ATE263964T1 - Vorrichtung zum messen des magneto-optischen effektes - Google Patents
Vorrichtung zum messen des magneto-optischen effektesInfo
- Publication number
- ATE263964T1 ATE263964T1 AT97106400T AT97106400T ATE263964T1 AT E263964 T1 ATE263964 T1 AT E263964T1 AT 97106400 T AT97106400 T AT 97106400T AT 97106400 T AT97106400 T AT 97106400T AT E263964 T1 ATE263964 T1 AT E263964T1
- Authority
- AT
- Austria
- Prior art keywords
- light
- spectroscope
- polarizer
- light source
- optical effect
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/21—Polarisation-affecting properties
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Spectrometry And Color Measurement (AREA)
- Measuring Magnetic Variables (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP09688796A JP3311927B2 (ja) | 1996-04-18 | 1996-04-18 | 光−磁気光学効果測定装置 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE263964T1 true ATE263964T1 (de) | 2004-04-15 |
Family
ID=14176912
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT97106400T ATE263964T1 (de) | 1996-04-18 | 1997-04-17 | Vorrichtung zum messen des magneto-optischen effektes |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US5822063A (de) |
| EP (1) | EP0802407B1 (de) |
| JP (1) | JP3311927B2 (de) |
| KR (1) | KR100215516B1 (de) |
| AT (1) | ATE263964T1 (de) |
| DE (1) | DE69728464T2 (de) |
Families Citing this family (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20010015544A (ko) * | 1997-07-10 | 2001-02-26 | 오노 시게오 | 면검사장치 및 방법 |
| JP3778669B2 (ja) * | 1997-09-29 | 2006-05-24 | トヨタ自動車株式会社 | 光−磁気光学効果測定装置 |
| US6495825B1 (en) | 1999-12-22 | 2002-12-17 | International Business Machines Corporation | Apparatus for photo exposure of materials with subsequent capturing of volatiles for analysis |
| US7193708B1 (en) * | 2000-03-21 | 2007-03-20 | J.A. Woollam Co., Inc | Time efficient method for investigating sample systems with spectroscopic electromagnetic radiation |
| JP2002299757A (ja) * | 2001-04-02 | 2002-10-11 | Ando Electric Co Ltd | 可変波長光源装置 |
| US7154601B2 (en) * | 2004-04-22 | 2006-12-26 | Optimax Technology Corporation | Testing method for a polarizing plate |
| NL2005584C2 (en) * | 2009-10-26 | 2014-09-04 | Mapper Lithography Ip Bv | Charged particle multi-beamlet lithography system with modulation device. |
| RU2560148C1 (ru) * | 2014-05-08 | 2015-08-20 | Федеральное государственное бюджетное учреждение науки институт физики им. Л.В. Киренского Сибирского отделения Российской академии наук | СПОСОБ ИЗМЕРЕНИЯ МАГНИТООПТИЧЕСКИХ ЭФФЕКТОВ in situ |
| WO2016084261A1 (ja) * | 2014-11-28 | 2016-06-02 | 株式会社日立製作所 | 欠陥検査装置及び欠陥検査方法 |
| CN104458590B (zh) * | 2014-12-02 | 2017-04-05 | 华侨大学 | 一种垂直磁化薄膜测试装置 |
| CA2956230C (en) * | 2016-04-29 | 2020-01-14 | Synaptive Medical (Barbados) Inc. | Multi-modal optical imaging system for tissue analysis |
| KR102546691B1 (ko) | 2018-10-22 | 2023-06-22 | 삼성전자주식회사 | 자기 특성 측정 시스템, 자기 특성 측정 방법, 및 이를 이용한 자기 기억 소자의 제조방법 |
| US20220373452A1 (en) * | 2019-09-30 | 2022-11-24 | Rensselaer Polytechnic Institute | Diffractive imaging magneto-optical system |
| US11237224B2 (en) * | 2019-10-03 | 2022-02-01 | Samsung Electronics Co., Ltd. | Magnetic property measuring systems, methods of measuring magnetic property, and methods of fabricating magnetic memory devices using the same |
| KR102455161B1 (ko) * | 2021-04-23 | 2022-10-18 | 대전대학교 산학협력단 | 전기장과 자기장 및 led를 이용한 분광 장치 |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63122930A (ja) * | 1986-11-13 | 1988-05-26 | Matsushita Electric Ind Co Ltd | 光磁気メモリ媒体のカ−回転角測定装置 |
| KR960016331B1 (ko) * | 1990-08-29 | 1996-12-09 | 가부시끼가이샤 시마즈 세이사구쇼 | 흡광도 검출기 |
| JPH0534277A (ja) * | 1991-03-01 | 1993-02-09 | Yokogawa Electric Corp | 紫外線吸収検出器 |
-
1996
- 1996-04-18 JP JP09688796A patent/JP3311927B2/ja not_active Expired - Fee Related
-
1997
- 1997-04-17 AT AT97106400T patent/ATE263964T1/de active
- 1997-04-17 DE DE69728464T patent/DE69728464T2/de not_active Expired - Lifetime
- 1997-04-17 EP EP97106400A patent/EP0802407B1/de not_active Expired - Lifetime
- 1997-04-17 US US08/840,907 patent/US5822063A/en not_active Expired - Lifetime
- 1997-04-18 KR KR1019970014539A patent/KR100215516B1/ko not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| DE69728464T2 (de) | 2005-04-07 |
| EP0802407A2 (de) | 1997-10-22 |
| KR100215516B1 (ko) | 1999-08-16 |
| JP3311927B2 (ja) | 2002-08-05 |
| JPH09280953A (ja) | 1997-10-31 |
| EP0802407A3 (de) | 1998-04-29 |
| EP0802407B1 (de) | 2004-04-07 |
| DE69728464D1 (de) | 2004-05-13 |
| KR970070995A (ko) | 1997-11-07 |
| US5822063A (en) | 1998-10-13 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| UEP | Publication of translation of european patent specification |
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