ATE249620T1 - Verfahren und einrichtung zur verarbeitung von bildern - Google Patents

Verfahren und einrichtung zur verarbeitung von bildern

Info

Publication number
ATE249620T1
ATE249620T1 AT01926303T AT01926303T ATE249620T1 AT E249620 T1 ATE249620 T1 AT E249620T1 AT 01926303 T AT01926303 T AT 01926303T AT 01926303 T AT01926303 T AT 01926303T AT E249620 T1 ATE249620 T1 AT E249620T1
Authority
AT
Austria
Prior art keywords
nominal
appearance data
data
determined
appearance
Prior art date
Application number
AT01926303T
Other languages
English (en)
Inventor
Niklas Andersson
Simon Sandgren
Johan Aberg
Original Assignee
Mydata Automation Ab
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=20279484&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=ATE249620(T1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Mydata Automation Ab filed Critical Mydata Automation Ab
Application granted granted Critical
Publication of ATE249620T1 publication Critical patent/ATE249620T1/de

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T1/00—General purpose image data processing
    • G06T1/20—Processor architectures; Processor configuration, e.g. pipelining
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/70—Determining position or orientation of objects or cameras
    • G06T7/73—Determining position or orientation of objects or cameras using feature-based methods
    • G06T7/74—Determining position or orientation of objects or cameras using feature-based methods involving reference images or patches
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30148—Semiconductor; IC; Wafer
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30152—Solder

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Image Analysis (AREA)
  • Image Processing (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Closed-Circuit Television Systems (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
AT01926303T 2000-04-28 2001-04-27 Verfahren und einrichtung zur verarbeitung von bildern ATE249620T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
SE0001577A SE516239C2 (sv) 2000-04-28 2000-04-28 Metod och anordning för bestämning av nominella data för elektroniska kretsar, genom att ta en digital bild och jämföra med lagrade nominella data.
PCT/SE2001/000916 WO2001084499A2 (en) 2000-04-28 2001-04-27 Method and device for determining nominal data for electronic circuits by capturing a digital image and compare with stored nonimal data

Publications (1)

Publication Number Publication Date
ATE249620T1 true ATE249620T1 (de) 2003-09-15

Family

ID=20279484

Family Applications (1)

Application Number Title Priority Date Filing Date
AT01926303T ATE249620T1 (de) 2000-04-28 2001-04-27 Verfahren und einrichtung zur verarbeitung von bildern

Country Status (10)

Country Link
US (1) US7324710B2 (de)
EP (1) EP1277041B1 (de)
JP (1) JP4800547B2 (de)
KR (1) KR100874389B1 (de)
CN (1) CN1264115C (de)
AT (1) ATE249620T1 (de)
AU (1) AU2001252833A1 (de)
DE (1) DE60100757T2 (de)
SE (1) SE516239C2 (de)
WO (1) WO2001084499A2 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7711157B2 (en) 2006-08-01 2010-05-04 California Institute Of Technology Artificial intelligence systems for identifying objects
US20090080010A1 (en) * 2007-09-21 2009-03-26 Canon Kabushiki Kaisha Image forming apparatus, image forming method, and program
US8725477B2 (en) 2008-04-10 2014-05-13 Schlumberger Technology Corporation Method to generate numerical pseudocores using borehole images, digital rock samples, and multi-point statistics
US9581723B2 (en) * 2008-04-10 2017-02-28 Schlumberger Technology Corporation Method for characterizing a geological formation traversed by a borehole
US8389057B2 (en) * 2009-04-06 2013-03-05 Douglas Knox Systems and methods for printing electronic device assembly
US8311788B2 (en) 2009-07-01 2012-11-13 Schlumberger Technology Corporation Method to quantify discrete pore shapes, volumes, and surface areas using confocal profilometry
BR102015013591A8 (pt) * 2015-06-10 2023-03-07 Valid Solucoes E Servicos De Seguranca Em Meios De Pagamento E Identificacao S A Processo e sistema de identificação de produtos em movimentação em uma linha de produção
WO2017009615A1 (en) * 2015-07-13 2017-01-19 Renishaw Plc Method for measuring an artefact

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EP0715275B1 (de) 1987-02-20 2002-08-28 Sagem Sa Automatisches Fingerabdruckidentifizierungssystem mit Verfahren und Vorrichtung zum Vergleichen von Fingerabdrücken
US4790564A (en) 1987-02-20 1988-12-13 Morpho Systemes Automatic fingerprint identification system including processes and apparatus for matching fingerprints
JPH07118012B2 (ja) * 1987-10-20 1995-12-18 松下電器産業株式会社 部品のリード端子間隔検査方法
WO1989011093A1 (fr) * 1988-05-09 1989-11-16 Omron Corporation Appareil de controle de substrats et procede d'utilisation
US5265170A (en) * 1990-01-11 1993-11-23 Hine Design, Inc. Devices and methods for reading identification marks on semiconductor wafers
US5119436A (en) 1990-09-24 1992-06-02 Kulicke And Soffa Industries, Inc Method of centering bond positions
US5185811A (en) * 1990-12-27 1993-02-09 International Business Machines Corporation Automated visual inspection of electronic component leads prior to placement
SG45181A1 (en) 1991-07-22 1998-01-16 Omron Tateisi Electronics Co Teaching method and system for mounted component inspection
US5469294A (en) 1992-05-01 1995-11-21 Xrl, Inc. Illumination system for OCR of indicia on a substrate
US5737122A (en) 1992-05-01 1998-04-07 Electro Scientific Industries, Inc. Illumination system for OCR of indicia on a substrate
US5555316A (en) * 1992-06-30 1996-09-10 Matsushita Electric Industrial Co., Ltd. Inspecting apparatus of mounting state of component or printing state of cream solder in mounting line of electronic component
JP2941617B2 (ja) 1993-10-21 1999-08-25 株式会社テンリュウテクニックス 電子部品の部品データ記録装置およびそれを用いた電子部品の搬送組み付け装置
US5563798A (en) * 1994-04-05 1996-10-08 Applied Materials, Inc. Wafer positioning system
JP3472971B2 (ja) * 1994-07-15 2003-12-02 株式会社アドバンテスト Ｉｃ不良解析方法及び不良解析装置
US6026176A (en) * 1995-07-25 2000-02-15 Cognex Corporation Machine vision methods and articles of manufacture for ball grid array inspection
JP3679471B2 (ja) * 1995-09-18 2005-08-03 ジェネシス・テクノロジー株式会社 光学的欠陥検査装置
JP2850807B2 (ja) * 1995-10-27 1999-01-27 日本電気株式会社 検査データ作成装置
JPH09184715A (ja) * 1995-12-28 1997-07-15 Hitachi Ltd パターン形状検査装置
JPH09265537A (ja) * 1996-03-29 1997-10-07 Hitachi Ltd 画像処理方法
US5785484A (en) 1996-08-23 1998-07-28 Electro Scientific Industries, Inc. Method and apparatus for orienting miniature components
US5894530A (en) 1996-09-05 1999-04-13 Electro Scientific Industries, Inc. Optical viewing system for simultaneously viewing indicia located on top and bottom surfaces of a substrate
CN1201953A (zh) 1997-06-06 1998-12-16 童超 手形图像识别仪
US5956134A (en) * 1997-07-11 1999-09-21 Semiconductor Technologies & Instruments, Inc. Inspection system and method for leads of semiconductor devices
US6895109B1 (en) * 1997-09-04 2005-05-17 Texas Instruments Incorporated Apparatus and method for automatically detecting defects on silicon dies on silicon wafers
US6038336A (en) 1997-12-04 2000-03-14 Daewoo Electronics Co., Ltd. PCB testing circuit for an automatic inserting apparatus and a testing method therefor
US5969752A (en) 1998-06-15 1999-10-19 Electro Scientific Industries Multi-function viewer/tester for miniature electric components
JP4358991B2 (ja) * 1998-08-04 2009-11-04 サイバーオプティクス コーポレーション 強化されたセンサ
US6275742B1 (en) * 1999-04-16 2001-08-14 Berkeley Process Control, Inc. Wafer aligner system
US6326618B1 (en) * 1999-07-02 2001-12-04 Agere Systems Guardian Corp. Method of analyzing semiconductor surface with patterned feature using line width metrology
US6225639B1 (en) * 1999-08-27 2001-05-01 Agere Systems Guardian Corp. Method of monitoring a patterned transfer process using line width metrology
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US6718227B1 (en) 1999-12-16 2004-04-06 Texas Instruments Incorporated System and method for determining a position error in a wafer handling device
US6704653B2 (en) * 2000-05-12 2004-03-09 Kabushiki Kaisha Toyota Jidoshokki Vehicle backing support apparatus
US6464636B1 (en) * 2000-10-18 2002-10-15 Koninklijke Philips Electronics N.V. Configuration tool for use in ultrasound imaging device
US6584213B2 (en) * 2001-07-23 2003-06-24 Pulsent Corporation Motion matching method

Also Published As

Publication number Publication date
CN1426533A (zh) 2003-06-25
EP1277041A2 (de) 2003-01-22
JP2003532243A (ja) 2003-10-28
SE516239C2 (sv) 2001-12-03
AU2001252833A1 (en) 2001-11-12
SE0001577L (sv) 2001-10-29
WO2001084499A2 (en) 2001-11-08
WO2001084499A3 (en) 2002-01-24
EP1277041B1 (de) 2003-09-10
US7324710B2 (en) 2008-01-29
DE60100757T2 (de) 2004-07-01
JP4800547B2 (ja) 2011-10-26
CN1264115C (zh) 2006-07-12
SE0001577D0 (sv) 2000-04-28
KR20030005301A (ko) 2003-01-17
KR100874389B1 (ko) 2008-12-17
US20030113039A1 (en) 2003-06-19
DE60100757D1 (de) 2003-10-16

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