ATE114370T1 - Vorrichtung und verfahren zur metallanalyse. - Google Patents

Vorrichtung und verfahren zur metallanalyse.

Info

Publication number
ATE114370T1
ATE114370T1 AT90109244T AT90109244T ATE114370T1 AT E114370 T1 ATE114370 T1 AT E114370T1 AT 90109244 T AT90109244 T AT 90109244T AT 90109244 T AT90109244 T AT 90109244T AT E114370 T1 ATE114370 T1 AT E114370T1
Authority
AT
Austria
Prior art keywords
fluorescence
analysis
ray
measurement point
elements
Prior art date
Application number
AT90109244T
Other languages
English (en)
Inventor
Yasumasa C O Chuo-Kenky Sayama
Kitabukuro-Cho
Koichi C O Mitsubishi K Nomura
Morihiko C O Naoshima- Iwasaki
Naoshima-Cho
Original Assignee
Mitsubishi Materials Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Materials Corp filed Critical Mitsubishi Materials Corp
Application granted granted Critical
Publication of ATE114370T1 publication Critical patent/ATE114370T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating Or Analyzing Non-Biological Materials By The Use Of Chemical Means (AREA)
AT90109244T 1989-05-16 1990-05-16 Vorrichtung und verfahren zur metallanalyse. ATE114370T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12263289 1989-05-16

Publications (1)

Publication Number Publication Date
ATE114370T1 true ATE114370T1 (de) 1994-12-15

Family

ID=14840777

Family Applications (1)

Application Number Title Priority Date Filing Date
AT90109244T ATE114370T1 (de) 1989-05-16 1990-05-16 Vorrichtung und verfahren zur metallanalyse.

Country Status (8)

Country Link
US (1) US5062127A (de)
EP (1) EP0400396B1 (de)
JP (1) JP2853261B2 (de)
KR (1) KR960006366B1 (de)
AT (1) ATE114370T1 (de)
CA (1) CA2016778A1 (de)
DE (1) DE69014233T2 (de)
HK (1) HK4596A (de)

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JP3921872B2 (ja) * 1999-05-20 2007-05-30 株式会社島津製作所 蛍光ｘ線分析用データ処理装置
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SE529264C2 (sv) * 2006-04-28 2007-06-12 Xrf Analytical Ab Förfarande vid spektrometri för undersökning av prover, där provet innehåller åtminstone två grundämnen
JP4848846B2 (ja) * 2006-06-02 2011-12-28 大同特殊鋼株式会社 携帯ｘ線分析装置を用いた鋼材の流通チェック方法及びチェック装置
JP4930874B2 (ja) * 2006-06-22 2012-05-16 エスアイアイ・ナノテクノロジー株式会社 エネルギー分散型放射線検出システム及び対象元素の含有量測定方法
JP2008203245A (ja) * 2007-01-23 2008-09-04 Sii Nanotechnology Inc Ｘ線分析装置及びｘ線分析方法
JP5350604B2 (ja) * 2007-05-16 2013-11-27 スパンション エルエルシー 半導体装置及びその製造方法
JP2008286735A (ja) * 2007-05-21 2008-11-27 Jeol Ltd 蛍光ｘ線分析装置のｅｄｓヘッド保護方法及び保護機構
US8918290B2 (en) * 2007-08-27 2014-12-23 Key To Metals Ag Method and system to identify metal alloys
BRPI0706233B1 (pt) * 2007-10-31 2018-07-24 Universidade Federal Da Bahia "métodos para determinação do teor de elementos leves em aços e ligas".
JP5269521B2 (ja) * 2008-08-22 2013-08-21 株式会社日立ハイテクサイエンス Ｘ線分析装置及びｘ線分析方法
SE533452C2 (sv) * 2009-01-19 2010-10-05 Xrf Analytical Ab Förfarande vid spektrometri för undersökning av prover innehållande åtminstone två grundämnen
CN102414556B (zh) * 2009-04-30 2015-09-02 赛默科技便携式分析仪器有限公司 利用具有不同检验体积的xrf分析对关注元素定位
CN101718721B (zh) * 2009-11-10 2011-08-10 天津出入境检验检疫局化矿金属材料检测中心 重金属精矿与冶炼渣属性鉴别方法
CN102739831B (zh) * 2011-03-31 2016-04-06 富泰华工业（深圳）有限公司 具物质纯度检测功能的移动电话及其检测物质纯度的方法
US20130202083A1 (en) * 2012-02-03 2013-08-08 Stanislaw Piorek System and method for identification of counterfeit gold jewelry using xrf
US8532256B1 (en) 2012-03-05 2013-09-10 Bobby D. Jeter Method and apparatus for the automated assay and valuation of precious metal objects
JP6036321B2 (ja) * 2012-03-23 2016-11-30 株式会社リガク Ｘ線複合装置
JP6266914B2 (ja) * 2013-08-01 2018-01-24 田中貴金属工業株式会社 蛍光ｘ線分析装置を用いた貴金属製品の分析方法、及び、貴金属製品分析用のコンピュータプログラム
US9575018B2 (en) * 2013-09-16 2017-02-21 Cerium Laboratories, Llc System and method for testing ceramic coatings
JP6305247B2 (ja) * 2014-06-13 2018-04-04 株式会社日立ハイテクサイエンス 蛍光ｘ線分析装置
WO2017026200A1 (ja) * 2015-08-10 2017-02-16 株式会社リガク 蛍光ｘ線分析装置
CN107923859B (zh) 2015-08-28 2018-12-21 株式会社理学 荧光x射线分析装置
JP6528279B2 (ja) * 2015-09-25 2019-06-12 清水建設株式会社 コンクリート中の微量元素の分析方法および分析装置
CN106706691A (zh) * 2017-01-06 2017-05-24 中冶华天工程技术有限公司 便携式x射线荧光光谱法重金属检测种类判断方法
EP3598116B1 (de) * 2017-03-15 2021-07-21 Rigaku Corporation Röntgenfluoreszenzanalyseverfahren, röntgenfluoreszenzanalyseprogramm und röntgenfluoreszenzspektrometer
RU2662049C1 (ru) * 2017-07-13 2018-07-23 федеральное государственное бюджетное образовательное учреждение высшего образования "Алтайский государственный университет" Способ рентгенофлуоресцентного определения золота
EP3553508B1 (de) * 2018-04-13 2025-04-02 Malvern Panalytical B.V. Röntgenanalysevorrichtung und -verfahren
CN110530912B (zh) * 2019-09-12 2022-01-04 岛津企业管理（中国）有限公司 一种含镀层贵金属成分的x射线荧光光谱分析方法
CN112986298B (zh) * 2021-02-06 2023-10-10 钢研纳克检测技术股份有限公司 一种单晶高温合金枝晶组织原位统计分布表征方法
CN113049621B (zh) * 2021-03-19 2023-02-28 钢研纳克检测技术股份有限公司 一种高温合金铸锭枝晶偏析和枝晶间距定量表征方法
US20250244265A1 (en) * 2024-01-30 2025-07-31 Thermo Scientific Portable Analytical Instruments Systems and methods for adjustment of xrf analysis strategy

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Also Published As

Publication number Publication date
DE69014233D1 (de) 1995-01-05
EP0400396A3 (de) 1991-03-20
JP2853261B2 (ja) 1999-02-03
EP0400396B1 (de) 1994-11-23
DE69014233T2 (de) 1995-05-04
US5062127A (en) 1991-10-29
EP0400396A2 (de) 1990-12-05
KR960006366B1 (ko) 1996-05-15
HK4596A (en) 1996-01-19
KR900018665A (ko) 1990-12-22
JPH0373834A (ja) 1991-03-28
CA2016778A1 (en) 1990-11-16

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Legal Events

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UEP Publication of translation of european patent specification
REN Ceased due to non-payment of the annual fee