ATE348394T1 - Mehrspurige integrierte spiralinduktivität - Google Patents
Mehrspurige integrierte spiralinduktivitätInfo
- Publication number
- ATE348394T1 ATE348394T1 AT00905784T AT00905784T ATE348394T1 AT E348394 T1 ATE348394 T1 AT E348394T1 AT 00905784 T AT00905784 T AT 00905784T AT 00905784 T AT00905784 T AT 00905784T AT E348394 T1 ATE348394 T1 AT E348394T1
- Authority
- AT
- Austria
- Prior art keywords
- frequency
- filter
- filters
- receiver
- image
- Prior art date
Links
Classifications
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F17/00—Fixed inductances of the signal type
- H01F17/0006—Printed inductances
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03B—GENERATION OF OSCILLATIONS, DIRECTLY OR BY FREQUENCY-CHANGING, BY CIRCUITS EMPLOYING ACTIVE ELEMENTS WHICH OPERATE IN A NON-SWITCHING MANNER; GENERATION OF NOISE BY SUCH CIRCUITS
- H03B5/00—Generation of oscillations using amplifier with regenerative feedback from output to input
- H03B5/08—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element comprising lumped inductance and capacitance
- H03B5/12—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element comprising lumped inductance and capacitance active element in amplifier being semiconductor device
- H03B5/1206—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element comprising lumped inductance and capacitance active element in amplifier being semiconductor device using multiple transistors for amplification
- H03B5/1212—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element comprising lumped inductance and capacitance active element in amplifier being semiconductor device using multiple transistors for amplification the amplifier comprising a pair of transistors, wherein an output terminal of each being connected to an input terminal of the other, e.g. a cross coupled pair
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03B—GENERATION OF OSCILLATIONS, DIRECTLY OR BY FREQUENCY-CHANGING, BY CIRCUITS EMPLOYING ACTIVE ELEMENTS WHICH OPERATE IN A NON-SWITCHING MANNER; GENERATION OF NOISE BY SUCH CIRCUITS
- H03B5/00—Generation of oscillations using amplifier with regenerative feedback from output to input
- H03B5/08—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element comprising lumped inductance and capacitance
- H03B5/12—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element comprising lumped inductance and capacitance active element in amplifier being semiconductor device
- H03B5/1228—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element comprising lumped inductance and capacitance active element in amplifier being semiconductor device the amplifier comprising one or more field effect transistors
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03B—GENERATION OF OSCILLATIONS, DIRECTLY OR BY FREQUENCY-CHANGING, BY CIRCUITS EMPLOYING ACTIVE ELEMENTS WHICH OPERATE IN A NON-SWITCHING MANNER; GENERATION OF NOISE BY SUCH CIRCUITS
- H03B5/00—Generation of oscillations using amplifier with regenerative feedback from output to input
- H03B5/08—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element comprising lumped inductance and capacitance
- H03B5/12—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element comprising lumped inductance and capacitance active element in amplifier being semiconductor device
- H03B5/1237—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element comprising lumped inductance and capacitance active element in amplifier being semiconductor device comprising means for varying the frequency of the generator
- H03B5/124—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element comprising lumped inductance and capacitance active element in amplifier being semiconductor device comprising means for varying the frequency of the generator the means comprising a voltage dependent capacitance
- H03B5/1243—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element comprising lumped inductance and capacitance active element in amplifier being semiconductor device comprising means for varying the frequency of the generator the means comprising a voltage dependent capacitance the means comprising voltage variable capacitance diodes
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03B—GENERATION OF OSCILLATIONS, DIRECTLY OR BY FREQUENCY-CHANGING, BY CIRCUITS EMPLOYING ACTIVE ELEMENTS WHICH OPERATE IN A NON-SWITCHING MANNER; GENERATION OF NOISE BY SUCH CIRCUITS
- H03B5/00—Generation of oscillations using amplifier with regenerative feedback from output to input
- H03B5/30—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element being electromechanical resonator
- H03B5/32—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element being electromechanical resonator being a piezoelectric resonator
- H03B5/36—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element being electromechanical resonator being a piezoelectric resonator active element in amplifier being semiconductor device
- H03B5/364—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element being electromechanical resonator being a piezoelectric resonator active element in amplifier being semiconductor device the amplifier comprising field effect transistors
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03D—DEMODULATION OR TRANSFERENCE OF MODULATION FROM ONE CARRIER TO ANOTHER
- H03D7/00—Transference of modulation from one carrier to another, e.g. frequency-changing
- H03D7/16—Multiple-frequency-changing
- H03D7/161—Multiple-frequency-changing all the frequency changers being connected in cascade
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03D—DEMODULATION OR TRANSFERENCE OF MODULATION FROM ONE CARRIER TO ANOTHER
- H03D7/00—Transference of modulation from one carrier to another, e.g. frequency-changing
- H03D7/18—Modifications of frequency-changers for eliminating image frequencies
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03G—CONTROL OF AMPLIFICATION
- H03G1/00—Details of arrangements for controlling amplification
- H03G1/0005—Circuits characterised by the type of controlling devices operated by a controlling current or voltage signal
- H03G1/0017—Circuits characterised by the type of controlling devices operated by a controlling current or voltage signal the device being at least one of the amplifying solid-state elements
- H03G1/0029—Circuits characterised by the type of controlling devices operated by a controlling current or voltage signal the device being at least one of the amplifying solid-state elements using field-effect transistors [FET]
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H11/00—Networks using active elements
- H03H11/02—Multiple-port networks
- H03H11/04—Frequency selective two-port networks
- H03H11/12—Frequency selective two-port networks using amplifiers with feedback
- H03H11/1291—Current or voltage controlled filters
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03J—TUNING RESONANT CIRCUITS; SELECTING RESONANT CIRCUITS
- H03J1/00—Details of adjusting, driving, indicating, or mechanical control arrangements for resonant circuits in general
- H03J1/0008—Details of adjusting, driving, indicating, or mechanical control arrangements for resonant circuits in general using a central processing unit, e.g. a microprocessor
- H03J1/0058—Details of adjusting, driving, indicating, or mechanical control arrangements for resonant circuits in general using a central processing unit, e.g. a microprocessor provided with channel identification means
- H03J1/0066—Details of adjusting, driving, indicating, or mechanical control arrangements for resonant circuits in general using a central processing unit, e.g. a microprocessor provided with channel identification means with means for analysing the received signal strength
- H03J1/0075—Details of adjusting, driving, indicating, or mechanical control arrangements for resonant circuits in general using a central processing unit, e.g. a microprocessor provided with channel identification means with means for analysing the received signal strength where the receiving frequencies of the stations are stored in a permanent memory, e.g. ROM
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03J—TUNING RESONANT CIRCUITS; SELECTING RESONANT CIRCUITS
- H03J3/00—Continuous tuning
- H03J3/02—Details
- H03J3/04—Arrangements for compensating for variations of physical values, e.g. temperature
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03J—TUNING RESONANT CIRCUITS; SELECTING RESONANT CIRCUITS
- H03J3/00—Continuous tuning
- H03J3/02—Details
- H03J3/06—Arrangements for obtaining constant bandwidth or gain throughout tuning range or ranges
- H03J3/08—Arrangements for obtaining constant bandwidth or gain throughout tuning range or ranges by varying a second parameter simultaneously with the tuning, e.g. coupling bandpass filter
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03J—TUNING RESONANT CIRCUITS; SELECTING RESONANT CIRCUITS
- H03J3/00—Continuous tuning
- H03J3/02—Details
- H03J3/16—Tuning without displacement of reactive element, e.g. by varying permeability
- H03J3/18—Tuning without displacement of reactive element, e.g. by varying permeability by discharge tube or semiconductor device simulating variable reactance
- H03J3/185—Tuning without displacement of reactive element, e.g. by varying permeability by discharge tube or semiconductor device simulating variable reactance with varactors, i.e. voltage variable reactive diodes
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L7/00—Automatic control of frequency or phase; Synchronisation
- H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
- H03L7/08—Details of the phase-locked loop
- H03L7/10—Details of the phase-locked loop for assuring initial synchronisation or for broadening the capture range
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L7/00—Automatic control of frequency or phase; Synchronisation
- H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
- H03L7/16—Indirect frequency synthesis, i.e. generating a desired one of a number of predetermined frequencies using a frequency- or phase-locked loop
- H03L7/22—Indirect frequency synthesis, i.e. generating a desired one of a number of predetermined frequencies using a frequency- or phase-locked loop using more than one loop
- H03L7/23—Indirect frequency synthesis, i.e. generating a desired one of a number of predetermined frequencies using a frequency- or phase-locked loop using more than one loop with pulse counters or frequency dividers
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B1/00—Details of transmission systems, not covered by a single one of groups H04B3/00 - H04B13/00; Details of transmission systems not characterised by the medium used for transmission
- H04B1/06—Receivers
- H04B1/16—Circuits
- H04B1/26—Circuits for superheterodyne receivers
- H04B1/28—Circuits for superheterodyne receivers the receiver comprising at least one semiconductor device having three or more electrodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D89/00—Aspects of integrated devices not covered by groups H10D84/00 - H10D88/00
- H10D89/60—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D89/00—Aspects of integrated devices not covered by groups H10D84/00 - H10D88/00
- H10D89/60—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD]
- H10D89/601—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W20/00—Interconnections in chips, wafers or substrates
- H10W20/40—Interconnections external to wafers or substrates, e.g. back-end-of-line [BEOL] metallisations or vias connecting to gate electrodes
- H10W20/497—Inductive arrangements or effects of, or between, wiring layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W42/00—Arrangements for protection of devices
- H10W42/60—Arrangements for protection of devices protecting against electrostatic charges or discharges, e.g. Faraday shields
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F17/00—Fixed inductances of the signal type
- H01F17/0006—Printed inductances
- H01F17/0013—Printed inductances with stacked layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F17/00—Fixed inductances of the signal type
- H01F17/0006—Printed inductances
- H01F2017/0053—Printed inductances with means to reduce eddy currents
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F21/00—Variable inductances or transformers of the signal type
- H01F21/12—Variable inductances or transformers of the signal type discontinuously variable, e.g. tapped
- H01F2021/125—Printed variable inductor with taps, e.g. for VCO
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03J—TUNING RESONANT CIRCUITS; SELECTING RESONANT CIRCUITS
- H03J2200/00—Indexing scheme relating to tuning resonant circuits and selecting resonant circuits
- H03J2200/10—Tuning of a resonator by means of digitally controlled capacitor bank
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Networks & Wireless Communication (AREA)
- Signal Processing (AREA)
- Computer Hardware Design (AREA)
- Noise Elimination (AREA)
- Coils Or Transformers For Communication (AREA)
- Control Of Motors That Do Not Use Commutators (AREA)
- Superheterodyne Receivers (AREA)
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US11760999P | 1999-01-28 | 1999-01-28 | |
| US13665499P | 1999-05-27 | 1999-05-27 | |
| US09/439,101 US7092043B2 (en) | 1998-11-12 | 1999-11-12 | Fully integrated tuner architecture |
| US09/483,551 US6445039B1 (en) | 1998-11-12 | 2000-01-14 | System and method for ESD Protection |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE348394T1 true ATE348394T1 (de) | 2007-01-15 |
Family
ID=27494147
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT00905784T ATE348394T1 (de) | 1999-01-28 | 2000-01-28 | Mehrspurige integrierte spiralinduktivität |
Country Status (6)
| Country | Link |
|---|---|
| US (5) | US6445039B1 (de) |
| EP (1) | EP1149391B1 (de) |
| AT (1) | ATE348394T1 (de) |
| AU (1) | AU2741400A (de) |
| DE (2) | DE60036140T2 (de) |
| WO (1) | WO2000045399A1 (de) |
Families Citing this family (73)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6885275B1 (en) * | 1998-11-12 | 2005-04-26 | Broadcom Corporation | Multi-track integrated spiral inductor |
| US6525609B1 (en) * | 1998-11-12 | 2003-02-25 | Broadcom Corporation | Large gain range, high linearity, low noise MOS VGA |
| US6445039B1 (en) * | 1998-11-12 | 2002-09-03 | Broadcom Corporation | System and method for ESD Protection |
| US7687858B2 (en) * | 1999-01-15 | 2010-03-30 | Broadcom Corporation | System and method for ESD protection |
| US8405152B2 (en) * | 1999-01-15 | 2013-03-26 | Broadcom Corporation | System and method for ESD protection |
| EP1145318B1 (de) * | 1999-01-15 | 2015-12-30 | Broadcom Corporation | System und verfahren für esd-schutz |
| JP3988914B2 (ja) * | 1999-04-28 | 2007-10-10 | 株式会社ルネサステクノロジ | 静電破壊保護回路を有する半導体集積回路 |
| GB2357633A (en) * | 1999-12-21 | 2001-06-27 | Nokia Mobile Phones Ltd | Electrostatic discharge protection for integrated circuits |
| US6721544B1 (en) * | 2000-11-09 | 2004-04-13 | Intel Corporation | Duplexer structure for coupling a transmitter and a receiver to a common antenna |
| US6577219B2 (en) | 2001-06-29 | 2003-06-10 | Koninklijke Philips Electronics N.V. | Multiple-interleaved integrated circuit transformer |
| US6937003B2 (en) * | 2002-03-26 | 2005-08-30 | Veris Industries, Llc | Power monitoring system |
| JP3794368B2 (ja) * | 2002-10-29 | 2006-07-05 | セイコーエプソン株式会社 | El表示装置 |
| US6987654B2 (en) * | 2002-11-27 | 2006-01-17 | Endevco Corporation | Electrostatic discharge circuit |
| US7522394B2 (en) * | 2003-08-21 | 2009-04-21 | Broadcom Corporation | Radio frequency integrated circuit having sectional ESD protection |
| TWI297095B (en) * | 2003-10-02 | 2008-05-21 | Au Optronics Corp | Bonding pad structure for a display and fabrication method thereof |
| US7729766B2 (en) | 2003-10-02 | 2010-06-01 | Medtronic, Inc. | Circuit board construction for handheld programmer |
| US20050118977A1 (en) * | 2003-12-02 | 2005-06-02 | Drogi Serge F. | Method, apparatus, and systems for digital radio communication systems |
| US7595949B1 (en) * | 2003-12-04 | 2009-09-29 | Maxtor Corporation | Method for active cancellation of write-to-read crosstalk |
| JP4978998B2 (ja) * | 2004-03-12 | 2012-07-18 | ローム株式会社 | 半導体装置 |
| US8134799B1 (en) | 2004-04-06 | 2012-03-13 | Oracle America, Inc. | Gripper assembly for data storage system |
| US7102447B2 (en) * | 2004-05-04 | 2006-09-05 | Telefonaktiebolaget L M Ericsson (Publ) | XO-buffer robust to interference |
| US7015823B1 (en) * | 2004-10-15 | 2006-03-21 | Systran Federal Corporation | Tamper resistant circuit boards |
| US7439592B2 (en) * | 2004-12-13 | 2008-10-21 | Broadcom Corporation | ESD protection for high voltage applications |
| US7505238B2 (en) * | 2005-01-07 | 2009-03-17 | Agnes Neves Woo | ESD configuration for low parasitic capacitance I/O |
| DE112005003364A5 (de) * | 2005-03-10 | 2007-10-04 | Conti Temic Microelectronic Gmbh | Einrichtung zur Energieversorgung eines integrierten Schaltkreises |
| US7272802B2 (en) * | 2005-05-11 | 2007-09-18 | Lsi Corporation | R-cells containing CDM clamps |
| JP2006324592A (ja) * | 2005-05-20 | 2006-11-30 | Nec Electronics Corp | 半導体集積回路装置 |
| US7375543B2 (en) * | 2005-07-21 | 2008-05-20 | Lsi Corporation | Electrostatic discharge testing |
| KR100718375B1 (ko) * | 2005-09-01 | 2007-05-14 | 주식회사 팬택앤큐리텔 | 정전기 방전 차단 기능을 구비한 이동통신 단말기 |
| US7566923B2 (en) * | 2005-12-23 | 2009-07-28 | Lsi Corporation | Isolated power domain core regions in platform ASICs |
| DE102006019888B4 (de) * | 2006-04-28 | 2012-10-04 | Infineon Technologies Ag | Verstärker mit ESD-Schutz |
| DE102006042800A1 (de) * | 2006-09-08 | 2008-03-27 | Conti Temic Microelectronic Gmbh | Geregelte Energieversorgung eines Schaltkreises |
| US7692907B2 (en) * | 2006-09-11 | 2010-04-06 | Industrial Technology Research Institute | Circuit for electrostatic discharge (ESD) protection |
| JP4312784B2 (ja) * | 2006-10-26 | 2009-08-12 | Necエレクトロニクス株式会社 | Esd解析装置、esd解析プログラム、半導体装置の設計方法、半導体装置の製造方法 |
| JP4425264B2 (ja) * | 2006-12-15 | 2010-03-03 | Okiセミコンダクタ株式会社 | 走査線駆動回路 |
| US7486135B2 (en) * | 2007-05-29 | 2009-02-03 | Telefonaktiebolaget Lm Ericsson (Publ) | Configurable, variable gain LNA for multi-band RF receiver |
| US7952844B2 (en) * | 2007-06-20 | 2011-05-31 | United Microelectronics Corp. | Electrostatic discharge immunizing circuit without area penalty |
| US8212155B1 (en) * | 2007-06-26 | 2012-07-03 | Wright Peter V | Integrated passive device |
| US7652355B2 (en) | 2007-08-01 | 2010-01-26 | Chartered Semiconductor Manufacturing, Ltd. | Integrated circuit shield structure |
| US7646254B2 (en) | 2007-08-30 | 2010-01-12 | Honeywell International Inc. | Radiation hard oscillator and differential circuit design |
| KR100894254B1 (ko) * | 2007-11-06 | 2009-04-21 | 주식회사 실리콘웍스 | 전압강하가 최소화된 전원공급라인을 구비하는 반도체 칩 |
| US8159254B2 (en) * | 2008-02-13 | 2012-04-17 | Infineon Technolgies Ag | Crack sensors for semiconductor devices |
| US9197423B2 (en) * | 2008-02-14 | 2015-11-24 | Akros Silicon, Inc. | Electrostatic discharge protection circuit |
| US8107918B2 (en) | 2008-04-11 | 2012-01-31 | Zoran Corporation | Broadband tuner for very wide signal conversion |
| US9343900B2 (en) * | 2008-07-24 | 2016-05-17 | Robert Bosch Gmbh | Passive network for electrostatic protection of integrated circuits |
| US8115321B2 (en) * | 2009-04-30 | 2012-02-14 | Lsi Corporation | Separate probe and bond regions of an integrated circuit |
| US8525265B2 (en) | 2010-02-12 | 2013-09-03 | United Microelectronics Corp. | Electrostatic discharge protection circuit |
| US8970239B2 (en) * | 2010-09-27 | 2015-03-03 | International Business Machines Corporation | Methods and systems for detecting ESD events in cabled devices |
| US8531806B2 (en) * | 2011-03-01 | 2013-09-10 | Qualcomm Incorporated | Distributed building blocks of R-C clamping circuitry in semiconductor die core area |
| DE102011016159B3 (de) * | 2011-04-05 | 2012-10-18 | Micronas Gmbh | Anordnung aus einem integrierten passiven Bauelement und einem auf einem Metallträger angeordneten Halbleiterkörper |
| DE102011100487A1 (de) | 2011-05-04 | 2012-11-08 | Micronas Gmbh | Integriertes passives Bauelement |
| DE102011100485B4 (de) | 2011-05-04 | 2016-04-28 | Micronas Gmbh | Integriertes passives Bauelement sowie dessen Verwendung |
| US9507441B2 (en) * | 2011-09-08 | 2016-11-29 | Jcm Electronic Stylus Llc | Electronic stylus with low skew tip for capacitive touch screens |
| KR101945866B1 (ko) | 2012-03-19 | 2019-02-11 | 삼성디스플레이 주식회사 | 차폐 도전체를 가지는 액정 표시 장치 |
| CN102693979B (zh) * | 2012-06-11 | 2017-02-08 | 上海华虹宏力半导体制造有限公司 | 全芯片esd保护电路 |
| CN103794592B (zh) * | 2012-10-30 | 2016-10-05 | 中芯国际集成电路制造(上海)有限公司 | 具有接地屏蔽结构的半导体器件 |
| KR102041265B1 (ko) * | 2013-05-02 | 2019-11-27 | 삼성전자주식회사 | Emi 차폐기능과 방열 기능을 가지는 반도체 패키지 |
| TWI526696B (zh) * | 2014-05-22 | 2016-03-21 | 聯詠科技股份有限公司 | 影像顯示系統及其顯示驅動模組 |
| TWI509927B (zh) * | 2014-08-20 | 2015-11-21 | Realtek Semiconductor Corp | 靜電放電防護電路 |
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-
2000
- 2000-01-14 US US09/483,551 patent/US6445039B1/en not_active Expired - Lifetime
- 2000-01-28 DE DE60036140T patent/DE60036140T2/de not_active Expired - Lifetime
- 2000-01-28 AU AU27414/00A patent/AU2741400A/en not_active Abandoned
- 2000-01-28 AT AT00905784T patent/ATE348394T1/de not_active IP Right Cessation
- 2000-01-28 DE DE60032336T patent/DE60032336T2/de not_active Expired - Lifetime
- 2000-01-28 WO PCT/US2000/002138 patent/WO2000045399A1/en not_active Ceased
- 2000-01-28 EP EP00905784A patent/EP1149391B1/de not_active Expired - Lifetime
-
2002
- 2002-07-19 US US10/198,408 patent/US6963110B2/en not_active Expired - Fee Related
-
2005
- 2005-07-01 US US11/171,325 patent/US7115952B2/en not_active Expired - Lifetime
-
2006
- 2006-09-15 US US11/521,361 patent/US7417303B2/en not_active Expired - Fee Related
-
2007
- 2007-07-26 US US11/878,750 patent/US7692247B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| US20070007598A1 (en) | 2007-01-11 |
| DE60036140D1 (de) | 2007-10-04 |
| DE60036140T2 (de) | 2008-05-15 |
| AU2741400A (en) | 2000-08-18 |
| US20020180001A1 (en) | 2002-12-05 |
| WO2000045399A1 (en) | 2000-08-03 |
| US6963110B2 (en) | 2005-11-08 |
| US6445039B1 (en) | 2002-09-03 |
| EP1149391B1 (de) | 2006-12-13 |
| US7115952B2 (en) | 2006-10-03 |
| DE60032336D1 (de) | 2007-01-25 |
| US7417303B2 (en) | 2008-08-26 |
| US20050236673A1 (en) | 2005-10-27 |
| DE60032336T2 (de) | 2007-06-28 |
| US20080036037A1 (en) | 2008-02-14 |
| US7692247B2 (en) | 2010-04-06 |
| EP1149391A1 (de) | 2001-10-31 |
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