WO2017207352A1 - Détection d'erreur sur des broches d'entrée/sortie de circuit intégré - Google Patents

Détection d'erreur sur des broches d'entrée/sortie de circuit intégré Download PDF

Info

Publication number
WO2017207352A1
WO2017207352A1 PCT/EP2017/062409 EP2017062409W WO2017207352A1 WO 2017207352 A1 WO2017207352 A1 WO 2017207352A1 EP 2017062409 W EP2017062409 W EP 2017062409W WO 2017207352 A1 WO2017207352 A1 WO 2017207352A1
Authority
WO
WIPO (PCT)
Prior art keywords
input
value
output
output pin
pin
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/EP2017/062409
Other languages
English (en)
Inventor
Yuhong Fang
Mark CIOLEK
Harshitha GUDIPATI
George Gruev
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Signify Holding BV
Original Assignee
Philips Lighting Holding BV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Lighting Holding BV filed Critical Philips Lighting Holding BV
Priority to US16/305,197 priority Critical patent/US11467211B2/en
Priority to CN201780034306.0A priority patent/CN109564265B/zh
Priority to EP17724389.6A priority patent/EP3465239B1/fr
Publication of WO2017207352A1 publication Critical patent/WO2017207352A1/fr
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31905—Interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31926—Routing signals to or from the device under test [DUT], e.g. switch matrix, pin multiplexing
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B45/00—Circuit arrangements for operating light-emitting diodes [LED]
    • H05B45/50—Circuit arrangements for operating light-emitting diodes [LED] responsive to malfunctions or undesirable behaviour of LEDs; responsive to LED life; Protective circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/64—Testing of capacitors
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B41/00—Circuit arrangements or apparatus for igniting or operating discharge lamps
    • H05B41/14—Circuit arrangements
    • H05B41/26—Circuit arrangements in which the lamp is fed by power derived from DC by means of a converter, e.g. by high-voltage DC
    • H05B41/28—Circuit arrangements in which the lamp is fed by power derived from DC by means of a converter, e.g. by high-voltage DC using static converters
    • H05B41/282—Circuit arrangements in which the lamp is fed by power derived from DC by means of a converter, e.g. by high-voltage DC using static converters with semiconductor devices
    • H05B41/285—Arrangements for protecting lamps or circuits against abnormal operating conditions
    • H05B41/2851—Arrangements for protecting lamps or circuits against abnormal operating conditions for protecting the circuit against abnormal operating conditions

Definitions

  • dedicated hardware implementations such as application-specific integrated circuits (ASICs), programmable logic arrays and other hardware components, can be constructed to implement one or more of the methods described herein.
  • ASICs application-specific integrated circuits
  • One or more embodiments described herein may implement functions using two or more specific interconnected hardware modules or devices with related control and data signals that can be communicated between and through the modules. Accordingly, the present disclosure encompasses software, firmware, and hardware implementations. None in the present application should be interpreted as being implemented or
  • Providing a second, disparate value at S620 may be performed in several different ways. For instance, value set by a received signal may be identified, so that the pin can be set with a different level at S620. Alternatively, a previous value set for an input/output pin configured for output may be considered a first value, and the second, disparate value may be set to ensure that the pin is not stuck at the previous (first) level.

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Analogue/Digital Conversion (AREA)

Abstract

La présente invention concerne un procédé de détection d'erreur sur une broche d'entrée/sortie (ES) d'un circuit intégré qui comprend l'utilisation de la broche d'entrée/sortie du circuit intégré dans un premier mode par réception ou envoi d'une première valeur sous forme de donnée analogique ou donnée numérique. La broche d'entrée/sortie est basculée dans un mode de test après chaque instance d'utilisation de la broche d'entrée/sortie dans le premier mode. Le mode de test comprend la fourniture d'une deuxième valeur distincte de la première valeur pendant un temps défini après l'utilisation de la broche d'entrée/sortie dans le premier mode, la réception en retour, pendant le temps défini, d'une valeur résultante sur la base de la fourniture de la deuxième valeur, la mesure de la valeur résultante, et l'identification d'une erreur sur la broche d'entrée/sortie du circuit intégré sur la base de la valeur résultante mesurée.
PCT/EP2017/062409 2016-06-01 2017-05-23 Détection d'erreur sur des broches d'entrée/sortie de circuit intégré Ceased WO2017207352A1 (fr)

Priority Applications (3)

Application Number Priority Date Filing Date Title
US16/305,197 US11467211B2 (en) 2016-06-01 2017-05-23 Error detection on integrated circuit input/output pins
CN201780034306.0A CN109564265B (zh) 2016-06-01 2017-05-23 集成电路输入/输出引脚上的错误检测
EP17724389.6A EP3465239B1 (fr) 2016-06-01 2017-05-23 Circuit intégré de détection d'erreur sur des broches d'entrée/sortie

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US201662343998P 2016-06-01 2016-06-01
US62/343998 2016-06-01
EP16174882.7 2016-06-17
EP16174882 2016-06-17

Publications (1)

Publication Number Publication Date
WO2017207352A1 true WO2017207352A1 (fr) 2017-12-07

Family

ID=56137165

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/EP2017/062409 Ceased WO2017207352A1 (fr) 2016-06-01 2017-05-23 Détection d'erreur sur des broches d'entrée/sortie de circuit intégré

Country Status (1)

Country Link
WO (1) WO2017207352A1 (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111736057A (zh) * 2020-06-12 2020-10-02 青岛地铁集团有限公司运营分公司 一种集成电路板的在线检测装置

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4459693A (en) * 1982-01-26 1984-07-10 Genrad, Inc. Method of and apparatus for the automatic diagnosis of the failure of electrical devices connected to common bus nodes and the like
JPH07113850A (ja) * 1993-10-19 1995-05-02 Matsushita Electric Ind Co Ltd 半導体集積回路
US20020135391A1 (en) * 2001-03-21 2002-09-26 Rearick Jeffrey R. Systems and methods for facilitating testing of pad receivers of integrated circuits
US20070143047A1 (en) * 2005-11-24 2007-06-21 Rearick Jeffrey R Testing target resistances in circuit assemblies
US20080265262A1 (en) * 2007-04-26 2008-10-30 General Electric Company Methods and systems for testing a functional status of a light unit
US20100045328A1 (en) * 2008-08-25 2010-02-25 Freescale Semiconductor, Inc Circuit for detecting bonding defect in multi-bonding wire
US20110148429A1 (en) * 2009-12-21 2011-06-23 Minemier Ronald K DC Testing Integrated Circuits
US20110187384A1 (en) * 2010-02-02 2011-08-04 Stmicroelectronics S.R.L. Electrical interconnection integrated device with fault detecting module and electronic apparatus comprising the device
US20110234105A1 (en) * 2010-03-23 2011-09-29 Stmicroelectronics S.R.I. Automatic method to detect short and open conditions on the outputs of a led driver device
US20120235585A1 (en) * 2009-11-19 2012-09-20 Koninklijke Philips Electronics, N.V. Method and apparatus selectively determining universal voltage input for solid state light fixtures

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4459693A (en) * 1982-01-26 1984-07-10 Genrad, Inc. Method of and apparatus for the automatic diagnosis of the failure of electrical devices connected to common bus nodes and the like
JPH07113850A (ja) * 1993-10-19 1995-05-02 Matsushita Electric Ind Co Ltd 半導体集積回路
US20020135391A1 (en) * 2001-03-21 2002-09-26 Rearick Jeffrey R. Systems and methods for facilitating testing of pad receivers of integrated circuits
US20070143047A1 (en) * 2005-11-24 2007-06-21 Rearick Jeffrey R Testing target resistances in circuit assemblies
US20080265262A1 (en) * 2007-04-26 2008-10-30 General Electric Company Methods and systems for testing a functional status of a light unit
US20100045328A1 (en) * 2008-08-25 2010-02-25 Freescale Semiconductor, Inc Circuit for detecting bonding defect in multi-bonding wire
US20120235585A1 (en) * 2009-11-19 2012-09-20 Koninklijke Philips Electronics, N.V. Method and apparatus selectively determining universal voltage input for solid state light fixtures
US20110148429A1 (en) * 2009-12-21 2011-06-23 Minemier Ronald K DC Testing Integrated Circuits
US20110187384A1 (en) * 2010-02-02 2011-08-04 Stmicroelectronics S.R.L. Electrical interconnection integrated device with fault detecting module and electronic apparatus comprising the device
US20110234105A1 (en) * 2010-03-23 2011-09-29 Stmicroelectronics S.R.I. Automatic method to detect short and open conditions on the outputs of a led driver device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111736057A (zh) * 2020-06-12 2020-10-02 青岛地铁集团有限公司运营分公司 一种集成电路板的在线检测装置

Similar Documents

Publication Publication Date Title
US10258267B2 (en) Pulse oximeter with an accelerometer
JP4942756B2 (ja) 故障検出装置、故障検出方法、および故障検出プログラム
US9476937B2 (en) Debug circuit for an integrated circuit
US9773358B2 (en) Device and method for detecting faults in electronic systems
RU2014139956A (ru) Многоканальный гамма-контроллер
JP2014504772A5 (fr)
US20150286607A1 (en) Determination of the state of an i2c bus
US9970982B2 (en) Apparatus and a method for providing an output parameter and a sensor device
JP2013192012A (ja) ネットワークシステムおよびネットワークシステムにおける識別情報の設定方法
WO2017207352A1 (fr) Détection d'erreur sur des broches d'entrée/sortie de circuit intégré
EP3465239B1 (fr) Circuit intégré de détection d'erreur sur des broches d'entrée/sortie
JP2016166860A5 (fr)
TW202014714A (zh) 補償讀取錯誤
TWI432749B (zh) 天線偵測模組及其電子裝置
CN108122363B (zh) 用于烟雾报警的集成电路及系统
US10529506B2 (en) Electronic apparatus comprising a linear keypad
TWI499153B (zh) 電源等級識別電路、標示電路與電源等級供電系統
ES2607132T3 (es) Regulador integrado, en particular regulador de tensión, y aparato de control para medios de protección de personas con tensión de salida configurable
CN117639841A (zh) 可重新配置传感器设备和用于重新配置传感器设备的方法
US9547476B2 (en) Semiconductor-junction-derived random number generation with triggering mechanism
JP5022343B2 (ja) 物理量検出システム
KR101977955B1 (ko) 마이크로컨트롤러 유닛 감시 장치 및 방법
US12243595B2 (en) Solid-state drive controller and circuit controller
US10008284B2 (en) Semiconductor device including an interface arranged to perform external data communications
US10536141B2 (en) Semiconductor device

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 17724389

Country of ref document: EP

Kind code of ref document: A1

NENP Non-entry into the national phase

Ref country code: DE

ENP Entry into the national phase

Ref document number: 2017724389

Country of ref document: EP

Effective date: 20190102