WO2008043459A3 - Anordnung zur aufteilung von detektionslicht - Google Patents

Anordnung zur aufteilung von detektionslicht Download PDF

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Publication number
WO2008043459A3
WO2008043459A3 PCT/EP2007/008555 EP2007008555W WO2008043459A3 WO 2008043459 A3 WO2008043459 A3 WO 2008043459A3 EP 2007008555 W EP2007008555 W EP 2007008555W WO 2008043459 A3 WO2008043459 A3 WO 2008043459A3
Authority
WO
WIPO (PCT)
Prior art keywords
optical axis
detection light
degrees
relation
carried out
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/EP2007/008555
Other languages
English (en)
French (fr)
Other versions
WO2008043459A2 (de
Inventor
Ralf Wolleschensky
Wolfgang Bathe
Joerg Steinert
Dieter Huhse
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Carl Zeiss Microscopy GmbH
Original Assignee
Carl Zeiss MicroImaging GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Carl Zeiss MicroImaging GmbH filed Critical Carl Zeiss MicroImaging GmbH
Publication of WO2008043459A2 publication Critical patent/WO2008043459A2/de
Publication of WO2008043459A3 publication Critical patent/WO2008043459A3/de
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0064—Optical details of the image generation multi-spectral or wavelength-selective arrangements, e.g. wavelength fan-out, chromatic profiling
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/10—Beam splitting or combining systems
    • G02B27/1006—Beam splitting or combining systems for splitting or combining different wavelengths
    • G02B27/1013—Beam splitting or combining systems for splitting or combining different wavelengths for colour or multispectral image sensors, e.g. splitting an image into monochromatic image components on respective sensors
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/10—Beam splitting or combining systems
    • G02B27/14—Beam splitting or combining systems operating by reflection only
    • G02B27/145—Beam splitting or combining systems operating by reflection only having sequential partially reflecting surfaces

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

Abstract

Anordnung zur Aufteilung von Detektionslicht in einem Laser-Scanning-Mikroskop, wobei eine spektrale Separierung unterschiedlicher Spektralanteile in transmittierte und ausgeblendete Anteile erfolgt, wobei die Aufteilung durch mindestens einen in einem Winkel ungleich 90 und Null Grad zur optischen Achse verkippten beschichteten Filter erfolgt, wobei der Winkel zur optischen Achse weniger als 20 Grad, vorteilhaft weniger als 10 Grad von der optischen Achse abweicht.
PCT/EP2007/008555 2006-10-06 2007-10-02 Anordnung zur aufteilung von detektionslicht Ceased WO2008043459A2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE200610047911 DE102006047911A1 (de) 2006-10-06 2006-10-06 Anordnung zur Aufteilung von Detektionslicht
DE102006047911.4 2006-10-06

Publications (2)

Publication Number Publication Date
WO2008043459A2 WO2008043459A2 (de) 2008-04-17
WO2008043459A3 true WO2008043459A3 (de) 2008-07-10

Family

ID=39154696

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/EP2007/008555 Ceased WO2008043459A2 (de) 2006-10-06 2007-10-02 Anordnung zur aufteilung von detektionslicht

Country Status (2)

Country Link
DE (1) DE102006047911A1 (de)
WO (1) WO2008043459A2 (de)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102008034008B4 (de) 2008-07-21 2010-07-01 Carl Zeiss Surgical Gmbh Filtersatz zur Beobachtung von Fluoreszenzstrahlung in biologischem Gewebe
DE102011083847A1 (de) * 2011-09-30 2013-04-04 Carl Zeiss Microscopy Gmbh Mikroskop für die Weitfeldmikroskopie
DE102018126232B3 (de) * 2018-10-22 2020-03-26 Abberior Instruments Gmbh Scanning-Lichtmikroskop mit verschiedenen Eingängen für Licht unterschiedlicher Wellenlängen zum Abtasten einer Probe
DE102019101773B9 (de) 2019-01-24 2021-11-25 Carl Zeiss Meditec Ag Mikroskopiesystem und Verfahren zum Betreiben eines Mikroskopiesystems

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19702753A1 (de) * 1997-01-27 1998-07-30 Zeiss Carl Jena Gmbh Laser-Scanning-Mikroskop
DE19859314A1 (de) * 1998-12-22 2000-06-29 Zeiss Carl Jena Gmbh Anordnung zur Separierung von Anregungs- und Emissionslicht in einem Mikroskop
US20060077383A1 (en) * 2004-10-12 2006-04-13 Leica Microsystems Cms Gmbh Device for selecting and detecting at least two spectral regions of a light beam

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19702753A1 (de) * 1997-01-27 1998-07-30 Zeiss Carl Jena Gmbh Laser-Scanning-Mikroskop
DE19859314A1 (de) * 1998-12-22 2000-06-29 Zeiss Carl Jena Gmbh Anordnung zur Separierung von Anregungs- und Emissionslicht in einem Mikroskop
US20060077383A1 (en) * 2004-10-12 2006-04-13 Leica Microsystems Cms Gmbh Device for selecting and detecting at least two spectral regions of a light beam

Also Published As

Publication number Publication date
WO2008043459A2 (de) 2008-04-17
DE102006047911A1 (de) 2008-04-10

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