TW201535761A - 異質接面太陽能電池及其製造方法 - Google Patents
異質接面太陽能電池及其製造方法 Download PDFInfo
- Publication number
- TW201535761A TW201535761A TW104108169A TW104108169A TW201535761A TW 201535761 A TW201535761 A TW 201535761A TW 104108169 A TW104108169 A TW 104108169A TW 104108169 A TW104108169 A TW 104108169A TW 201535761 A TW201535761 A TW 201535761A
- Authority
- TW
- Taiwan
- Prior art keywords
- layer
- amorphous germanium
- doped layer
- deposited
- boron
- Prior art date
Links
- 238000004519 manufacturing process Methods 0.000 title claims description 29
- 239000010410 layer Substances 0.000 claims abstract description 333
- 229910052732 germanium Inorganic materials 0.000 claims abstract description 238
- 239000000758 substrate Substances 0.000 claims abstract description 142
- 229910052698 phosphorus Inorganic materials 0.000 claims abstract description 84
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims abstract description 76
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 claims abstract description 69
- 239000011574 phosphorus Substances 0.000 claims abstract description 66
- 229910052796 boron Inorganic materials 0.000 claims abstract description 64
- 239000002344 surface layer Substances 0.000 claims abstract description 35
- 238000004050 hot filament vapor deposition Methods 0.000 claims abstract description 30
- 230000005012 migration Effects 0.000 claims abstract description 18
- 238000013508 migration Methods 0.000 claims abstract description 18
- 238000000034 method Methods 0.000 claims description 73
- 239000013078 crystal Substances 0.000 claims description 47
- MZLGASXMSKOWSE-UHFFFAOYSA-N tantalum nitride Chemical compound [Ta]#N MZLGASXMSKOWSE-UHFFFAOYSA-N 0.000 claims description 39
- 125000004437 phosphorous atom Chemical group 0.000 claims description 30
- XYFCBTPGUUZFHI-UHFFFAOYSA-N Phosphine Chemical compound P XYFCBTPGUUZFHI-UHFFFAOYSA-N 0.000 claims description 24
- 239000011148 porous material Substances 0.000 claims description 24
- KJTLSVCANCCWHF-UHFFFAOYSA-N Ruthenium Chemical compound [Ru] KJTLSVCANCCWHF-UHFFFAOYSA-N 0.000 claims description 20
- 229910052707 ruthenium Inorganic materials 0.000 claims description 20
- 239000003054 catalyst Substances 0.000 claims description 15
- 229910000073 phosphorus hydride Inorganic materials 0.000 claims description 12
- 229910052751 metal Inorganic materials 0.000 claims description 11
- 239000002184 metal Substances 0.000 claims description 11
- BHEPBYXIRTUNPN-UHFFFAOYSA-N hydridophosphorus(.) (triplet) Chemical compound [PH] BHEPBYXIRTUNPN-UHFFFAOYSA-N 0.000 claims description 6
- 239000000463 material Substances 0.000 claims description 6
- 150000004767 nitrides Chemical class 0.000 claims description 3
- 238000005229 chemical vapour deposition Methods 0.000 claims description 2
- VGRFVJMYCCLWPQ-UHFFFAOYSA-N germanium Chemical compound [Ge].[Ge] VGRFVJMYCCLWPQ-UHFFFAOYSA-N 0.000 claims 64
- 239000010408 film Substances 0.000 claims 38
- 239000000126 substance Substances 0.000 claims 1
- 239000010409 thin film Substances 0.000 claims 1
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 abstract description 178
- 230000006798 recombination Effects 0.000 abstract description 14
- 238000005215 recombination Methods 0.000 abstract description 14
- 238000006243 chemical reaction Methods 0.000 abstract description 13
- 230000005540 biological transmission Effects 0.000 abstract description 10
- 239000000969 carrier Substances 0.000 abstract description 2
- 210000004027 cell Anatomy 0.000 description 86
- 239000007789 gas Substances 0.000 description 21
- 239000012535 impurity Substances 0.000 description 15
- 238000000151 deposition Methods 0.000 description 14
- 230000000694 effects Effects 0.000 description 12
- 238000010586 diagram Methods 0.000 description 10
- 238000000623 plasma-assisted chemical vapour deposition Methods 0.000 description 9
- 230000007547 defect Effects 0.000 description 8
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 7
- 238000000354 decomposition reaction Methods 0.000 description 7
- 238000009792 diffusion process Methods 0.000 description 7
- 238000001000 micrograph Methods 0.000 description 7
- 238000011160 research Methods 0.000 description 7
- 229910052709 silver Inorganic materials 0.000 description 7
- 239000004332 silver Substances 0.000 description 7
- 238000005452 bending Methods 0.000 description 6
- 239000007788 liquid Substances 0.000 description 6
- 229910052715 tantalum Inorganic materials 0.000 description 6
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 6
- 230000008859 change Effects 0.000 description 5
- 238000000576 coating method Methods 0.000 description 5
- 238000009826 distribution Methods 0.000 description 5
- 230000001965 increasing effect Effects 0.000 description 5
- 230000008569 process Effects 0.000 description 5
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 4
- 229910052760 oxygen Inorganic materials 0.000 description 4
- 239000001301 oxygen Substances 0.000 description 4
- 230000000737 periodic effect Effects 0.000 description 4
- 238000012545 processing Methods 0.000 description 4
- 230000035484 reaction time Effects 0.000 description 4
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 3
- 229910021417 amorphous silicon Inorganic materials 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 3
- 238000007796 conventional method Methods 0.000 description 3
- 238000002474 experimental method Methods 0.000 description 3
- 239000002994 raw material Substances 0.000 description 3
- 230000007704 transition Effects 0.000 description 3
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 3
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 2
- 229910052799 carbon Inorganic materials 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 2
- 238000010276 construction Methods 0.000 description 2
- 230000008021 deposition Effects 0.000 description 2
- 230000006866 deterioration Effects 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- 239000010419 fine particle Substances 0.000 description 2
- 150000002431 hydrogen Chemical class 0.000 description 2
- 239000001257 hydrogen Substances 0.000 description 2
- 229910052739 hydrogen Inorganic materials 0.000 description 2
- 125000004435 hydrogen atom Chemical group [H]* 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- 238000010248 power generation Methods 0.000 description 2
- 230000009467 reduction Effects 0.000 description 2
- 238000001004 secondary ion mass spectrometry Methods 0.000 description 2
- 238000004381 surface treatment Methods 0.000 description 2
- UCKMPCXJQFINFW-UHFFFAOYSA-N Sulphide Chemical compound [S-2] UCKMPCXJQFINFW-UHFFFAOYSA-N 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 230000006978 adaptation Effects 0.000 description 1
- 125000004429 atom Chemical group 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 229910052797 bismuth Inorganic materials 0.000 description 1
- JCXGWMGPZLAOME-UHFFFAOYSA-N bismuth atom Chemical compound [Bi] JCXGWMGPZLAOME-UHFFFAOYSA-N 0.000 description 1
- 238000003421 catalytic decomposition reaction Methods 0.000 description 1
- 230000003197 catalytic effect Effects 0.000 description 1
- 210000003850 cellular structure Anatomy 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 238000012790 confirmation Methods 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 229910021419 crystalline silicon Inorganic materials 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 210000003298 dental enamel Anatomy 0.000 description 1
- 230000002542 deteriorative effect Effects 0.000 description 1
- 238000005315 distribution function Methods 0.000 description 1
- 239000002019 doping agent Substances 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 230000002708 enhancing effect Effects 0.000 description 1
- 238000013213 extrapolation Methods 0.000 description 1
- 229910052735 hafnium Inorganic materials 0.000 description 1
- VBJZVLUMGGDVMO-UHFFFAOYSA-N hafnium atom Chemical compound [Hf] VBJZVLUMGGDVMO-UHFFFAOYSA-N 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 229910052746 lanthanum Inorganic materials 0.000 description 1
- FZLIPJUXYLNCLC-UHFFFAOYSA-N lanthanum atom Chemical compound [La] FZLIPJUXYLNCLC-UHFFFAOYSA-N 0.000 description 1
- 230000003211 malignant effect Effects 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 239000002923 metal particle Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 1
- 238000002161 passivation Methods 0.000 description 1
- 230000035515 penetration Effects 0.000 description 1
- 230000000704 physical effect Effects 0.000 description 1
- 238000003672 processing method Methods 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 238000004528 spin coating Methods 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 229910052718 tin Inorganic materials 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
- 238000012795 verification Methods 0.000 description 1
- 238000005406 washing Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F10/00—Individual photovoltaic cells, e.g. solar cells
- H10F10/10—Individual photovoltaic cells, e.g. solar cells having potential barriers
- H10F10/16—Photovoltaic cells having only PN heterojunction potential barriers
- H10F10/164—Photovoltaic cells having only PN heterojunction potential barriers comprising heterojunctions with Group IV materials, e.g. ITO/Si or GaAs/SiGe photovoltaic cells
- H10F10/165—Photovoltaic cells having only PN heterojunction potential barriers comprising heterojunctions with Group IV materials, e.g. ITO/Si or GaAs/SiGe photovoltaic cells the heterojunctions being Group IV-IV heterojunctions, e.g. Si/Ge, SiGe/Si or Si/SiC photovoltaic cells
- H10F10/166—Photovoltaic cells having only PN heterojunction potential barriers comprising heterojunctions with Group IV materials, e.g. ITO/Si or GaAs/SiGe photovoltaic cells the heterojunctions being Group IV-IV heterojunctions, e.g. Si/Ge, SiGe/Si or Si/SiC photovoltaic cells the Group IV-IV heterojunctions being heterojunctions of crystalline and amorphous materials, e.g. silicon heterojunction [SHJ] photovoltaic cells
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F71/00—Manufacture or treatment of devices covered by this subclass
- H10F71/121—The active layers comprising only Group IV materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/20—Electrodes
- H10F77/206—Electrodes for devices having potential barriers
- H10F77/211—Electrodes for devices having potential barriers for photovoltaic cells
- H10F77/219—Arrangements for electrodes of back-contact photovoltaic cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/547—Monocrystalline silicon PV cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
Landscapes
- Photovoltaic Devices (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2014051160 | 2014-03-14 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW201535761A true TW201535761A (zh) | 2015-09-16 |
Family
ID=54071600
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW104108169A TW201535761A (zh) | 2014-03-14 | 2015-03-13 | 異質接面太陽能電池及其製造方法 |
Country Status (3)
| Country | Link |
|---|---|
| JP (1) | JP6396425B2 (fr) |
| TW (1) | TW201535761A (fr) |
| WO (1) | WO2015137152A1 (fr) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR102018381B1 (ko) * | 2017-01-26 | 2019-09-04 | 엘지전자 주식회사 | 태양 전지 및 이의 제조 방법 |
| CN109004053B (zh) * | 2017-06-06 | 2024-03-29 | 通威太阳能(成都)有限公司 | 双面受光的晶体硅/薄膜硅异质结太阳电池及制作方法 |
| CN108831967B (zh) * | 2018-06-25 | 2019-10-29 | 江苏悦阳光伏科技有限公司 | 一种新型hit太阳能电池及其制备方法 |
| CN110643971A (zh) * | 2019-09-27 | 2020-01-03 | 上海理想万里晖薄膜设备有限公司 | 用于制造异质结太阳能电池的cvd设备及其镀膜方法 |
| CN114566561A (zh) * | 2020-11-27 | 2022-05-31 | 嘉兴阿特斯技术研究院有限公司 | 异质结太阳能电池及其制作方法 |
| CN114005886B (zh) * | 2021-10-29 | 2024-01-09 | 苏州光汇新能源科技有限公司 | 一种适用于室内发电的硅异质结太阳电池结构及其制备方法 |
| CN116247111A (zh) * | 2021-12-07 | 2023-06-09 | 嘉兴阿特斯技术研究院有限公司 | 太阳能电池及其制备方法 |
| CN114497288A (zh) * | 2022-01-26 | 2022-05-13 | 中节能太阳能科技(镇江)有限公司 | 栅线嵌入选择性重掺杂区域的异质结太阳能电池制造方法 |
| CN114497260B (zh) * | 2022-02-08 | 2024-01-09 | 理想万里晖半导体设备(上海)股份有限公司 | 用于制造异质结太阳能电池的方法及异质结太阳能电池 |
| CN116913991A (zh) * | 2023-08-01 | 2023-10-20 | 天合光能股份有限公司 | 异质结太阳能电池及其制备方法、光伏组件以及光伏系统 |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000058885A (ja) * | 1998-08-03 | 2000-02-25 | Sanyo Electric Co Ltd | 太陽電池及びその製造方法 |
| JP2011146528A (ja) * | 2010-01-14 | 2011-07-28 | Kaneka Corp | 多結晶シリコン系太陽電池およびその製造方法 |
| JPWO2013179529A1 (ja) * | 2012-05-30 | 2016-01-18 | パナソニックIpマネジメント株式会社 | 太陽電池 |
-
2015
- 2015-02-27 WO PCT/JP2015/055772 patent/WO2015137152A1/fr not_active Ceased
- 2015-02-27 JP JP2016507447A patent/JP6396425B2/ja not_active Expired - Fee Related
- 2015-03-13 TW TW104108169A patent/TW201535761A/zh unknown
Also Published As
| Publication number | Publication date |
|---|---|
| JP6396425B2 (ja) | 2018-09-26 |
| WO2015137152A1 (fr) | 2015-09-17 |
| JPWO2015137152A1 (ja) | 2017-04-06 |
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