ATE284986T1 - Verfahren und vorrichtung zur herstellung von siliziumkarbid-kristallen - Google Patents
Verfahren und vorrichtung zur herstellung von siliziumkarbid-kristallenInfo
- Publication number
- ATE284986T1 ATE284986T1 AT00978907T AT00978907T ATE284986T1 AT E284986 T1 ATE284986 T1 AT E284986T1 AT 00978907 T AT00978907 T AT 00978907T AT 00978907 T AT00978907 T AT 00978907T AT E284986 T1 ATE284986 T1 AT E284986T1
- Authority
- AT
- Austria
- Prior art keywords
- carbide
- silicon carbide
- producing silicon
- carbide crystals
- boules
- Prior art date
Links
- 238000000034 method Methods 0.000 title abstract 2
- 229910010271 silicon carbide Inorganic materials 0.000 title abstract 2
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 title abstract 2
- 239000013078 crystal Substances 0.000 title 1
- INZDTEICWPZYJM-UHFFFAOYSA-N 1-(chloromethyl)-4-[4-(chloromethyl)phenyl]benzene Chemical compound C1=CC(CCl)=CC=C1C1=CC=C(CCl)C=C1 INZDTEICWPZYJM-UHFFFAOYSA-N 0.000 abstract 1
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 abstract 1
- 229910026551 ZrC Inorganic materials 0.000 abstract 1
- OTCHGXYCWNXDOA-UHFFFAOYSA-N [C].[Zr] Chemical compound [C].[Zr] OTCHGXYCWNXDOA-UHFFFAOYSA-N 0.000 abstract 1
- 239000011248 coating agent Substances 0.000 abstract 1
- 238000000576 coating method Methods 0.000 abstract 1
- 229910002804 graphite Inorganic materials 0.000 abstract 1
- 239000010439 graphite Substances 0.000 abstract 1
- WHJFNYXPKGDKBB-UHFFFAOYSA-N hafnium;methane Chemical compound C.[Hf] WHJFNYXPKGDKBB-UHFFFAOYSA-N 0.000 abstract 1
- 229910052751 metal Inorganic materials 0.000 abstract 1
- 239000002184 metal Substances 0.000 abstract 1
- 150000001247 metal acetylides Chemical class 0.000 abstract 1
- UNASZPQZIFZUSI-UHFFFAOYSA-N methylidyneniobium Chemical compound [Nb]#C UNASZPQZIFZUSI-UHFFFAOYSA-N 0.000 abstract 1
- NFFIWVVINABMKP-UHFFFAOYSA-N methylidynetantalum Chemical compound [Ta]#C NFFIWVVINABMKP-UHFFFAOYSA-N 0.000 abstract 1
- 229910003468 tantalcarbide Inorganic materials 0.000 abstract 1
- MTPVUVINMAGMJL-UHFFFAOYSA-N trimethyl(1,1,2,2,2-pentafluoroethyl)silane Chemical compound C[Si](C)(C)C(F)(F)C(F)(F)F MTPVUVINMAGMJL-UHFFFAOYSA-N 0.000 abstract 1
- UONOETXJSWQNOL-UHFFFAOYSA-N tungsten carbide Chemical compound [W+]#[C-] UONOETXJSWQNOL-UHFFFAOYSA-N 0.000 abstract 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B23/00—Single-crystal growth by condensing evaporated or sublimed materials
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/36—Carbides
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10S117/90—Apparatus characterized by composition or treatment thereof, e.g. surface finish, surface coating
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10S117/901—Levitation, reduced gravity, microgravity, space
- Y10S117/902—Specified orientation, shape, crystallography, or size of seed or substrate
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Inorganic Chemistry (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Carbon And Carbon Compounds (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/415,402 US6824611B1 (en) | 1999-10-08 | 1999-10-08 | Method and apparatus for growing silicon carbide crystals |
| PCT/US2000/041076 WO2001027361A1 (en) | 1999-10-08 | 2000-10-05 | Method and apparatus for growing silicon carbide crystals |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE284986T1 true ATE284986T1 (de) | 2005-01-15 |
Family
ID=23645557
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT00978907T ATE284986T1 (de) | 1999-10-08 | 2000-10-05 | Verfahren und vorrichtung zur herstellung von siliziumkarbid-kristallen |
Country Status (12)
| Country | Link |
|---|---|
| US (2) | US6824611B1 (de) |
| EP (1) | EP1218572B1 (de) |
| JP (1) | JP2003511337A (de) |
| KR (1) | KR100855650B1 (de) |
| CN (2) | CN1384892A (de) |
| AT (1) | ATE284986T1 (de) |
| AU (1) | AU1631601A (de) |
| CA (1) | CA2385621C (de) |
| DE (1) | DE60016771T2 (de) |
| ES (1) | ES2233478T3 (de) |
| TW (1) | TW552325B (de) |
| WO (1) | WO2001027361A1 (de) |
Families Citing this family (52)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6814801B2 (en) * | 2002-06-24 | 2004-11-09 | Cree, Inc. | Method for producing semi-insulating resistivity in high purity silicon carbide crystals |
| US7601441B2 (en) * | 2002-06-24 | 2009-10-13 | Cree, Inc. | One hundred millimeter high purity semi-insulating single crystal silicon carbide wafer |
| ATE335872T1 (de) * | 2003-04-24 | 2006-09-15 | Norstel Ab | Vorrichtung und verfahren zur herstellung von einkristallen durch dampfphasenabscheidung |
| US7147713B2 (en) | 2003-04-30 | 2006-12-12 | Cree, Inc. | Phase controlled sublimation |
| US7247513B2 (en) | 2003-05-08 | 2007-07-24 | Caracal, Inc. | Dissociation of silicon clusters in a gas phase during chemical vapor deposition homo-epitaxial growth of silicon carbide |
| ITMI20031196A1 (it) * | 2003-06-13 | 2004-12-14 | Lpe Spa | Sistema per crescere cristalli di carburo di silicio |
| KR100561701B1 (ko) * | 2004-01-30 | 2006-03-17 | 한국과학기술연구원 | 탄화규소 나노로드 및 나노와이어의 제조 방법 |
| JP2006001786A (ja) * | 2004-06-17 | 2006-01-05 | Hitachi Chem Co Ltd | フッ化カルシウム結晶育成ルツボ、フッ化カルシウム結晶の製造方法及びフッ化カルシウム結晶 |
| JP4609003B2 (ja) * | 2004-08-30 | 2011-01-12 | 株式会社デンソー | 炭化珪素単結晶の製造装置 |
| US7314520B2 (en) | 2004-10-04 | 2008-01-01 | Cree, Inc. | Low 1c screw dislocation 3 inch silicon carbide wafer |
| JP5068423B2 (ja) * | 2004-10-13 | 2012-11-07 | 新日本製鐵株式会社 | 炭化珪素単結晶インゴット、炭化珪素単結晶ウェハ及びその製造方法 |
| KR20060094769A (ko) * | 2005-02-26 | 2006-08-30 | 네오세미테크 주식회사 | 대구경 탄화규소 단결정 성장 장치 |
| JP4522898B2 (ja) * | 2005-03-25 | 2010-08-11 | 日本碍子株式会社 | 単結晶製造装置 |
| US7608524B2 (en) * | 2005-04-19 | 2009-10-27 | Ii-Vi Incorporated | Method of and system for forming SiC crystals having spatially uniform doping impurities |
| US7615801B2 (en) * | 2005-05-18 | 2009-11-10 | Cree, Inc. | High voltage silicon carbide devices having bi-directional blocking capabilities |
| US20060267043A1 (en) | 2005-05-27 | 2006-11-30 | Emerson David T | Deep ultraviolet light emitting devices and methods of fabricating deep ultraviolet light emitting devices |
| NO326797B1 (no) * | 2005-06-10 | 2009-02-16 | Elkem As | Fremgangsmate og apparat for raffinering av smeltet materiale |
| US8052794B2 (en) * | 2005-09-12 | 2011-11-08 | The United States Of America As Represented By The Secretary Of The Navy | Directed reagents to improve material uniformity |
| US20070169687A1 (en) * | 2006-01-26 | 2007-07-26 | Caracal, Inc. | Silicon carbide formation by alternating pulses |
| US8044567B2 (en) * | 2006-03-31 | 2011-10-25 | General Electric Company | Light source incorporating a high temperature ceramic composite and gas phase for selective emission |
| KR100760336B1 (ko) * | 2006-06-22 | 2007-09-20 | (주)글로벌코센테크 | 화학적 기상 반응 방법을 이용하여 흑연의 표면 특성을개질하는 방법 |
| ITMI20062213A1 (it) * | 2006-11-20 | 2008-05-21 | Lpe Spa | Reattore per crescere cristalli |
| JP4735622B2 (ja) * | 2007-08-28 | 2011-07-27 | 株式会社デンソー | 炭化珪素単結晶の製造装置 |
| CN100523315C (zh) * | 2007-09-28 | 2009-08-05 | 中国科学院物理研究所 | 分体式钽坩埚及其制造方法 |
| JP4547031B2 (ja) * | 2009-03-06 | 2010-09-22 | 新日本製鐵株式会社 | 炭化珪素単結晶製造用坩堝、並びに炭化珪素単結晶の製造装置及び製造方法 |
| CN102057083B (zh) * | 2009-07-21 | 2013-09-11 | 丰田自动车株式会社 | 使用熔液法的单晶生长用籽晶轴 |
| JP5500953B2 (ja) * | 2009-11-19 | 2014-05-21 | 株式会社ニューフレアテクノロジー | 成膜装置および成膜方法 |
| EP2657373A1 (de) | 2012-04-23 | 2013-10-30 | Chung-Shan Institute of Science and Technology, Armaments, Bureau, Ministry of National Defense | Tiegel zum Züchten von Kristallen |
| KR101458183B1 (ko) * | 2013-03-07 | 2014-11-05 | 에스케이씨 주식회사 | 탄화규소 단결정 성장 장치 및 방법 |
| EP2823703A1 (de) | 2013-07-10 | 2015-01-14 | Heliospectra AB | Verfahren und Vorrichtung zur Steuerung von Pflanzenwachstum |
| US9580837B2 (en) * | 2014-09-03 | 2017-02-28 | Ii-Vi Incorporated | Method for silicon carbide crystal growth by reacting elemental silicon vapor with a porous carbon solid source material |
| CN105702561B (zh) * | 2014-12-12 | 2018-09-18 | 韩国东海炭素株式会社 | 半导体处理组件再生方法 |
| CN104514034B (zh) * | 2015-01-08 | 2017-10-27 | 中国科学院半导体研究所 | 用于碳化硅生长的高温装置及方法 |
| CN108463580B (zh) | 2015-09-24 | 2021-11-12 | 帕里杜斯有限公司 | 气相沉积装置以及使用高纯度聚合物衍生的碳化硅的技术 |
| CN106929919A (zh) * | 2015-12-29 | 2017-07-07 | 中国科学院上海硅酸盐研究所 | 一种碳化硅晶体生长用坩埚 |
| CN105525352B (zh) * | 2016-01-12 | 2018-07-10 | 台州市一能科技有限公司 | 一种采用升华法高速制造碳化硅晶体的装置及方法 |
| JP6390628B2 (ja) * | 2016-01-12 | 2018-09-19 | トヨタ自動車株式会社 | SiC単結晶の製造方法及び製造装置 |
| CN105543964A (zh) * | 2016-02-02 | 2016-05-04 | 北京华进创威电子有限公司 | 消除碳化硅单晶生长过程中硅对石墨体腐蚀的方法和装置 |
| CN108070908A (zh) * | 2016-11-17 | 2018-05-25 | 上海新昇半导体科技有限公司 | 4H-SiC晶体生长设备及方法 |
| JP7068914B2 (ja) * | 2018-04-26 | 2022-05-17 | 昭和電工株式会社 | 断熱性遮蔽部材及びそれを備えた単結晶製造装置 |
| CN109234798B (zh) * | 2018-11-02 | 2019-07-23 | 山东天岳先进材料科技有限公司 | 碳化硅单晶的连续长晶方法 |
| KR102233751B1 (ko) * | 2019-03-12 | 2021-03-30 | 주식회사 카보넥스 | 탄화규소 제조장치 및 그를 이용한 탄화규소의 제조방법 |
| JP7393900B2 (ja) * | 2019-09-24 | 2023-12-07 | 一般財団法人電力中央研究所 | 炭化珪素単結晶ウェハ及び炭化珪素単結晶インゴットの製造方法 |
| CN111732448A (zh) * | 2020-06-16 | 2020-10-02 | 璨隆科技发展有限公司 | 一种石墨坩埚及其制备方法 |
| JP7711173B2 (ja) | 2020-08-06 | 2025-07-22 | エスジーエル・カーボン・エスイー | デバイス及びデバイスを調製するためのcvd法 |
| WO2022076180A1 (en) * | 2020-10-06 | 2022-04-14 | Corning Incorporated | Protective coating for muffle in optical fiber draw furnace |
| CN113026099A (zh) * | 2021-03-05 | 2021-06-25 | 广州爱思威科技股份有限公司 | 碳化硅单晶生长控制装置及控制方法 |
| CN113463197A (zh) * | 2021-06-18 | 2021-10-01 | 广州爱思威科技股份有限公司 | 一种碳化硅晶体的制备方法、碳化硅晶片、碳化硅衬底及半导体器件 |
| CN114045558B (zh) * | 2021-10-19 | 2023-06-09 | 江苏超芯星半导体有限公司 | 一种以单一气体为源气体制备碳化硅晶体的方法 |
| CN115287760A (zh) * | 2022-08-04 | 2022-11-04 | 顾赢速科技(合肥)有限公司 | 高温化学气相沉积法生长碳化硅晶体的方法及其装置 |
| CN117403319A (zh) * | 2023-11-23 | 2024-01-16 | 保定市北方特种气体有限公司 | 烷基硅烷制备芯片用单晶碳化硅晶体的方法 |
| CN120328561B (zh) * | 2025-06-20 | 2025-11-18 | 浙江晶越半导体有限公司 | 一种低氮含量高纯碳化硅粉料的合成方法及装置 |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3230727C2 (de) | 1982-08-18 | 1987-02-19 | Siemens AG, 1000 Berlin und 8000 München | Verfahren zum Herstellen von Einkristallen aus Siliziumkarbid SiC |
| US4664944A (en) * | 1986-01-31 | 1987-05-12 | The United States Of America As Represented By The United States Department Of Energy | Deposition method for producing silicon carbide high-temperature semiconductors |
| US4866005A (en) | 1987-10-26 | 1989-09-12 | North Carolina State University | Sublimation of silicon carbide to produce large, device quality single crystals of silicon carbide |
| WO1992022922A2 (en) * | 1991-06-12 | 1992-12-23 | Case Western Reserve University | Process for the controlled growth of single-crystal films of silicon carbide polytypes on silicon carbide wafers |
| JPH05208900A (ja) * | 1992-01-28 | 1993-08-20 | Nisshin Steel Co Ltd | 炭化ケイ素単結晶の成長装置 |
| JP3491402B2 (ja) | 1995-08-07 | 2004-01-26 | 株式会社デンソー | 単結晶製造方法及びその単結晶製造装置 |
| SE9503426D0 (sv) * | 1995-10-04 | 1995-10-04 | Abb Research Ltd | A device for heat treatment of objects and a method for producing a susceptor |
| US5746827A (en) | 1995-12-27 | 1998-05-05 | Northrop Grumman Corporation | Method of producing large diameter silicon carbide crystals |
| RU2094547C1 (ru) | 1996-01-22 | 1997-10-27 | Юрий Александрович Водаков | Сублимационный способ выращивания монокристаллов карбида кремния и источник карбида кремния для осуществления способа |
| JP3384242B2 (ja) * | 1996-03-29 | 2003-03-10 | 株式会社豊田中央研究所 | 炭化珪素単結晶の製造方法 |
| US5873937A (en) | 1997-05-05 | 1999-02-23 | Northrop Grumman Corporation | Method of growing 4H silicon carbide crystal |
| US5915194A (en) * | 1997-07-03 | 1999-06-22 | The United States Of America As Represented By The Administrator Of National Aeronautics And Space Administration | Method for growth of crystal surfaces and growth of heteroepitaxial single crystal films thereon |
| JP4122548B2 (ja) * | 1997-10-15 | 2008-07-23 | 昭和電工株式会社 | 炭化珪素単結晶の製造方法 |
| JPH11116399A (ja) * | 1997-10-16 | 1999-04-27 | Denso Corp | 炭化タンタルのコーティング方法及びこの方法を用いて製造した単結晶製造装置 |
| US5985024A (en) * | 1997-12-11 | 1999-11-16 | Northrop Grumman Corporation | Method and apparatus for growing high purity single crystal silicon carbide |
| RU2162117C2 (ru) * | 1999-01-21 | 2001-01-20 | Макаров Юрий Николаевич | Способ эпитаксиального выращивания карбида кремния и реактор для его осуществления |
-
1999
- 1999-10-08 US US09/415,402 patent/US6824611B1/en not_active Expired - Lifetime
-
2000
- 2000-10-05 WO PCT/US2000/041076 patent/WO2001027361A1/en not_active Ceased
- 2000-10-05 CA CA002385621A patent/CA2385621C/en not_active Expired - Lifetime
- 2000-10-05 AU AU16316/01A patent/AU1631601A/en not_active Abandoned
- 2000-10-05 JP JP2001529488A patent/JP2003511337A/ja active Pending
- 2000-10-05 KR KR1020027003677A patent/KR100855650B1/ko not_active Expired - Lifetime
- 2000-10-05 CN CN00814001A patent/CN1384892A/zh active Pending
- 2000-10-05 AT AT00978907T patent/ATE284986T1/de not_active IP Right Cessation
- 2000-10-05 DE DE60016771T patent/DE60016771T2/de not_active Expired - Lifetime
- 2000-10-05 ES ES00978907T patent/ES2233478T3/es not_active Expired - Lifetime
- 2000-10-05 CN CNA2007101619502A patent/CN101220504A/zh active Pending
- 2000-10-05 EP EP00978907A patent/EP1218572B1/de not_active Expired - Lifetime
- 2000-11-13 TW TW089121008A patent/TW552325B/zh not_active IP Right Cessation
-
2004
- 2004-09-24 US US10/949,577 patent/US20050120943A1/en not_active Abandoned
Also Published As
| Publication number | Publication date |
|---|---|
| CA2385621C (en) | 2009-12-22 |
| CN1384892A (zh) | 2002-12-11 |
| EP1218572B1 (de) | 2004-12-15 |
| KR20020042682A (ko) | 2002-06-05 |
| EP1218572A1 (de) | 2002-07-03 |
| JP2003511337A (ja) | 2003-03-25 |
| DE60016771T2 (de) | 2006-02-23 |
| US6824611B1 (en) | 2004-11-30 |
| AU1631601A (en) | 2001-04-23 |
| KR100855650B1 (ko) | 2008-09-03 |
| DE60016771D1 (de) | 2005-01-20 |
| ES2233478T3 (es) | 2005-06-16 |
| CN101220504A (zh) | 2008-07-16 |
| CA2385621A1 (en) | 2001-04-19 |
| TW552325B (en) | 2003-09-11 |
| WO2001027361A1 (en) | 2001-04-19 |
| US20050120943A1 (en) | 2005-06-09 |
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