WO2012157868A3 - 비행시간 기반 질량 분석을 위한 펄싱 클러스터 가스 이온건 - Google Patents
비행시간 기반 질량 분석을 위한 펄싱 클러스터 가스 이온건 Download PDFInfo
- Publication number
- WO2012157868A3 WO2012157868A3 PCT/KR2012/003464 KR2012003464W WO2012157868A3 WO 2012157868 A3 WO2012157868 A3 WO 2012157868A3 KR 2012003464 W KR2012003464 W KR 2012003464W WO 2012157868 A3 WO2012157868 A3 WO 2012157868A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- flight time
- mass analysis
- pulsing
- time based
- ion gun
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/40—Time-of-flight spectrometers
- H01J49/408—Time-of-flight spectrometers with multiple changes of direction, e.g. by using electric or magnetic sectors, closed-loop time-of-flight
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
- H01J49/142—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers using a solid target which is not previously vapourised
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/0004—Imaging particle spectrometry
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
- H01J49/0409—Sample holders or containers
- H01J49/0418—Sample holders or containers for laser desorption, e.g. matrix-assisted laser desorption/ionisation [MALDI] plates or surface enhanced laser desorption/ionisation [SELDI] plates
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/40—Time-of-flight spectrometers
- H01J49/405—Time-of-flight spectrometers characterised by the reflectron, e.g. curved field, electrode shapes
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Optics & Photonics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Abstract
본 발명의 목적은 비행시간 기반으로 질량 분석을 수행함에 있어서 종래에 비해 질량분해능을 훨씬 우수하게 하며, 이에 따라 다양한 약물/대사체/지질/펩타이드/유전자/단백질 등의 분석이 모두 가능하게끔 하는, 비행시간 기반 질량 분석을 위한 펄싱 클러스터 가스 이온건을 제공함에 있다.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020110045272A KR101766637B1 (ko) | 2011-05-13 | 2011-05-13 | 비행시간 기반 질량 분석을 위한 펄싱 클러스터 가스 이온건 |
| KR10-2011-0045272 | 2011-05-13 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| WO2012157868A2 WO2012157868A2 (ko) | 2012-11-22 |
| WO2012157868A3 true WO2012157868A3 (ko) | 2013-01-10 |
Family
ID=47177431
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/KR2012/003464 Ceased WO2012157868A2 (ko) | 2011-05-13 | 2012-05-03 | 비행시간 기반 질량 분석을 위한 펄싱 클러스터 가스 이온건 |
Country Status (2)
| Country | Link |
|---|---|
| KR (1) | KR101766637B1 (ko) |
| WO (1) | WO2012157868A2 (ko) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101616380B1 (ko) * | 2014-06-19 | 2016-04-29 | 한국원자력연구원 | 펄스 발생장치 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0574593A (ja) * | 1991-09-12 | 1993-03-26 | Agency Of Ind Science & Technol | 低エネルギー荷電粒子ビームパルス化装置 |
| KR100232430B1 (ko) * | 1990-08-29 | 1999-12-01 | 제이. 베반 오트 | 성분 분석장치와 방법 |
| JP2008282726A (ja) * | 2007-05-11 | 2008-11-20 | Canon Inc | 飛行時間型2次イオン質量分析装置 |
-
2011
- 2011-05-13 KR KR1020110045272A patent/KR101766637B1/ko not_active Expired - Fee Related
-
2012
- 2012-05-03 WO PCT/KR2012/003464 patent/WO2012157868A2/ko not_active Ceased
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100232430B1 (ko) * | 1990-08-29 | 1999-12-01 | 제이. 베반 오트 | 성분 분석장치와 방법 |
| JPH0574593A (ja) * | 1991-09-12 | 1993-03-26 | Agency Of Ind Science & Technol | 低エネルギー荷電粒子ビームパルス化装置 |
| JP2008282726A (ja) * | 2007-05-11 | 2008-11-20 | Canon Inc | 飛行時間型2次イオン質量分析装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| KR20120127049A (ko) | 2012-11-21 |
| KR101766637B1 (ko) | 2017-08-23 |
| WO2012157868A2 (ko) | 2012-11-22 |
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| Date | Code | Title | Description |
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| NENP | Non-entry into the national phase |
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