WO1998043116A3 - Ionisationskammer für radiometrische messeinrichtungen - Google Patents

Ionisationskammer für radiometrische messeinrichtungen Download PDF

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Publication number
WO1998043116A3
WO1998043116A3 PCT/DE1998/000818 DE9800818W WO9843116A3 WO 1998043116 A3 WO1998043116 A3 WO 1998043116A3 DE 9800818 W DE9800818 W DE 9800818W WO 9843116 A3 WO9843116 A3 WO 9843116A3
Authority
WO
WIPO (PCT)
Prior art keywords
measuring instruments
insulator
ionization chamber
housing
radiometric measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/DE1998/000818
Other languages
English (en)
French (fr)
Other versions
WO1998043116B1 (de
WO1998043116A2 (de
Inventor
Siegfried Laube
Franz-Josef Urban
Steffen Hildebrandt
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Vacutec Messtechnik GmbH
Original Assignee
Vacutec Messtechnik GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from DE1997131608 external-priority patent/DE19731608C1/de
Application filed by Vacutec Messtechnik GmbH filed Critical Vacutec Messtechnik GmbH
Priority to JP54468298A priority Critical patent/JP2002507311A/ja
Priority to US09/381,555 priority patent/US6278121B1/en
Priority to DE59808464T priority patent/DE59808464D1/de
Priority to EP98925415A priority patent/EP0968519B1/de
Publication of WO1998043116A2 publication Critical patent/WO1998043116A2/de
Publication of WO1998043116A3 publication Critical patent/WO1998043116A3/de
Publication of WO1998043116B1 publication Critical patent/WO1998043116B1/de
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J47/00—Tubes for determining the presence, intensity, density or energy of radiation or particles
    • H01J47/02—Ionisation chambers

Landscapes

  • Measurement Of Radiation (AREA)
  • Electron Tubes For Measurement (AREA)

Abstract

Eine Ionisationskammer für radiometrische Meßeinrichtungen, insbesondere für traversierende Flächenmassemeßsysteme soll geschaffen werden, die eine hinreichende Empfindlichkeit besitzt und dabei die bei Ionisationskammern üblichen guten Werte hinsichtlich Vakuumdichtigkeit, Grundstrom und Temperaturabhängigkeit liefert. Innerhalb des Gehäuses (3) eine Mehrzahl benachbarter und gegenseitig abgegrenzter Abschnitte (2) mit den jeweiligen Sammelelektroden (6) unterteilt. Die Sammelelektroden (6) sind mit elektrischen Anschlüssen (14) verbunden, die durch den Isolator (13; 17) einer gasdichten Mehrfach-Durchführung hindurch nach außen geführt sind und daß der Isolator (13; 17) mit einem die elektrischen Anschlüsse (14) gemeinsam umgebenden elektrisch leitfähigen Bereich versehen, der sowohl gegenüber dem Gehäuse (3), als auch den Anschlüssen (14) elektrisch isoliert angeordnet ist, jedoch im stromlosen Zustand auf Elektrodenpotential liegt.
PCT/DE1998/000818 1997-03-21 1998-03-20 Ionisationskammer für radiometrische messeinrichtungen Ceased WO1998043116A2 (de)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP54468298A JP2002507311A (ja) 1997-03-21 1998-03-20 放射能測定装置のイオン化室
US09/381,555 US6278121B1 (en) 1997-03-21 1998-03-20 Ionization chamber for radiometric measuring instruments
DE59808464T DE59808464D1 (de) 1997-03-21 1998-03-20 Ionisationskammer für radiometrische messeinrichtungen
EP98925415A EP0968519B1 (de) 1997-03-21 1998-03-20 Ionisationskammer für radiometrische messeinrichtungen

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
DE19712032 1997-03-21
DE19712032.6 1997-03-21
DE1997131608 DE19731608C1 (de) 1997-07-23 1997-07-23 Ionisationskammer für radiometrische Meßeinrichtungen
DE19731608.5 1997-07-23

Publications (3)

Publication Number Publication Date
WO1998043116A2 WO1998043116A2 (de) 1998-10-01
WO1998043116A3 true WO1998043116A3 (de) 1998-12-17
WO1998043116B1 WO1998043116B1 (de) 1999-01-28

Family

ID=26035124

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/DE1998/000818 Ceased WO1998043116A2 (de) 1997-03-21 1998-03-20 Ionisationskammer für radiometrische messeinrichtungen

Country Status (5)

Country Link
US (1) US6278121B1 (de)
EP (1) EP0968519B1 (de)
JP (1) JP2002507311A (de)
DE (1) DE59808464D1 (de)
WO (1) WO1998043116A2 (de)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7701123B2 (en) * 2005-12-13 2010-04-20 Varian, Inc. Electron source for ionization with leakage current suppression
CN115327603B (zh) * 2022-08-01 2024-10-18 中国原子能科学研究院 一种束流探测极排及束流探测装置

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1040707B (de) * 1956-11-13 1958-10-09 Siemens Ag Strahlungsmessgeraet in Vergleichsschaltung, vorzugsweise Dickenmessanlage
FR2105649A5 (en) * 1970-09-16 1972-04-28 Commissariat Energie Atomique Ionisation chamber detector system - for determination of activity of gamma- or x-ray sources
JPS6273548A (ja) * 1985-09-27 1987-04-04 Hamamatsu Photonics Kk 電子増倍管
DE19545340A1 (de) * 1995-12-05 1997-06-12 Vacutec Mestechnik Gmbh Vorrichtung zur Kontrolle von Flächenmassen

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3676682A (en) * 1968-10-30 1972-07-11 Fred W Falk Absorbed ionizing radiation measuring device
US3575597A (en) * 1969-04-01 1971-04-20 Nasa A multichannel photoionization chamber for absorption analysis
US3914607A (en) * 1973-12-12 1975-10-21 Industrial Nucleonics Corp Thickness measuring apparatus and method for tire ply and similar materials
DE2747872A1 (de) * 1977-10-26 1979-05-03 Philips Patentverwaltung Strahlennachweisvorrichtung
US4301368A (en) * 1980-01-31 1981-11-17 Hospital Physics Oy Ionizing radiation detector adapted for use with tomography systems
US5010252A (en) * 1983-12-27 1991-04-23 General Electric Company Ionization detector
US4751391A (en) * 1986-12-19 1988-06-14 General Electric Company High resolution X-ray collimator/detector system having reduced sensitivity to leakage radiation

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1040707B (de) * 1956-11-13 1958-10-09 Siemens Ag Strahlungsmessgeraet in Vergleichsschaltung, vorzugsweise Dickenmessanlage
FR2105649A5 (en) * 1970-09-16 1972-04-28 Commissariat Energie Atomique Ionisation chamber detector system - for determination of activity of gamma- or x-ray sources
JPS6273548A (ja) * 1985-09-27 1987-04-04 Hamamatsu Photonics Kk 電子増倍管
DE19545340A1 (de) * 1995-12-05 1997-06-12 Vacutec Mestechnik Gmbh Vorrichtung zur Kontrolle von Flächenmassen

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
PATENT ABSTRACTS OF JAPAN vol. 011, no. 271 (E - 536) 3 September 1987 (1987-09-03) *

Also Published As

Publication number Publication date
US6278121B1 (en) 2001-08-21
JP2002507311A (ja) 2002-03-05
WO1998043116A2 (de) 1998-10-01
EP0968519A2 (de) 2000-01-05
EP0968519B1 (de) 2003-05-21
DE59808464D1 (de) 2003-06-26

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