用いた光学フィルムの製造方法
JP5508352B2 (ja) * 2011-07-05 2014-05-28 富士フイルム株式会社 光学特性測定方法及び装置
JP6641682B2 (ja) * 2014-10-15 2020-02-05 日本ゼオン株式会社 光学フィルムの位相差の測定方法、光学フィルムの製造方法、光学フィルム位相差の測定装置、及び光学フィルムの製造装置
JP6535799B1 (ja) * 2018-08-27 2019-06-26 日東電工株式会社 延伸樹脂膜の製造方法、偏光子の製造方法、および延伸樹脂膜の製造装置

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3358099B2 (ja) * 1994-03-25 2002-12-16 オムロン株式会社 光学式センサ装置
JP3442179B2 (ja) * 1995-02-21 2003-09-02 積水化学工業株式会社 位相差値測定装置
JPH0989721A (ja) * 1995-09-20 1997-04-04 Kao Corp ポリカーボネート樹脂の複屈折測定方法
JPH11326190A (ja) * 1998-03-19 1999-11-26 Toray Ind Inc リタ―デ―ション計測装置、複屈折計測装置および同装置を備えたプラスチックフイルムの製造方法
JP2001004535A (ja) * 1999-06-21 2001-01-12 Kanegafuchi Chem Ind Co Ltd レターデーション測定方法及びシステム
JP2002122734A (ja) * 2000-10-16 2002-04-26 Fuji Photo Film Co Ltd 偏光板用フィルム
JP3797477B2 (ja) * 2001-11-01 2006-07-19 横河電機株式会社 厚さ・水分測定方法及び厚さ・水分測定装置
JP2006084268A (ja) * 2004-09-15 2006-03-30 Konica Minolta Opto Inc 測定方法及び生産管理方法
JP2007168425A (ja) * 2005-11-22 2007-07-05 Fujifilm Corp 熱可塑性樹脂フィルムの製造方法
JP2007285871A (ja) * 2006-04-17 2007-11-01 Fujifilm Corp 複屈折測定装置
JP2008068498A (ja) * 2006-09-13 2008-03-27 Fujifilm Corp セルロースアシレートフィルム及びその製造方法

Also Published As

Publication number Publication date
KR20090101825A (ko) 2009-09-29
CN101545853A (zh) 2009-09-30
JP5123016B2 (ja) 2013-01-16
JP2009229278A (ja) 2009-10-08
KR101619821B1 (ko) 2016-05-11
TWI453396B (zh) 2014-09-21

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees