TW201129794A - Inspecting apparatus - Google Patents

Inspecting apparatus

Info

Publication number
TW201129794A
TW201129794A TW99131650A TW99131650A TW201129794A TW 201129794 A TW201129794 A TW 201129794A TW 99131650 A TW99131650 A TW 99131650A TW 99131650 A TW99131650 A TW 99131650A TW 201129794 A TW201129794 A TW 201129794A
Authority
TW
Taiwan
Prior art keywords
figures
printing status
inspecting apparatus
words
identification means
Prior art date
Application number
TW99131650A
Other languages
English (en)
Chinese (zh)
Inventor
Masaki Amano
Masayoshi Mikami
Yukihiro Higashioka
Shun Kojima
Original Assignee
Ushio Electric Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ushio Electric Inc filed Critical Ushio Electric Inc
Publication of TW201129794A publication Critical patent/TW201129794A/zh

Links

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
TW99131650A 2009-11-27 2010-09-17 Inspecting apparatus TW201129794A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2009269370A JP5110071B2 (ja) 2009-11-27 2009-11-27 検査装置

Publications (1)

Publication Number Publication Date
TW201129794A true TW201129794A (en) 2011-09-01

Family

ID=44087135

Family Applications (1)

Application Number Title Priority Date Filing Date
TW99131650A TW201129794A (en) 2009-11-27 2010-09-17 Inspecting apparatus

Country Status (4)

Country Link
JP (1) JP5110071B2 (ja)
KR (1) KR20110059521A (ja)
CN (1) CN102081049A (ja)
TW (1) TW201129794A (ja)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013101003A (ja) * 2011-11-07 2013-05-23 Adc Technology Inc 物体検知装置
CN103115589B (zh) * 2013-02-01 2017-08-25 厦门思泰克智能科技股份有限公司 一种红绿蓝三色led光测量装置
JP2015075436A (ja) * 2013-10-10 2015-04-20 小島プレス工業株式会社 印刷装置
JP7060538B2 (ja) * 2019-03-26 2022-04-26 株式会社 日立産業制御ソリューションズ 外観検査システム、および、外観検査方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11295047A (ja) * 1998-04-06 1999-10-29 Omron Corp 照明装置
JP2003098094A (ja) * 2001-09-25 2003-04-03 Stabic:Kk 検査装置に用いられる照明装置、及び検査装置
JP2005214694A (ja) * 2004-01-28 2005-08-11 Fuji Photo Film Co Ltd 印刷検査方法及び印刷検査システム並びにこれに供される被印刷物
JP4428296B2 (ja) * 2005-06-10 2010-03-10 セイコーエプソン株式会社 表示パネルモジュールおよび表示装置
CN101490538B (zh) * 2006-08-02 2013-03-27 株式会社尼康 缺陷检测装置和缺陷检测方法
JP5260903B2 (ja) * 2007-07-06 2013-08-14 株式会社東芝 自動分析装置
JP2009128303A (ja) * 2007-11-27 2009-06-11 Omron Corp 基板外観検査装置
JP2010190786A (ja) * 2009-02-19 2010-09-02 Takeda Chem Ind Ltd 固形製剤の印字検査方法及び装置

Also Published As

Publication number Publication date
JP2011112519A (ja) 2011-06-09
CN102081049A (zh) 2011-06-01
KR20110059521A (ko) 2011-06-02
JP5110071B2 (ja) 2012-12-26

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