TWI492940B - 產生光酸之單體的製備方法 - Google Patents
產生光酸之單體的製備方法 Download PDFInfo
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- TWI492940B TWI492940B TW100149501A TW100149501A TWI492940B TW I492940 B TWI492940 B TW I492940B TW 100149501 A TW100149501 A TW 100149501A TW 100149501 A TW100149501 A TW 100149501A TW I492940 B TWI492940 B TW I492940B
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- Prior art keywords
- alkyl
- sultone
- cation
- group
- independently
- Prior art date
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- 239000000178 monomer Substances 0.000 title claims description 28
- 238000000034 method Methods 0.000 title claims description 25
- -1 oxygen anion Chemical class 0.000 claims description 45
- 150000008053 sultones Chemical class 0.000 claims description 31
- 125000000217 alkyl group Chemical group 0.000 claims description 28
- 150000001768 cations Chemical class 0.000 claims description 26
- 239000012038 nucleophile Substances 0.000 claims description 25
- 238000006243 chemical reaction Methods 0.000 claims description 23
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 23
- 229910052731 fluorine Inorganic materials 0.000 claims description 22
- 125000003118 aryl group Chemical group 0.000 claims description 20
- 229910052799 carbon Inorganic materials 0.000 claims description 18
- 239000002253 acid Substances 0.000 claims description 17
- 125000001153 fluoro group Chemical group F* 0.000 claims description 17
- 150000001875 compounds Chemical class 0.000 claims description 16
- 125000002887 hydroxy group Chemical group [H]O* 0.000 claims description 13
- 125000000753 cycloalkyl group Chemical group 0.000 claims description 11
- 125000000008 (C1-C10) alkyl group Chemical class 0.000 claims description 9
- 229910052739 hydrogen Inorganic materials 0.000 claims description 9
- 125000002950 monocyclic group Chemical group 0.000 claims description 9
- CERQOIWHTDAKMF-UHFFFAOYSA-N Methacrylic acid Chemical compound CC(=C)C(O)=O CERQOIWHTDAKMF-UHFFFAOYSA-N 0.000 claims description 8
- 125000003367 polycyclic group Chemical group 0.000 claims description 8
- 239000002904 solvent Substances 0.000 claims description 8
- 229910052717 sulfur Inorganic materials 0.000 claims description 7
- 229910052740 iodine Inorganic materials 0.000 claims description 6
- 150000003839 salts Chemical class 0.000 claims description 6
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 claims description 5
- 150000001336 alkenes Chemical class 0.000 claims description 5
- 239000011737 fluorine Chemical group 0.000 claims description 5
- 230000000269 nucleophilic effect Effects 0.000 claims description 5
- JRZJOMJEPLMPRA-UHFFFAOYSA-N olefin Natural products CCCCCCCC=C JRZJOMJEPLMPRA-UHFFFAOYSA-N 0.000 claims description 5
- NIXOWILDQLNWCW-UHFFFAOYSA-N 2-Propenoic acid Natural products OC(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 claims description 4
- 239000007795 chemical reaction product Substances 0.000 claims description 4
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 claims description 3
- 238000005341 cation exchange Methods 0.000 claims description 3
- 150000002429 hydrazines Chemical class 0.000 claims description 3
- 150000002825 nitriles Chemical class 0.000 claims description 3
- 229910052760 oxygen Inorganic materials 0.000 claims description 3
- 239000001301 oxygen Substances 0.000 claims description 3
- 229920002554 vinyl polymer Polymers 0.000 claims description 3
- FUGYGGDSWSUORM-UHFFFAOYSA-N 4-hydroxystyrene Chemical compound OC1=CC=C(C=C)C=C1 FUGYGGDSWSUORM-UHFFFAOYSA-N 0.000 claims description 2
- 150000001298 alcohols Chemical class 0.000 claims description 2
- 229910021529 ammonia Inorganic materials 0.000 claims description 2
- 150000001735 carboxylic acids Chemical class 0.000 claims description 2
- 150000002170 ethers Chemical class 0.000 claims description 2
- 229920001567 vinyl ester resin Polymers 0.000 claims description 2
- WEVYAHXRMPXWCK-UHFFFAOYSA-N Acetonitrile Chemical compound CC#N WEVYAHXRMPXWCK-UHFFFAOYSA-N 0.000 description 21
- 239000000203 mixture Substances 0.000 description 16
- 238000005481 NMR spectroscopy Methods 0.000 description 15
- 239000002585 base Substances 0.000 description 15
- 239000007787 solid Substances 0.000 description 14
- 239000000047 product Substances 0.000 description 13
- YMWUJEATGCHHMB-UHFFFAOYSA-N Dichloromethane Chemical compound ClCCl YMWUJEATGCHHMB-UHFFFAOYSA-N 0.000 description 12
- 239000010410 layer Substances 0.000 description 12
- 238000002360 preparation method Methods 0.000 description 12
- 239000000243 solution Substances 0.000 description 12
- 239000011734 sodium Substances 0.000 description 11
- 125000001424 substituent group Chemical group 0.000 description 10
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 9
- RTZKZFJDLAIYFH-UHFFFAOYSA-N Diethyl ether Chemical compound CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 8
- WYURNTSHIVDZCO-UHFFFAOYSA-N Tetrahydrofuran Chemical compound C1CCOC1 WYURNTSHIVDZCO-UHFFFAOYSA-N 0.000 description 8
- 238000007142 ring opening reaction Methods 0.000 description 8
- 238000003756 stirring Methods 0.000 description 8
- NIXOWILDQLNWCW-UHFFFAOYSA-M Acrylate Chemical compound [O-]C(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-M 0.000 description 7
- 150000001450 anions Chemical class 0.000 description 7
- 229920002120 photoresistant polymer Polymers 0.000 description 7
- 229920000642 polymer Polymers 0.000 description 7
- 238000002411 thermogravimetry Methods 0.000 description 7
- UHOVQNZJYSORNB-UHFFFAOYSA-N Benzene Chemical compound C1=CC=CC=C1 UHOVQNZJYSORNB-UHFFFAOYSA-N 0.000 description 6
- KWYUFKZDYYNOTN-UHFFFAOYSA-M Potassium hydroxide Chemical compound [OH-].[K+] KWYUFKZDYYNOTN-UHFFFAOYSA-M 0.000 description 6
- UIIMBOGNXHQVGW-UHFFFAOYSA-M Sodium bicarbonate Chemical compound [Na+].OC([O-])=O UIIMBOGNXHQVGW-UHFFFAOYSA-M 0.000 description 6
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 6
- 239000011541 reaction mixture Substances 0.000 description 6
- 229910052708 sodium Inorganic materials 0.000 description 6
- BDHFUVZGWQCTTF-UHFFFAOYSA-N sulfonic acid Chemical compound OS(=O)=O BDHFUVZGWQCTTF-UHFFFAOYSA-N 0.000 description 6
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 5
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical group C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 description 5
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 5
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 5
- 238000000354 decomposition reaction Methods 0.000 description 5
- 230000000694 effects Effects 0.000 description 5
- DOUHZFSGSXMPIE-UHFFFAOYSA-N hydroxidooxidosulfur(.) Chemical compound [O]SO DOUHZFSGSXMPIE-UHFFFAOYSA-N 0.000 description 5
- 150000002978 peroxides Chemical class 0.000 description 5
- ISWSIDIOOBJBQZ-UHFFFAOYSA-N phenol group Chemical group C1(=CC=CC=C1)O ISWSIDIOOBJBQZ-UHFFFAOYSA-N 0.000 description 5
- 239000002002 slurry Substances 0.000 description 5
- RTTCOQHNKANLOS-UHFFFAOYSA-N 4-bromo-3,3,4,4-tetrafluorobutan-1-ol Chemical compound OCCC(F)(F)C(F)(F)Br RTTCOQHNKANLOS-UHFFFAOYSA-N 0.000 description 4
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 4
- CDBYLPFSWZWCQE-UHFFFAOYSA-L Sodium Carbonate Chemical compound [Na+].[Na+].[O-]C([O-])=O CDBYLPFSWZWCQE-UHFFFAOYSA-L 0.000 description 4
- CSCPPACGZOOCGX-WFGJKAKNSA-N acetone d6 Chemical compound [2H]C([2H])([2H])C(=O)C([2H])([2H])[2H] CSCPPACGZOOCGX-WFGJKAKNSA-N 0.000 description 4
- 239000007864 aqueous solution Substances 0.000 description 4
- 150000001732 carboxylic acid derivatives Chemical class 0.000 description 4
- 150000001767 cationic compounds Chemical class 0.000 description 4
- 239000013078 crystal Substances 0.000 description 4
- 239000008367 deionised water Substances 0.000 description 4
- 229910021641 deionized water Inorganic materials 0.000 description 4
- 238000004821 distillation Methods 0.000 description 4
- 125000004428 fluoroalkoxy group Chemical group 0.000 description 4
- 125000003709 fluoroalkyl group Chemical group 0.000 description 4
- 229910001411 inorganic cation Inorganic materials 0.000 description 4
- 239000011159 matrix material Substances 0.000 description 4
- JESXATFQYMPTNL-UHFFFAOYSA-N mono-hydroxyphenyl-ethylene Natural products OC1=CC=CC=C1C=C JESXATFQYMPTNL-UHFFFAOYSA-N 0.000 description 4
- 239000012299 nitrogen atmosphere Substances 0.000 description 4
- 150000002892 organic cations Chemical class 0.000 description 4
- 239000012071 phase Substances 0.000 description 4
- XAEFZNCEHLXOMS-UHFFFAOYSA-M potassium benzoate Chemical compound [K+].[O-]C(=O)C1=CC=CC=C1 XAEFZNCEHLXOMS-UHFFFAOYSA-M 0.000 description 4
- 239000002243 precursor Substances 0.000 description 4
- 238000007363 ring formation reaction Methods 0.000 description 4
- 229910000104 sodium hydride Inorganic materials 0.000 description 4
- YLQBMQCUIZJEEH-UHFFFAOYSA-N tetrahydrofuran Natural products C=1C=COC=1 YLQBMQCUIZJEEH-UHFFFAOYSA-N 0.000 description 4
- FMWOQCFGKLGVLR-UHFFFAOYSA-N 1,1,2,2-tetrafluoro-4-hydroxybutane-1-sulfonic acid Chemical compound OCCC(F)(F)C(F)(F)S(O)(=O)=O FMWOQCFGKLGVLR-UHFFFAOYSA-N 0.000 description 3
- XUDBVJCTLZTSDC-UHFFFAOYSA-N 2-ethenylbenzoic acid Chemical compound OC(=O)C1=CC=CC=C1C=C XUDBVJCTLZTSDC-UHFFFAOYSA-N 0.000 description 3
- XLLXMBCBJGATSP-UHFFFAOYSA-N 2-phenylethenol Chemical compound OC=CC1=CC=CC=C1 XLLXMBCBJGATSP-UHFFFAOYSA-N 0.000 description 3
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Chemical compound CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 description 3
- WFDIJRYMOXRFFG-UHFFFAOYSA-N Acetic anhydride Chemical compound CC(=O)OC(C)=O WFDIJRYMOXRFFG-UHFFFAOYSA-N 0.000 description 3
- QGZKDVFQNNGYKY-UHFFFAOYSA-O Ammonium Chemical compound [NH4+] QGZKDVFQNNGYKY-UHFFFAOYSA-O 0.000 description 3
- VHUUQVKOLVNVRT-UHFFFAOYSA-N Ammonium hydroxide Chemical compound [NH4+].[OH-] VHUUQVKOLVNVRT-UHFFFAOYSA-N 0.000 description 3
- WVDDGKGOMKODPV-UHFFFAOYSA-N Benzyl alcohol Chemical group OCC1=CC=CC=C1 WVDDGKGOMKODPV-UHFFFAOYSA-N 0.000 description 3
- MHAJPDPJQMAIIY-UHFFFAOYSA-N Hydrogen peroxide Chemical compound OO MHAJPDPJQMAIIY-UHFFFAOYSA-N 0.000 description 3
- WMFOQBRAJBCJND-UHFFFAOYSA-M Lithium hydroxide Chemical compound [Li+].[OH-] WMFOQBRAJBCJND-UHFFFAOYSA-M 0.000 description 3
- CERQOIWHTDAKMF-UHFFFAOYSA-M Methacrylate Chemical compound CC(=C)C([O-])=O CERQOIWHTDAKMF-UHFFFAOYSA-M 0.000 description 3
- ZMXDDKWLCZADIW-UHFFFAOYSA-N N,N-Dimethylformamide Chemical compound CN(C)C=O ZMXDDKWLCZADIW-UHFFFAOYSA-N 0.000 description 3
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 3
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 3
- ZMANZCXQSJIPKH-UHFFFAOYSA-N Triethylamine Chemical compound CCN(CC)CC ZMANZCXQSJIPKH-UHFFFAOYSA-N 0.000 description 3
- 150000007513 acids Chemical class 0.000 description 3
- 125000003545 alkoxy group Chemical group 0.000 description 3
- 125000002877 alkyl aryl group Chemical group 0.000 description 3
- FJDQFPXHSGXQBY-UHFFFAOYSA-L caesium carbonate Chemical compound [Cs+].[Cs+].[O-]C([O-])=O FJDQFPXHSGXQBY-UHFFFAOYSA-L 0.000 description 3
- 229910000024 caesium carbonate Inorganic materials 0.000 description 3
- 229920001429 chelating resin Polymers 0.000 description 3
- 238000009792 diffusion process Methods 0.000 description 3
- UAOMVDZJSHZZME-UHFFFAOYSA-N diisopropylamine Chemical compound CC(C)NC(C)C UAOMVDZJSHZZME-UHFFFAOYSA-N 0.000 description 3
- OAKJQQAXSVQMHS-UHFFFAOYSA-N hydrazine Substances NN OAKJQQAXSVQMHS-UHFFFAOYSA-N 0.000 description 3
- 238000000655 nuclear magnetic resonance spectrum Methods 0.000 description 3
- 229910052700 potassium Inorganic materials 0.000 description 3
- 238000010526 radical polymerization reaction Methods 0.000 description 3
- 229920005989 resin Polymers 0.000 description 3
- 239000011347 resin Substances 0.000 description 3
- 229910000030 sodium bicarbonate Inorganic materials 0.000 description 3
- 235000017557 sodium bicarbonate Nutrition 0.000 description 3
- HRJIMEINFSCMIT-UHFFFAOYSA-M sodium;1,1,2,2-tetrafluoro-4-hydroxybutane-1-sulfonate Chemical compound [Na+].OCCC(F)(F)C(F)(F)S([O-])(=O)=O HRJIMEINFSCMIT-UHFFFAOYSA-M 0.000 description 3
- 238000001228 spectrum Methods 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- BDHFUVZGWQCTTF-UHFFFAOYSA-M sulfonate Chemical compound [O-]S(=O)=O BDHFUVZGWQCTTF-UHFFFAOYSA-M 0.000 description 3
- 125000000027 (C1-C10) alkoxy group Chemical group 0.000 description 2
- 125000006651 (C3-C20) cycloalkyl group Chemical group 0.000 description 2
- XFCXPQZFZAEPCU-UHFFFAOYSA-M 1,1,2,2-tetrafluoro-4-(2-methylprop-2-enoyloxy)butane-1-sulfonate;triphenylsulfanium Chemical compound CC(=C)C(=O)OCCC(F)(F)C(F)(F)S([O-])(=O)=O.C1=CC=CC=C1[S+](C=1C=CC=CC=1)C1=CC=CC=C1 XFCXPQZFZAEPCU-UHFFFAOYSA-M 0.000 description 2
- NWUYHJFMYQTDRP-UHFFFAOYSA-N 1,2-bis(ethenyl)benzene;1-ethenyl-2-ethylbenzene;styrene Chemical compound C=CC1=CC=CC=C1.CCC1=CC=CC=C1C=C.C=CC1=CC=CC=C1C=C NWUYHJFMYQTDRP-UHFFFAOYSA-N 0.000 description 2
- PPNCOQHHSGMKGI-UHFFFAOYSA-N 1-cyclononyldiazonane Chemical compound C1CCCCCCCC1N1NCCCCCCC1 PPNCOQHHSGMKGI-UHFFFAOYSA-N 0.000 description 2
- VZAWCLCJGSBATP-UHFFFAOYSA-N 1-cycloundecyl-1,2-diazacycloundecane Chemical compound C1CCCCCCCCCC1N1NCCCCCCCCC1 VZAWCLCJGSBATP-UHFFFAOYSA-N 0.000 description 2
- PAMIQIKDUOTOBW-UHFFFAOYSA-N 1-methylpiperidine Chemical compound CN1CCCCC1 PAMIQIKDUOTOBW-UHFFFAOYSA-N 0.000 description 2
- IANXAXNUNBAWBA-UHFFFAOYSA-N 2,2,3-trimethylundecane Chemical compound CCCCCCCCC(C)C(C)(C)C IANXAXNUNBAWBA-UHFFFAOYSA-N 0.000 description 2
- RKMGAJGJIURJSJ-UHFFFAOYSA-N 2,2,6,6-tetramethylpiperidine Chemical compound CC1(C)CCCC(C)(C)N1 RKMGAJGJIURJSJ-UHFFFAOYSA-N 0.000 description 2
- PAYRUJLWNCNPSJ-UHFFFAOYSA-N Aniline Chemical compound NC1=CC=CC=C1 PAYRUJLWNCNPSJ-UHFFFAOYSA-N 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 2
- BVKZGUZCCUSVTD-UHFFFAOYSA-L Carbonate Chemical compound [O-]C([O-])=O BVKZGUZCCUSVTD-UHFFFAOYSA-L 0.000 description 2
- MHZGKXUYDGKKIU-UHFFFAOYSA-N Decylamine Chemical compound CCCCCCCCCCN MHZGKXUYDGKKIU-UHFFFAOYSA-N 0.000 description 2
- VZCYOOQTPOCHFL-OWOJBTEDSA-N Fumaric acid Chemical compound OC(=O)\C=C\C(O)=O VZCYOOQTPOCHFL-OWOJBTEDSA-N 0.000 description 2
- QIGBRXMKCJKVMJ-UHFFFAOYSA-N Hydroquinone Chemical compound OC1=CC=C(O)C=C1 QIGBRXMKCJKVMJ-UHFFFAOYSA-N 0.000 description 2
- WHXSMMKQMYFTQS-UHFFFAOYSA-N Lithium Chemical compound [Li] WHXSMMKQMYFTQS-UHFFFAOYSA-N 0.000 description 2
- CSNNHWWHGAXBCP-UHFFFAOYSA-L Magnesium sulfate Chemical compound [Mg+2].[O-][S+2]([O-])([O-])[O-] CSNNHWWHGAXBCP-UHFFFAOYSA-L 0.000 description 2
- KWYHDKDOAIKMQN-UHFFFAOYSA-N N,N,N',N'-tetramethylethylenediamine Chemical compound CN(C)CCN(C)C KWYHDKDOAIKMQN-UHFFFAOYSA-N 0.000 description 2
- MZRVEZGGRBJDDB-UHFFFAOYSA-N N-Butyllithium Chemical compound [Li]CCCC MZRVEZGGRBJDDB-UHFFFAOYSA-N 0.000 description 2
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- NQRYJNQNLNOLGT-UHFFFAOYSA-N Piperidine Chemical compound C1CCNCC1 NQRYJNQNLNOLGT-UHFFFAOYSA-N 0.000 description 2
- ZLMJMSJWJFRBEC-UHFFFAOYSA-N Potassium Chemical compound [K] ZLMJMSJWJFRBEC-UHFFFAOYSA-N 0.000 description 2
- JUJWROOIHBZHMG-UHFFFAOYSA-N Pyridine Chemical compound C1=CC=NC=C1 JUJWROOIHBZHMG-UHFFFAOYSA-N 0.000 description 2
- KAESVJOAVNADME-UHFFFAOYSA-N Pyrrole Chemical compound C=1C=CNC=1 KAESVJOAVNADME-UHFFFAOYSA-N 0.000 description 2
- KEAYESYHFKHZAL-UHFFFAOYSA-N Sodium Chemical compound [Na] KEAYESYHFKHZAL-UHFFFAOYSA-N 0.000 description 2
- DWAQJAXMDSEUJJ-UHFFFAOYSA-M Sodium bisulfite Chemical compound [Na+].OS([O-])=O DWAQJAXMDSEUJJ-UHFFFAOYSA-M 0.000 description 2
- WQDUMFSSJAZKTM-UHFFFAOYSA-N Sodium methoxide Chemical compound [Na+].[O-]C WQDUMFSSJAZKTM-UHFFFAOYSA-N 0.000 description 2
- PPBRXRYQALVLMV-UHFFFAOYSA-N Styrene Chemical compound C=CC1=CC=CC=C1 PPBRXRYQALVLMV-UHFFFAOYSA-N 0.000 description 2
- LSNNMFCWUKXFEE-UHFFFAOYSA-N Sulfurous acid Chemical compound OS(O)=O LSNNMFCWUKXFEE-UHFFFAOYSA-N 0.000 description 2
- DKGAVHZHDRPRBM-UHFFFAOYSA-N Tert-Butanol Chemical compound CC(C)(C)O DKGAVHZHDRPRBM-UHFFFAOYSA-N 0.000 description 2
- 238000002441 X-ray diffraction Methods 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 2
- 230000002378 acidificating effect Effects 0.000 description 2
- 229910052783 alkali metal Inorganic materials 0.000 description 2
- 150000004703 alkoxides Chemical class 0.000 description 2
- 239000000908 ammonium hydroxide Substances 0.000 description 2
- RDOXTESZEPMUJZ-UHFFFAOYSA-N anisole Chemical compound COC1=CC=CC=C1 RDOXTESZEPMUJZ-UHFFFAOYSA-N 0.000 description 2
- 125000004104 aryloxy group Chemical group 0.000 description 2
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 2
- RQPZNWPYLFFXCP-UHFFFAOYSA-L barium dihydroxide Chemical compound [OH-].[OH-].[Ba+2] RQPZNWPYLFFXCP-UHFFFAOYSA-L 0.000 description 2
- 229910001863 barium hydroxide Inorganic materials 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 229910052792 caesium Inorganic materials 0.000 description 2
- 150000001721 carbon Chemical group 0.000 description 2
- 125000004432 carbon atom Chemical group C* 0.000 description 2
- 239000003729 cation exchange resin Substances 0.000 description 2
- 239000003153 chemical reaction reagent Substances 0.000 description 2
- 239000003795 chemical substances by application Substances 0.000 description 2
- 229920001577 copolymer Polymers 0.000 description 2
- 238000007334 copolymerization reaction Methods 0.000 description 2
- JHIVVAPYMSGYDF-UHFFFAOYSA-N cyclohexanone Chemical compound O=C1CCCCC1 JHIVVAPYMSGYDF-UHFFFAOYSA-N 0.000 description 2
- PAFZNILMFXTMIY-UHFFFAOYSA-N cyclohexylamine Chemical compound NC1CCCCC1 PAFZNILMFXTMIY-UHFFFAOYSA-N 0.000 description 2
- 229960003843 cyproterone Drugs 0.000 description 2
- 230000005595 deprotonation Effects 0.000 description 2
- 238000010537 deprotonation reaction Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000002050 diffraction method Methods 0.000 description 2
- USIUVYZYUHIAEV-UHFFFAOYSA-N diphenyl ether Chemical compound C=1C=CC=CC=1OC1=CC=CC=C1 USIUVYZYUHIAEV-UHFFFAOYSA-N 0.000 description 2
- 230000009977 dual effect Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- LZCLXQDLBQLTDK-UHFFFAOYSA-N ethyl 2-hydroxypropanoate Chemical compound CCOC(=O)C(C)O LZCLXQDLBQLTDK-UHFFFAOYSA-N 0.000 description 2
- 238000000806 fluorine-19 nuclear magnetic resonance spectrum Methods 0.000 description 2
- 238000005227 gel permeation chromatography Methods 0.000 description 2
- 229910052736 halogen Inorganic materials 0.000 description 2
- 150000002367 halogens Chemical class 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 150000004678 hydrides Chemical class 0.000 description 2
- 125000004435 hydrogen atom Chemical group [H]* 0.000 description 2
- MGFYSGNNHQQTJW-UHFFFAOYSA-N iodonium Chemical compound [IH2+] MGFYSGNNHQQTJW-UHFFFAOYSA-N 0.000 description 2
- ZXEKIIBDNHEJCQ-UHFFFAOYSA-N isobutanol Chemical compound CC(C)CO ZXEKIIBDNHEJCQ-UHFFFAOYSA-N 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 229910052744 lithium Inorganic materials 0.000 description 2
- ZCSHNCUQKCANBX-UHFFFAOYSA-N lithium diisopropylamide Chemical compound [Li+].CC(C)[N-]C(C)C ZCSHNCUQKCANBX-UHFFFAOYSA-N 0.000 description 2
- 238000001459 lithography Methods 0.000 description 2
- 238000005649 metathesis reaction Methods 0.000 description 2
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 2
- 230000003647 oxidation Effects 0.000 description 2
- 238000007254 oxidation reaction Methods 0.000 description 2
- XYFCBTPGUUZFHI-UHFFFAOYSA-O phosphonium Chemical compound [PH4+] XYFCBTPGUUZFHI-UHFFFAOYSA-O 0.000 description 2
- 238000000206 photolithography Methods 0.000 description 2
- 239000011591 potassium Substances 0.000 description 2
- BWHMMNNQKKPAPP-UHFFFAOYSA-L potassium carbonate Chemical compound [K+].[K+].[O-]C([O-])=O BWHMMNNQKKPAPP-UHFFFAOYSA-L 0.000 description 2
- NTTOTNSKUYCDAV-UHFFFAOYSA-N potassium hydride Chemical compound [KH] NTTOTNSKUYCDAV-UHFFFAOYSA-N 0.000 description 2
- 229910000105 potassium hydride Inorganic materials 0.000 description 2
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- LLLCSBYSPJHDJX-UHFFFAOYSA-M potassium;2-methylprop-2-enoate Chemical compound [K+].CC(=C)C([O-])=O LLLCSBYSPJHDJX-UHFFFAOYSA-M 0.000 description 1
- ZMJJCODMIXQWCQ-UHFFFAOYSA-N potassium;di(propan-2-yl)azanide Chemical compound [K+].CC(C)[N-]C(C)C ZMJJCODMIXQWCQ-UHFFFAOYSA-N 0.000 description 1
- WQKGAJDYBZOFSR-UHFFFAOYSA-N potassium;propan-2-olate Chemical compound [K+].CC(C)[O-] WQKGAJDYBZOFSR-UHFFFAOYSA-N 0.000 description 1
- ARJOQCYCJMAIFR-UHFFFAOYSA-N prop-2-enoyl prop-2-enoate Chemical compound C=CC(=O)OC(=O)C=C ARJOQCYCJMAIFR-UHFFFAOYSA-N 0.000 description 1
- 230000005588 protonation Effects 0.000 description 1
- UMJSCPRVCHMLSP-UHFFFAOYSA-N pyridine Natural products COC1=CC=CN=C1 UMJSCPRVCHMLSP-UHFFFAOYSA-N 0.000 description 1
- 125000004076 pyridyl group Chemical group 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 150000003254 radicals Chemical class 0.000 description 1
- 238000000066 reactive distillation Methods 0.000 description 1
- 238000002390 rotary evaporation Methods 0.000 description 1
- IGLNJRXAVVLDKE-UHFFFAOYSA-N rubidium atom Chemical compound [Rb] IGLNJRXAVVLDKE-UHFFFAOYSA-N 0.000 description 1
- 125000002914 sec-butyl group Chemical group [H]C([H])([H])C([H])([H])C([H])(*)C([H])([H])[H] 0.000 description 1
- 238000007086 side reaction Methods 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 238000004467 single crystal X-ray diffraction Methods 0.000 description 1
- 229940079827 sodium hydrogen sulfite Drugs 0.000 description 1
- 229910052938 sodium sulfate Inorganic materials 0.000 description 1
- 235000011152 sodium sulphate Nutrition 0.000 description 1
- SYXYWTXQFUUWLP-UHFFFAOYSA-N sodium;butan-1-olate Chemical compound [Na+].CCCC[O-] SYXYWTXQFUUWLP-UHFFFAOYSA-N 0.000 description 1
- YHOBGCSGTGDMLF-UHFFFAOYSA-N sodium;di(propan-2-yl)azanide Chemical compound [Na+].CC(C)[N-]C(C)C YHOBGCSGTGDMLF-UHFFFAOYSA-N 0.000 description 1
- WBQTXTBONIWRGK-UHFFFAOYSA-N sodium;propan-2-olate Chemical compound [Na+].CC(C)[O-] WBQTXTBONIWRGK-UHFFFAOYSA-N 0.000 description 1
- 239000011973 solid acid Substances 0.000 description 1
- 239000011343 solid material Substances 0.000 description 1
- 239000012607 strong cation exchange resin Substances 0.000 description 1
- 229910052712 strontium Inorganic materials 0.000 description 1
- CIOAGBVUUVVLOB-UHFFFAOYSA-N strontium atom Chemical compound [Sr] CIOAGBVUUVVLOB-UHFFFAOYSA-N 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- BUUPQKDIAURBJP-UHFFFAOYSA-N sulfinic acid Chemical compound OS=O BUUPQKDIAURBJP-UHFFFAOYSA-N 0.000 description 1
- 125000000542 sulfonic acid group Chemical group 0.000 description 1
- RWSOTUBLDIXVET-UHFFFAOYSA-O sulfonium Chemical class [SH3+] RWSOTUBLDIXVET-UHFFFAOYSA-O 0.000 description 1
- 239000011593 sulfur Substances 0.000 description 1
- 229910021653 sulphate ion Inorganic materials 0.000 description 1
- 238000003786 synthesis reaction Methods 0.000 description 1
- YBRBMKDOPFTVDT-UHFFFAOYSA-N tert-butylamine Chemical compound CC(C)(C)N YBRBMKDOPFTVDT-UHFFFAOYSA-N 0.000 description 1
- 125000005207 tetraalkylammonium group Chemical group 0.000 description 1
- DZLFLBLQUQXARW-UHFFFAOYSA-N tetrabutylammonium Chemical compound CCCC[N+](CCCC)(CCCC)CCCC DZLFLBLQUQXARW-UHFFFAOYSA-N 0.000 description 1
- QEMXHQIAXOOASZ-UHFFFAOYSA-N tetramethylammonium Chemical compound C[N+](C)(C)C QEMXHQIAXOOASZ-UHFFFAOYSA-N 0.000 description 1
- 238000010257 thawing Methods 0.000 description 1
- 150000003573 thiols Chemical class 0.000 description 1
- 229910052723 transition metal Inorganic materials 0.000 description 1
- 125000005208 trialkylammonium group Chemical group 0.000 description 1
- ZMANZCXQSJIPKH-UHFFFAOYSA-O triethylammonium ion Chemical compound CC[NH+](CC)CC ZMANZCXQSJIPKH-UHFFFAOYSA-O 0.000 description 1
- 125000002023 trifluoromethyl group Chemical group FC(F)(F)* 0.000 description 1
- WLOQLWBIJZDHET-UHFFFAOYSA-N triphenylsulfonium Chemical compound C1=CC=CC=C1[S+](C=1C=CC=CC=1)C1=CC=CC=C1 WLOQLWBIJZDHET-UHFFFAOYSA-N 0.000 description 1
- 239000012953 triphenylsulfonium Substances 0.000 description 1
- SXPSZIHEWFTLEQ-UHFFFAOYSA-N tröger's base Chemical compound C12=CC=C(C)C=C2CN2C3=CC=C(C)C=C3CN1C2 SXPSZIHEWFTLEQ-UHFFFAOYSA-N 0.000 description 1
- 238000003828 vacuum filtration Methods 0.000 description 1
- 125000000391 vinyl group Chemical group [H]C([*])=C([H])[H] 0.000 description 1
- 239000003039 volatile agent Substances 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
- 239000011701 zinc Substances 0.000 description 1
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- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
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- C07C303/00—Preparation of esters or amides of sulfuric acids; Preparation of sulfonic acids or of their esters, halides, anhydrides or amides
- C07C303/32—Preparation of esters or amides of sulfuric acids; Preparation of sulfonic acids or of their esters, halides, anhydrides or amides of salts of sulfonic acids
-
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- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C309/00—Sulfonic acids; Halides, esters, or anhydrides thereof
- C07C309/01—Sulfonic acids
- C07C309/25—Sulfonic acids having sulfo groups bound to carbon atoms of rings other than six-membered aromatic rings of a carbon skeleton
- C07C309/27—Sulfonic acids having sulfo groups bound to carbon atoms of rings other than six-membered aromatic rings of a carbon skeleton containing carboxyl groups bound to the carbon skeleton
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- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C381/00—Compounds containing carbon and sulfur and having functional groups not covered by groups C07C301/00 - C07C337/00
- C07C381/12—Sulfonium compounds
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- C—CHEMISTRY; METALLURGY
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- C07D327/04—Five-membered rings
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- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07D—HETEROCYCLIC COMPOUNDS
- C07D327/00—Heterocyclic compounds containing rings having oxygen and sulfur atoms as the only ring hetero atoms
- C07D327/02—Heterocyclic compounds containing rings having oxygen and sulfur atoms as the only ring hetero atoms one oxygen atom and one sulfur atom
- C07D327/06—Six-membered rings
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- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/0046—Photosensitive materials with perfluoro compounds, e.g. for dry lithography
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
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- C08F220/00—Copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and only one being terminated by only one carboxyl radical or a salt, anhydride ester, amide, imide or nitrile thereof
- C08F220/02—Monocarboxylic acids having less than ten carbon atoms; Derivatives thereof
- C08F220/10—Esters
- C08F220/38—Esters containing sulfur
- C08F220/382—Esters containing sulfur and containing oxygen, e.g. 2-sulfoethyl (meth)acrylate
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- C08F228/00—Copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by a bond to sulfur or by a heterocyclic ring containing sulfur
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Description
本申請案係於2010年12月31日申請之第61/428,996號美國臨時申請案之非臨時申請,該臨時申請案之內容係藉由引用而以其整體併入本文。
本發明係揭露使用經氟化之磺酸內酯製備可聚合之產生光酸之單體的方法。
通常,於將所欲之圖案印於矽晶圓上之先進光微影技術中,為了誘發溶解度之改變而將聚(甲基丙烯酸酯)光阻劑聚合物中的酯經酸催化之去保護變為酸係作為轉移圖案的關鍵化學反應。該催化製程亦稱為化學放大,係藉由照射光敏劑或光酸產生劑(PAG)誘發之。於光阻劑聚合物中使用之PAG可由兩部份組成:磺酸根陰離子,以及一般具有至少一個芳族基之參(烴基)硫鎓陽離子,其中,該陽離子吸收光子並分解,以產生一個導致多種所欲之酸催化化學反應的酸質子。於某些應用中,較佳者係磺酸超強酸類如,與硫離子之距離2個或3個鍵長度之內具有氟取代基之烷基磺酸類或芳基磺酸類。
由於光微影技術之進步導致具有解析度越發精微之圖案,光阻劑基質中之酸擴散成為關切。於一種路徑中,酸擴散可能受阻於將該酸(如磺酸根陰離子)之共軛鹼縛於該聚合物,將該酸限制於有限體積,以及將PAG更均勻地分佈於該光阻劑基質中。
美國專利申請案公開第2009/0202943 A1號揭露一種正調阻劑,其係包括自丙烯酸酯或甲基丙烯酸酯單體製備之聚合物,該單體係具有透過(甲基)丙烯酸酯單體鏈結縛於其上之光活性氟烷基磺酸硫鎓鹽(亦即,超強酸之共軛鹼)。一種例示性此單體係藉由1,1-二氟-2-羥乙基磺酸之三芳基硫鎓與(甲基)丙烯酸酐縮合而製備。儘管原則上可使用此縮合反應,但自可商購之前體合成該陰離子包含三步驟,且由於與該陽離子及/或該多官能陰離子發生副反應之可能性,該等前體亦受限。
先前技術之上述及其他缺陷可藉由製備單體之方法克服之,該方法係包含:將式(I)之磺酸內酯與具有可聚合之基的親核劑反應:
其中,各R係獨立為F、C1-10
烷基、氟取代之C1-10
烷基、C1-10
環烷基或氟取代之C1-10
環烷基,限制條件為至少一個R係F;n係0至10之整數,以及m係1至4+2n之整數。
又,單體係藉由上揭方法製備之。
結合後附圖式,可自下列詳細說明中明確獲知本發明之前述及其他目的、特徵及優點。
本文係揭露自經氟化之磺酸內酯前體製備可用作光酸產生劑(本文中稱為PAG)之新穎烯烴類單體的方法。如本文所使用者,“磺酸內酯”係指稱能藉由親核劑之加成反應進行開環攻擊之環狀磺酸酯,其中,開環親核攻擊係特定於該磺酸內酯環的氧之α碳原子。較佳地,該磺酸內酯係以一個或多個氟原子氟化之,再更佳地,該磺酸內酯可包括位於該磺酸酯硫原子之α位的偕二氟亞甲基(geminal difluoromethylene group)。若於該開環反應中使用之親核劑係羧酸如(甲基)丙烯酸或乙烯基苯甲酸,或羥基苯乙烯或羥甲基苯乙烯,則其與該磺酸內酯之反應產物可用作自由基聚合反應之單體。於此等例中,該親核劑可係此等化合物之一者之氧陰離子,且可藉由鹼與(甲基)丙烯酸或乙烯基苯甲酸、羥基苯乙烯(具有酚基)或羥甲基苯乙烯(具有苯甲醇部份)的反應製備。
如此,以高產率非常潔淨地獲得該磺酸內酯之開環產物。可進一步藉由陽離子交換(本文中有時將該製程稱為“複分解”)自該開環產物製備具有低擴散與低脫氣性質之光酸產生劑,其中,該開環產物的陽離子被交換為光活性陽離子,如具有至少一個苯基之鎓陽離子。當將此單體,較佳將聚合為聚合物並用於光阻組成物之此單體曝露於先進微影之照射如電子束、X射線以及波長為13.4至13.5奈米(nm)之極紫外(EUV)照射時,該單體產生酸。此等單體所欲地酸擴散性低,且能提供高對比度及優良線形。再者,此等PAG之分解產物較之於光阻劑組成物、曝光及處理之類似條件下之常規PAG降低。
如本文中使用者,“鎓”係指稱碘鎓或硫鎓陽離子。又,如本文中使用者,“經取代”係意指包括取代基如,鹵素(亦即,F、Cl、Br、I)、羥基、胺基、巰基、羧基、羧酸酯、醯胺、腈、硫醇、硫化物、二硫化物、硝基、C1-10
烷基、C1-10
烷氧基、C6-10
芳基、C6-10
芳氧基、C7-10
烷基芳基、C7-10
烷基芳氧基或包含前述之至少一者的組合。應理解,除另行指明者或這種取代將對所得結構之所欲性質造成顯著之負面影響者外,所揭露之關於本文中化學式的任何基或結構可經如是取代。又,本文中使用之“(甲基)丙烯酸酯”係意指丙烯酸酯或甲基丙烯酸酯,且除另行指明者之外,並未限於此等之任何一者。
該製備單體之方法係包括將式(I)之磺酸內酯與具有可聚合之基的親核劑反應
於式(I)中,各R係獨立為F、C1-10
烷基、氟取代之C1-10
烷基、C1-10
環烷基或氟取代之C1-10
環烷基,限制條件為至少一個R係F。通常皆應理解,於本文中,若一個碳原子上無特定之R或其他取代基,則各該碳原子之價態係以氫原子補足。例示性R基除了包括一個或多個氟原子外,亦可包括烷基如甲基、乙基、正丙基、異丙基、正丁基、2-丁基、異丁基、正戊基、2-戊基、3-戊基、2-甲基丁基、3-甲基丁基、正己基、正庚基、正辛基、3-辛基、正癸基、或具有一個或多個氟取代基之任何前述烷基,包括三氟甲基、2,2,2-三氟乙基、全氟乙基、全氟丁基等;或環烷基如環丁基、環戊基、1-甲基環戊基、環己基、1-甲基環己基、1-金剛烷基、2-金剛烷基、1-十氫萘基、2-十氫萘基;或具有一個或多個氟取代基之任何前述環烷基,包括全氟環戊基、3,5-雙(三氟甲基)環己基、全氟環己基等。更佳地,R係F。
又,於式(I),n係0至10之整數,較佳地,n係1、2或3。該磺酸內酯可包括m個取代基R,其中,m係1至4+2n之整數。該磺酸內酯可包括僅一個R基取代基(其中,該取代基為F,且n為1),或除了包括該F基外,還包括超過一個之取代基,其中,取代基R之總數係受限於磺酸內酯環碳原子之數目2+n,其中,各環碳係具有最高2個取代基,總計最多為2×(2+n)個或4+2n個取代基。較佳地,取代基之總數係界定為其中m係1至4之整數。或者,m可為0,及/或R不是F。
較佳地,該磺酸內酯係式(II)、式(III)或式(IV):
其中,各R係獨立為F、C1-10
烷基或氟取代之C1-10
烷基,限制條件為至少一個R係F;a係1至6之整數,b係1至8之整數,以及,c係1至10之整數。
更佳地,該磺酸內酯可係式(V):
其中,R1
、R2
、R3
及R4
係各獨立為H、F、C1-10
烷基或氟取代之C1-10
烷基,限制條件為R1
、R2
、R3
或R4
之至少一者係F。較佳地,R1
、R2
或R3
之至少一者係氟原子,其中,剩餘之各R1
、R2
及/或R3
為H,以及,R4
係H。又,較佳地,二R1
、R2
及/或R3
皆為氟原子,其中,任何剩餘之R1
、R2
及/或R3
係H,以及,R4
係H。
再佳地,該磺酸內酯可係式(VI)或式(VII):
其中,R2
與R3
係各獨立為H、F、C1-10
烷基或氟取代之C1-10
烷基,限制條件為R2
或R3
之至少一者為F。較佳地,R2
或R3
之至少一者可係氟原子,其中,剩餘之各R2
及/或R3
係為H。又,較佳地,R2
及/或R3
之兩者係包括氟,其中,任何剩餘之R2
及/或R3
係H。
例示性式(II)之磺酸內酯係包括下列各式:
通常,該磺酸內酯本身可於熱之存在下藉由脫水環化前體α-ω醇-磺酸化合物而製備。該環化反應可於高達250℃,較佳50至200℃之溫度施行。可於此等溫度下加熱任何達成足夠產率環化所需時間。也可藉由自形成水共沸物之溶液(如使用苯/水或甲苯/水)蒸餾而使用共沸脫水來移除水,或可使用反應性蒸餾於環化過程中移除所產生之水。或者,可使用脫水劑如1,3-二環己基碳二亞胺,或可於酸性脫水條件下如使用酐(如,醋酸酐)或硫酸的條件下施行環化。
可經環化形成該磺酸內酯之該α-ω醇-磺酸化合物本身可藉由諸如自相應之α-ω羥基-溴化合物形成該亞磺酸的方法製備。於此反應中,係於弱鹼如碳酸氫鈉之存在下以二硫亞磺酸鈉(Na2
S2
O4
)替換該溴基,以形成中間體α-ω羥基亞磺酸鹽,隨後再將該亞磺酸鹽氧化為相應磺酸鹽。可使用任何適當之方法施行該亞磺酸鹽之氧化,如以高錳酸鉀水溶液或過氧化物如過氧化氫水溶液氧化。隨後,可藉由直接以酸處理或藉由使用固體酸如陽離子交換樹脂進行質子化,將該α-ω羥基磺酸鹽轉化為相應磺酸。可用之此等樹脂係包括磺酸強陽離子交換樹脂如,可自羅門哈斯公司(Rohm and Haas Company)購得之AMBERLITETM
120H樹脂或AMBERLYSTTM
15H樹脂。
該製備單體之方法係包括將磺酸內酯與親核劑反應。此文中所使用之“反應”係意指,該親核劑加成至該磺酸內酯之氧的α-碳上,同時該磺酸內酯開環。儘管該親核劑可包括可與本文揭露之磺酸內酯反應以給出所欲之開環產物的任何親核基,該親核劑較佳係可聚合基,其可於聚合條件下(如自由基聚合方法、陰離子聚合方法、陽離子聚合方法或受調控之自由基聚合方法)反應以提供聚合物。
較佳地,該親核劑係含羧基或含羥基之含有經鹵化或未經鹵化之C2-30
烯烴之化合物的氧陰離子。更佳地,該親核劑係下列之氧陰離子:C3-20
乙烯基羧酸、C8-20
乙烯基芳族羧酸、羧酸之含羥基C5-20
乙烯酯、或C7-20
乙烯基羥基芳族化合物。若使用羥基芳族化合物,則該羥基芳族化合物可包括酚系羥基,或非酚系羥基如苄羥基,或側鏈羥基。
例示性親核劑係包括下列化合物之氧陰離子:如不飽和羧酸如(甲基)丙烯酸、2-((甲基)丙烯醯基)醋酸、馬來酸或富馬酸、焦檸檬酸、伊康酸、含羥基之(甲基)丙烯酸酯如(甲基)丙烯酸2-羥基乙酯及(甲基)丙烯酸2-羥基丙酯、降莰烯類之羧酸如5-降莰烯-2-羧酸及5-降莰烯-2,3-二羧酸、以及乙烯基苯甲酸;羥基苯乙烯類如鄰羥基苯乙烯、間羥基苯乙烯或對羥基苯乙烯,或乙烯基苯甲醇如4-乙烯基苯甲醇。
該氧陰離子係藉由含羥基之含有經鹵化或未經鹵化之C2-30
烯烴的化合物與與鹼反應所形成,其中,該鹼之共軛酸的pKa係大於12,限制條件為所使用之鹼的鹼性係足以造成該親核劑之質子化前體的有效去質子化,以及限制條件為該鹼本身之非親核性係足夠以至於與該親核劑中之其他官能度的明顯反應不會發生。依據該親核劑之共軛酸的質子酸度,用於此目的之鹼可包括:碳酸鹽鹼類如碳酸鋰、碳酸鈉、碳酸鉀、碳酸銣、碳酸銫、碳酸胍或碳酸氫鈉;氫氧化物鹼類如氫氧化鋰、氫氧化鈉、氫氧化鉀、氫氧化銣及氫氧化銫;烷氧化物鹼類如甲醇鈉、乙醇鈉、異丙醇鈉、第三丁醇鈉、甲醇鉀、乙醇鉀、異丙醇鉀、戊醇鉀(potassium amulate)或第三丁醇鉀;胺基(amido)鹼類如二異丙基胺基鋰、二異丙基胺基鈉、二異丙基胺基鉀、六甲基二矽基胺基鋰、六甲基二矽基胺基鈉、六甲基二矽基胺基鉀;胺鹼類如三甲胺、三乙胺、二乙基異丙基胺、二異丙胺、第三丁胺、質子海綿(proton sponge)、環己胺、苯胺、吡啶、N,N-二甲胺基吡啶、4-吡咯啶基吡啶、吡、吡咯、哌啶、N-甲基哌啶、2,2,6,6-四甲基哌啶、四甲基乙二胺、二胺基環己烷、N,N,N’N’-四甲基環己烷、二氮雜雙環壬烷(DBN)、二氮雜雙環十一烷(DBU)以及晁格爾鹼(Troger’s base);氫化物鹼類如氫化鋰、氫化鈉、氫化鉀、氫化銣、氫化銫、氫化鈣;格氏試劑(Grignard reagents)或有機鋰試劑如氯化甲基鎂或正丁基鋰;鹼金屬類如Li、Na、K、Rb及Cs,或直接與該親核劑之前體反應或溶解於介質如氨中(Li/NH3
)或石墨中(如,KC8
)。較佳地,該氧陰離子係藉由使用氫氧化物(如,NaOH或KOH)、烷氧化物(如,乙醇鈉或第三丁醇鉀)、碳酸鹽(如,Na2
CO3
或NaHCO3
)或氫化物(NaH或KH)鹼而產生。若該氧陰離子係酚或醇之陰離子,最佳反應條件為使用NaH或KH於非質子、不可烯醇化(non-enolizable)溶劑中施行醇/酚/羧酸之去質子化。
可於溶劑中施行該磺酸內酯與該親核劑之反應。可使用之用於此目的之溶劑可包括水;氨水;醚類,如乙醚、二異丙醚、甲基苯基醚、二苯醚、四氫呋喃、二烷或二氧雜環戊烷;醇類,如甲醇、乙醇、異丙醇、第三丁醇、2-甲基丙醇、甲基賽珞蘇或乙基賽珞蘇;乙腈;醯胺類,如N,N-二甲基甲醯胺、N,N-二甲基乙醯胺、N-甲基吡咯啶酮、1,3-二甲基-2-咪唑啶酮及六甲基磷醯胺;二甲亞碸;以及環丁碸。可使用包含前述之至少一者的組合。反應條件並無特別限制,可於高達約250℃之溫度施行,反應時間係適於造成開環加成。
藉此,可藉由上揭方法使用式(I)之磺酸內酯製備可聚合單體。如此製備之此等單體係具有下述通式(VIII)之化合物:
其中,各R5
、R6
及R7
係獨立為H、F、C1-10
烷基或氟取代之C1-10
烷基,限制條件為至少一個R為F。又,於式(VIII)中,n係1至10之整數,較佳地,n係1、2或3。
又,於式(VIII)中,A係親核劑之反應殘基。較佳地,A係如上文所述之提供含有經鹵化或未經鹵化之C2-30
烯烴之可聚合基的親核劑反應殘基。G+
係有機或無機陽離子。
更佳地,該等化合物係具有式(IX)、式(X)、式(XI)、式(XII)或式(XIII):
其中,各R6
、R7
、R8
、R9
及R10
係獨立為H、F、C1-10
烷基或氟取代之C1-10
烷基,各R11
係獨立為F、C1-10
烷基或氟取代之C1-10
烷基,L係經鹵化或未經鹵化之C1-30
伸烷基、C2-30
伸烯基、單環或多環C3-30
伸環烷基、單環或多環C6-30
伸芳基、或單環或多環C7-30
伸烷基-伸芳基;k及l係各獨立為0至5之整數,其中,k係0,l係1;m係0至4之整數;n係1、2或3;以及,G+
係有機或無機陽離子。
更佳地,該化合物係式(XIV)、式(XV)、式(XVI)、式(XVII)或式(XVIII):
其中,R8
及R10
係獨立為H、F、C1-10
烷基或氟取代之C1-10
烷基,以及,G+
係有機或無機陽離子。較佳地,R8
及R10
係獨立為H或-CH3
基。
該單體除包括藉由該磺酸內酯與該親核劑反應所提供之陰離子性結構外,還包括陽離子G+
,其中,該陽離子可為與該親核劑相關之任何陽離子(亦即,作為該親核劑之鹽的陽離子)。因此,該陽離子,舉例而言,可為無機陽離子,包括鹼金屬陽離子如鋰、鈉、鉀、銣或銫,鹼土金屬陽離子如鎂、鈣、鋇或鍶,主族金屬陽離子如鋁、錫、鉛或鉍,或過渡金屬陽離子如銅、鋅、鐵、鎳、鈷或銀;或該陽離子可為有機陽離子,如銨陽離子包括銨,烷基銨(包括單烷基銨、二烷基銨、三烷基銨及四烷基銨如三乙基銨、四甲基銨、四丁基銨、三甲基苄基銨或十六烷基銨);亞銨離子(iminium ion);胍離子(guanidinium ion);烷基鏻陽離子;或經烷基、芳基或芳烷基取代之碘鎓或硫鎓陽離子。可使用包含前述之至少一者的組合。較佳地,該陽離子係可光分解之鎓陽離子,故該單體也為可光分解者,亦即光酸產生劑(PAG)單體。
本文所揭露之PAG單體係基於陽離子-陰離子結構,其中,該陽離子較佳係芳基取代之鎓(亦即,二取代之碘鎓或三取代之硫鎓)陽離子,如三苯基硫鎓陽離子;或具下述結構,該芳基取代基進一步連結至舉例而言包括該鎓之雜環結構中之一個或多個相鄰芳基,或該芳基取代基係作為稠合芳環系之一部份。
若該單體係可光分解者,亦即,若該氧陰離子親核劑與該磺酸內酯之反應產物係具有不可光分解之第一陽離子的鹽,則該方法進一步包含將該不可光分解之第一陽離子與式(XIX)之第二陽離子交換:
其中,X係S或I,各R0
係獨立為經鹵化或未經鹵化之基,包含:C1-30
烷基;多環或單環C3-30
環烷基;多環或單環C6-30
芳基;包含前述之至少一者的組合,以及,視需要,兩個R0
基進一步藉由單鍵彼此連結,其中,各R0
係獨立為單環C6-30
芳基,且a係2或3,其中,當X為I時,a為2;或當X為S時,a為3。
較佳地,G+
係具有式(XX)、式(XXI)或式(XXII):
其中,X係I或S,R12
、R13
、R14
及R15
係各獨立為羥基、腈、鹵素、C1-10
烷基、C1-10
氟烷基、C1-10
烷氧基、C1-10
氟烷氧基、C6-20
芳基、C6-20
氟芳基、C6-20
芳氧基或C6-20
氟芳氧基,Ar1
及Ar2
係獨立為C10-30
經稠合之或經單鍵鍵合之多環芳基;X為I時,R16
係孤對電子,或X為S時,R16
係C6-20
芳基;以及p係整數2或3,其中,當X為I時,p為2,當X為S時,p為3,q及r係各獨立為0至5之整數,以及,s及t係各獨立為0至4之整數。
例示性之式(XXI)中的PAG陽離子G+
係包括下列結構:
其中,X係S或I,限制條件為當X為I時,R’係孤對電子,R係C1-10
烷基、C1-10
氟烷基、C1-10
烷氧基或C1-10
氟烷氧基;當X為S時,R’係C6-30
芳基、C6-30
伸芳基或C7-20
烷基-芳基,各R”係獨立為H、OH、鹵素、C1-20
烷基、C1-20
氟烷基、C1-20
烷氧基、C1-20
氟烷氧基、C3-20
環烷基、C3-20
氟環烷基、C6-20
芳基、C7-20
烷基-芳基或包含前述之至少一者的組合,以及,各R’’’係獨立為H、C1-20
烷基、C1-20
氟烷基、C1-20
烷氧基、C1-20
氟烷氧基、C3-20
環烷基、C3-20
氟環烷基、C6-20
芳基、C7-20
烷基-芳基或包含前述之至少一者的組合。
PAG陽離子可包括於該單體中,且可藉由陽離子交換反應(本文中有時指代為複分解反應)予以施行,其中,第一陽離子/陰離子對A+
C-
與第二陽離子/陰離子對B+
D-
於溶液中反應,以形成交換產物A+
D-
及B+
C-
。複分解(亦即,離子交換)反應可於諸如雙相介質中予以施行,於該雙相介質中,低活性陽離子/高活性陰離子,舉例而言,如溴化三苯基硫鎓,可與高活性陽離子/低活性陰離子,舉例而言,如2-甲基-2-丙烯酸4-磺基-3,3,4,4-四氟丁酯之鈉鹽或鉀鹽交換。該雙相介質可係任何適宜之雙相介質,較佳係具有用於溶解並移除所得高活性鹽(如,例示性具體實施態樣中之NaBr或KBr)之水相以及用於溶解並移除該低活性鹽(如,2-甲基-2-丙烯酸4-磺基-3,3,4,4-四氟丁酯之三苯基硫鎓鹽)之有機介質如醚,或較佳為二氯甲烷。交換可於環境溫度施行,反應時間為適合造成交換平衡,其中,溶劑、用量及時間可由熟悉該技藝之人士確定。
例示性通式(VIII)之單體係包括:
其中,R8
係H、F、C1-6
烷基或C1-6
氟烷基。較佳地,R8
係H或-CH3
。
單體(包括本文中揭露之PAG單體)可與適用於與他們共聚合之單體聚合。較佳地,若該單體為PAG單體,該PAG單體係與一種或多種具有酸敏基之共單體及視需要之其他單體聚合,以形成共聚物,提供其他性質如蝕刻控制、溶解速率控制及黏著性。此等共聚物可用於光阻劑中,較佳係用於EUV微影,且與曝露於其他波長之照射相比較,當曝露於EUV照射時,該等聚合物可具有所欲之特定吸收及分解特性。舉例而言,該EUV照射源除了發射EUV區域(約12至14nm,其中,所使用之典型發射係13.4至13.5nm)中之發射光譜外,亦可發射對光酸產生劑可能敏感之波長為更長者,如248nm及/或193nm(其亦為DUV及193nm微影使用之KrF與ArF準分子雷射所使用之發射頻)。
藉由下列實施例進一步例示性說明本發明。
除了下文已提供獲得過程者之外,本文中使用之全部化合物皆為可商購者。使用Varian INOVA 300(FT 300 MHz,1
H;282 MHz,19
F)型核磁共振儀獲取核磁共振(NMR)光譜。1
H譜及19
F譜之化學位移係以參照內加之四甲基矽烷報告之,或參照內部溶劑共振並相對於四甲基矽烷報告之。4-溴-3,3,4,4-四氟-1-丁醇係自氟化學公司(Synquest Laboratories)獲得。除另行指明者外,其他試劑全部係自阿德瑞希公司(Aldrich)獲得。溶劑係自阿德瑞希公司或費舍爾科技公司(Fisher Scientific)獲得。
使用熱分析儀器公司(TA Instruments)之Q5000型熱重分析儀於氮氣氛下以5℃/分鐘之升溫速率獲取熱重分析(TGA)。
使用布魯克(Bruker)SMART X2S型檯面晶體學系統獲取X射線晶體學數據。使用APEX2版本2009.9軟體(Bruker AXS Inc.)施行單位晶胞之初步確定。使用SAINT版本7.68A軟體(Bruker AXS Inc.,2009)施行積分強度及單位晶胞參數精修。使用多次掃描技術(multiscan technique)以SADABS版本2008/1軟體(Bruker AXS Inc.)修正數據之吸收效應。
藉由凝膠滲透色層分析(GPC)確定聚合物之分子量(Mw)及多分散性(PD),樣本濃度為1毫克(mg)/毫升(mL),使用交聯之苯乙烯-二乙烯基苯柱(具有以聚苯乙烯標準樣品校準普適校準曲線),以及,使用四氫呋喃以1 mL/分鐘之流速洗脫。
實施例1:2-甲基-2-丙烯酸4-磺基-3,3,4,4-四氟丁酯之鈉鹽(1:1)之製備
A. 4-羥基-1,1,2,2-四氟丁烷-1-亞磺酸鈉中間體之製備
將4-溴-3,3,4,4-四氟-1-丁醇(5.00公克(g),22.2毫莫耳(mmol))加入由NaHCO3
(5.60g,66.67mmol)與Na2
S2
O4
(11.61g,66.67mmol)於15mL乙腈及22mL水形成的漿料中。於約55℃蠟浴中,將該混合物於攪拌下加熱兩天。沉降該漿料,並移除一份小樣以1
H NMR(D2
O)偵測,結果顯示反應完全。過濾該反應混合物,以旋轉蒸發儀於減壓下移除揮發性成份,以提供呈白色固體之亞磺酸鹽中間體,將該中間體放回該蠟浴中,於減壓下於80℃加熱度過整個週末。19
F NMR譜證實該亞磺酸鹽中間體之身份。19
F NMR(D2
O):d-112.55(dd,2F),-131.30(dd,2F)。
B. 4-羥基-1,1,2,2-四氟丁烷-1-磺酸鈉中間體之製備(小規模)
將上述製備之固體溶解於25mL水中,冷卻至0℃,於產生蒸汽之情況下加入5mL之50%(w/w)H2
O2
水溶液。攪拌1小時之後,取得一份小樣之NMR譜,顯示反應完成約50%。再加入H2
O2
水溶液(5mL),繼續攪拌。NMR分析顯示反應完全。以旋轉蒸發儀於減壓下移除揮發性成份,以給出白色固體。使用過氧化物測試條證實冷凝液(被丟棄)與固體(被再次溶解於水中)中存在過氧化物。加入亞硫酸氫鈉,直至無過氧化物殘留。過濾該漿料,以旋轉蒸發儀於減壓下移除揮發性成份,以給出呈白色固體之磺酸鹽。19
F NMR(D2
O):d-112.44(dd,2F),-117.08(dd,2F)。
C. 4-羥基-1,1,2,2-四氟丁烷-1-亞磺酸鈉中間體之製備(較大規模)
將4-溴-3,3,4,4-四氟-1-丁醇(19.92g,88.54mmol)加入由NaHCO3
(22.31g,265.6mmol)與Na2
S2
O4
(46.25g,265.6mmol)於60mL乙腈及88mL水形成的漿料中。將該混合物於蠟浴中於約55℃加熱兩天,由於存在大量固體,故無法攪拌。19
F NMR譜顯示幾乎沒有原料轉化為產物。隨後,將溫度升至約80℃。隨著溫度升高,足夠之無機鹽(NaHCO3
與Na2
S2
O4
)溶解,使得該混合物可以攪拌。再加入二硫亞磺酸鈉(17g)及碳酸氫鈉(15g)。NMR譜顯示,未出現進一步之反應。將該反應混合物冷卻至環境溫度,再加入額外水(100mL)及乙腈(100mL),使得全部固體材料溶解。取得每層之NMR譜。水層含有亞硫酸鹽且可能存在少量磺酸鹽,但沒有起始之溴化物;而乙腈層顯示相當可觀之量的起始材料。分離該等層。將水層置於一旁,再將二硫亞磺酸鈉(30g)與碳酸鈉(38g)伴隨約100mL水加入該乙腈層(200mL)中。將該反應混合物於約85℃加熱過夜。冷卻該溶液,過濾,與先前分離之水層合併,以旋轉蒸發儀移除揮發性成份。以約200mL乙醚洗滌所得酥脆固體,並真空乾燥。
D. 4-羥基-1,1,2,2-四氟丁烷-1-磺酸鈉中間體之製備(較大規模)
將上述製備之固體溶解於25mL水中,於冰浴中冷卻至0℃,於產生蒸汽之情況下加入5mL之50%(w/w)H2
O2
水溶液。將該反應混合物攪拌過夜。19
F NMR譜顯示反應完成度約為90%至95%。再加入額外H2
O2
溶液(20mL),繼續攪拌,直至NMR分析顯示反應完全。隨後,加入亞硫酸氫鈉,直至無過氧化物殘留。隨後,過濾該漿料,以旋轉蒸發儀於減壓下移除揮發性成份,以給出具有與實施例1之B部份所揭示者相同之特性的白色固體。
E. 4-羥基-1,1,2,2-四氟丁烷-1-磺酸中間體之製備
用甲醇(約200mL)萃取含有4-羥基-1,1,2,2-四氟丁烷-1-磺酸鈉之來自實施例1之D部份的白色固體,並過濾以移除顆粒物。所得淺黃色溶液穿行通過以8公分(cm)之AMBERLITETM
120H酸性陽離子交換樹脂填裝之柱,以提供經質子化化合物的淺褐色溶液作為標題之磺酸。使用額外之甲醇洗出任何殘留之磺酸。於減壓下移除揮發性成份,以給出含有黑色顆粒物碎屑的深黑褐色油。基於起始之4-溴-3,3,4,4-四氟-1-丁醇,產率為15.5g,77.2%。
於氮氣氛下,藉由熱重分析(TGA)以5℃/分鐘之升溫速率表徵該磺酸。第1圖顯示熱重分析(TGA)圖數據,自該圖可見,直至達到約150℃之前,該磺酸之分解穩定進行,且失重約30%,於約150℃,分解加速,並於159.6℃出現最大分解速率,以及,該化合物於約245℃達到完全失重。
F. 3,3,4,4-四氟丁烷磺酸內酯之製備
將4-羥基-1,1,2,2-四氟丁烷-1-磺酸(2.00g,8.84mmol)置於連結短徑蒸餾柱之5mL圓底燒瓶中。將該系統置於氮氣氛中。將該燒瓶浸潤於熱蠟浴中,並將溫度自130℃逐漸升至180℃。於此升溫出現之同時,水開始蒸餾進入該蒸餾設備之較冷區域。拆除該設備,將該燒瓶與微蒸餾設備連接,再次於氮氣氛下加熱。壓力逐漸下降,因此產物磺酸內酯與水被蒸除,並形成兩相液體產物。藉由移液管移除下方之磺酸內酯層,以無水硫酸鎂乾燥,透過過濾移液管過濾,以給出呈無色液體之產物。
G. 3,3,4,4-四氟丁烷磺酸內酯之製備(較大規模)
將4-羥基-1,1,2,2-四氟丁烷-1-磺酸(6.78g,30.0mmol)置於經V管與希丁克管(Schlenk tube)連結之50mL圓底燒瓶中。將該系統置於真空下,並將該希丁克管浸潤於液態氮中。將含有該磺酸之燒瓶浸潤於熱蠟浴中,並將溫度逐漸升至約160℃。產物磺酸內酯與水逐漸被蒸除並於接受容器中凍結。解凍之後,形成兩層。藉由移液管移除下方之磺酸內酯層,以無水硫酸鎂乾燥,過濾,以給出呈無色液體之產物(3.85g,61.7%)。
H. 2-甲基-2-丙烯酸4-磺基-3,3,4,4-四氟丁酯之鈉鹽或鉀鹽(1:1)之製備
NMR管規模,鈉鹽(1:1):將氫化鈉(0.029g,1.2mmol)緩慢加入溶於1mL CD3
CN中之甲基丙烯酸(0.103g,1.2 mmol)中。攪拌過夜之後,加入3,3,4,4-四氟丁烷磺酸內酯(0.250g,1.2mmol),將該混合物轉移至NMR管中。以1
H NMR監控反應進程。將該混合物逐漸加熱至75℃,此時,反應完全。
大規模,鉀鹽(1:1):將甲基丙烯酸(1.708g,19.85 mmol)緩慢加入溶於40mL四氫呋喃(THF)中之氫化鉀(1.150 g,28.66mmol)中。攪拌過夜之後,過濾該反應混合物,並於減壓下移除揮發性成份。將3,3,4,4-四氟丁烷磺酸內酯(3.260g,15.66mmol)、甲基丙烯酸(2.0mL)及少量氫醌加入該甲基丙烯酸鉀中,隨後將該混合物於75℃加熱過夜。將丙酮(10mL)加入該混合物中。濾除固體,用額外之丙酮洗滌固體,並於減壓下乾燥。隨後,以水萃取該固體並過濾。於減壓下移除揮發性成份,以給出白色結晶固體(4.10 g,78.8%)。
第2圖係顯示該產物2-甲基-2-丙烯酸4-磺基-3,3,4,4-四氟丁酯鉀鹽(1:1)之結構的ORTEP圖。適用於單晶X射線繞射研究之晶體係藉由蒸發實施例1之H部份(大規模)之產物的水溶液而生長。該等晶體長成扁平無色針狀之形式。該等數據集係使用Bruker SMART X2S檯面晶體學系統以直觀方式予以收集。XPREP版本2008/2軟體(Bruker AXS Inc.)確定,晶胞C8
H9
F4
KO5
S之空間群為P 1 21/c 1,且Z=4。以XS版本2008/1軟體(Bruker AXS Inc.)解析該結構,並以XL版本2008/4軟體(Bruker AXS Inc.)施行後續之結構精修。最終,對於所觀察之數據,具有173變量之Fo 1
的最終各向異性全矩陣最小二乘法(full-matrix least-squares)精修收斂於R1=5.11%,而對於全部數據,收斂於R2=16.75%。
實施例2:1,1,2,2-四氟-4-(甲基丙烯醯氧基)丁烷-1-磺酸三苯基硫鎓之製備
將1,1,2,2-四氟-4-(甲基丙烯醯氧基)丁烷-1-磺酸鉀(2g,6.02mmol)與溴化三苯基硫鎓(2.25g,6.57mmol)伴隨著15mL二氯甲烷及15mL經蒸餾之去離子水一起加入100mL圓底燒瓶中。將該混合物劇烈攪拌36小時。停止攪拌,該混合物分成兩層澄清層;以30mL 1%(w/w)氫氧化銨水溶液洗滌兩次,再以30mL經蒸餾之去離子水洗滌5次。以硫酸鈉乾燥該有機層並過濾。加入氫醌(1mg),藉由高真空旋轉蒸發移除溶劑,以獲得呈無色黏稠油之產物(2.65 g,4.76mmol)。1
H NMR(d6
-丙酮):7.9(br),6.1(s),5.6(s),4.4(t),2.8(m),1.9(s);19
F NMR(d6
-丙酮):-112.7(s),-119.7(s)。
實施例3:1,1,2,2-四氟-4-(甲基丙烯醯氧基)丁烷-1-磺酸苯基二苯并噻吩鎓之製備
將1,1,2,2-四氟-4-(甲基丙烯醯氧基)丁烷-1-磺酸鉀(1.91g,5.75mmol)與溴化苯基二苯并噻吩鎓(2.14g,6.27mmol)伴隨著15mL二氯甲烷及15mL經蒸餾之去離子水一起加入100mL圓底燒瓶中。該混合物被劇烈攪拌過週末。停止攪拌,該混合物分成兩層澄清層;以30mL 1%(w/w)氫氧化銨水溶液洗滌兩次,再以30mL經蒸餾之去離子水洗滌5次。藉由高真空旋轉蒸發移除二氯甲烷,以獲得呈白色粉末之產物(2.41g,4.35mmol)。1
H NMR(d6
-丙酮):8.6(d),8.4(d),8.0(t),7.8(br),7.6(t),6.1(s),5.6(s),4.4(t),2.8(m),1.9(s);19
F NMR(d6
-丙酮):-112.7(s),-119.8(s)。
實施例4:1,1,2,2-四氟-4-(甲基丙烯醯氧基)丁烷-1-磺酸三苯基硫鎓之共聚合(例示性聚合物)
將甲基丙烯酸2-苯基-2-丙酯(3.32g,16.25mmol)、α-(γ-丁內酯)甲基丙烯酸酯(4.40g,23.75mmol)、甲基丙烯酸3,5-雙(1,1,1,3,3,3-六氟-2-羥基丙烷2-基)環己酯(3.13g,6.25mmol)及1,1,2,2-四氟-4-(甲基丙烯醯氧基)丁烷-1-磺酸三苯基硫鎓(50wt.%之乙腈溶液;4.17 g,3.75mmol)溶解於16.8g乳酸乙酯/環己酮(70/30 v/v)中。將2,2-偶氮雙(2,4-二甲基戊腈)(1.24g,3.75mmol)溶解於該單體溶液中。將少量(約5mL)單體溶液引入於80℃油浴中預熱之容器中,5分鐘後,將該單體溶液之剩餘部份歷時4小時饋入該容器中。再將該反應混合物額外加熱2小時。將該反應溶液冷卻至室溫,並於攪動之1公升(L)之甲基第三丁基醚與2-丙醇(90/10 v/v)的混合物中沉澱。藉由真空過濾分離所得白色粉末聚合物,並於45℃真空爐中乾燥48小時(產率為7.3g,58%)。
本文所揭示之全部範圍係包括端點,且端點可獨立地彼此組合。如本文中使用者,後綴“等”係欲以包括其所修飾之術語的單數及複數形式,藉以至少包含一種該術語。“視需要”或“視需要地”係意指後續揭示之事件或情況可出現或不出現,且該說明係包括該事件出現之例及該事件不出現之例。如本文中使用者,“組合”係包括摻合物、混合物、合金或反應產物。全部參考文獻係藉由引用併入本文。
於描述本發明之內文(尤其於後附之申請專利範圍之內文)中,除了本文中另行指明者或與其內文明顯矛盾者之外,術語“一(a)”、“一(an)”、“該”及類似者係應理解為涵蓋單數及複數形式兩者。再者,應進一步注意,本文中之術語“第一”、“第二”等並不表示任何次序、數量或重要性,僅用以將一個元件與另一個元件區分開來。
第1圖係顯示例示性單體之質量損失相對於溫度的熱重分析圖;以及
第2圖係例示性單體之鉀鹽基於X射線晶體學分析的ORTEP圖。
圖示為結果數據或晶體解析軟體圖,不適於作為代表圖,故本案未指定代表圖
Claims (8)
- 一種製備單體之方法,係包含:將磺酸內酯與親核劑反應,該磺酸內酯具下式(I):
其中,各R係獨立為F、C1-10 烷基、氟取代之C1-10 烷基、C1-10 環烷基或氟取代之C1-10 環烷基,限制條件為至少一個R係F;n係0至10之整數,以及m係1至4+2n之整數;其中,該親核劑係下列之氧陰離子:含羧基或羥基之含有經鹵化或未經鹵化之C2-30 烯烴的化合物;及其中,該反應係於由水、氨水、醚類、醇類、腈、醯胺類、亞碸、碸或其組合物所組成之溶劑中進行。 - 如申請專利範圍第1項所述之方法,其中,該磺酸內酯係具下式:
其中,各R係獨立為F、C1-10 烷基或氟取代之C1-10 烷基,限制條件為至少一個R係F;a係1至6之整數,b係1至8之整數,以及c係1至10之整數。 - 如申請專利範圍第1項所述之方法,其中,該磺酸內酯係具下式:
其中,R1 、R2 、R3 及R4 係各獨立為H、F、C1-10 烷基或氟取代之C1-10 烷基,限制條件為R1 、R2 、R3 或R4 之至少一個係F。 - 如申請專利範圍第1項所述之方法,其中,該磺酸內酯係具下式:
- 如申請專利範圍第1項所述之方法,其中,該親核劑係下列之氧陰離子:C3-20 乙烯基羧酸、C8-20 乙烯基芳族羧酸、羧酸含羥基C5-20 乙烯酯或C7-20 乙烯基羥基芳族化合物。
- 如申請專利範圍第5項所述之方法,其中,該親核劑係(甲基)丙烯酸或對羥基苯乙烯之氧陰離子。
- 如申請專利範圍第1項所述之方法,其中,該氧陰離子係藉由將該含羧基或羥基之含有經鹵化或未經鹵化之C2-30 烯烴的化合物與鹼反應所形成,其中,該鹼之共軛酸的pKa係大於12。
- 如申請專利範圍第1項所述之方法,其中,該氧陰離子 與該磺酸內酯之反應產物係具有第一陽離子的鹽,以及,該方法係進一步包含將該第一陽離子與下式之第二陽離子交換:
其中,X係S或I,各R0 係獨立為經鹵化或未經鹵化之基,包含:C1-30 烷基;多環或單環C3-30 環烷基;多環或單環C6-30 芳基;或包含前述之至少一者的組合,視需要,兩個R0 基係藉由單鍵進一步彼此結合,其中,各R0 係獨立為單環C6-30 芳基,以及a係2或3,其中,當X為I時,a為2,或當X為S時,a為3。
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| JP6031420B2 (ja) * | 2012-08-31 | 2016-11-24 | ダウ グローバル テクノロジーズ エルエルシー | 光酸発生剤を含む末端基を含むポリマー、前記ポリマーを含むフォトレジストおよびデバイスの製造方法 |
| US9182669B2 (en) * | 2013-12-19 | 2015-11-10 | Rohm And Haas Electronic Materials Llc | Copolymer with acid-labile group, photoresist composition, coated substrate, and method of forming an electronic device |
| CN105175390A (zh) * | 2015-08-27 | 2015-12-23 | 石家庄圣泰化工有限公司 | 1-氟-1,3-丙烷磺酸内酯的制备方法 |
| KR102648061B1 (ko) * | 2015-12-01 | 2024-03-18 | 제이에스알 가부시끼가이샤 | 감방사선성 조성물, 패턴 형성 방법 및 감방사선성 산 발생제 |
| US11613519B2 (en) | 2016-02-29 | 2023-03-28 | Rohm And Haas Electronic Materials Llc | Photoacid-generating monomer, polymer derived therefrom, photoresist composition including the polymer, and method of forming a photoresist relief image using the photoresist composition |
| CN106632232A (zh) * | 2016-08-29 | 2017-05-10 | 宁德市凯欣电池材料有限公司 | 一种氟代磺酸内酯的制备方法 |
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| US8907122B2 (en) | 2014-12-09 |
| JP5955552B2 (ja) | 2016-07-20 |
| US20120172619A1 (en) | 2012-07-05 |
| EP2472321A1 (en) | 2012-07-04 |
| TW201240982A (en) | 2012-10-16 |
| CN105859593A (zh) | 2016-08-17 |
| CN102603578A (zh) | 2012-07-25 |
| JP2012140426A (ja) | 2012-07-26 |
| KR20120078652A (ko) | 2012-07-10 |
| KR101460526B1 (ko) | 2014-11-12 |
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