WO2003093902A3 - Beleuchtungssystem, insbesondere für die euv-lithographie - Google Patents
Beleuchtungssystem, insbesondere für die euv-lithographie Download PDFInfo
- Publication number
- WO2003093902A3 WO2003093902A3 PCT/EP2003/003616 EP0303616W WO03093902A3 WO 2003093902 A3 WO2003093902 A3 WO 2003093902A3 EP 0303616 W EP0303616 W EP 0303616W WO 03093902 A3 WO03093902 A3 WO 03093902A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- optical element
- screen elements
- screen
- elements
- euv
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70075—Homogenization of illumination intensity in the mask plane by using an integrator, e.g. fly's eye lens, facet mirror or glass rod, by using a diffusing optical element or by beam deflection
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
- G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
- G02B26/0816—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70141—Illumination system adjustment, e.g. adjustments during exposure or alignment during assembly of illumination system
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/702—Reflective illumination, i.e. reflective optical elements other than folding mirrors, e.g. extreme ultraviolet [EUV] illumination systems
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Lenses (AREA)
Abstract
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| AU2003227574A AU2003227574A1 (en) | 2002-04-30 | 2003-04-08 | Lighting system, particularly for use in extreme ultraviolet (euv) lithography |
| JP2004502061A JP2005524236A (ja) | 2002-04-30 | 2003-04-08 | 特には極端紫外線(euv)リソグラフィに用いる、照明システム |
| US10/512,100 US7196841B2 (en) | 2002-04-30 | 2003-04-08 | Lighting system, particularly for use in extreme ultraviolet (EUV) lithography |
| EP03724973A EP1499925A2 (de) | 2002-04-30 | 2003-04-08 | Beleuchtungssystem, insbesondere f r die euv-lithographie |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE10219514A DE10219514A1 (de) | 2002-04-30 | 2002-04-30 | Beleuchtungssystem, insbesondere für die EUV-Lithographie |
| DE10219514.5 | 2002-04-30 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| WO2003093902A2 WO2003093902A2 (de) | 2003-11-13 |
| WO2003093902A3 true WO2003093902A3 (de) | 2004-03-11 |
Family
ID=29224960
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/EP2003/003616 Ceased WO2003093902A2 (de) | 2002-04-30 | 2003-04-08 | Beleuchtungssystem, insbesondere für die euv-lithographie |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US7196841B2 (de) |
| EP (1) | EP1499925A2 (de) |
| JP (1) | JP2005524236A (de) |
| CN (1) | CN1650234A (de) |
| AU (1) | AU2003227574A1 (de) |
| DE (1) | DE10219514A1 (de) |
| WO (1) | WO2003093902A2 (de) |
Families Citing this family (58)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7843632B2 (en) * | 2006-08-16 | 2010-11-30 | Cymer, Inc. | EUV optics |
| DE102004019346A1 (de) * | 2004-04-21 | 2005-11-10 | Infineon Technologies Ag | Blende, Belichtungsapparat und Verfahren zum Steuern der Blende in dem Belichtungsapparat |
| JP4817702B2 (ja) * | 2005-04-14 | 2011-11-16 | キヤノン株式会社 | 光学装置及びそれを備えた露光装置 |
| DE502006009171D1 (de) * | 2005-10-18 | 2011-05-05 | Zeiss Carl Smt Gmbh | Kollektor für beleuchtungssysteme mit einer wellenlänge </= 193 nm |
| DE102006020734A1 (de) * | 2006-05-04 | 2007-11-15 | Carl Zeiss Smt Ag | Beleuchtungssystem für die EUV-Lithographie sowie erstes und zweites optisches Element zum Einsatz in einem derartigen Beleuchtungssystem |
| EP2020679A4 (de) * | 2006-05-25 | 2011-04-13 | Nikon Corp | Optische beleuchtungsvorrichtung, belichtungsgerät und geräteherstellungsverfahren |
| US9250536B2 (en) | 2007-03-30 | 2016-02-02 | Asml Netherlands B.V. | Lithographic apparatus and method |
| US8937706B2 (en) | 2007-03-30 | 2015-01-20 | Asml Netherlands B.V. | Lithographic apparatus and method |
| DE102007047446A1 (de) * | 2007-10-04 | 2009-04-09 | Carl Zeiss Smt Ag | Optisches Element mit wenigstens einem elektrisch leitenden Bereich und Beleuchtungssystem mit einem solchen Element |
| DE102008013229B4 (de) | 2007-12-11 | 2015-04-09 | Carl Zeiss Smt Gmbh | Beleuchtungsoptik für die Mikrolithographie |
| CN101946190B (zh) * | 2008-02-15 | 2013-06-19 | 卡尔蔡司Smt有限责任公司 | 微光刻的投射曝光设备使用的分面镜 |
| JP5074226B2 (ja) * | 2008-02-16 | 2012-11-14 | エスアイアイ・ナノテクノロジー株式会社 | 荷電粒子ビーム装置 |
| DE102008000788A1 (de) * | 2008-03-20 | 2009-09-24 | Carl Zeiss Smt Ag | Beleuchtungssystem für eine Mikrolithographie-Projektionsbelichtungsanlage |
| DE102008000967B4 (de) * | 2008-04-03 | 2015-04-09 | Carl Zeiss Smt Gmbh | Projektionsbelichtungsanlage für die EUV-Mikrolithographie |
| DE102008049586A1 (de) | 2008-09-30 | 2010-04-08 | Carl Zeiss Smt Ag | Feldfacettenspiegel zum Einsatz in einer Beleuchtungsoptik einer Projektionsbelichtungsanlage für die EUV-Mikrolithographie |
| DE102009045135A1 (de) * | 2009-09-30 | 2011-03-31 | Carl Zeiss Smt Gmbh | Beleuchtungsoptik für die Mikrolithographie |
| DE102009045694B4 (de) * | 2009-10-14 | 2012-03-29 | Carl Zeiss Smt Gmbh | Beleuchtungsoptik für die Mikrolithographie sowie Beleuchtungssystem und Projektionsbelichtungsanlage mit einer derartigen Beleuchtungsoptik |
| DE102009054540B4 (de) * | 2009-12-11 | 2011-11-10 | Carl Zeiss Smt Gmbh | Beleuchtungsoptik für die EUV-Mikrolithographie |
| DE102009054888A1 (de) | 2009-12-17 | 2011-06-22 | Carl Zeiss SMT GmbH, 73447 | Optisches Element mit einer Mehrzahl von refletiven Facettenelementen |
| WO2011076500A1 (en) | 2009-12-23 | 2011-06-30 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| DE102011004615A1 (de) * | 2010-03-17 | 2011-09-22 | Carl Zeiss Smt Gmbh | Beleuchtungsoptik für die Projektionslithografie |
| WO2011131289A1 (en) * | 2010-04-22 | 2011-10-27 | Carl Zeiss Smt Gmbh | Imaging optics, and a projection exposure apparatus for microlithography having such an imaging optics |
| DE102010029765A1 (de) | 2010-06-08 | 2011-12-08 | Carl Zeiss Smt Gmbh | Beleuchtungsoptik für die EUV-Projektionslithografie |
| JP5644416B2 (ja) * | 2010-11-24 | 2014-12-24 | 株式会社ニコン | 光学ユニット、光学系、露光装置、及びデバイスの製造方法 |
| DE102011076145B4 (de) | 2011-05-19 | 2013-04-11 | Carl Zeiss Smt Gmbh | Verfahren zum Zuordnen einer Pupillenfacette eines Pupillenfacettenspiegels einer Beleuchtungsoptik einer Projektionsbelichtungsanlage zu einer Feldfacette eines Feldfacettenspiegels der Beleuchtungsoptik |
| DE102011076460A1 (de) * | 2011-05-25 | 2012-11-29 | Carl Zeiss Smt Gmbh | Beleuchtungsoptik |
| DE102011076549A1 (de) | 2011-05-26 | 2012-11-29 | Carl Zeiss Smt Gmbh | Optische Anordnung in einer mikrolithographischen Projektionsbelichtungsanlage |
| DE102011076658A1 (de) * | 2011-05-30 | 2012-05-10 | Carl Zeiss Smt Gmbh | Beleuchtungsoptik für die EUV-Projektionslithographie |
| DE102011086328A1 (de) | 2011-11-15 | 2013-05-16 | Carl Zeiss Smt Gmbh | Spiegel zum Einsatz zur Führung von Beleuchtungs- und Abbildungslicht in der EUV-Projektionslithografie |
| DE102012213368A1 (de) | 2012-07-30 | 2013-12-05 | Carl Zeiss Smt Gmbh | Beleuchtungsoptik für die EUV-Projektionslithographie |
| DE102012220596A1 (de) | 2012-11-13 | 2014-05-15 | Carl Zeiss Smt Gmbh | Verfahren zum Zuordnen einer Pupillenfacette eines Pupillenfacettenspiegels einer Beleuchtungsoptik einer Projektionsbelichtungsanlage zu einer Feldfacette eines Feldfacettenspiegels der Beleuchtungsoptik |
| DE102012220597A1 (de) * | 2012-11-13 | 2014-05-28 | Carl Zeiss Smt Gmbh | Beleuchtungsoptik für die EUV-Projektionslithographie |
| EP2754524B1 (de) | 2013-01-15 | 2015-11-25 | Corning Laser Technologies GmbH | Verfahren und Vorrichtung zum laserbasierten Bearbeiten von flächigen Substraten, d.h. Wafer oder Glaselement, unter Verwendung einer Laserstrahlbrennlinie |
| US9448343B2 (en) * | 2013-03-15 | 2016-09-20 | Kla-Tencor Corporation | Segmented mirror apparatus for imaging and method of using the same |
| EP2781296B1 (de) | 2013-03-21 | 2020-10-21 | Corning Laser Technologies GmbH | Vorrichtung und verfahren zum ausschneiden von konturen aus flächigen substraten mittels laser |
| DE102013206981A1 (de) | 2013-04-18 | 2013-12-24 | Carl Zeiss Smt Gmbh | Facettenspiegel mit im Krümmungsradius einstellbaren Spiegel-Facetten und Verfahren hierzu |
| DE102013212363A1 (de) * | 2013-06-27 | 2014-07-31 | Carl Zeiss Smt Gmbh | Facettenspiegel, insbesondere für die EUV-Projektionslithografie |
| US9517963B2 (en) | 2013-12-17 | 2016-12-13 | Corning Incorporated | Method for rapid laser drilling of holes in glass and products made therefrom |
| US11556039B2 (en) | 2013-12-17 | 2023-01-17 | Corning Incorporated | Electrochromic coated glass articles and methods for laser processing the same |
| TWI730945B (zh) | 2014-07-08 | 2021-06-21 | 美商康寧公司 | 用於雷射處理材料的方法與設備 |
| CN104142613B (zh) * | 2014-07-11 | 2016-08-17 | 广东工业大学 | 一种大面积数字光刻光学系统 |
| JP2017530867A (ja) * | 2014-07-14 | 2017-10-19 | コーニング インコーポレイテッド | 長さおよび直径の調節可能なレーザビーム焦線を用いて透明材料を加工するためのシステムおよび方法 |
| DE102014217608A1 (de) | 2014-09-03 | 2014-11-20 | Carl Zeiss Smt Gmbh | Verfahren zum Zuordnen einer zweiten Facette eines im Strahlengang zweiten facettierten Elements einer Beleuchtungsoptik |
| DE102014223326B4 (de) | 2014-11-14 | 2018-08-16 | Carl Zeiss Smt Gmbh | Verfahren zur Vorhersage mindestens eines Beleuchtungsparameters zur Bewertung eines Beleuchtungssettings und Verfahren zur Optimierung eines Beleuchtungssettings |
| WO2016154284A1 (en) | 2015-03-24 | 2016-09-29 | Corning Incorporated | Laser cutting and processing of display glass compositions |
| DE102016202736A1 (de) | 2015-04-17 | 2016-05-25 | Carl Zeiss Smt Gmbh | Beleuchtungsoptik für eine Projektionsbelichtungsanlage |
| US10730783B2 (en) | 2016-09-30 | 2020-08-04 | Corning Incorporated | Apparatuses and methods for laser processing transparent workpieces using non-axisymmetric beam spots |
| EP3848333B1 (de) | 2016-10-24 | 2025-12-03 | Corning Incorporated | Substratverarbeitungsstation zur laserbasierten verarbeitung von flächigen glassubstraten |
| DE102018207103A1 (de) * | 2018-05-08 | 2019-03-21 | Carl Zeiss Smt Gmbh | Feldfacettenspiegel |
| DE102018220625A1 (de) | 2018-11-29 | 2020-06-04 | Carl Zeiss Smt Gmbh | Optisches Beleuchtungssystem für Projektionslithographie |
| DE102018221128A1 (de) | 2018-12-06 | 2020-06-10 | Carl Zeiss Smt Gmbh | Verfahren zum Tauschen eines Spiegels in einer Projektionsbelichtungsanlage sowie Lagedaten-Messeinrichtung zum Durchführen des Verfahrens |
| DE102020210771A1 (de) | 2020-08-26 | 2021-08-19 | Carl Zeiss Smt Gmbh | Facettenspiegel für eine projektionsbelichtungsanlage und projektionsbelichtungsanlage mit entsprechendem facettenspiegel sowie verfahren zum betrieb derselben |
| DE102020211096A1 (de) * | 2020-09-02 | 2022-03-03 | Carl Zeiss Smt Gmbh | Feldfacette für einen Feldfacettenspiegel einer Projektionsbelichtungsanlage |
| DE102021202768A1 (de) * | 2021-03-22 | 2022-09-22 | Carl Zeiss Smt Gmbh | Facettensystem und lithographieanlage |
| EP4403903A4 (de) * | 2021-09-13 | 2025-09-17 | Shimadzu Corp | Mikroskopische raman-spektroskopievorrichtung und winkeleinstellelement für ein optisches element |
| DE102021213168A1 (de) * | 2021-11-23 | 2023-05-25 | Carl Zeiss Smt Gmbh | Verfahren |
| CN114660880A (zh) * | 2022-04-11 | 2022-06-24 | 长沙沃默科技有限公司 | 一种反射式投影成像装置及其设计方法 |
| DE102022209214A1 (de) | 2022-09-05 | 2024-03-07 | Carl Zeiss Smt Gmbh | Einzelspiegel eines Pupillenfacettenspiegels und Pupillenfacettenspiegel für eine Beleuchtungsoptik einer Projektionsbelichtungsanlage |
Citations (5)
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| DE19903807A1 (de) * | 1998-05-05 | 1999-11-11 | Zeiss Carl Fa | Beleuchtungssystem insbesondere für die EUV-Lithographie |
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2002
- 2002-04-30 DE DE10219514A patent/DE10219514A1/de not_active Withdrawn
-
2003
- 2003-04-08 US US10/512,100 patent/US7196841B2/en not_active Expired - Fee Related
- 2003-04-08 EP EP03724973A patent/EP1499925A2/de not_active Withdrawn
- 2003-04-08 CN CN03809609.9A patent/CN1650234A/zh active Pending
- 2003-04-08 WO PCT/EP2003/003616 patent/WO2003093902A2/de not_active Ceased
- 2003-04-08 AU AU2003227574A patent/AU2003227574A1/en not_active Abandoned
- 2003-04-08 JP JP2004502061A patent/JP2005524236A/ja active Pending
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Also Published As
| Publication number | Publication date |
|---|---|
| JP2005524236A (ja) | 2005-08-11 |
| AU2003227574A8 (en) | 2003-11-17 |
| CN1650234A (zh) | 2005-08-03 |
| WO2003093902A2 (de) | 2003-11-13 |
| US20050174650A1 (en) | 2005-08-11 |
| AU2003227574A1 (en) | 2003-11-17 |
| EP1499925A2 (de) | 2005-01-26 |
| US7196841B2 (en) | 2007-03-27 |
| DE10219514A1 (de) | 2003-11-13 |
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