TW359748B - Device for inspecting liquid crystal display panel, method of inspecting liquid crystal display panel and method of manufacturing liquid crystal display panel - Google Patents

Device for inspecting liquid crystal display panel, method of inspecting liquid crystal display panel and method of manufacturing liquid crystal display panel

Info

Publication number
TW359748B
TW359748B TW086112603A TW86112603A TW359748B TW 359748 B TW359748 B TW 359748B TW 086112603 A TW086112603 A TW 086112603A TW 86112603 A TW86112603 A TW 86112603A TW 359748 B TW359748 B TW 359748B
Authority
TW
Taiwan
Prior art keywords
liquid crystal
crystal display
display panel
bonded
inspecting
Prior art date
Application number
TW086112603A
Other languages
English (en)
Chinese (zh)
Inventor
Kozo Gyoda
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Application granted granted Critical
Publication of TW359748B publication Critical patent/TW359748B/zh

Links

Classifications

    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Liquid Crystal (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Measuring Leads Or Probes (AREA)
TW086112603A 1996-09-02 1997-09-02 Device for inspecting liquid crystal display panel, method of inspecting liquid crystal display panel and method of manufacturing liquid crystal display panel TW359748B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP23233596A JP3624570B2 (ja) 1996-09-02 1996-09-02 液晶表示パネルの検査装置、液晶表示パネルの検査方法及び集積回路の実装方法

Publications (1)

Publication Number Publication Date
TW359748B true TW359748B (en) 1999-06-01

Family

ID=16937594

Family Applications (1)

Application Number Title Priority Date Filing Date
TW086112603A TW359748B (en) 1996-09-02 1997-09-02 Device for inspecting liquid crystal display panel, method of inspecting liquid crystal display panel and method of manufacturing liquid crystal display panel

Country Status (5)

Country Link
JP (1) JP3624570B2 (ja)
KR (1) KR100518161B1 (ja)
CN (1) CN1175271C (ja)
TW (1) TW359748B (ja)
WO (1) WO1998010298A1 (ja)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3525918B2 (ja) * 2000-10-31 2004-05-10 セイコーエプソン株式会社 電気光学装置、その検査方法および電子機器
KR100911467B1 (ko) * 2002-12-31 2009-08-11 삼성전자주식회사 액정표시장치의 검사 장치
JP4219729B2 (ja) * 2003-04-25 2009-02-04 日本発條株式会社 液晶パネル用検査装置
JP4579074B2 (ja) * 2005-07-15 2010-11-10 三菱電機株式会社 フレキシブル回路基板及びこれを用いた表示装置
JP2008032958A (ja) * 2006-07-28 2008-02-14 Optrex Corp 表示パネルの点灯検査装置および点灯検査方法
KR100843126B1 (ko) * 2006-08-29 2008-07-02 주식회사 에스에프에이 평판 표시장치의 패널 검사장치 및 그 방법, 그리고 평판표시장치의 회로기판 본딩 시스템 및 그 방법
KR20060122804A (ko) * 2006-11-11 2006-11-30 윤재완 디스플레이 패널 검사용 프로브 블록
JP5347258B2 (ja) * 2007-09-28 2013-11-20 カシオ計算機株式会社 電子デバイス用機能検査装置
KR101219285B1 (ko) * 2011-01-06 2013-01-11 (주)에이앤아이 기판 검사방법 및 장치
KR101290669B1 (ko) * 2013-02-04 2013-07-29 (주)메리테크 패널 테스트용 프로브 블록
CN105867003A (zh) * 2016-06-15 2016-08-17 苏州众显电子科技有限公司 一种新型stn液晶显示屏
CN106205030B (zh) * 2016-07-25 2019-01-29 京东方科技集团股份有限公司 一种警报电路、集成电路板及警报系统

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2559242B2 (ja) * 1987-12-25 1996-12-04 東京エレクトロン株式会社 プローブカード
JPH02253168A (ja) * 1989-03-28 1990-10-11 Seiko Epson Corp 液晶表示パネルの点燈検査用プローブ
JP2524308Y2 (ja) * 1989-12-27 1997-01-29 日本電子材料 株式会社 プローブカード
JPH0489579A (ja) * 1990-07-31 1992-03-23 Morimichi Fujiyoshi プリント基板等の検査装置
JPH0495929A (ja) * 1990-08-08 1992-03-27 Fujitsu Ltd アクティブプローブを用いた試験装置と試験方法
JP2966671B2 (ja) * 1991-11-18 1999-10-25 東京エレクトロン株式会社 プローブカード
JPH06120647A (ja) * 1992-10-06 1994-04-28 Fujitsu Ltd 半導体素子の実装方法と実装装置

Also Published As

Publication number Publication date
WO1998010298A1 (en) 1998-03-12
KR100518161B1 (ko) 2005-12-01
CN1199466A (zh) 1998-11-18
CN1175271C (zh) 2004-11-10
JPH1078456A (ja) 1998-03-24
JP3624570B2 (ja) 2005-03-02
KR20000064315A (ko) 2000-11-06

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees