ES2185226T3 - Dispositivo para la prueba de platinas de circuitos. - Google Patents

Dispositivo para la prueba de platinas de circuitos.

Info

Publication number
ES2185226T3
ES2185226T3 ES98954273T ES98954273T ES2185226T3 ES 2185226 T3 ES2185226 T3 ES 2185226T3 ES 98954273 T ES98954273 T ES 98954273T ES 98954273 T ES98954273 T ES 98954273T ES 2185226 T3 ES2185226 T3 ES 2185226T3
Authority
ES
Spain
Prior art keywords
component
instrument
test
drive unit
test device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES98954273T
Other languages
English (en)
Inventor
Manfred Buks
Karim Hosseini
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Scorpion Technologies AG
Original Assignee
Scorpion Technologies AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Scorpion Technologies AG filed Critical Scorpion Technologies AG
Application granted granted Critical
Publication of ES2185226T3 publication Critical patent/ES2185226T3/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
    • G01R29/0878—Sensors; antennas; probes; detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/303—Contactless testing of integrated circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/304—Contactless testing of printed or hybrid circuits

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Electromagnetism (AREA)
  • Measurement And Recording Of Electrical Phenomena And Electrical Characteristics Of The Living Body (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Monitoring And Testing Of Exchanges (AREA)
  • Measurement Of Resistance Or Impedance (AREA)

Abstract

Dispositivo para la prueba de componentes electrónicos (1, 2, 21, 30, 51.4), con un dispositivo (6) de excitación que contacta galvánicamente el componente y lo excita mediante la conexión de una tensión para la creación de un campo en el espacio circundante, así como con un dispositivo de medición que se posiciona con un primer electrodo (11; 42; 53; 61; 71, 72) cerca del componente, caracterizado porque el dispositivo (11, 13, 15) de medición se separa galvánicamente del componente (1, 2, 21, 30, 51.4) y porque el dispositivo de medición presenta un amplificador (13) de medición que se configura para la medición de una diferencia de tensión entre el primer electrodo (11; 42; 53; 61; 71, 72) y un segundo electrodo (15), dispuesto en el campo a una distancia de éste.
ES98954273T 1997-09-24 1998-09-11 Dispositivo para la prueba de platinas de circuitos. Expired - Lifetime ES2185226T3 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19742055A DE19742055C2 (de) 1997-09-24 1997-09-24 Vorrichtung zum Testen von Schaltungsplatinen

Publications (1)

Publication Number Publication Date
ES2185226T3 true ES2185226T3 (es) 2003-04-16

Family

ID=7843416

Family Applications (1)

Application Number Title Priority Date Filing Date
ES98954273T Expired - Lifetime ES2185226T3 (es) 1997-09-24 1998-09-11 Dispositivo para la prueba de platinas de circuitos.

Country Status (7)

Country Link
US (1) US6496013B1 (es)
EP (1) EP1018031B1 (es)
AT (1) ATE225944T1 (es)
AU (1) AU1146299A (es)
DE (3) DE19742055C2 (es)
ES (1) ES2185226T3 (es)
WO (1) WO1999015910A1 (es)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6625554B2 (en) * 2001-06-22 2003-09-23 Hitachi, Ltd. Method and apparatus for determining a magnetic field
AUPR793201A0 (en) * 2001-09-28 2001-10-18 Deepwater Electronics Electric field detector
US7859666B2 (en) * 2003-07-28 2010-12-28 Nippon Telegraph And Telephone Corporation Electric field sensor
US8493053B2 (en) * 2009-12-18 2013-07-23 GRID20/20, Inc. System and device for measuring voltage in a conductor
DE102011018650B4 (de) 2010-04-22 2015-05-07 Elowerk Gmbh & Co.Kg Verfahren zum Testen eines elektrischen Bauelementes und Verwendung
US8742777B2 (en) 2010-12-29 2014-06-03 The Board Of Trustees Of The University Of Alabama For And On Behalf Of The University Of Alabama Method and system for testing an electric circuit
US9523729B2 (en) * 2013-09-13 2016-12-20 Infineon Technologies Ag Apparatus and method for testing electric conductors

Family Cites Families (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3925726A (en) * 1974-05-08 1975-12-09 Us Navy Electric field sensor
GB1537870A (en) * 1975-09-05 1979-01-04 Ericsson L M Pty Ltd Printed circuit board testing method and apparatus
US4186338A (en) * 1976-12-16 1980-01-29 Genrad, Inc. Phase change detection method of and apparatus for current-tracing the location of faults on printed circuit boards and similar systems
DE2813947C2 (de) * 1978-03-31 1986-09-04 Siemens AG, 1000 Berlin und 8000 München Verfahren zur berührungslosen Messung des Potentialverlaufs in einem elektronischen Bauelement und Anordnung zur Durchführung des Verfahrens
DE2903077C2 (de) * 1979-01-26 1986-07-17 Siemens AG, 1000 Berlin und 8000 München Verfahren zur berührungslosen Potentialmessung an einem elektronischen Bauelement und Anordnung zur Durchführung des Verfahrens
US4588993A (en) * 1980-11-26 1986-05-13 The United States Of America As Represented By The Secretary Of The Department Of Health And Human Services Broadband isotropic probe system for simultaneous measurement of complex E- and H-fields
DE3334494A1 (de) * 1983-09-23 1985-04-11 Siemens AG, 1000 Berlin und 8000 München Verfahren zum messen niederfrequenter signalverlaeufe innerhalb integrierter schaltungen mit der elektronensonde
US4670710A (en) * 1985-03-29 1987-06-02 International Business Machines Corporation Noncontact full-line dynamic AC tester for integrated circuits
DE3544187A1 (de) * 1985-12-13 1987-06-19 Flowtec Ag Kapazitaetsmessschaltung
US4837506A (en) * 1986-10-02 1989-06-06 Ultraprobe, Inc. Apparatus including a focused UV light source for non-contact measuremenht and alteration of electrical properties of conductors
EP0264481B1 (en) * 1986-10-23 1992-05-13 International Business Machines Corporation Testing method for integrated circuit packaging boards using a laser in vacuum
US4779041A (en) * 1987-05-20 1988-10-18 Hewlett-Packard Company Integrated circuit transfer test device system
US4924172A (en) * 1988-08-25 1990-05-08 Kaman Instrumentation Corporation Capacitive sensor and electronic circuit for non-contact distance measurement
US5006808A (en) * 1989-03-21 1991-04-09 Bath Scientific Limited Testing electrical circuits
US4991580A (en) * 1989-03-30 1991-02-12 Invivo Research, Inc. Method of improving the quality of an electrocardiogram obtained from a patient undergoing magnetic resonance imaging
EP0393382B1 (de) * 1989-04-07 1994-06-01 Asea Brown Boveri Ag Vorrichtung zum Messen eines eletrischen Feldes
GB2236593B (en) * 1989-08-25 1994-01-05 Janet Heather Driver Detector
US5138266A (en) * 1989-10-20 1992-08-11 Digital Equipment Corporation Single-probe charge measurement testing method
DE4022563A1 (de) * 1990-04-11 1991-10-17 Flachglas Ag Verfahren zur kontaktlosen messung des elektrischen widerstands eines untersuchungsmaterials
US5489888A (en) * 1990-11-07 1996-02-06 Precitec Gmbh Sensor system for contactless distance measuring
US5254953A (en) * 1990-12-20 1993-10-19 Hewlett-Packard Company Identification of pin-open faults by capacitive coupling through the integrated circuit package
US5124660A (en) * 1990-12-20 1992-06-23 Hewlett-Packard Company Identification of pin-open faults by capacitive coupling through the integrated circuit package
CA2049616C (en) * 1991-01-22 2000-04-04 Jacob Soiferman Contactless test method and system for testing printed circuit boards
EP0527321A1 (de) * 1991-08-05 1993-02-17 Siemens Aktiengesellschaft Verfahren zur automatischen Fehlerdiagnose von elektrischen Baugruppen
US5406209A (en) 1993-02-04 1995-04-11 Northern Telecom Limited Methods and apparatus for testing circuit boards
IT1261074B (it) * 1993-07-05 1996-05-08 Luciano Bonaria Metodo e dispositivo di collaudo per schede elettroniche
US5514229A (en) * 1993-11-24 1996-05-07 Ramot-University Authority For Applied Research And Industrial Development Ltd., Tel Aviv University Method of producing transparent and other electrically conductive materials
AU2563797A (en) * 1996-04-26 1997-11-19 Anthony Charles Leonid Fox Satellite synchronized 3-d magnetotelluric system
US5954762A (en) * 1997-09-15 1999-09-21 Di Mino; Alfonso Computer-controlled servo-mechanism for positioning corona discharge beam applicator
US6359451B1 (en) * 2000-02-11 2002-03-19 Image Graphics Incorporated System for contactless testing of printed circuit boards

Also Published As

Publication number Publication date
DE19742055A1 (de) 1999-04-08
EP1018031A1 (de) 2000-07-12
DE19742055C2 (de) 2000-02-24
ATE225944T1 (de) 2002-10-15
EP1018031B1 (de) 2002-10-09
WO1999015910A1 (de) 1999-04-01
AU1146299A (en) 1999-04-12
DE59805921D1 (de) 2002-11-14
US6496013B1 (en) 2002-12-17
DE19881384D2 (de) 2001-03-08

Similar Documents

Publication Publication Date Title
DE60214044D1 (de) Sensor für messungen an nassen und trockenen fingern
DE59208512D1 (de) Elektrochemisches Analysesystem
NO20021031D0 (no) Kalibrerings-eksitasjon
ATE345494T1 (de) Wellenformgenerator-elektronik mit abgestimmten lc-schaltkreisen
BR0214331B1 (pt) eletrodo para mediÇÕes biomÉdicas, e, cinta de eletrodo.
EP1566645A3 (en) Method and system for continuity testing of medical electrodes
AU6356698A (en) Apparatus for identifying container components using electrical conductivity
ATE100212T1 (de) Anordnung zur spannungspruefung.
ES2185226T3 (es) Dispositivo para la prueba de platinas de circuitos.
KR850002326A (ko) 반도체 장치의 정전기 파괴 시험방법 및 장치
ES8704019A1 (es) Un metodo y un aparato para vigilar la produccion de un suceso y para detectar y obtener informacion sobre el suceso al ocurrir este.
AR031323A1 (es) Metodo y aparato de medicion sin contacto que produce una senal representativa de una distancia entre superficies enfrentadas
GR1000643B (el) Συστημα ελεγχου βραχυκυκλωματων πλαισιου αγωγων.
JP2009053074A (ja) 電界検出装置
Lippmann et al. A modular, isolated high-voltage switch for application in ion mobility spectrometry
WO2021182082A1 (ja) クランプ式交流電圧プローブ
RU2029965C1 (ru) Устройство для измерения диэлектрических потерь конденсаторных датчиков
JP2739457B2 (ja) 仮想接地方法とその装置
ATE228251T1 (de) Phasenprüfgerät
ATE212716T1 (de) Elketrostatischer haftfestigkeitsprüfer für dünnschichtleiter
SU1469474A1 (ru) Измеритель напр женности электрического пол электрета
RU93040949A (ru) Устройство для измерения удельной электропроводности жидких сред
JPS58216963A (ja) 光電圧計
ATE158412T1 (de) Verfahren und vorrichtung für die überprüfung des elektrischen isolierungszustands einer elektrisch leitenden konstruktion
KR950014896A (ko) 물질의 전기분극 측정에 있어 전도성 전류의 보정방법