ATE241142T1 - Roboterdoppelsonde zur messung auf gedruckten schaltungskarten und elektrischen und elektronischen anordnungen - Google Patents

Roboterdoppelsonde zur messung auf gedruckten schaltungskarten und elektrischen und elektronischen anordnungen

Info

Publication number
ATE241142T1
ATE241142T1 AT98943338T AT98943338T ATE241142T1 AT E241142 T1 ATE241142 T1 AT E241142T1 AT 98943338 T AT98943338 T AT 98943338T AT 98943338 T AT98943338 T AT 98943338T AT E241142 T1 ATE241142 T1 AT E241142T1
Authority
AT
Austria
Prior art keywords
probe
control software
motors
leads
lead
Prior art date
Application number
AT98943338T
Other languages
English (en)
Inventor
Brian K Lucas
Eric D Collingbourne
Original Assignee
Proteus Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Proteus Corp filed Critical Proteus Corp
Application granted granted Critical
Publication of ATE241142T1 publication Critical patent/ATE241142T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measuring Leads Or Probes (AREA)
AT98943338T 1997-08-25 1998-08-21 Roboterdoppelsonde zur messung auf gedruckten schaltungskarten und elektrischen und elektronischen anordnungen ATE241142T1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US5697297P 1997-08-25 1997-08-25
US08/958,747 US5994909A (en) 1997-08-25 1997-10-31 Robotic twin probe for measurement on printed circuit boards and electrical and electronic assemblies
PCT/US1998/017480 WO1999010749A1 (en) 1997-08-25 1998-08-21 Robotic twin probe for measurement on printed circuit boards and electrical and electronic assemblies

Publications (1)

Publication Number Publication Date
ATE241142T1 true ATE241142T1 (de) 2003-06-15

Family

ID=26735912

Family Applications (1)

Application Number Title Priority Date Filing Date
AT98943338T ATE241142T1 (de) 1997-08-25 1998-08-21 Roboterdoppelsonde zur messung auf gedruckten schaltungskarten und elektrischen und elektronischen anordnungen

Country Status (7)

Country Link
US (1) US5994909A (de)
EP (1) EP1007981B1 (de)
AT (1) ATE241142T1 (de)
AU (1) AU9116098A (de)
CA (1) CA2301604A1 (de)
DE (1) DE69814876D1 (de)
WO (1) WO1999010749A1 (de)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2357012A1 (en) * 1998-12-30 2000-07-06 Proteus Corporation Dual-pin probe for testing circuit boards
AU2727401A (en) 1999-12-15 2001-06-25 Introbotics Corporation Automated domain reflectometry testing system
US6798229B2 (en) * 2000-05-11 2004-09-28 Brian D. Butler Wide-bandwidth coaxial probe
US20030115008A1 (en) * 2001-12-18 2003-06-19 Yutaka Doi Test fixture with adjustable pitch for network measurement
US20030182647A1 (en) * 2002-03-19 2003-09-25 Radeskog Mattias Dan Automatic interactive component placement for electronics-CAD software through the use of force simulations
CA2476389A1 (en) * 2002-03-22 2003-10-09 Electro Scientific Industries, Inc. Test probe alignment apparatus
GB0308550D0 (en) * 2003-04-10 2003-05-21 Barker Colin Improvements to an automatic test machine
WO2006059259A1 (en) * 2004-11-30 2006-06-08 Koninklijke Philips Electronics, N.V. Wireless probe system
US7091730B1 (en) * 2005-07-15 2006-08-15 Huntron, Inc. Dual probe assembly for a printed circuit board test apparatus
DK1942710T3 (da) * 2007-01-04 2011-08-15 Oticon As Fremgangsmåde til frembringelse af en elektrisk komponent i et elektrisk kredsløb på et substrat
CN101788579B (zh) * 2010-02-09 2013-06-05 中兴通讯股份有限公司 一种示波器及其信号波形采集及显示的方法及系统
KR20150042404A (ko) * 2013-10-11 2015-04-21 삼성전자주식회사 반도체 장치의 검사 방법 및 이에 사용되는 프로빙 어셈블리
WO2015116224A1 (en) * 2014-01-31 2015-08-06 Hewlett-Packard Development Company, L.P. Test probe
GB201411232D0 (en) * 2014-06-25 2014-08-06 Rolls Royce Plc Component processing
US20250271466A1 (en) * 2024-02-25 2025-08-28 PMK Mess- und Kommunikationstechnik, GmbH Adjustable Probe Tip

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3727119A (en) * 1971-02-01 1973-04-10 Information Dev Corp Servo controlled automatic inspection apparatus
GB8423023D0 (en) * 1984-09-12 1984-10-17 Short Brothers Ltd Ultrasonic scanning system
FR2605414B1 (fr) * 1986-10-15 1989-05-12 Automatisme Lumiere Commerce I Procede de controle sequentiel automatique d'une carte portant des composants electroniques et dispositif pour la mise en oeuvre de ce procede
US5006793A (en) * 1989-06-08 1991-04-09 Cascade Microtech, Inc. High-frequency active probe having replaceable contact needles
EP0468153B1 (de) * 1990-07-25 1995-10-11 atg test systems GmbH Kontaktierungsvorrichtung für Prüfzwecke
US5264788A (en) * 1992-06-12 1993-11-23 Cascade Microtech, Inc. Adjustable strap implemented return line for a probe station
US5550844A (en) * 1992-11-19 1996-08-27 Proteus Corporation Printed circuit board fault injection circuit
US5473254A (en) * 1994-08-12 1995-12-05 At&T Corp. Test probe assembly provides precise and repeatable contact forces
JPH095357A (ja) * 1995-06-15 1997-01-10 Advantest Corp Ｉｃテスタの信号観測装置用プローブコンタクト

Also Published As

Publication number Publication date
US5994909A (en) 1999-11-30
EP1007981B1 (de) 2003-05-21
AU9116098A (en) 1999-03-16
WO1999010749A1 (en) 1999-03-04
EP1007981A1 (de) 2000-06-14
CA2301604A1 (en) 1999-03-04
DE69814876D1 (de) 2003-06-26

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Legal Events

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