ATE114386T1 - Halbleiterheterostruktur. - Google Patents

Halbleiterheterostruktur.

Info

Publication number
ATE114386T1
ATE114386T1 AT89901135T AT89901135T ATE114386T1 AT E114386 T1 ATE114386 T1 AT E114386T1 AT 89901135 T AT89901135 T AT 89901135T AT 89901135 T AT89901135 T AT 89901135T AT E114386 T1 ATE114386 T1 AT E114386T1
Authority
AT
Austria
Prior art keywords
layers
heterosstructure
semiconductor
monolayers
silicon
Prior art date
Application number
AT89901135T
Other languages
English (en)
Inventor
Michael Anthony Gell
Original Assignee
British Telecomm
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from GB878729953A external-priority patent/GB8729953D0/en
Priority claimed from GB888807350A external-priority patent/GB8807350D0/en
Priority claimed from GB888817884A external-priority patent/GB8817884D0/en
Priority claimed from GB888820150A external-priority patent/GB8820150D0/en
Application filed by British Telecomm filed Critical British Telecomm
Application granted granted Critical
Publication of ATE114386T1 publication Critical patent/ATE114386T1/de

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/80Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
    • H10D62/81Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials of structures exhibiting quantum-confinement effects, e.g. single quantum wells; of structures having periodic or quasi-periodic potential variation
    • H10D62/815Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials of structures exhibiting quantum-confinement effects, e.g. single quantum wells; of structures having periodic or quasi-periodic potential variation of structures having periodic or quasi-periodic potential variation, e.g. superlattices or multiple quantum wells [MQW]
    • H10D62/8161Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials of structures exhibiting quantum-confinement effects, e.g. single quantum wells; of structures having periodic or quasi-periodic potential variation of structures having periodic or quasi-periodic potential variation, e.g. superlattices or multiple quantum wells [MQW] potential variation due to variations in composition or crystallinity, e.g. heterojunction superlattices
    • H10D62/8162Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials of structures exhibiting quantum-confinement effects, e.g. single quantum wells; of structures having periodic or quasi-periodic potential variation of structures having periodic or quasi-periodic potential variation, e.g. superlattices or multiple quantum wells [MQW] potential variation due to variations in composition or crystallinity, e.g. heterojunction superlattices having quantum effects only in the vertical direction, i.e. layered structures having quantum effects solely resulting from vertical potential variation
    • H10D62/8164Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials of structures exhibiting quantum-confinement effects, e.g. single quantum wells; of structures having periodic or quasi-periodic potential variation of structures having periodic or quasi-periodic potential variation, e.g. superlattices or multiple quantum wells [MQW] potential variation due to variations in composition or crystallinity, e.g. heterojunction superlattices having quantum effects only in the vertical direction, i.e. layered structures having quantum effects solely resulting from vertical potential variation comprising only semiconductor materials 

Landscapes

  • Recrystallisation Techniques (AREA)
  • Led Devices (AREA)
  • Light Receiving Elements (AREA)
  • Heterocyclic Carbon Compounds Containing A Hetero Ring Having Oxygen Or Sulfur (AREA)
  • Bipolar Transistors (AREA)
  • Thin Film Transistor (AREA)
AT89901135T 1987-12-23 1988-12-22 Halbleiterheterostruktur. ATE114386T1 (de)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
GB878729953A GB8729953D0 (en) 1987-12-23 1987-12-23 Semiconductor heterostructures
GB888807350A GB8807350D0 (en) 1988-03-28 1988-03-28 Semiconductor heterostructures
GB888817884A GB8817884D0 (en) 1988-07-27 1988-07-27 Semiconductor heterostructures
GB888820150A GB8820150D0 (en) 1988-08-25 1988-08-25 Semiconductor heterostructures

Publications (1)

Publication Number Publication Date
ATE114386T1 true ATE114386T1 (de) 1994-12-15

Family

ID=27450021

Family Applications (1)

Application Number Title Priority Date Filing Date
AT89901135T ATE114386T1 (de) 1987-12-23 1988-12-22 Halbleiterheterostruktur.

Country Status (9)

Country Link
US (1) US4959694A (de)
EP (1) EP0393135B1 (de)
JP (1) JP2740029B2 (de)
CN (1) CN1013536B (de)
AT (1) ATE114386T1 (de)
CA (1) CA1301957C (de)
DE (1) DE3852180T2 (de)
HK (1) HK137996A (de)
WO (1) WO1989006050A1 (de)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5266813A (en) * 1992-01-24 1993-11-30 International Business Machines Corporation Isolation technique for silicon germanium devices
US5244749A (en) * 1992-08-03 1993-09-14 At&T Bell Laboratories Article comprising an epitaxial multilayer mirror
US6664115B2 (en) * 1992-10-23 2003-12-16 Symetrix Corporation Metal insulator structure with polarization-compatible buffer layer
US5357119A (en) * 1993-02-19 1994-10-18 Board Of Regents Of The University Of California Field effect devices having short period superlattice structures using Si and Ge
US5329257A (en) * 1993-04-30 1994-07-12 International Business Machines Corproation SiGe transferred electron device and oscillator using same
US5298457A (en) * 1993-07-01 1994-03-29 G. I. Corporation Method of making semiconductor devices using epitaxial techniques to form Si/Si-Ge interfaces and inverting the material
US5685946A (en) * 1993-08-11 1997-11-11 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Method of producing buried porous silicon-geramanium layers in monocrystalline silicon lattices
US5917195A (en) * 1995-02-17 1999-06-29 B.A. Painter, Iii Phonon resonator and method for its production
DE19714054A1 (de) * 1997-04-05 1998-10-08 Daimler Benz Ag SiGe-Photodetektor mit hohem Wirkungsgrad
US6154475A (en) * 1997-12-04 2000-11-28 The United States Of America As Represented By The Secretary Of The Air Force Silicon-based strain-symmetrized GE-SI quantum lasers
JP5066321B2 (ja) 2000-08-04 2012-11-07 台湾積體電路製造股▲ふん▼有限公司 モノリシックoeic用埋め込み光電子材料を備えたシリコンウエハ
US6734453B2 (en) 2000-08-08 2004-05-11 Translucent Photonics, Inc. Devices with optical gain in silicon
US6528827B2 (en) 2000-11-10 2003-03-04 Optolynx, Inc. MSM device and method of manufacturing same
WO2003036698A2 (en) * 2001-10-26 2003-05-01 Sige Semiconductor Inc. Method of depositing high-quality sige on sige substrates
US7271458B2 (en) * 2002-04-15 2007-09-18 The Board Of Trustees Of The Leland Stanford Junior University High-k dielectric for thermodynamically-stable substrate-type materials
WO2003096390A1 (en) * 2002-04-15 2003-11-20 Stanford University High-k dielectric for thermodynamically-stable substrate-type materials
ATE365382T1 (de) * 2002-11-29 2007-07-15 Max Planck Gesellschaft Halbleiterstruktur für infrarotbereich und herstellungsverfahren
US6878576B1 (en) * 2003-06-26 2005-04-12 Rj Mears, Llc Method for making semiconductor device including band-engineered superlattice
US20090166770A1 (en) * 2008-01-02 2009-07-02 International Business Machines Corporation Method of fabricating gate electrode for gate of mosfet and structure thereof
CN105429001B (zh) * 2015-10-27 2019-06-25 西安电子科技大学 Si/Ge超晶格量子级联激光器及其制备方法
CN115537916B (zh) * 2022-10-13 2024-07-16 上海理工大学 一种iv族直接带隙半导体超晶格材料及其应用

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3626257A (en) * 1969-04-01 1971-12-07 Ibm Semiconductor device with superlattice region
DE2139436A1 (de) * 1971-08-06 1973-02-22 Licentia Gmbh Halbleiterlaser
NL8301215A (nl) * 1983-04-07 1984-11-01 Philips Nv Halfgeleiderinrichting voor het opwekken van electromagnetische straling.
JPS6028268A (ja) * 1983-07-26 1985-02-13 Agency Of Ind Science & Technol 半導体装置
US4529455A (en) * 1983-10-28 1985-07-16 At&T Bell Laboratories Method for epitaxially growing Gex Si1-x layers on Si utilizing molecular beam epitaxy
US4661829A (en) * 1985-06-05 1987-04-28 American Telephone And Telegraph Company, At&T Bell Laboratories Device using ordered semiconductor alloy
CA1282671C (en) * 1985-11-18 1991-04-09 John Condon Bean Device having strain induced region
US4814837A (en) * 1986-03-13 1989-03-21 The United States Of America As Represented By The Secretary Of The Navy Quantum well electron barrier diode

Also Published As

Publication number Publication date
WO1989006050A1 (en) 1989-06-29
JP2740029B2 (ja) 1998-04-15
US4959694A (en) 1990-09-25
EP0393135B1 (de) 1994-11-23
JPH03503343A (ja) 1991-07-25
CN1035585A (zh) 1989-09-13
EP0393135A1 (de) 1990-10-24
DE3852180D1 (de) 1995-01-05
CN1013536B (zh) 1991-08-14
CA1301957C (en) 1992-05-26
DE3852180T2 (de) 1995-04-06
HK137996A (en) 1996-08-02

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