ATE359524T1 - Prüfbare analog/digitalschnittstelleschaltung - Google Patents

Prüfbare analog/digitalschnittstelleschaltung

Info

Publication number
ATE359524T1
ATE359524T1 AT00402493T AT00402493T ATE359524T1 AT E359524 T1 ATE359524 T1 AT E359524T1 AT 00402493 T AT00402493 T AT 00402493T AT 00402493 T AT00402493 T AT 00402493T AT E359524 T1 ATE359524 T1 AT E359524T1
Authority
AT
Austria
Prior art keywords
signal
interface circuit
circuit
analogue
digital interface
Prior art date
Application number
AT00402493T
Other languages
English (en)
Inventor
Michael Fitchett
Jan Krellner
Original Assignee
Freescale Semiconductor Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Freescale Semiconductor Inc filed Critical Freescale Semiconductor Inc
Application granted granted Critical
Publication of ATE359524T1 publication Critical patent/ATE359524T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318541—Scan latches or cell details

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Logic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Analogue/Digital Conversion (AREA)
  • Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
  • Oscillators With Electromechanical Resonators (AREA)
AT00402493T 2000-09-11 2000-09-11 Prüfbare analog/digitalschnittstelleschaltung ATE359524T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP00402493A EP1189069B1 (de) 2000-09-11 2000-09-11 Prüfbare Analog/Digitalschnittstelleschaltung

Publications (1)

Publication Number Publication Date
ATE359524T1 true ATE359524T1 (de) 2007-05-15

Family

ID=8173852

Family Applications (1)

Application Number Title Priority Date Filing Date
AT00402493T ATE359524T1 (de) 2000-09-11 2000-09-11 Prüfbare analog/digitalschnittstelleschaltung

Country Status (6)

Country Link
US (1) US6993693B2 (de)
EP (1) EP1189069B1 (de)
AT (1) ATE359524T1 (de)
AU (1) AU2001287726A1 (de)
DE (1) DE60034337T2 (de)
WO (1) WO2002021148A1 (de)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7975184B2 (en) * 2006-04-03 2011-07-05 Donald Goff Diagnostic access system
CN104345263B (zh) * 2013-07-26 2017-11-03 北京兆易创新科技股份有限公司 一种数模混合芯片的信号管理方法和装置

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4393461A (en) * 1980-10-06 1983-07-12 Honeywell Information Systems Inc. Communications subsystem having a self-latching data monitor and storage device
JPS5813046A (ja) * 1981-07-17 1983-01-25 Victor Co Of Japan Ltd デ−タ読み取り回路
JPH0629621A (ja) * 1992-07-09 1994-02-04 Mitsubishi Electric Corp 半導体レーザ装置
US5406216A (en) * 1993-11-29 1995-04-11 Motorola, Inc. Technique and method for asynchronous scan design
JPH08189952A (ja) * 1994-09-29 1996-07-23 Sony Trans Com Inc 境界スキャン試験の試験方法及び装置
US5847561A (en) * 1994-12-16 1998-12-08 Texas Instruments Incorporated Low overhead input and output boundary scan cells
US5574731A (en) * 1995-02-22 1996-11-12 National Semiconductor Corporation Set/reset scan flip-flops
JPH0997164A (ja) * 1995-10-02 1997-04-08 Oki Electric Ind Co Ltd 非同期バーストデータ受信回路
KR0157903B1 (ko) * 1995-10-13 1999-03-20 문정환 아날로그/디지탈 변환기의 변환특성 테스트회로와 그 방법
WO1999056396A2 (en) * 1998-04-23 1999-11-04 Koninklijke Philips Electronics N.V. Testable ic having analog and digital circuits

Also Published As

Publication number Publication date
WO2002021148A1 (en) 2002-03-14
US6993693B2 (en) 2006-01-31
DE60034337D1 (de) 2007-05-24
DE60034337T2 (de) 2007-12-20
EP1189069A1 (de) 2002-03-20
AU2001287726A1 (en) 2002-03-22
EP1189069B1 (de) 2007-04-11
US20040100301A1 (en) 2004-05-27

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Legal Events

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