SE0001577L - Metod och anordning för bestämning av nominella data för elektroniska kretsar, genom att ta en digital bild och jämföra med lagrade nominella data. - Google Patents

Metod och anordning för bestämning av nominella data för elektroniska kretsar, genom att ta en digital bild och jämföra med lagrade nominella data.

Info

Publication number
SE0001577L
SE0001577L SE0001577A SE0001577A SE0001577L SE 0001577 L SE0001577 L SE 0001577L SE 0001577 A SE0001577 A SE 0001577A SE 0001577 A SE0001577 A SE 0001577A SE 0001577 L SE0001577 L SE 0001577L
Authority
SE
Sweden
Prior art keywords
nominal data
nominal
data
digital image
appearance data
Prior art date
Application number
SE0001577A
Other languages
English (en)
Other versions
SE0001577D0 (sv
SE516239C2 (sv
Inventor
Niklas Andersson
Simon Sandgren
Johan Aaberg
Original Assignee
Mydata Automation Ab
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=20279484&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=SE0001577(L) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Mydata Automation Ab filed Critical Mydata Automation Ab
Priority to SE0001577A priority Critical patent/SE516239C2/sv
Publication of SE0001577D0 publication Critical patent/SE0001577D0/sv
Priority to JP2001581234A priority patent/JP4800547B2/ja
Priority to AT01926303T priority patent/ATE249620T1/de
Priority to CNB018085407A priority patent/CN1264115C/zh
Priority to AU2001252833A priority patent/AU2001252833A1/en
Priority to EP01926303A priority patent/EP1277041B1/en
Priority to KR1020027014365A priority patent/KR100874389B1/ko
Priority to DE60100757T priority patent/DE60100757T2/de
Priority to US10/240,561 priority patent/US7324710B2/en
Priority to PCT/SE2001/000916 priority patent/WO2001084499A2/en
Publication of SE0001577L publication Critical patent/SE0001577L/sv
Publication of SE516239C2 publication Critical patent/SE516239C2/sv

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/70—Determining position or orientation of objects or cameras
    • G06T7/73—Determining position or orientation of objects or cameras using feature-based methods
    • G06T7/74—Determining position or orientation of objects or cameras using feature-based methods involving reference images or patches
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T1/00—General purpose image data processing
    • G06T1/20—Processor architectures; Processor configuration, e.g. pipelining
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30148—Semiconductor; IC; Wafer
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30152—Solder

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Image Analysis (AREA)
  • Image Processing (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Closed-Circuit Television Systems (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
SE0001577A 2000-04-28 2000-04-28 Metod och anordning för bestämning av nominella data för elektroniska kretsar, genom att ta en digital bild och jämföra med lagrade nominella data. SE516239C2 (sv)

Priority Applications (10)

Application Number Priority Date Filing Date Title
SE0001577A SE516239C2 (sv) 2000-04-28 2000-04-28 Metod och anordning för bestämning av nominella data för elektroniska kretsar, genom att ta en digital bild och jämföra med lagrade nominella data.
PCT/SE2001/000916 WO2001084499A2 (en) 2000-04-28 2001-04-27 Method and device for determining nominal data for electronic circuits by capturing a digital image and compare with stored nonimal data
US10/240,561 US7324710B2 (en) 2000-04-28 2001-04-27 Method and device for determining nominal data for electronic circuits by capturing a digital image and compare with stored nominal data
CNB018085407A CN1264115C (zh) 2000-04-28 2001-04-27 用于确定电子装置标称机械数据的方法和装置
AT01926303T ATE249620T1 (de) 2000-04-28 2001-04-27 Verfahren und einrichtung zur verarbeitung von bildern
JP2001581234A JP4800547B2 (ja) 2000-04-28 2001-04-27 画像を処理する方法と装置
AU2001252833A AU2001252833A1 (en) 2000-04-28 2001-04-27 Method and device for processing images
EP01926303A EP1277041B1 (en) 2000-04-28 2001-04-27 Method and device for processing images
KR1020027014365A KR100874389B1 (ko) 2000-04-28 2001-04-27 이미지 처리 방법 및 장치
DE60100757T DE60100757T2 (de) 2000-04-28 2001-04-27 Verfahren und einrichtung zur verarbeitung von bildern

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE0001577A SE516239C2 (sv) 2000-04-28 2000-04-28 Metod och anordning för bestämning av nominella data för elektroniska kretsar, genom att ta en digital bild och jämföra med lagrade nominella data.

Publications (3)

Publication Number Publication Date
SE0001577D0 SE0001577D0 (sv) 2000-04-28
SE0001577L true SE0001577L (sv) 2001-10-29
SE516239C2 SE516239C2 (sv) 2001-12-03

Family

ID=20279484

Family Applications (1)

Application Number Title Priority Date Filing Date
SE0001577A SE516239C2 (sv) 2000-04-28 2000-04-28 Metod och anordning för bestämning av nominella data för elektroniska kretsar, genom att ta en digital bild och jämföra med lagrade nominella data.

Country Status (10)

Country Link
US (1) US7324710B2 (sv)
EP (1) EP1277041B1 (sv)
JP (1) JP4800547B2 (sv)
KR (1) KR100874389B1 (sv)
CN (1) CN1264115C (sv)
AT (1) ATE249620T1 (sv)
AU (1) AU2001252833A1 (sv)
DE (1) DE60100757T2 (sv)
SE (1) SE516239C2 (sv)
WO (1) WO2001084499A2 (sv)

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US7711157B2 (en) 2006-08-01 2010-05-04 California Institute Of Technology Artificial intelligence systems for identifying objects
US20090080010A1 (en) * 2007-09-21 2009-03-26 Canon Kabushiki Kaisha Image forming apparatus, image forming method, and program
WO2009126888A2 (en) * 2008-04-10 2009-10-15 Services Petroliers Schlumberger Method for characterizing a geological formation traversed by a borehole
US8725477B2 (en) 2008-04-10 2014-05-13 Schlumberger Technology Corporation Method to generate numerical pseudocores using borehole images, digital rock samples, and multi-point statistics
US8389057B2 (en) * 2009-04-06 2013-03-05 Douglas Knox Systems and methods for printing electronic device assembly
US8311788B2 (en) 2009-07-01 2012-11-13 Schlumberger Technology Corporation Method to quantify discrete pore shapes, volumes, and surface areas using confocal profilometry
BR102015013591A8 (pt) * 2015-06-10 2023-03-07 Valid Solucoes E Servicos De Seguranca Em Meios De Pagamento E Identificacao S A Processo e sistema de identificação de produtos em movimentação em uma linha de produção
WO2017009615A1 (en) * 2015-07-13 2017-01-19 Renishaw Plc Method for measuring an artefact

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ES2161800T3 (es) 1987-02-20 2001-12-16 Sagem Procedimiento para comparar huellas digitales.
US4790564A (en) 1987-02-20 1988-12-13 Morpho Systemes Automatic fingerprint identification system including processes and apparatus for matching fingerprints
JPH07118012B2 (ja) * 1987-10-20 1995-12-18 松下電器産業株式会社 部品のリード端子間隔検査方法
DE68929481T2 (de) 1988-05-09 2004-06-09 Omron Corp. Vorrichtung und Verfahren zur Anzeige der Ergebnisse einer Leiterplattenprüfung
US5265170A (en) * 1990-01-11 1993-11-23 Hine Design, Inc. Devices and methods for reading identification marks on semiconductor wafers
US5119436A (en) 1990-09-24 1992-06-02 Kulicke And Soffa Industries, Inc Method of centering bond positions
US5185811A (en) * 1990-12-27 1993-02-09 International Business Machines Corporation Automated visual inspection of electronic component leads prior to placement
EP0526080B1 (en) 1991-07-22 1996-10-02 Omron Corporation Teaching method and system for mounted component inspection
US5737122A (en) 1992-05-01 1998-04-07 Electro Scientific Industries, Inc. Illumination system for OCR of indicia on a substrate
US5469294A (en) 1992-05-01 1995-11-21 Xrl, Inc. Illumination system for OCR of indicia on a substrate
US5555316A (en) 1992-06-30 1996-09-10 Matsushita Electric Industrial Co., Ltd. Inspecting apparatus of mounting state of component or printing state of cream solder in mounting line of electronic component
JP2941617B2 (ja) 1993-10-21 1999-08-25 株式会社テンリュウテクニックス 電子部品の部品データ記録装置およびそれを用いた電子部品の搬送組み付け装置
US5563798A (en) * 1994-04-05 1996-10-08 Applied Materials, Inc. Wafer positioning system
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JP3679471B2 (ja) 1995-09-18 2005-08-03 ジェネシス・テクノロジー株式会社 光学的欠陥検査装置
JP2850807B2 (ja) * 1995-10-27 1999-01-27 日本電気株式会社 検査データ作成装置
JPH09184715A (ja) * 1995-12-28 1997-07-15 Hitachi Ltd パターン形状検査装置
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US5956134A (en) 1997-07-11 1999-09-21 Semiconductor Technologies & Instruments, Inc. Inspection system and method for leads of semiconductor devices
US6895109B1 (en) * 1997-09-04 2005-05-17 Texas Instruments Incorporated Apparatus and method for automatically detecting defects on silicon dies on silicon wafers
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Also Published As

Publication number Publication date
SE0001577D0 (sv) 2000-04-28
DE60100757T2 (de) 2004-07-01
JP2003532243A (ja) 2003-10-28
US20030113039A1 (en) 2003-06-19
KR100874389B1 (ko) 2008-12-17
EP1277041A2 (en) 2003-01-22
CN1426533A (zh) 2003-06-25
KR20030005301A (ko) 2003-01-17
WO2001084499A2 (en) 2001-11-08
US7324710B2 (en) 2008-01-29
AU2001252833A1 (en) 2001-11-12
JP4800547B2 (ja) 2011-10-26
ATE249620T1 (de) 2003-09-15
SE516239C2 (sv) 2001-12-03
DE60100757D1 (de) 2003-10-16
CN1264115C (zh) 2006-07-12
WO2001084499A3 (en) 2002-01-24
EP1277041B1 (en) 2003-09-10

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