TW519664B - Method for patterning electro-conductive tin oxide film - Google Patents
Method for patterning electro-conductive tin oxide film Download PDFInfo
- Publication number
- TW519664B TW519664B TW090132578A TW90132578A TW519664B TW 519664 B TW519664 B TW 519664B TW 090132578 A TW090132578 A TW 090132578A TW 90132578 A TW90132578 A TW 90132578A TW 519664 B TW519664 B TW 519664B
- Authority
- TW
- Taiwan
- Prior art keywords
- compound
- film
- tin oxide
- patent application
- pattern
- Prior art date
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- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 title claims abstract description 41
- 229910001887 tin oxide Inorganic materials 0.000 title claims abstract description 36
- 238000000034 method Methods 0.000 title claims abstract description 27
- 238000000059 patterning Methods 0.000 title claims abstract description 6
- 150000003606 tin compounds Chemical class 0.000 claims abstract description 20
- 239000003960 organic solvent Substances 0.000 claims abstract description 13
- 150000001875 compounds Chemical class 0.000 claims abstract description 10
- 238000001035 drying Methods 0.000 claims abstract description 5
- 239000000758 substrate Substances 0.000 claims description 13
- 238000011049 filling Methods 0.000 claims description 8
- 150000001463 antimony compounds Chemical class 0.000 claims description 7
- 238000000576 coating method Methods 0.000 claims description 7
- 150000002222 fluorine compounds Chemical class 0.000 claims description 7
- -1 compound compound Chemical class 0.000 claims description 6
- 239000007787 solid Substances 0.000 claims description 6
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 claims description 5
- 238000001354 calcination Methods 0.000 claims description 5
- 230000002079 cooperative effect Effects 0.000 claims description 5
- 230000002378 acidificating effect Effects 0.000 claims description 3
- 239000011248 coating agent Substances 0.000 claims description 3
- 238000003384 imaging method Methods 0.000 claims description 3
- 239000007788 liquid Substances 0.000 claims description 2
- 230000003647 oxidation Effects 0.000 claims description 2
- 238000007254 oxidation reaction Methods 0.000 claims description 2
- 239000012528 membrane Substances 0.000 claims 1
- 239000002019 doping agent Substances 0.000 abstract description 2
- 238000005530 etching Methods 0.000 abstract description 2
- 230000015572 biosynthetic process Effects 0.000 abstract 1
- 239000010408 film Substances 0.000 description 34
- 239000000243 solution Substances 0.000 description 20
- 229920002120 photoresistant polymer Polymers 0.000 description 13
- YUOWTJMRMWQJDA-UHFFFAOYSA-J tin(iv) fluoride Chemical compound [F-].[F-].[F-].[F-].[Sn+4] YUOWTJMRMWQJDA-UHFFFAOYSA-J 0.000 description 11
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 9
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 6
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 6
- 239000007864 aqueous solution Substances 0.000 description 6
- LYCAIKOWRPUZTN-UHFFFAOYSA-N Ethylene glycol Chemical compound OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 description 4
- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 description 4
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 4
- 229910052718 tin Inorganic materials 0.000 description 4
- ZWEHNKRNPOVVGH-UHFFFAOYSA-N 2-Butanone Chemical compound CCC(C)=O ZWEHNKRNPOVVGH-UHFFFAOYSA-N 0.000 description 3
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Chemical compound CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 description 3
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 3
- XEKOWRVHYACXOJ-UHFFFAOYSA-N Ethyl acetate Chemical compound CCOC(C)=O XEKOWRVHYACXOJ-UHFFFAOYSA-N 0.000 description 3
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 3
- KWYUFKZDYYNOTN-UHFFFAOYSA-M Potassium hydroxide Chemical compound [OH-].[K+] KWYUFKZDYYNOTN-UHFFFAOYSA-M 0.000 description 3
- DNIAPMSPPWPWGF-UHFFFAOYSA-N Propylene glycol Chemical compound CC(O)CO DNIAPMSPPWPWGF-UHFFFAOYSA-N 0.000 description 3
- 229910052770 Uranium Inorganic materials 0.000 description 3
- 150000007513 acids Chemical class 0.000 description 3
- 150000007514 bases Chemical class 0.000 description 3
- 229910003437 indium oxide Inorganic materials 0.000 description 3
- PJXISJQVUVHSOJ-UHFFFAOYSA-N indium(iii) oxide Chemical compound [O-2].[O-2].[O-2].[In+3].[In+3] PJXISJQVUVHSOJ-UHFFFAOYSA-N 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- DNYWZCXLKNTFFI-UHFFFAOYSA-N uranium Chemical compound [U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U] DNYWZCXLKNTFFI-UHFFFAOYSA-N 0.000 description 3
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 2
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 2
- LRHPLDYGYMQRHN-UHFFFAOYSA-N N-Butanol Chemical compound CCCCO LRHPLDYGYMQRHN-UHFFFAOYSA-N 0.000 description 2
- WYURNTSHIVDZCO-UHFFFAOYSA-N Tetrahydrofuran Chemical compound C1CCOC1 WYURNTSHIVDZCO-UHFFFAOYSA-N 0.000 description 2
- 229910021627 Tin(IV) chloride Inorganic materials 0.000 description 2
- DTQVDTLACAAQTR-UHFFFAOYSA-N Trifluoroacetic acid Chemical compound OC(=O)C(F)(F)F DTQVDTLACAAQTR-UHFFFAOYSA-N 0.000 description 2
- 150000001298 alcohols Chemical class 0.000 description 2
- 229910000147 aluminium phosphate Inorganic materials 0.000 description 2
- 229910052787 antimony Inorganic materials 0.000 description 2
- 229940058905 antimony compound for treatment of leishmaniasis and trypanosomiasis Drugs 0.000 description 2
- GUNJVIDCYZYFGV-UHFFFAOYSA-K antimony trifluoride Chemical compound F[Sb](F)F GUNJVIDCYZYFGV-UHFFFAOYSA-K 0.000 description 2
- WERYXYBDKMZEQL-UHFFFAOYSA-N butane-1,4-diol Chemical compound OCCCCO WERYXYBDKMZEQL-UHFFFAOYSA-N 0.000 description 2
- 239000004020 conductor Substances 0.000 description 2
- JHIVVAPYMSGYDF-UHFFFAOYSA-N cyclohexanone Chemical compound O=C1CCCCC1 JHIVVAPYMSGYDF-UHFFFAOYSA-N 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 239000004973 liquid crystal related substance Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- BDAGIHXWWSANSR-UHFFFAOYSA-N methanoic acid Natural products OC=O BDAGIHXWWSANSR-UHFFFAOYSA-N 0.000 description 2
- 238000002156 mixing Methods 0.000 description 2
- 150000003839 salts Chemical class 0.000 description 2
- WGTYBPLFGIVFAS-UHFFFAOYSA-M tetramethylammonium hydroxide Chemical compound [OH-].C[N+](C)(C)C WGTYBPLFGIVFAS-UHFFFAOYSA-M 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- AFNRRBXCCXDRPS-UHFFFAOYSA-N tin(ii) sulfide Chemical compound [Sn]=S AFNRRBXCCXDRPS-UHFFFAOYSA-N 0.000 description 2
- HPGGPRDJHPYFRM-UHFFFAOYSA-J tin(iv) chloride Chemical compound Cl[Sn](Cl)(Cl)Cl HPGGPRDJHPYFRM-UHFFFAOYSA-J 0.000 description 2
- QAEDZJGFFMLHHQ-UHFFFAOYSA-N trifluoroacetic anhydride Chemical compound FC(F)(F)C(=O)OC(=O)C(F)(F)F QAEDZJGFFMLHHQ-UHFFFAOYSA-N 0.000 description 2
- GSJBKPNSLRKRNR-UHFFFAOYSA-N $l^{2}-stannanylidenetin Chemical compound [Sn].[Sn] GSJBKPNSLRKRNR-UHFFFAOYSA-N 0.000 description 1
- RWNUSVWFHDHRCJ-UHFFFAOYSA-N 1-butoxypropan-2-ol Chemical compound CCCCOCC(C)O RWNUSVWFHDHRCJ-UHFFFAOYSA-N 0.000 description 1
- LRMSQVBRUNSOJL-UHFFFAOYSA-N 2,2,3,3,3-pentafluoropropanoic acid Chemical compound OC(=O)C(F)(F)C(F)(F)F LRMSQVBRUNSOJL-UHFFFAOYSA-N 0.000 description 1
- HZAXFHJVJLSVMW-UHFFFAOYSA-N 2-Aminoethan-1-ol Chemical compound NCCO HZAXFHJVJLSVMW-UHFFFAOYSA-N 0.000 description 1
- XNWFRZJHXBZDAG-UHFFFAOYSA-N 2-METHOXYETHANOL Chemical compound COCCO XNWFRZJHXBZDAG-UHFFFAOYSA-N 0.000 description 1
- POAOYUHQDCAZBD-UHFFFAOYSA-N 2-butoxyethanol Chemical compound CCCCOCCO POAOYUHQDCAZBD-UHFFFAOYSA-N 0.000 description 1
- OSWFIVFLDKOXQC-UHFFFAOYSA-N 4-(3-methoxyphenyl)aniline Chemical compound COC1=CC=CC(C=2C=CC(N)=CC=2)=C1 OSWFIVFLDKOXQC-UHFFFAOYSA-N 0.000 description 1
- DDFHBQSCUXNBSA-UHFFFAOYSA-N 5-(5-carboxythiophen-2-yl)thiophene-2-carboxylic acid Chemical compound S1C(C(=O)O)=CC=C1C1=CC=C(C(O)=O)S1 DDFHBQSCUXNBSA-UHFFFAOYSA-N 0.000 description 1
- QTBSBXVTEAMEQO-UHFFFAOYSA-M Acetate Chemical compound CC([O-])=O QTBSBXVTEAMEQO-UHFFFAOYSA-M 0.000 description 1
- VHUUQVKOLVNVRT-UHFFFAOYSA-N Ammonium hydroxide Chemical compound [NH4+].[OH-] VHUUQVKOLVNVRT-UHFFFAOYSA-N 0.000 description 1
- 229910015900 BF3 Inorganic materials 0.000 description 1
- DKPFZGUDAPQIHT-UHFFFAOYSA-N Butyl acetate Natural products CCCCOC(C)=O DKPFZGUDAPQIHT-UHFFFAOYSA-N 0.000 description 1
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- GRYLNZFGIOXLOG-UHFFFAOYSA-N Nitric acid Chemical compound O[N+]([O-])=O GRYLNZFGIOXLOG-UHFFFAOYSA-N 0.000 description 1
- BPQQTUXANYXVAA-UHFFFAOYSA-N Orthosilicate Chemical compound [O-][Si]([O-])([O-])[O-] BPQQTUXANYXVAA-UHFFFAOYSA-N 0.000 description 1
- 229910019142 PO4 Inorganic materials 0.000 description 1
- 239000004115 Sodium Silicate Substances 0.000 description 1
- VMHLLURERBWHNL-UHFFFAOYSA-M Sodium acetate Chemical compound [Na+].CC([O-])=O VMHLLURERBWHNL-UHFFFAOYSA-M 0.000 description 1
- STSCVKRWJPWALQ-UHFFFAOYSA-N TRIFLUOROACETIC ACID ETHYL ESTER Chemical compound CCOC(=O)C(F)(F)F STSCVKRWJPWALQ-UHFFFAOYSA-N 0.000 description 1
- GSEJCLTVZPLZKY-UHFFFAOYSA-N Triethanolamine Chemical compound OCCN(CCO)CCO GSEJCLTVZPLZKY-UHFFFAOYSA-N 0.000 description 1
- RHQDFWAXVIIEBN-UHFFFAOYSA-N Trifluoroethanol Chemical compound OCC(F)(F)F RHQDFWAXVIIEBN-UHFFFAOYSA-N 0.000 description 1
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 1
- TXTQARDVRPFFHL-UHFFFAOYSA-N [Sb].[H][H] Chemical compound [Sb].[H][H] TXTQARDVRPFFHL-UHFFFAOYSA-N 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- 239000002313 adhesive film Substances 0.000 description 1
- 229910052783 alkali metal Inorganic materials 0.000 description 1
- 150000001340 alkali metals Chemical class 0.000 description 1
- 150000001412 amines Chemical class 0.000 description 1
- 239000000908 ammonium hydroxide Substances 0.000 description 1
- WATWJIUSRGPENY-UHFFFAOYSA-N antimony atom Chemical group [Sb] WATWJIUSRGPENY-UHFFFAOYSA-N 0.000 description 1
- 229910000410 antimony oxide Inorganic materials 0.000 description 1
- FAPDDOBMIUGHIN-UHFFFAOYSA-K antimony trichloride Chemical compound Cl[Sb](Cl)Cl FAPDDOBMIUGHIN-UHFFFAOYSA-K 0.000 description 1
- XQRVLQLHRAJWLU-UHFFFAOYSA-K antimony(3+);butanoate Chemical class [Sb+3].CCCC([O-])=O.CCCC([O-])=O.CCCC([O-])=O XQRVLQLHRAJWLU-UHFFFAOYSA-K 0.000 description 1
- RPJGYLSSECYURW-UHFFFAOYSA-K antimony(3+);tribromide Chemical compound Br[Sb](Br)Br RPJGYLSSECYURW-UHFFFAOYSA-K 0.000 description 1
- JRLDUDBQNVFTCA-UHFFFAOYSA-N antimony(3+);trinitrate Chemical compound [Sb+3].[O-][N+]([O-])=O.[O-][N+]([O-])=O.[O-][N+]([O-])=O JRLDUDBQNVFTCA-UHFFFAOYSA-N 0.000 description 1
- LLRXPBUXLCBJQF-UHFFFAOYSA-N antimony;ethanol Chemical compound [Sb].CCO.CCO.CCO LLRXPBUXLCBJQF-UHFFFAOYSA-N 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- LDDQLRUQCUTJBB-UHFFFAOYSA-O azanium;hydrofluoride Chemical compound [NH4+].F LDDQLRUQCUTJBB-UHFFFAOYSA-O 0.000 description 1
- 239000002585 base Substances 0.000 description 1
- NDKBVBUGCNGSJJ-UHFFFAOYSA-M benzyltrimethylammonium hydroxide Chemical compound [OH-].C[N+](C)(C)CC1=CC=CC=C1 NDKBVBUGCNGSJJ-UHFFFAOYSA-M 0.000 description 1
- WTEOIRVLGSZEPR-UHFFFAOYSA-N boron trifluoride Chemical compound FB(F)F WTEOIRVLGSZEPR-UHFFFAOYSA-N 0.000 description 1
- OPPYGNKZIKRDCQ-UHFFFAOYSA-K butyl(chloro)tin(2+);diacetate Chemical compound CC([O-])=O.CC([O-])=O.CCCC[Sn+2]Cl OPPYGNKZIKRDCQ-UHFFFAOYSA-K 0.000 description 1
- AFOLZIVGFUUSMF-UHFFFAOYSA-K butyl(dichloro)stannanylium;acetate Chemical compound CCCC[Sn](Cl)(Cl)OC(C)=O AFOLZIVGFUUSMF-UHFFFAOYSA-K 0.000 description 1
- LUZSPGQEISANPO-UHFFFAOYSA-N butyltin Chemical compound CCCC[Sn] LUZSPGQEISANPO-UHFFFAOYSA-N 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- UETQVDZZPKAQIC-UHFFFAOYSA-N chlorane Chemical compound Cl.Cl.Cl.Cl UETQVDZZPKAQIC-UHFFFAOYSA-N 0.000 description 1
- 229940126214 compound 3 Drugs 0.000 description 1
- JQZRVMZHTADUSY-UHFFFAOYSA-L di(octanoyloxy)tin Chemical compound [Sn+2].CCCCCCCC([O-])=O.CCCCCCCC([O-])=O JQZRVMZHTADUSY-UHFFFAOYSA-L 0.000 description 1
- PNOXNTGLSKTMQO-UHFFFAOYSA-L diacetyloxytin Chemical compound CC(=O)O[Sn]OC(C)=O PNOXNTGLSKTMQO-UHFFFAOYSA-L 0.000 description 1
- JGFBRKRYDCGYKD-UHFFFAOYSA-N dibutyl(oxo)tin Chemical compound CCCC[Sn](=O)CCCC JGFBRKRYDCGYKD-UHFFFAOYSA-N 0.000 description 1
- ZBCBWPMODOFKDW-UHFFFAOYSA-N diethanolamine Chemical compound OCCNCCO ZBCBWPMODOFKDW-UHFFFAOYSA-N 0.000 description 1
- 238000007598 dipping method Methods 0.000 description 1
- 239000007772 electrode material Substances 0.000 description 1
- 229910052731 fluorine Inorganic materials 0.000 description 1
- 125000001153 fluoro group Chemical group F* 0.000 description 1
- 235000019253 formic acid Nutrition 0.000 description 1
- LNTHITQWFMADLM-UHFFFAOYSA-N gallic acid Chemical compound OC(=O)C1=CC(O)=C(O)C(O)=C1 LNTHITQWFMADLM-UHFFFAOYSA-N 0.000 description 1
- 238000002309 gasification Methods 0.000 description 1
- ACCCMOQWYVYDOT-UHFFFAOYSA-N hexane-1,1-diol Chemical compound CCCCCC(O)O ACCCMOQWYVYDOT-UHFFFAOYSA-N 0.000 description 1
- FUZZWVXGSFPDMH-UHFFFAOYSA-N hexanoic acid Chemical compound CCCCCC(O)=O FUZZWVXGSFPDMH-UHFFFAOYSA-N 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- WGCNASOHLSPBMP-UHFFFAOYSA-N hydroxyacetaldehyde Natural products OCC=O WGCNASOHLSPBMP-UHFFFAOYSA-N 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- JMMWKPVZQRWMSS-UHFFFAOYSA-N isopropanol acetate Natural products CC(C)OC(C)=O JMMWKPVZQRWMSS-UHFFFAOYSA-N 0.000 description 1
- 229940011051 isopropyl acetate Drugs 0.000 description 1
- GWYFCOCPABKNJV-UHFFFAOYSA-N isovaleric acid Chemical compound CC(C)CC(O)=O GWYFCOCPABKNJV-UHFFFAOYSA-N 0.000 description 1
- 150000002576 ketones Chemical class 0.000 description 1
- 229910000000 metal hydroxide Inorganic materials 0.000 description 1
- 150000004692 metal hydroxides Chemical class 0.000 description 1
- 150000007522 mineralic acids Chemical class 0.000 description 1
- REOJLIXKJWXUGB-UHFFFAOYSA-N mofebutazone Chemical group O=C1C(CCCC)C(=O)NN1C1=CC=CC=C1 REOJLIXKJWXUGB-UHFFFAOYSA-N 0.000 description 1
- 229910017604 nitric acid Inorganic materials 0.000 description 1
- 150000007524 organic acids Chemical class 0.000 description 1
- VTRUBDSFZJNXHI-UHFFFAOYSA-N oxoantimony Chemical compound [Sb]=O VTRUBDSFZJNXHI-UHFFFAOYSA-N 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- NBIIXXVUZAFLBC-UHFFFAOYSA-K phosphate Chemical compound [O-]P([O-])([O-])=O NBIIXXVUZAFLBC-UHFFFAOYSA-K 0.000 description 1
- 239000010452 phosphate Substances 0.000 description 1
- 239000002244 precipitate Substances 0.000 description 1
- 125000001453 quaternary ammonium group Chemical group 0.000 description 1
- 238000005245 sintering Methods 0.000 description 1
- 239000001632 sodium acetate Substances 0.000 description 1
- 235000017281 sodium acetate Nutrition 0.000 description 1
- 239000001488 sodium phosphate Substances 0.000 description 1
- 229910000162 sodium phosphate Inorganic materials 0.000 description 1
- NTHWMYGWWRZVTN-UHFFFAOYSA-N sodium silicate Chemical compound [Na+].[Na+].[O-][Si]([O-])=O NTHWMYGWWRZVTN-UHFFFAOYSA-N 0.000 description 1
- 229910052911 sodium silicate Inorganic materials 0.000 description 1
- 238000004528 spin coating Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- FPADWGFFPCNGDD-UHFFFAOYSA-N tetraethoxystannane Chemical compound [Sn+4].CC[O-].CC[O-].CC[O-].CC[O-] FPADWGFFPCNGDD-UHFFFAOYSA-N 0.000 description 1
- YLQBMQCUIZJEEH-UHFFFAOYSA-N tetrahydrofuran Natural products C=1C=COC=1 YLQBMQCUIZJEEH-UHFFFAOYSA-N 0.000 description 1
- SYRHIZPPCHMRIT-UHFFFAOYSA-N tin(4+) Chemical compound [Sn+4] SYRHIZPPCHMRIT-UHFFFAOYSA-N 0.000 description 1
- YGBFTDQFAKDXBZ-UHFFFAOYSA-N tributyl stiborite Chemical compound [Sb+3].CCCC[O-].CCCC[O-].CCCC[O-] YGBFTDQFAKDXBZ-UHFFFAOYSA-N 0.000 description 1
- RYFMWSXOAZQYPI-UHFFFAOYSA-K trisodium phosphate Chemical compound [Na+].[Na+].[Na+].[O-]P([O-])([O-])=O RYFMWSXOAZQYPI-UHFFFAOYSA-K 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/1343—Electrodes
- G02F1/13439—Electrodes characterised by their electrical, optical, physical properties; materials therefor; method of making
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/0042—Photosensitive materials with inorganic or organometallic light-sensitive compounds not otherwise provided for, e.g. inorganic resists
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F71/00—Manufacture or treatment of devices covered by this subclass
- H10F71/138—Manufacture of transparent electrodes, e.g. transparent conductive oxides [TCO] or indium tin oxide [ITO] electrodes
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/02—Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding
-
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Description
519664 A7 B7 五、發明説明(1) 技術領域 (請先閱讀背面之注意事項再填寫本頁) 本發明爲關於必須以透明顯示電極之觸控面板、等離 子體顯示面板、液晶顯示器、太陽電池等所用之透明導電 性氧化錫膜的圖型化方法。 背景技術 近年’隨著電腦的急速普及,更簡單輸入資料裝置之 觸控面板的重要性亦日漸增加,又,液晶顯示器和等離子 體顯示面板、E L顯.示器亦以取代c R T之新穎的顯示器 型式而受到注目。此類使用透明電極的裝置已被使用於各 種領域,由產業上.之有用性而言可預知其市場日漸擴大。 經濟部智慧財產局員工消費合作社印製 透明電極材料爲以摻混氧化錫之氧化銦(I I I )、 和摻混氧化銻之氧化錫(I V )爲其代表。氧化錫(j V )系導電性材料爲比氧化銦(I I丨)系之原料豐富且便 宜,具有耐熱性高且化學性亦安定之優良特徵。但是,其 反面因鈾刻困難’故具有難以取得精度高之圖型之問題點 。因此,現在,於上述用途中,主要使用容易蝕刻之氧化 銦(I I I )系導電性材料,將氧化錫(I V )系材料予 以圖型化乃成爲技術性課題。 先前形成氧化錫(I V )膜圖型之方法已有各種提案 〇 於特開昭5 5 — 1 3 9 7 1 4號公報中,揭示於玻璃 基板上形成氧化錫(I V )之薄膜上塗佈光阻物,形成光 阻圖型’且於全面塗佈鋅粉末並令無光阻物之部分與氧化 -4 - 本紙張尺度適用中國國家標準(CNS ) A4規格(2ΐ〇χ297公釐) 519664 A7 _B7__ 五、發明説明(3 錫(I V )膜接觸後,於鹽酸和磷酸之混合水溶液中浸漬 除去氧化錫(I V )膜,並再除去光阻物則可形成所欲之 氧化錫(I V)薄膜圖型之方法。 於特開昭5 7 - 1 3 6 7 0 5號公報中,揭示於基體 上形成氧化錫(I V )膜,並於其上塗佈光阻物’形成光 阻圖型,且於保持在1 0 0 °C以上之狀態下,於氫等離子 體中曝露令無光阻物之部分還原成爲金屬錫,並以鹽酸將 還原之部分予以溶解,.且在剝離光罩圖型下,取得氧化錫 (I V )薄膜圖型之方法。 於特開平2 — 2 3 4 3 1 0號公報中,揭示對於 4 0 0 °C加熱之基板噴霧四氯化錫和硫酸之水溶液,於基 板上形成硫化錫(I I ),並且恢復至室溫後塗佈光阻物 ,形成圖型,並以氫氧化鈉水溶液將無光阻物部分之硫化 錫(I I )膜予以蝕刻,除去光阻物後,最後進行煅燒, 取得圖型化之氧化錫(I V )膜之方法。 於特開平1 1 一 1 1 1 0 8 2號公報中,揭示將溶解 錫化合物和摻混劑化合物之溶液於基材上塗佈,並將該基 板上所形成之被膜乾燥,形成乾燥膜,且於其上層形成光 * 阻物,令該光阻物部分顯像且形成圖型,並將下層之乾燥 膜予以鈾刻後,剝離未顯像之光阻物,並將其下層之乾燥 膜锻燒作成氧化錫(I V )膜之形成導電性氧化錫膜圖型 之方法中,經由使用將有機溶劑中可溶之錫化合物與摻混 劑化合物於該有機溶劑中溶解之溶液,且令該乾燥膜於對 於顯像液保持溶解性之範圍內乾燥,並將光阻物與乾燥膜 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) 冬 (請先閱讀背面之注意事項再填寫本頁) 裝. 訂 經濟部智慧財產局員工消費合作社印製 519664 A7 ___B7_ 五、發明説明(5) 物及摻混劑化合物濃度爲圖型成分濃度爲2〜3 0重量% 〇 包含紫外線區域之光線爲使用含有1 8 0 n m以上 4 0 〇 n m以下波長之光線。 前述顯像液爲使用鹼性顯像液或酸性顯像液。 前述基材上所形成之被膜的乾燥溫度爲室溫〜1 5 0 °C之範圍內爲佳,且特別以5 0〜1 0 0 °C之範圍內爲更 佳。 前述圖型膜之煅燒溫度爲3 5 0 °C以上爲佳。 圖面之簡單說明. 圖1〜圖4爲將本發明之形成導電性氧化錫膜圖型之 方法的實施例1以時序式示出的截面圖。 圖1 :將含有錫化合物之溶液於基板上塗佈,並且乾 燥之截面圖。 圖2 ··透過圖型光罩物,照射紫外線且曝光之截面圖 (請先閲讀背面之注意事項再填寫本頁) -裝· 訂 線 經濟部智慧財產局員工消費合作社印製 圖圖 面 截 之 刻 鈾 以 予 膜 燥 乾 之 β· 立口 光 曝 未 將 液 像 顯 性 驗 以 圖 面 截 之 膜 。 }號 V 符 I 之 ( 4 錫圖 化 ~ 氧 1 成圖 形於 燒關 锻明 : 說. 4 下 圖以 板 表基 照: 對 1 件 元 準 標 家 國 ,國 f中 用 一適 尺 I張 紙 I本 I釐 公 7 9 2 519664 A7 B7
2 :含有錫化合物之圖型膜 3 :光罩物 4 :氧化錫(I V )膜 用以實施發明之最佳型態 本發明所用之錫化合物若爲於有機溶劑中溶解者即可 ’並無特別限定。錫化合物之例可使用氛化錫(I Ϊ )、 氯化錫(I V )、醋酸錫(I I )、辛酸錫(I I )、四 乙醇錫、三氯化單丁,基錫、二氯化二丁基錫、醋酸丁基二 氯基錫、二醋酸丁基氯基錫 '二丁基二丁氧基錫、二丁基 錫氧化物等之一種.或二種以上。 本發明所用之摻混劑化合物於提高氧化錫膜導電性之 目的下,使用銻化合物和/或氟化合物爲佳。 將銻化合物使用做爲摻混劑時,銻化合物之例可使用 三乙醇銻、三丁醇銻等之銻醇鹽類、硝酸銻(I I I )、 氯化銻(I I I )、溴化銻(I I I )等之無機鹽類、醏 酸銻(I I I) 、丁酸銻(I I I)等之有機鹽類等之一 種或二種以上。 I .相對於錫化合物之銻化合物添加量,以相對於錫原子 之銻原子比爲2〜3 0莫耳%之範圍爲佳。未滿2莫耳% 或超過3 0莫耳%之範圍下,無法取得添加銻化合物所造 成之摻混效果優良且導電性提高的氧化錫(I V )膜,故 爲不佳。 使用氟化合物做爲摻混劑時,氟化合物之例可使用氟 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) Γ〇Ί (請先閲讀背面之注意事項再填寫本頁) 裝_ 線 經濟部智慧財產局員工消費合作社印製 519664 Α7 Β7 經濟部智慧財產局員工消費合作社印製 五、發明説明(7) 化氣、氟化銨、氟化氫銨、氟化錫(I I )、氟化銻 (III)、氟化硼、三氟醋酸、三氟醋酸酐、三氟乙醇 、三氟醋酸乙酯、五氟丙酸之一種或二種以上爲佳。其中 ,特別以使用氟化錫(I V)者因操作容易,故爲佳。 相對於錫化合物之氟化合物添加量,以相對於錫原子 之氟原子比爲2〜6 0莫耳%之範圍爲佳。未滿2莫耳% 或超過6 0莫耳%之範圍下,無法取得添加氟化合物所造 成之摻混效果優良且導電性提高的氧化錫(I V )膜,故 爲不佳。 > 本發明所用之有機溶劑若爲令錫化合物及摻混劑化合 物溶解,且,於煆燒後之膜中不會副生成鹼金屬和碳等之 阻礙導電性之不純物者即可,並無特別限制。有機溶劑之 例可使用甲醇、乙醇、異丙醇、丁醇等之醇類、四氫呋喃 、丙酮、甲基乙基酮、乙醯丙酮、環己酮等之酮類、乙二 醇、己二醇、丙二醇、1 ,4 一丁二醇等之醇類、乙二醇 單甲醚、乙二醇單丁醚、丙二醇單丁醚等之二元醇醚類、 醋酸乙酯、醋酸異丙酯、醋酸丁酯等之有機酸酯類等等一 種或二種以上之組合。 本發明中將錫化合物及摻混劑化合物於有機溶劑中溶 解的溶液爲不含有沈澱物和膠狀物的均勻透明溶液。錫化 合物及摻混劑化合物之固型成分爲以相對·於溶液全重量之 不揮發性氧化物成分之重量比例算出。溶液之固型成分濃 度爲2〜3 0重星%爲佳’且特別以5〜1 5重量%爲佳 。固型成分濃度低於2重量%時’無法以一'回之塗佈取得 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) ~\τΓ ' (請先閱讀背面之注意事項再填寫本頁) .裝· 訂 線 519664 經濟部智慧財產局員工消費合作社印製 A7 _ B7_____ 五、發明説明(8) 充分之膜厚,產生必須以多層且無效率。固型成分濃度若 於3 0重量%時,以一回之塗佈則膜厚過厚,且恐造成裂 縫。 於本發明中,若對在於顯像液保持溶解性之範圍內乾 燥之膜,以含有紫外線區域之光線予以曝光,則引起乾燥 膜中錫化合物之氧化,選擇性地令曝光部之乾燥膜不溶化 。含有紫外線區域之光爲含有1 8 0 nm以上4 0 0 nm 以下波長之光源,可爲市售而輕易取得爲佳。 本發明所用之顯.像液爲用以進行含有錫化合物之乾燥 膜的蝕刻。因此,使用鹼性化合物溶液或酸性化合物溶液 爲佳。鹼性化合物溶液(驗性顯像液)可使用例如驗金屬 、四級銨之氫氧化鈉。矽酸鹽、磷酸鹽、醋酸鹽、胺類等 水溶液。具體例可列舉氫氧化鈉、氫氧化鉀、氫氧化銨、 氫氧化三甲基苄基銨、氫氧化四甲基銨、矽酸鈉、磷酸鈉 、醋酸鈉、單乙醇胺、二乙醇胺、三乙醇胺等之水溶液。 酸性化合物溶液(酸性顯像液)以鹽酸、硝酸、硫酸、氟 酸、磷酸等之無機酸、甲酸、醋酸等之有機酸之水溶液爲 佳。但,相對於水量之鹼性化合物或酸性化合物之份量, 以可令曝光部和未曝光部充分產生溶解度差之份量爲佳。 本發明中溶液之塗佈法並無特別限制,可依通常之方 法,例如浸漬法、旋塗法.、刷毛刷塗法、輥塗法、撓性印 刷法、金屬網棒塗法等塗佈基材。 本發明所用之基材若爲容許其上形成密合性被膜者即 可’並無特別限制,但特別於形成氧化錫膜上,使用玻璃 本紙張尺度適用中國國家標準(CNS ) Μ腦·( 210X;297公釐)" (請先閲讀背面之注意事項再填寫本頁) •裝- 訂 線
Claims (1)
- 519664 A8 B8 C8 D8 W( f 六、申請專利範圍 1 附件1A: 第901 32578號專利申請案 中文申請專利範圍修正本 (讀先閱讀背面之注意事項再填寫本頁) 民國91年12月4日修正 1 . 一種形成導電性氧化錫膜圖型之方法,其特徵爲 使用將有機溶劑中可溶之錫化合物和摻混劑化合物於該有 機溶劑中溶解的溶液,並於該乾燥膜對於顯像液保持溶解 性之範圍內乾燥,經由含有紫外線區域之光線予以曝光令 部分呈現不溶,且以顯像液將未曝光部予以蝕刻。 2 .如申請專利範圍第1項所述之形成導電性氧化錫 膜圖型之方法,其爲由下述步驟(A) 、(B)及(C) 所構成 (A ):形成令有機溶劑中可溶之錫化合物和摻混劑 化合物於該有機溶劑中溶解之溶液之步驟、 (B ):將(A )步驟所得之溶解液於基材上塗佈, 並令該基板上所形成之被膜乾燥,形成乾燥膜之步驟、 經濟部智慧財產局員工消費合作社印製 (C ):對(B )步驟所得之乾燥膜以含有紫外線區 域之光線轉印圖型,其次將構成轉印圖型之乾燥膜以顯像 液予以蝕刻,形成部分顯像之圖型膜之步驟,其次將該圖 型膜煅燒,生成氧化錫(I V )膜之.步驟: 3 ·如申請專利範圍第1或2項之形成導電性氧化錫 膜圖型之方法,其中摻混劑化合物爲銻化合物和/或氟化 合物。 · 4 .如申請專利範圍第3項之形成導電性氧化錫膜圖 本紙張尺度適用中國國家標準(CNS )八4規格(210 X 297公釐) ~Γ ~ " 519664 A8 B8 C8 D8 __ 六、申請專利範圍 2 型之方法,其中銻化合物相對於錫化合物,使用原子比爲 2〜3〇莫耳%。 5 .如申請專利範圍第3項之形成導電性氧化錫膜圖 型之方法,其中氟化合物相對於錫化合物,使用原子比爲 2〜6 0莫耳%。 6 .如申請專利範圍第1或2項之形成導電性氧化錫 膜圖型之方法,其中於有機溶劑中溶解之溶液中的錫化合 物及摻混劑化合物濃度以固形成分濃度而言爲2〜3 0重 量% 〇 7 ·如申請專利範圍第1或2項之形成導電性氧化錫 膜圖型之方法,其中含有紫外線區域之光線爲含有1 8 0 n m以上4 0 0 n m以下波長之光線。 8 ·如申請專利範圍第1或2項之形成導電性氧化錫 膜圖型之方法,其中顯像液爲鹼性顯像液或酸性顯像液。 9 ·如申請專利範圍第1或2項之形成導電性氧化錫 膜圖型之方法,其中於基材上所形成之被膜的乾燥溫度爲 在室溫〜1 5 0 °C之範圍內。 1 0 ·如申請專利範圍第1或2項之形成導電性氧化 錫膜圖型之方法,其中該圖型乾燥膜之煅燒溫度爲3 5 0 t:以上。 .‘ 1 1 ·如申請專利範圍第3項之形成導電性氧化錫膜 圖型之方法,其中於有機溶劑中溶解之溶液中的錫化合物 及摻混劑化合物濃度以固形成分濃度而言爲2〜3 0重量 %。 本紙張尺度適财關家標準(CNS ) A4規格(21GX297公釐)~~ : " (請先閱讀背面之注意事項再填寫本頁) 、1T 經濟部智慧財產局員工消費合作社印製 519664 A8 B8 C8 D8 六、申請專利範圍 3 1 2 .如申請專利範圍第3項之形成導電性氧化錫膜 圖型之方法,其中含有紫外線區域之光線爲含有1 8 0 n m以上4 0 0 n m以下波長之光線。 1 3 .如申請專利範圍第3項之形成導電性氧化錫膜 圖型之方法,其中顯像液爲鹼性顯像液或酸性顯像液。 1 4 .如申請專利範圍第3項之形成導電性氧化錫膜 圖型之方法,其中於基材上所形成之被膜的乾燥溫度爲在 室溫〜1 5 0 °C之範圍內。 1 5 .如申請專利範圍第3項之形成導電性氧化錫膜 圖型之方法,其中該圖型乾燥膜之煅燒溫度爲3 5 0 °C以 上。 (請先閱讀背面之注意事項再填寫本頁) 經濟部智慧財產局員工消費合作社印製 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐)一3
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| TW090132578A TW519664B (en) | 2000-12-28 | 2001-12-27 | Method for patterning electro-conductive tin oxide film |
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| Country | Link |
|---|---|
| US (1) | US20040067444A1 (zh) |
| EP (1) | EP1347468A4 (zh) |
| JP (1) | JP4631011B2 (zh) |
| KR (1) | KR100731945B1 (zh) |
| TW (1) | TW519664B (zh) |
| WO (1) | WO2002054416A1 (zh) |
Families Citing this family (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4699140B2 (ja) * | 2005-08-29 | 2011-06-08 | 東京応化工業株式会社 | パターン形成方法 |
| KR100856508B1 (ko) * | 2007-06-15 | 2008-09-04 | 주식회사 잉크테크 | 투명도전막 및 이의 제조방법 |
| KR100870425B1 (ko) | 2008-04-11 | 2008-11-25 | 한밭대학교 산학협력단 | 유기성 폐기물 처리를 위한 혐기성 통합공정장치 |
| US8445373B2 (en) | 2009-05-28 | 2013-05-21 | Guardian Industries Corp. | Method of enhancing the conductive and optical properties of deposited indium tin oxide (ITO) thin films |
| US9176377B2 (en) | 2010-06-01 | 2015-11-03 | Inpria Corporation | Patterned inorganic layers, radiation based patterning compositions and corresponding methods |
| JP5559640B2 (ja) * | 2010-08-25 | 2014-07-23 | 独立行政法人産業技術総合研究所 | 構造体の製造方法 |
| JP5708521B2 (ja) * | 2011-02-15 | 2015-04-30 | 信越化学工業株式会社 | レジスト材料及びこれを用いたパターン形成方法 |
| US9310684B2 (en) | 2013-08-22 | 2016-04-12 | Inpria Corporation | Organometallic solution based high resolution patterning compositions |
| KR102952227B1 (ko) | 2014-10-23 | 2026-04-13 | 인프리아 코포레이션 | 유기 금속 용액 기반의 고해상도 패터닝 조성물 및 상응하는 방법 |
| WO2016127533A1 (zh) * | 2015-02-11 | 2016-08-18 | 佛山市顺德区美的电热电器制造有限公司 | 电热膜层的制造方法、电热膜层、电加热盘和烹饪器具 |
| US10011524B2 (en) | 2015-06-19 | 2018-07-03 | Guardian Glass, LLC | Coated article with sequentially activated low-E coating, and/or method of making the same |
| KR102508142B1 (ko) | 2015-10-13 | 2023-03-08 | 인프리아 코포레이션 | 유기주석 옥사이드 하이드록사이드 패터닝 조성물, 전구체 및 패터닝 |
| TW201905250A (zh) * | 2017-06-23 | 2019-02-01 | 美商應用材料股份有限公司 | 抑制金屬沉積之方法 |
| US12211691B2 (en) | 2018-12-20 | 2025-01-28 | Lam Research Corporation | Dry development of resists |
| TWI837391B (zh) | 2019-06-26 | 2024-04-01 | 美商蘭姆研究公司 | 利用鹵化物化學品的光阻顯影 |
| SG11202108851RA (en) | 2020-01-15 | 2021-09-29 | Lam Res Corp | Underlayer for photoresist adhesion and dose reduction |
| EP4078292A4 (en) | 2020-07-07 | 2023-11-22 | Lam Research Corporation | Integrated dry processes for patterning radiation photoresist patterning |
| US20230107357A1 (en) | 2020-11-13 | 2023-04-06 | Lam Research Corporation | Process tool for dry removal of photoresist |
| JP7681106B2 (ja) | 2020-12-08 | 2025-05-21 | ラム リサーチ コーポレーション | 有機蒸気によるフォトレジストの現像 |
| KR102725782B1 (ko) | 2022-07-01 | 2024-11-05 | 램 리써치 코포레이션 | 에칭 정지 억제 (etch stop deterrence) 를 위한 금속 옥사이드 기반 포토레지스트의 순환적 현상 |
| US12474640B2 (en) | 2023-03-17 | 2025-11-18 | Lam Research Corporation | Integration of dry development and etch processes for EUV patterning in a single process chamber |
| JP7852072B2 (ja) | 2023-07-27 | 2026-04-27 | ラム リサーチ コーポレーション | 金属含有フォトレジストのためのオールインワン乾式現像 |
Family Cites Families (10)
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| JPH0731951B2 (ja) * | 1986-03-03 | 1995-04-10 | 凸版印刷株式会社 | 透明電極基板の製造方法 |
| JP2538043B2 (ja) * | 1989-04-05 | 1996-09-25 | 松下電器産業株式会社 | パタ―ン形成用材料とそれを用いたパタ―ン形成基板の作製方法 |
| JPH0779008B2 (ja) * | 1989-04-06 | 1995-08-23 | 鐘淵化学工業株式会社 | パターン化した酸化錫系透明導電性薄膜の製法およびそれに用いる組成物 |
| JPH0779009B2 (ja) * | 1989-04-20 | 1995-08-23 | 鐘淵化学工業株式会社 | パターン化した酸化錫系透明導電性薄膜の製法およびそれに用いる組成物 |
| JPH046717A (ja) * | 1990-04-24 | 1992-01-10 | Kanegafuchi Chem Ind Co Ltd | パターン化された金属酸化物薄膜の製法およびそれに用いる組成物 |
| JPH07282653A (ja) * | 1994-04-04 | 1995-10-27 | Mitsubishi Materials Corp | 透明導電膜の製造方法 |
| JPH0982137A (ja) * | 1995-09-08 | 1997-03-28 | Dainippon Printing Co Ltd | 透明導電膜形成用組成物及び透明導電膜の形成方法 |
| US5695809A (en) * | 1995-11-14 | 1997-12-09 | Micron Display Technology, Inc. | Sol-gel phosphors |
| JPH11111082A (ja) * | 1997-10-03 | 1999-04-23 | Nissan Chem Ind Ltd | 導電性酸化スズ膜のパターニング方法 |
| US5958624A (en) * | 1997-12-18 | 1999-09-28 | Research Corporation Technologies, Inc. | Mesostructural metal oxide materials useful as an intercalation cathode or anode |
-
2001
- 2001-12-26 EP EP01272538A patent/EP1347468A4/en not_active Withdrawn
- 2001-12-26 JP JP2001393286A patent/JP4631011B2/ja not_active Expired - Lifetime
- 2001-12-26 US US10/451,363 patent/US20040067444A1/en not_active Abandoned
- 2001-12-26 KR KR1020037008123A patent/KR100731945B1/ko not_active Expired - Lifetime
- 2001-12-26 WO PCT/JP2001/011485 patent/WO2002054416A1/ja not_active Ceased
- 2001-12-27 TW TW090132578A patent/TW519664B/zh not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| EP1347468A4 (en) | 2005-04-20 |
| US20040067444A1 (en) | 2004-04-08 |
| WO2002054416A1 (en) | 2002-07-11 |
| KR100731945B1 (ko) | 2007-06-25 |
| JP4631011B2 (ja) | 2011-02-16 |
| EP1347468A1 (en) | 2003-09-24 |
| JP2002270051A (ja) | 2002-09-20 |
| KR20040028698A (ko) | 2004-04-03 |
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