WO2003016888A3 - Elektrode als probenträger für txrf-messungen - Google Patents

Elektrode als probenträger für txrf-messungen Download PDF

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Publication number
WO2003016888A3
WO2003016888A3 PCT/DE2002/002933 DE0202933W WO03016888A3 WO 2003016888 A3 WO2003016888 A3 WO 2003016888A3 DE 0202933 W DE0202933 W DE 0202933W WO 03016888 A3 WO03016888 A3 WO 03016888A3
Authority
WO
WIPO (PCT)
Prior art keywords
sample carrier
txrf
measurements
electrode used
ray fluorescence
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/DE2002/002933
Other languages
English (en)
French (fr)
Other versions
WO2003016888A2 (de
Inventor
Simone Griesel
Ruediger Kiehn
Andreas Prange
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
GKSS Forshungszentrum Geesthacht GmbH
Original Assignee
GKSS Forshungszentrum Geesthacht GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from DE10232825A external-priority patent/DE10232825A1/de
Application filed by GKSS Forshungszentrum Geesthacht GmbH filed Critical GKSS Forshungszentrum Geesthacht GmbH
Publication of WO2003016888A2 publication Critical patent/WO2003016888A2/de
Publication of WO2003016888A3 publication Critical patent/WO2003016888A3/de
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Sampling And Sample Adjustment (AREA)

Abstract

Die Erfindung betrifft eine Elektrode (15) als Probenträger für die Röntgenfluoreszenzspektroskopie, insbesondere Totalreflexions-Röntgenfluoreszenzspektroskopie.
PCT/DE2002/002933 2001-08-10 2002-08-08 Elektrode als probenträger für txrf-messungen Ceased WO2003016888A2 (de)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
DE10138320.7 2001-08-10
DE10138320 2001-08-10
DE10232825.0 2002-07-19
DE10232825A DE10232825A1 (de) 2001-08-10 2002-07-19 Elektrode als Probenträger für TXRF-Messungen

Publications (2)

Publication Number Publication Date
WO2003016888A2 WO2003016888A2 (de) 2003-02-27
WO2003016888A3 true WO2003016888A3 (de) 2003-10-09

Family

ID=26009877

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/DE2002/002933 Ceased WO2003016888A2 (de) 2001-08-10 2002-08-08 Elektrode als probenträger für txrf-messungen

Country Status (1)

Country Link
WO (1) WO2003016888A2 (de)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0461698A1 (de) * 1990-06-13 1991-12-18 SOLVAY (Société Anonyme) Vorrichtung zur Analyse von Werkstoffen und Verwendung dieser Vorrichtung

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0461698A1 (de) * 1990-06-13 1991-12-18 SOLVAY (Société Anonyme) Vorrichtung zur Analyse von Werkstoffen und Verwendung dieser Vorrichtung

Non-Patent Citations (6)

* Cited by examiner, † Cited by third party
Title
ALOV N V ET AL.: "Total-reflection X-ray fluorescence study of electrochemical deposition of metals on a glass-ceramic carbon electrode surface", CONFERENCE ON TOTAL REFLECTION X-RAY FLUORESCENCE ANALYSIS AND RELATED METHODS, September 2000 (2000-09-01), Vienna *
ALOV N V ET AL.: "Total-reflection X-ray fluorescence study of electrochemical deposition of metals on a glass-ceramic carbon electrode surface", SPECTROCHIMICA ACTA B, vol. 56, 30 November 2001 (2001-11-30), pages 2117 - 2126, XP002233123 *
FAN Q ET AL: "ENHANCEMENT OF TOTAL REFLECTION X-RAY FLUORESCENCE SPECTROSCOPY WITH ELECTROCHEMICAL DEPOSITION", APPLIED SPECTROSCOPY, THE SOCIETY FOR APPLIED SPECTROSCOPY. BALTIMORE, US, vol. 47, no. 11, 1 November 1993 (1993-11-01), pages 1742 - 1746, XP000409331, ISSN: 0003-7028 *
GRIESEL ET AL.: "Electro-deposition as a sample preparation technique for total-reflection X-ray fluorescence analysis", SPECTROCHIMICA ACTA B, vol. 56, 30 November 2001 (2001-11-30), pages 2107 - 2115, XP002233122 *
GRIESEL S: "Electro-deposition as a sample preparation technique for total-reflection X-ray fluorescence analysis", CONFERENCE ON TOTAL REFLECTION X-RAY FLUORESCENCE ANALYSIS AND RELATED METHODS, September 2000 (2000-09-01), Vienna *
RITSCHEL ET AL.: "An electrochemical enrichment procedure for the determination of heavy metals by total-reflection X-ray fluorescence spectroscopy", SPECTROCHIMICA ACTA B, vol. 54, 1999, pages 1449 - 1454, XP002232794 *

Also Published As

Publication number Publication date
WO2003016888A2 (de) 2003-02-27

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