WO2012141908A8 - Dépôt à basse température de films d'oxyde de silicium - Google Patents

Dépôt à basse température de films d'oxyde de silicium Download PDF

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Publication number
WO2012141908A8
WO2012141908A8 PCT/US2012/031122 US2012031122W WO2012141908A8 WO 2012141908 A8 WO2012141908 A8 WO 2012141908A8 US 2012031122 W US2012031122 W US 2012031122W WO 2012141908 A8 WO2012141908 A8 WO 2012141908A8
Authority
WO
WIPO (PCT)
Prior art keywords
silicon oxide
oxide films
low temperature
temperature deposition
wet chemistry
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/US2012/031122
Other languages
English (en)
Other versions
WO2012141908A1 (fr
Inventor
Curtis Dove
Baljit Singh
Eduard Gil Paran TESNADO
Mehdi Balooch
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Asia Union Electronic Chemical Corp
Original Assignee
Asia Union Electronic Chemical Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asia Union Electronic Chemical Corp filed Critical Asia Union Electronic Chemical Corp
Priority to EP12770650.5A priority Critical patent/EP2697826A4/fr
Priority to SG2013074265A priority patent/SG194085A1/en
Publication of WO2012141908A1 publication Critical patent/WO2012141908A1/fr
Publication of WO2012141908A8 publication Critical patent/WO2012141908A8/fr
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/60Formation of materials, e.g. in the shape of layers or pillars of insulating materials
    • H10P14/63Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the formation processes
    • H10P14/6302Non-deposition formation processes
    • H10P14/6304Formation by oxidation, e.g. oxidation of the substrate
    • H10P14/6306Formation by oxidation, e.g. oxidation of the substrate of the semiconductor materials
    • H10P14/6308Formation by oxidation, e.g. oxidation of the substrate of the semiconductor materials of Group IV semiconductors
    • H10P14/6309Formation by oxidation, e.g. oxidation of the substrate of the semiconductor materials of Group IV semiconductors of silicon in uncombined form, i.e. pure silicon
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F71/00Manufacture or treatment of devices covered by this subclass
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00Constructional details of devices covered by this subclass
    • H10F77/30Coatings
    • H10F77/306Coatings for devices having potential barriers
    • H10F77/311Coatings for devices having potential barriers for photovoltaic cells
    • H10F77/315Coatings for devices having potential barriers for photovoltaic cells the coatings being antireflective or having enhancing optical properties
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy

Landscapes

  • Photovoltaic Devices (AREA)
  • Formation Of Insulating Films (AREA)
  • Surface Treatment Of Glass (AREA)
  • Paints Or Removers (AREA)

Abstract

La présente invention concerne le dépôt de films d'oxyde de silicium à basse température en utilisant des techniques chimiques par voie humide. La solution chimique par voie humide peut être un mélange d'hypochlorure de sodium (NaOCl), d'hydroxyde de tétra-méthyl-ammonium (TMAH) et de silicate hydraté, tel que de l'acide silicique. Les films d'oxyde de silicium résultants fournissent d'excellents revêtements anti-réfléchissants pour des cellules solaires et analogues.
PCT/US2012/031122 2011-04-12 2012-03-29 Dépôt à basse température de films d'oxyde de silicium Ceased WO2012141908A1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
EP12770650.5A EP2697826A4 (fr) 2011-04-12 2012-03-29 Dépôt à basse température de films d'oxyde de silicium
SG2013074265A SG194085A1 (en) 2011-04-12 2012-03-29 Low temperature deposition of silicon oxide films

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201161474415P 2011-04-12 2011-04-12
US61/474,415 2011-04-12

Publications (2)

Publication Number Publication Date
WO2012141908A1 WO2012141908A1 (fr) 2012-10-18
WO2012141908A8 true WO2012141908A8 (fr) 2012-11-22

Family

ID=47009645

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2012/031122 Ceased WO2012141908A1 (fr) 2011-04-12 2012-03-29 Dépôt à basse température de films d'oxyde de silicium

Country Status (4)

Country Link
EP (1) EP2697826A4 (fr)
SG (1) SG194085A1 (fr)
TW (1) TW201307610A (fr)
WO (1) WO2012141908A1 (fr)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102013004611B4 (de) * 2013-03-14 2014-12-24 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Beschichtung, Verfahren zu deren Herstellung und ihre Verwendung

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2721632B2 (ja) * 1992-02-25 1998-03-04 松下電工株式会社 回路板の銅回路の処理方法
US5616233A (en) * 1996-05-01 1997-04-01 National Science Council Method for making a fluorinated silicon dioxide layer on silicon substrate by anodic oxidation at room temperature
US20020106865A1 (en) * 2001-02-05 2002-08-08 Tai-Ju Chen Method of forming shallow trench isolation
KR20030023524A (ko) * 2001-09-12 2003-03-19 도요 고세이 고교 가부시키가이샤 투명 실리카피막 형성용 도포용액 및 투명 실리카피막의제조방법
EP1692572A2 (fr) * 2003-10-29 2006-08-23 Mallinckrodt Baker, Inc. Decapants alcalins de restes de gravure et de cendre issus du traitement au plasma et compositions de decapage de resine photosensible contenant des inhibiteurs de corrosion sous forme d'halogenure metallique
KR100971658B1 (ko) * 2008-01-03 2010-07-22 엘지전자 주식회사 실리콘 태양전지의 텍스처링 방법

Also Published As

Publication number Publication date
WO2012141908A1 (fr) 2012-10-18
SG194085A1 (en) 2013-11-29
EP2697826A4 (fr) 2014-10-22
EP2697826A1 (fr) 2014-02-19
TW201307610A (zh) 2013-02-16

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