ATE287082T1 - Röntgendiffraktometer mit einstellbarem bildabstand - Google Patents
Röntgendiffraktometer mit einstellbarem bildabstandInfo
- Publication number
- ATE287082T1 ATE287082T1 AT99914933T AT99914933T ATE287082T1 AT E287082 T1 ATE287082 T1 AT E287082T1 AT 99914933 T AT99914933 T AT 99914933T AT 99914933 T AT99914933 T AT 99914933T AT E287082 T1 ATE287082 T1 AT E287082T1
- Authority
- AT
- Austria
- Prior art keywords
- rays
- sample
- ray
- image distance
- directed
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
- G01N23/20016—Goniometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
- G01N23/20025—Sample holders or supports therefor
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Holo Graphy (AREA)
- Apparatus For Radiation Diagnosis (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/056,654 US6069934A (en) | 1998-04-07 | 1998-04-07 | X-ray diffractometer with adjustable image distance |
| PCT/US1999/005876 WO1999051972A2 (en) | 1998-04-07 | 1999-03-17 | X-ray diffractometer with adjustable image distance |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE287082T1 true ATE287082T1 (de) | 2005-01-15 |
Family
ID=22005817
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT99914933T ATE287082T1 (de) | 1998-04-07 | 1999-03-17 | Röntgendiffraktometer mit einstellbarem bildabstand |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US6069934A (de) |
| EP (1) | EP1090285B1 (de) |
| AT (1) | ATE287082T1 (de) |
| AU (1) | AU3356999A (de) |
| DE (1) | DE69923182T2 (de) |
| WO (1) | WO1999051972A2 (de) |
Families Citing this family (35)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE19833524B4 (de) * | 1998-07-25 | 2004-09-23 | Bruker Axs Gmbh | Röntgen-Analysegerät mit Gradienten-Vielfachschicht-Spiegel |
| US20030022383A1 (en) * | 1999-04-06 | 2003-01-30 | Uab Research Foundation | Method for screening crystallization conditions in solution crystal growth |
| US7244396B2 (en) * | 1999-04-06 | 2007-07-17 | Uab Research Foundation | Method for preparation of microarrays for screening of crystal growth conditions |
| US7250305B2 (en) * | 2001-07-30 | 2007-07-31 | Uab Research Foundation | Use of dye to distinguish salt and protein crystals under microcrystallization conditions |
| US7214540B2 (en) * | 1999-04-06 | 2007-05-08 | Uab Research Foundation | Method for screening crystallization conditions in solution crystal growth |
| US7247490B2 (en) * | 1999-04-06 | 2007-07-24 | Uab Research Foundation | Method for screening crystallization conditions in solution crystal growth |
| CA2369935A1 (en) * | 1999-04-06 | 2000-10-12 | The Uab Research Foundation | Method for screening crystallization conditions in solution crystal growth |
| US6389100B1 (en) | 1999-04-09 | 2002-05-14 | Osmic, Inc. | X-ray lens system |
| US6630006B2 (en) * | 1999-06-18 | 2003-10-07 | The Regents Of The University Of California | Method for screening microcrystallizations for crystal formation |
| US6421417B1 (en) | 1999-08-02 | 2002-07-16 | Osmic, Inc. | Multilayer optics with adjustable working wavelength |
| US6453006B1 (en) * | 2000-03-16 | 2002-09-17 | Therma-Wave, Inc. | Calibration and alignment of X-ray reflectometric systems |
| US6870896B2 (en) | 2000-12-28 | 2005-03-22 | Osmic, Inc. | Dark-field phase contrast imaging |
| US6744850B2 (en) * | 2001-01-11 | 2004-06-01 | Therma-Wave, Inc. | X-ray reflectance measurement system with adjustable resolution |
| US6804324B2 (en) * | 2001-03-01 | 2004-10-12 | Osmo, Inc. | X-ray phase contrast imaging using a fabry-perot interferometer concept |
| US7670429B2 (en) * | 2001-04-05 | 2010-03-02 | The California Institute Of Technology | High throughput screening of crystallization of materials |
| US6510200B1 (en) | 2001-06-29 | 2003-01-21 | Osmic, Inc. | Multi-layer structure with variable bandpass for monochromatization and spectroscopy |
| US6643353B2 (en) | 2002-01-10 | 2003-11-04 | Osmic, Inc. | Protective layer for multilayers exposed to x-rays |
| EP1466166B2 (de) | 2002-01-15 | 2013-05-01 | Avantium International B.V. | Verfahren zur durchführung einer leistungsbeugungsanalyse |
| AU2003222026A1 (en) * | 2002-03-21 | 2003-10-08 | Bruker Axs, Inc. | Transmission mode x-ray diffraction screening system |
| US20070026528A1 (en) * | 2002-05-30 | 2007-02-01 | Delucas Lawrence J | Method for screening crystallization conditions in solution crystal growth |
| US20040007672A1 (en) * | 2002-07-10 | 2004-01-15 | Delucas Lawrence J. | Method for distinguishing between biomolecule and non-biomolecule crystals |
| JP3697246B2 (ja) * | 2003-03-26 | 2005-09-21 | 株式会社リガク | Ｘ線回折装置 |
| RU2242748C1 (ru) * | 2003-08-19 | 2004-12-20 | Общество с ограниченной ответственностью "Институт рентгеновской оптики" | Детектирующий узел для рентгеновских дифракционных измерений |
| US7801272B2 (en) * | 2007-09-28 | 2010-09-21 | Rigaku Corporation | X-ray diffraction apparatus and X-ray diffraction method |
| US7848483B2 (en) * | 2008-03-07 | 2010-12-07 | Rigaku Innovative Technologies | Magnesium silicide-based multilayer x-ray fluorescence analyzers |
| US7720197B2 (en) * | 2008-05-30 | 2010-05-18 | Rigaku Innovative Technologies, Inc. | High intensity x-ray beam system |
| JP6025211B2 (ja) * | 2013-11-28 | 2016-11-16 | 株式会社リガク | Ｘ線トポグラフィ装置 |
| JP6322172B2 (ja) * | 2015-09-11 | 2018-05-09 | 株式会社リガク | Ｘ線小角光学系装置 |
| KR102426344B1 (ko) | 2016-09-19 | 2022-07-27 | 소레크 뉴클리어 리서치 센터 | 샘플을 식별하는 ｘｒｆ 시스템과 방법 |
| US10753890B2 (en) * | 2017-03-09 | 2020-08-25 | Malvern Panalytical B.V. | High resolution X-ray diffraction method and apparatus |
| EP3605074A4 (de) * | 2017-03-30 | 2021-03-10 | Rigaku Corporation | Hilfsvorrichtung für röntgenuntersuchung und röntgenuntersuchungsvorrichtung |
| DE102017221005A1 (de) * | 2017-11-23 | 2019-05-23 | Carl Zeiss Smt Gmbh | Verfahren und Vorrichtung zur Kalibrierung einer diffraktiven Messstruktur |
| CN111722264B (zh) * | 2020-06-24 | 2023-02-03 | 中国科学院物理研究所 | 一种x射线多层膜反射镜的调节方法及应用 |
| US12259226B1 (en) * | 2024-04-30 | 2025-03-25 | King Saud University | Method of measuring thickness of thin films using diffraction of polarized light through a thin film |
| CN120703132B (zh) * | 2025-08-27 | 2025-11-28 | 中国航发北京航空材料研究院 | 一种x射线衍射测试的衍射结果确定方法及相关装置 |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| NL139600B (nl) * | 1968-12-10 | 1973-08-15 | Enraf Nonius | Goniometrische inrichting, in het bijzonder voor een diffractometer. |
| DE2933047C2 (de) * | 1979-08-16 | 1982-12-30 | Stoe & Cie. GmbH, 6100 Darmstadt | Verfahren und Vorrichtung der Röntgendiffraktion |
| US4525853A (en) * | 1983-10-17 | 1985-06-25 | Energy Conversion Devices, Inc. | Point source X-ray focusing device |
| US4958363A (en) * | 1986-08-15 | 1990-09-18 | Nelson Robert S | Apparatus for narrow bandwidth and multiple energy x-ray imaging |
| US5027377A (en) * | 1990-01-09 | 1991-06-25 | The United States Of America As Represented By The United States Department Of Energy | Chromatic X-ray magnifying method and apparatus by Bragg reflective planes on the surface of Abbe sphere |
| US5127039A (en) * | 1991-01-16 | 1992-06-30 | The United States Of America As Represented By The United States Department Of Energy | Sample holder for X-ray diffractometry |
| JPH04323545A (ja) * | 1991-04-22 | 1992-11-12 | Nec Corp | 全反射ｘ線回折顕微方法 |
| GB9122085D0 (en) * | 1991-10-17 | 1991-11-27 | Cambridge Surface Analytics | X-ray diffractometer |
| US5373544A (en) * | 1992-08-12 | 1994-12-13 | Siemens Aktiengesellschaft | X-ray diffractometer |
| US5359640A (en) * | 1993-08-10 | 1994-10-25 | Siemens Industrial Automation, Inc. | X-ray micro diffractometer sample positioner |
| US5418828A (en) * | 1993-09-08 | 1995-05-23 | The United States Of America As Represented By The Department Of Energy | Nondestructive method and apparatus for imaging grains in curved surfaces of polycrystalline articles |
| ATE169769T1 (de) * | 1994-05-11 | 1998-08-15 | Univ Colorado | Roentgenstrahlungsoptik mit streifendem lichteinfall und sphaerischen spiegeln |
| JPH0949812A (ja) * | 1995-08-08 | 1997-02-18 | Rigaku Corp | Ｘ線回折装置の試料ホルダ |
-
1998
- 1998-04-07 US US09/056,654 patent/US6069934A/en not_active Expired - Lifetime
-
1999
- 1999-03-17 AU AU33569/99A patent/AU3356999A/en not_active Abandoned
- 1999-03-17 AT AT99914933T patent/ATE287082T1/de not_active IP Right Cessation
- 1999-03-17 WO PCT/US1999/005876 patent/WO1999051972A2/en not_active Ceased
- 1999-03-17 EP EP99914933A patent/EP1090285B1/de not_active Expired - Lifetime
- 1999-03-17 DE DE69923182T patent/DE69923182T2/de not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| WO1999051972A2 (en) | 1999-10-14 |
| US6069934A (en) | 2000-05-30 |
| DE69923182T2 (de) | 2005-12-29 |
| WO1999051972A3 (en) | 2001-02-01 |
| AU3356999A (en) | 1999-10-25 |
| DE69923182D1 (de) | 2005-02-17 |
| EP1090285B1 (de) | 2005-01-12 |
| EP1090285A2 (de) | 2001-04-11 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |