ATE212716T1 - Elketrostatischer haftfestigkeitsprüfer für dünnschichtleiter - Google Patents

Elketrostatischer haftfestigkeitsprüfer für dünnschichtleiter

Info

Publication number: ATE212716T1
Authority: AT; Austria
Prior art keywords: thin film; film conductor; adhesion tester; conducting portion; adhesion
Prior art date: 1997-03-31

Application number

AT98914398T

Other languages

English (en)

Inventor

Alfred J Griffin Jr

Franz R Brotzen

Daniel L Callahan

Haining S Yang

Original Assignee

Rice University

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1997-03-31

Filing date

1998-03-31

Publication date

2002-02-15

1998-01-20 Priority claimed from US09/008,969 external-priority patent/US6002259A/en

1998-03-31 Application filed by Rice University filed Critical Rice University

2002-02-15 Application granted granted Critical

2002-02-15 Publication of ATE212716T1 publication Critical patent/ATE212716T1/de

Links

239000004020 conductor Substances 0.000 title abstract 10
239000010409 thin film Substances 0.000 title abstract 10
230000008878 coupling Effects 0.000 abstract 2
238000010168 coupling process Methods 0.000 abstract 2
238000005859 coupling reaction Methods 0.000 abstract 2
230000005684 electric field Effects 0.000 abstract 2
239000000758 substrate Substances 0.000 abstract 1

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N19/00—Investigating materials by mechanical methods
- G01N19/04—Measuring adhesive force between materials, e.g. of sealing tape, of coating
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/003—Generation of the force
- G01N2203/005—Electromagnetic means

Landscapes

Immunology (AREA)
Pathology (AREA)
Life Sciences & Earth Sciences (AREA)
Chemical & Material Sciences (AREA)
Analytical Chemistry (AREA)
Biochemistry (AREA)
Health & Medical Sciences (AREA)
General Health & Medical Sciences (AREA)
Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
Testing Or Measuring Of Semiconductors Or The Like (AREA)
Adhesives Or Adhesive Processes (AREA)
Preparing Plates And Mask In Photomechanical Process (AREA)
Paints Or Removers (AREA)
Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)

AT98914398T 1997-03-31 1998-03-31 Elketrostatischer haftfestigkeitsprüfer für dünnschichtleiter ATE212716T1 (de)

Applications Claiming Priority (3)

Application Number	Priority Date	Filing Date	Title
US4224397P	1997-03-31	1997-03-31
US09/008,969 US6002259A (en)	1998-01-20	1998-01-20	Electrostatic adhesion tester for thin film conductors
PCT/US1998/006424 WO1998044334A1 (en)	1997-03-31	1998-03-31	Electrostatic adhesion tester for thin film conductors

Publications (1)

Publication Number	Publication Date
ATE212716T1 true ATE212716T1 (de)	2002-02-15

Family

ID=26678856

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
AT98914398T ATE212716T1 (de)	1997-03-31	1998-03-31	Elketrostatischer haftfestigkeitsprüfer für dünnschichtleiter

Country Status (8)

Country	Link
EP (1)	EP0972182B1 (de)
JP (1)	JP2001524209A (de)
KR (1)	KR20010005829A (de)
CN (1)	CN1254414A (de)
AT (1)	ATE212716T1 (de)
CA (1)	CA2284831A1 (de)
DE (1)	DE69803660T2 (de)
WO (1)	WO1998044334A1 (de)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
CN101827103B (zh)	2004-03-10	2012-07-04	高通股份有限公司	具有改进链路同步的高数据速率接口
RU2377335C1 (ru) *	2008-10-14	2009-12-27	Государственное образовательное учреждение высшего профессионального образования "Российский химико-технологический университет им. Д.И. Менделеева" (РХТУ им. Д.И. Менделеева)	Способ получения высокопористого полимерного материала
JP2020521132A (ja) *	2017-05-25	2020-07-16	コーニングインコーポレイテッド	平面間の付着力を測定するための方法及び装置
CN115586132A (zh) *	2021-07-06	2023-01-10	浙江辉柯纸塑制品有限公司	一种静电膜贴吸附效应的试验方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
SU1310699A1 (ru) *	1985-10-16	1987-05-15	Гомельский политехнический институт	Способ определени адгезии металлической пленки к диэлектрической подложке
SU1627931A1 (ru) *	1988-11-16	1991-02-15	Предприятие П/Я Г-4671	Устройство дл испытани на адгезию токопровод щих пленок на диэлектрических подложках
JP2566496B2 (ja) *	1991-10-07	1996-12-25	株式会社東洋精機製作所	粘着応用製品の性能評価装置

1998
- 1998-03-31 WO PCT/US1998/006424 patent/WO1998044334A1/en not_active Ceased
- 1998-03-31 AT AT98914398T patent/ATE212716T1/de not_active IP Right Cessation
- 1998-03-31 EP EP98914398A patent/EP0972182B1/de not_active Expired - Lifetime
- 1998-03-31 CN CN98804632A patent/CN1254414A/zh active Pending
- 1998-03-31 KR KR1019997008903A patent/KR20010005829A/ko not_active Withdrawn
- 1998-03-31 JP JP54196498A patent/JP2001524209A/ja active Pending
- 1998-03-31 DE DE69803660T patent/DE69803660T2/de not_active Expired - Fee Related
- 1998-03-31 CA CA002284831A patent/CA2284831A1/en not_active Abandoned

Also Published As

Publication number	Publication date
DE69803660D1 (de)	2002-03-14
JP2001524209A (ja)	2001-11-27
KR20010005829A (ko)	2001-01-15
WO1998044334A1 (en)	1998-10-08
DE69803660T2 (de)	2002-10-17
EP0972182A1 (de)	2000-01-19
EP0972182B1 (de)	2002-01-30
CA2284831A1 (en)	1998-10-08
CN1254414A (zh)	2000-05-24

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Legal Events

Date	Code	Title	Description
2002-07-15	RER	Ceased as to paragraph 5 lit. 3 law introducing patent treaties