WO2008125532A3 - Verfahren und vorrichtung zur messung eines pegels einer zeitlich veränderlichen elektrischen messgrösse - Google Patents

Verfahren und vorrichtung zur messung eines pegels einer zeitlich veränderlichen elektrischen messgrösse Download PDF

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Publication number
WO2008125532A3
WO2008125532A3 PCT/EP2008/054150 EP2008054150W WO2008125532A3 WO 2008125532 A3 WO2008125532 A3 WO 2008125532A3 EP 2008054150 W EP2008054150 W EP 2008054150W WO 2008125532 A3 WO2008125532 A3 WO 2008125532A3
Authority
WO
WIPO (PCT)
Prior art keywords
measurement variable
level
measuring
over time
changed over
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/EP2008/054150
Other languages
English (en)
French (fr)
Other versions
WO2008125532A2 (de
Inventor
Klaus-Peter Linzmaier
Axel Voges
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens AG
Siemens Corp
Original Assignee
Siemens AG
Siemens Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens AG, Siemens Corp filed Critical Siemens AG
Priority to CN200880019575A priority Critical patent/CN101680772A/zh
Priority to EP08735884A priority patent/EP2137495A2/de
Priority to US12/450,772 priority patent/US20100188070A1/en
Publication of WO2008125532A2 publication Critical patent/WO2008125532A2/de
Publication of WO2008125532A3 publication Critical patent/WO2008125532A3/de
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/04—Measuring peak values or amplitude or envelope of AC or of pulses
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D7/00—Indicating measured values
    • G01D7/005—Indication of measured value by colour change

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Measurement Of Current Or Voltage (AREA)

Abstract

Die Erfindung betrifft ein Verfahren zur Messung eines Pegels einer zeitlich veränderlichen elektrischen Messgröße (M), insbesondere einer elektrischen Spannung (U) oder eines elektrischen Stromes, bei dem ein Messsignal der Messgröße (M) differenziert und ein momentaner Amplitudenwert (AW (n) ) der differenzierten Messgröße (M) ermittelt wird, wobei durch iterative Approximation eines Vergleichswertes (VW (n) ) an den momentanen Amplitudenwert (AW (n) ) ein Pegelwert (PW (n) ) der Messgröße (M) bestimmt wird.
PCT/EP2008/054150 2007-04-13 2008-04-07 Verfahren und vorrichtung zur messung eines pegels einer zeitlich veränderlichen elektrischen messgrösse Ceased WO2008125532A2 (de)

Priority Applications (3)

Application Number Priority Date Filing Date Title
CN200880019575A CN101680772A (zh) 2007-04-13 2008-04-07 用于测量随时间变化的电测量量的电平的方法和装置
EP08735884A EP2137495A2 (de) 2007-04-13 2008-04-07 Verfahren und vorrichtung zur messung eines pegels einer zeitlich veränderlichen elektrischen messgrösse
US12/450,772 US20100188070A1 (en) 2007-04-13 2008-04-07 Method and device for measuring a level of an electric measurement variable that can be changed over time

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102007017895A DE102007017895A1 (de) 2007-04-13 2007-04-13 Verfahren und Vorrichtung zur Messung eines Pegels einer zeitlich veränderlichen elektrischen Messgröße
DE102007017895.8 2007-04-13

Publications (2)

Publication Number Publication Date
WO2008125532A2 WO2008125532A2 (de) 2008-10-23
WO2008125532A3 true WO2008125532A3 (de) 2009-04-30

Family

ID=39767776

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/EP2008/054150 Ceased WO2008125532A2 (de) 2007-04-13 2008-04-07 Verfahren und vorrichtung zur messung eines pegels einer zeitlich veränderlichen elektrischen messgrösse

Country Status (5)

Country Link
US (1) US20100188070A1 (de)
EP (1) EP2137495A2 (de)
CN (1) CN101680772A (de)
DE (1) DE102007017895A1 (de)
WO (1) WO2008125532A2 (de)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102014206812A1 (de) 2014-04-09 2015-10-15 Klaus-Peter Linzmaier Optischer Empfänger mit adaptiver Hysterese

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1271856A (en) * 1968-07-26 1972-04-26 Int Standard Electric Corp Analog to digital converter
US5083282A (en) * 1988-03-31 1992-01-21 Anritsu Corporation Transition state detecting device and measuring device using the same
GB2286885A (en) * 1994-02-17 1995-08-30 Sony Uk Ltd A display device
US6107947A (en) * 1996-11-05 2000-08-22 University College Cork Parallel sigma delta modulator
DE10063102A1 (de) * 1999-12-17 2001-08-23 Infineon Technologies Ag Anordnung und Messung interner Spannungen in einer integrierten Halbleitervorrichtung

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2298633A2 (fr) * 1975-01-22 1976-08-20 Inst Textile De France Dispositif de d
US4213085A (en) * 1978-08-28 1980-07-15 Ramer Daniel J Phase inversion test device
DE2938947A1 (de) * 1979-09-26 1981-04-09 Siemens AG, 1000 Berlin und 8000 München Schaltungsanordnung fuer einen analogvergleicher
US4520270A (en) * 1982-09-30 1985-05-28 Ncr Canada Ltd - Ncr Canada Ltee Self-adjusting sensor controller
US4606435A (en) * 1984-09-10 1986-08-19 General Motors Corporation Brake lining wear sensor and indicator circuit
US4642696A (en) * 1985-07-25 1987-02-10 Rca Corporation Kinescope driver with kinescope current sensing circuit
US4994792A (en) * 1989-12-06 1991-02-19 Ziegler Jr Eldon W Fluid temperature monitoring system
US5373400A (en) * 1993-12-01 1994-12-13 Analog Devices, Inc. Dynamic threshold updating circuit for a maximum likelihood detector using both positive and negative comparators
US6499662B1 (en) * 1998-09-14 2002-12-31 Psc Scanning, Inc. Fast edge detection system tolerant of high degree of intersymbol interference
DE10131635B4 (de) * 2001-06-29 2004-09-30 Infineon Technologies Ag Vorrichtung und Verfahren zur Kalibrierung der Pulsdauer einer Signalquelle
US7135881B2 (en) * 2004-12-21 2006-11-14 Teradyne, Inc. Method and system for producing signals to test semiconductor devices
US7154774B2 (en) * 2005-03-30 2006-12-26 Ovonyx, Inc. Detecting switching of access elements of phase change memory cells
US7221303B1 (en) * 2006-03-24 2007-05-22 Cirrus Logic, Inc. Delta sigma modulator analog-to-digital converters with multiple threshold comparisons during a delta sigma modulator output cycle

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1271856A (en) * 1968-07-26 1972-04-26 Int Standard Electric Corp Analog to digital converter
US5083282A (en) * 1988-03-31 1992-01-21 Anritsu Corporation Transition state detecting device and measuring device using the same
GB2286885A (en) * 1994-02-17 1995-08-30 Sony Uk Ltd A display device
US6107947A (en) * 1996-11-05 2000-08-22 University College Cork Parallel sigma delta modulator
DE10063102A1 (de) * 1999-12-17 2001-08-23 Infineon Technologies Ag Anordnung und Messung interner Spannungen in einer integrierten Halbleitervorrichtung

Also Published As

Publication number Publication date
US20100188070A1 (en) 2010-07-29
WO2008125532A2 (de) 2008-10-23
CN101680772A (zh) 2010-03-24
EP2137495A2 (de) 2009-12-30
DE102007017895A1 (de) 2008-10-23

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