ATE177877T1 - Bromine-ätzverfahren für silizium - Google Patents

Bromine-ätzverfahren für silizium

Info

Publication number
ATE177877T1
ATE177877T1 AT87311196T AT87311196T ATE177877T1 AT E177877 T1 ATE177877 T1 AT E177877T1 AT 87311196 T AT87311196 T AT 87311196T AT 87311196 T AT87311196 T AT 87311196T AT E177877 T1 ATE177877 T1 AT E177877T1
Authority
AT
Austria
Prior art keywords
silicon
etching process
gas chemistry
iodide gas
bromine
Prior art date
Application number
AT87311196T
Other languages
English (en)
Inventor
Jerry Yuen Kui Wong
Mei Chang
Dan Maydan
David Nin-Kou Wang
Alfred W S Mak
Original Assignee
Applied Materials Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=25481506&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=ATE177877(T1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Applied Materials Inc filed Critical Applied Materials Inc
Application granted granted Critical
Publication of ATE177877T1 publication Critical patent/ATE177877T1/de

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P50/00—Etching of wafers, substrates or parts of devices
    • H10P50/20—Dry etching; Plasma etching; Reactive-ion etching
    • H10P50/26—Dry etching; Plasma etching; Reactive-ion etching of conductive or resistive materials
    • H10P50/264—Dry etching; Plasma etching; Reactive-ion etching of conductive or resistive materials by chemical means
    • H10P50/266—Dry etching; Plasma etching; Reactive-ion etching of conductive or resistive materials by chemical means by vapour etching only
    • H10P50/267—Dry etching; Plasma etching; Reactive-ion etching of conductive or resistive materials by chemical means by vapour etching only using plasmas
    • H10P50/268—Dry etching; Plasma etching; Reactive-ion etching of conductive or resistive materials by chemical means by vapour etching only using plasmas of silicon-containing layers
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P50/00—Etching of wafers, substrates or parts of devices
    • H10P50/20—Dry etching; Plasma etching; Reactive-ion etching
    • H10P50/24—Dry etching; Plasma etching; Reactive-ion etching of semiconductor materials
    • H10P50/242—Dry etching; Plasma etching; Reactive-ion etching of semiconductor materials of Group IV materials
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W10/00—Isolation regions in semiconductor bodies between components of integrated devices
    • H10W10/01—Manufacture or treatment
    • H10W10/011—Manufacture or treatment of isolation regions comprising dielectric materials
    • H10W10/014—Manufacture or treatment of isolation regions comprising dielectric materials using trench refilling with dielectric materials, e.g. shallow trench isolations
    • H10W10/0145—Manufacture or treatment of isolation regions comprising dielectric materials using trench refilling with dielectric materials, e.g. shallow trench isolations of trenches having shapes other than rectangular or V-shape
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W10/00—Isolation regions in semiconductor bodies between components of integrated devices
    • H10W10/10—Isolation regions comprising dielectric materials
    • H10W10/17—Isolation regions comprising dielectric materials formed using trench refilling with dielectric materials, e.g. shallow trench isolations

Landscapes

  • Drying Of Semiconductors (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
  • Silicon Compounds (AREA)
  • Weting (AREA)
AT87311196T 1986-12-19 1987-12-18 Bromine-ätzverfahren für silizium ATE177877T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US94449186A 1986-12-19 1986-12-19

Publications (1)

Publication Number Publication Date
ATE177877T1 true ATE177877T1 (de) 1999-04-15

Family

ID=25481506

Family Applications (1)

Application Number Title Priority Date Filing Date
AT87311196T ATE177877T1 (de) 1986-12-19 1987-12-18 Bromine-ätzverfahren für silizium

Country Status (5)

Country Link
US (2) US5874362A (de)
EP (2) EP0565212A2 (de)
JP (1) JPH0793291B2 (de)
AT (1) ATE177877T1 (de)
DE (1) DE3752259T2 (de)

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Also Published As

Publication number Publication date
EP0565212A2 (de) 1993-10-13
JPS63278339A (ja) 1988-11-16
DE3752259T2 (de) 1999-10-14
DE3752259D1 (de) 1999-04-22
EP0272143A2 (de) 1988-06-22
EP0272143B1 (de) 1999-03-17
US5874362A (en) 1999-02-23
EP0565212A3 (de) 1994-01-26
US6020270A (en) 2000-02-01
EP0272143A3 (de) 1990-09-05
JPH0793291B2 (ja) 1995-10-09

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