ATE282227T1 - System und verfahren zum schutz von daten und zur korrektur von bitfehlern folgend aus komponentenfehlern - Google Patents

System und verfahren zum schutz von daten und zur korrektur von bitfehlern folgend aus komponentenfehlern

Info

Publication number
ATE282227T1
ATE282227T1 AT00936433T AT00936433T ATE282227T1 AT E282227 T1 ATE282227 T1 AT E282227T1 AT 00936433 T AT00936433 T AT 00936433T AT 00936433 T AT00936433 T AT 00936433T AT E282227 T1 ATE282227 T1 AT E282227T1
Authority
AT
Austria
Prior art keywords
error correction
data
check bits
global
generation unit
Prior art date
Application number
AT00936433T
Other languages
English (en)
Inventor
Robert Cypher
Original Assignee
Sun Microsystems Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sun Microsystems Inc filed Critical Sun Microsystems Inc
Application granted granted Critical
Publication of ATE282227T1 publication Critical patent/ATE282227T1/de

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
    • G06F11/1012—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices using codes or arrangements adapted for a specific type of error
    • G06F11/1028—Adjacent errors, e.g. error in n-bit (n>1) wide storage units, i.e. package error

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Detection And Correction Of Errors (AREA)
  • Detection And Prevention Of Errors In Transmission (AREA)
  • Error Detection And Correction (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
AT00936433T 1999-06-01 2000-05-30 System und verfahren zum schutz von daten und zur korrektur von bitfehlern folgend aus komponentenfehlern ATE282227T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/323,795 US6473880B1 (en) 1999-06-01 1999-06-01 System and method for protecting data and correcting bit errors due to component failures
PCT/US2000/014944 WO2000073907A1 (en) 1999-06-01 2000-05-30 System and method for protecting data and correcting bit errors due to component failures

Publications (1)

Publication Number Publication Date
ATE282227T1 true ATE282227T1 (de) 2004-11-15

Family

ID=23260753

Family Applications (1)

Application Number Title Priority Date Filing Date
AT00936433T ATE282227T1 (de) 1999-06-01 2000-05-30 System und verfahren zum schutz von daten und zur korrektur von bitfehlern folgend aus komponentenfehlern

Country Status (7)

Country Link
US (1) US6473880B1 (de)
EP (1) EP1183605B1 (de)
JP (1) JP2003501722A (de)
AT (1) ATE282227T1 (de)
AU (1) AU5174800A (de)
DE (1) DE60015753T2 (de)
WO (1) WO2000073907A1 (de)

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US7181674B2 (en) * 2002-06-28 2007-02-20 Sun Microsystems, Inc. Computer system including a network employing redundant information and slicing
US6976194B2 (en) * 2002-06-28 2005-12-13 Sun Microsystems, Inc. Memory/Transmission medium failure handling controller and method
US7093190B1 (en) * 2002-07-12 2006-08-15 Unisys Corporation System and method for handling parity errors in a data processing system
US7475326B2 (en) * 2003-06-27 2009-01-06 Maxwell Technologies, Inc. Error detection and correction method and system for memory devices
US7065697B2 (en) * 2003-07-29 2006-06-20 Hewlett-Packard Development Company, L.P. Systems and methods of partitioning data to facilitate error correction
US7051265B2 (en) * 2003-07-29 2006-05-23 Hewlett-Packard Development Company, L.P. Systems and methods of routing data to facilitate error correction
US7530008B2 (en) 2003-08-08 2009-05-05 Sun Microsystems, Inc. Scalable-chip-correct ECC scheme
US7188296B1 (en) 2003-10-30 2007-03-06 Sun Microsystems, Inc. ECC for component failures using Galois fields
US7116600B2 (en) 2004-02-19 2006-10-03 Micron Technology, Inc. Memory device having terminals for transferring multiple types of data
US7350131B2 (en) * 2005-01-22 2008-03-25 Cisco Technology, Inc. Error protecting groups of data words
JP2006242569A (ja) * 2005-02-28 2006-09-14 Advantest Corp 試験装置、及び試験方法
US7412642B2 (en) * 2005-03-09 2008-08-12 Sun Microsystems, Inc. System and method for tolerating communication lane failures
US7227797B2 (en) * 2005-08-30 2007-06-05 Hewlett-Packard Development Company, L.P. Hierarchical memory correction system and method
US8024639B2 (en) 2006-06-23 2011-09-20 Schweitzer Engineering Laboratories, Inc. Software and methods to detect and correct data structure
EP1887446A1 (de) * 2006-08-02 2008-02-13 Siemens Aktiengesellschaft Verfahren zur seriellen asynchronen Übertragung von Daten in einer Anordnung zur Überwachung, Steuerung und Regelung einer betriebstechnischen Anlage eines Gebäudes
US20080080114A1 (en) * 2006-09-29 2008-04-03 Schweitzer Engineering Laboratories, Inc. Apparatus, systems and methods for reliably detecting faults within a power distribution system
US20080155293A1 (en) * 2006-09-29 2008-06-26 Schweitzer Engineering Laboratories, Inc. Apparatus, systems and methods for reliably detecting faults within a power distribution system
US8055975B2 (en) * 2007-06-05 2011-11-08 Apple Inc. Combined single error correction/device kill detection code
US8250452B2 (en) 2007-08-20 2012-08-21 Infineon Technologies Ag Method and apparatus for embedded memory security
US8301964B2 (en) * 2007-11-19 2012-10-30 Research In Motion Limited Incremental redundancy with resegmentation
US8468432B2 (en) * 2009-07-01 2013-06-18 Silicon Motion, Inc. Coder-decoder and method for encoding and decoding an error correction code
EP2482236A4 (de) * 2009-09-24 2013-10-30 Terrara Code Res Inst Inc Rfid-etikett, etiketten-lese- und schreibgerät, datenverwaltungssystem und datenverwaltungsverfahren
JP5670687B2 (ja) * 2010-09-24 2015-02-18 株式会社テララコード研究所 データ管理システム、ｒｆｉｄタグ及びタグリーダ／ライタ
US8392807B2 (en) * 2010-07-23 2013-03-05 Sandisk Technologies Inc. System and method of distributive ECC processing
US8441768B2 (en) 2010-09-08 2013-05-14 Schweitzer Engineering Laboratories Inc Systems and methods for independent self-monitoring
US9054840B2 (en) * 2011-12-15 2015-06-09 Lenovo Enterprise Solutions (Singapore) Pte. Ltd. Error detection and correction of a data transmission
US9007731B2 (en) 2012-03-26 2015-04-14 Schweitzer Engineering Laboratories, Inc. Leveraging inherent redundancy in a multifunction IED
CN103577274B (zh) 2012-07-31 2016-07-06 国际商业机器公司 管理存储器阵列的方法和装置
US9189327B2 (en) * 2013-11-19 2015-11-17 International Business Machines Corporation Error-correcting code distribution for memory systems
CN109669805A (zh) * 2018-12-24 2019-04-23 深圳忆联信息系统有限公司 减少校验比特位数的方法、装置、计算机设备及存储介质
US11323362B2 (en) 2020-08-07 2022-05-03 Schweitzer Engineering Laboratories, Inc. Resilience to single event upsets in software defined networks
US11462292B1 (en) 2021-04-12 2022-10-04 Samsung Electronics Co., Ltd. Error correction circuit of semiconductor memory device and semiconductor memory device including the same
CN114884519B (zh) * 2022-05-13 2024-06-25 中国电子科技集团公司第三十研究所 一种基于级联方案的cv-qkd残余误码分步消除的方法与装置
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US6393597B1 (en) * 1999-06-01 2002-05-21 Sun Microsystems, Inc. Mechanism for decoding linearly-shifted codes to facilitate correction of bit errors due to component failures

Also Published As

Publication number Publication date
EP1183605A1 (de) 2002-03-06
US6473880B1 (en) 2002-10-29
DE60015753D1 (de) 2004-12-16
EP1183605B1 (de) 2004-11-10
WO2000073907A1 (en) 2000-12-07
AU5174800A (en) 2000-12-18
JP2003501722A (ja) 2003-01-14
DE60015753T2 (de) 2006-02-09

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