ATE363729T1 - Prüfverbinder mit anisotroper leitfähigkeit - Google Patents

Prüfverbinder mit anisotroper leitfähigkeit

Info

Publication number
ATE363729T1
ATE363729T1 AT03784569T AT03784569T ATE363729T1 AT E363729 T1 ATE363729 T1 AT E363729T1 AT 03784569 T AT03784569 T AT 03784569T AT 03784569 T AT03784569 T AT 03784569T AT E363729 T1 ATE363729 T1 AT E363729T1
Authority
AT
Austria
Prior art keywords
conductive
particles
anisotropically conductive
wafer
anisotropically
Prior art date
Application number
AT03784569T
Other languages
English (en)
Inventor
Ryoji Setaka
Terukazu Kokubo
Koji Seno
Takeo Hara
Original Assignee
Jsr Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jsr Corp filed Critical Jsr Corp
Application granted granted Critical
Publication of ATE363729T1 publication Critical patent/ATE363729T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06755—Material aspects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
    • H01R13/2414—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means conductive elastomers
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P74/00—Testing or measuring during manufacture or treatment of wafers, substrates or devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2889—Interfaces, e.g. between probe and tester
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
    • H01R12/70—Coupling devices
    • H01R12/71—Coupling devices for rigid printing circuits or like structures
    • H01R12/712—Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit
    • H01R12/714—Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit with contacts abutting directly the printed circuit; Button contacts therefore provided on the printed circuit
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
    • H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
    • H10W70/62—Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their interconnections
    • H10W70/63—Vias, e.g. via plugs
    • H10W70/635—Through-vias
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
    • H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
    • H10W70/62—Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their interconnections
    • H10W70/66—Conductive materials thereof

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Measuring Leads Or Probes (AREA)
  • Non-Insulated Conductors (AREA)
  • Conductive Materials (AREA)
  • Electron Sources, Ion Sources (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
AT03784569T 2002-08-09 2003-08-07 Prüfverbinder mit anisotroper leitfähigkeit ATE363729T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2002232204 2002-08-09
JP2002232203 2002-08-09

Publications (1)

Publication Number Publication Date
ATE363729T1 true ATE363729T1 (de) 2007-06-15

Family

ID=31719858

Family Applications (1)

Application Number Title Priority Date Filing Date
AT03784569T ATE363729T1 (de) 2002-08-09 2003-08-07 Prüfverbinder mit anisotroper leitfähigkeit

Country Status (9)

Country Link
US (1) US7131851B2 (de)
EP (1) EP1553622B1 (de)
KR (1) KR100714327B1 (de)
CN (1) CN100369226C (de)
AT (1) ATE363729T1 (de)
AU (1) AU2003254854A1 (de)
DE (1) DE60314164T2 (de)
TW (1) TWI239404B (de)
WO (1) WO2004015761A1 (de)

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JP3573120B2 (ja) * 2001-08-31 2004-10-06 Ｊｓｒ株式会社 異方導電性コネクターおよびその製造方法並びにその応用製品
US7288950B2 (en) * 2002-08-07 2007-10-30 Hoya Corporation Contacting component, method of producing the same, and test tool having the contacting component
EP1553622B1 (de) 2002-08-09 2007-05-30 JSR Corporation Prüfverbinder mit anisotroper leitfähigkeit
KR100756120B1 (ko) * 2003-03-26 2007-09-05 제이에스알 가부시끼가이샤 이방 도전성 커넥터 및 도전성 페이스트 조성물, 프로브부재 및 웨이퍼 검사 장치 및 웨이퍼 검사 방법
US8518304B1 (en) 2003-03-31 2013-08-27 The Research Foundation Of State University Of New York Nano-structure enhancements for anisotropic conductive material and thermal interposers
TWI239684B (en) * 2003-04-16 2005-09-11 Jsr Corp Anisotropic conductive connector and electric inspection device for circuit device
KR101051217B1 (ko) * 2003-06-12 2011-07-21 제이에스알 가부시끼가이샤 이방 도전성 커넥터 장치 및 그 제조 방법 및 회로 장치의검사 장치
US20060177971A1 (en) * 2004-01-13 2006-08-10 Jsr Corporation Anisotropically conductive connector, production process thereof and application product thereof
US7656176B2 (en) * 2004-10-29 2010-02-02 Jsr Corporation Probe member for wafer inspection, probe card for wafer inspection and wafer inspection equipment
KR101167748B1 (ko) * 2004-11-12 2012-07-23 제이에스알 가부시끼가이샤 웨이퍼 검사용 탐침 부재, 웨이퍼 검사용 프로브 카드 및웨이퍼 검사 장치
US7442049B2 (en) * 2005-02-09 2008-10-28 International Business Machines Corporation Electrical connecting device and method of forming same
US7052290B1 (en) * 2005-08-10 2006-05-30 Sony Ericsson Mobile Communications Ab Low profile connector for electronic interface modules
KR101359065B1 (ko) * 2006-04-11 2014-02-05 제이에스알 가부시끼가이샤 이방 도전성 커넥터 및 이방 도전성 커넥터 장치
JP4913523B2 (ja) * 2006-09-29 2012-04-11 北陸電気工業株式会社 回路基板相互接続用コネクタ装置
KR100875142B1 (ko) 2007-01-22 2008-12-22 리노공업주식회사 검사용 탐침 장치
US8723537B2 (en) * 2008-02-26 2014-05-13 Denki Kagaku Kogyo Kabushiki Kaisha Probe inspecting method and curable resin composition
JP5509486B2 (ja) * 2009-03-05 2014-06-04 ポリマテック・ジャパン株式会社 弾性コネクタ及び弾性コネクタの製造方法並びに導通接続具
JP5880428B2 (ja) * 2012-12-28 2016-03-09 株式会社オートネットワーク技術研究所 カードエッジコネクタ
JP6476747B2 (ja) * 2014-10-28 2019-03-06 デクセリアルズ株式会社 異方性導電フィルム及び接続構造体
US9820664B2 (en) 2014-11-20 2017-11-21 Biosense Webster (Israel) Ltd. Catheter with high density electrode spine array
US10537259B2 (en) 2015-06-29 2020-01-21 Biosense Webster (Israel) Ltd. Catheter having closed loop array with in-plane linear electrode portion
US9949656B2 (en) 2015-06-29 2018-04-24 Biosense Webster (Israel) Ltd. Catheter with stacked spine electrode assembly
US10575742B2 (en) 2015-06-30 2020-03-03 Biosense Webster (Israel) Ltd. Catheter having closed electrode assembly with spines of uniform length
KR101959536B1 (ko) * 2016-04-05 2019-03-18 주식회사 아이에스시 이종의 입자가 혼합된 도전성 입자를 포함하는 이방도전성 시트
JP2018073577A (ja) * 2016-10-27 2018-05-10 株式会社エンプラス 異方導電性シート及びその製造方法
CN112154538A (zh) 2018-03-30 2020-12-29 申泰公司 导电过孔及其制造方法
JP7405337B2 (ja) * 2018-10-11 2023-12-26 積水ポリマテック株式会社 電気接続シート、及び端子付きガラス板構造
KR102046283B1 (ko) * 2019-07-29 2019-11-18 주식회사 새한마이크로텍 이방 전도성 시트
TW202606057A (zh) * 2019-09-30 2026-02-01 美商山姆科技公司 導電通孔和其製造方法
KR102195339B1 (ko) * 2019-11-26 2020-12-24 김규선 도전성 입자
WO2021107484A1 (ko) 2019-11-26 2021-06-03 주식회사 스노우 도전성 입자 및 이를 갖는 검사용 소켓
KR102220172B1 (ko) * 2020-03-03 2021-02-25 (주)티에스이 신호 전송 커넥터
KR20220164169A (ko) * 2021-06-04 2022-12-13 주식회사 스노우 도전성 입자 및 이를 포함하는 검사용 소켓
CN114302302B (zh) * 2021-12-30 2024-02-02 歌尔股份有限公司 振膜及其制备方法、发声装置、电子设备
CN114286261B (zh) * 2021-12-30 2024-11-22 歌尔股份有限公司 振膜及其制备方法、发声装置、电子设备
CN114222227B (zh) * 2021-12-30 2024-06-11 歌尔股份有限公司 振膜及其制备方法、发声装置、电子设备
CN114268887B (zh) * 2021-12-30 2024-10-01 歌尔股份有限公司 振膜及其制备方法、发声装置、电子设备
US20250201683A1 (en) * 2023-12-19 2025-06-19 Analog Devices, Inc. Molded vertical interconnect array
JP7649400B1 (ja) * 2024-03-28 2025-03-19 富士フイルム株式会社 異方導電性部材及び接合体

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JP2737647B2 (ja) * 1994-03-10 1998-04-08 カシオ計算機株式会社 異方導電性接着剤およびそれを用いた導電接続構造
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JP3541777B2 (ja) 2000-03-15 2004-07-14 ソニーケミカル株式会社 異方性導電接続材料
KR20030078870A (ko) * 2000-12-08 2003-10-08 제이에스알 가부시끼가이샤 이방 도전성 시트 및 웨이퍼 검사 장치
JP3543765B2 (ja) * 2000-12-28 2004-07-21 Ｊｓｒ株式会社 ウエハ検査用プローブ装置
EP1553622B1 (de) 2002-08-09 2007-05-30 JSR Corporation Prüfverbinder mit anisotroper leitfähigkeit
AU2003247705A1 (en) * 2003-07-02 2005-02-15 Paricon Technologies Corporation Pin-array, separable, compliant electrical contact member

Also Published As

Publication number Publication date
TWI239404B (en) 2005-09-11
EP1553622A1 (de) 2005-07-13
WO2004015761A1 (ja) 2004-02-19
DE60314164T2 (de) 2008-02-07
EP1553622A4 (de) 2006-05-24
US20050272282A1 (en) 2005-12-08
DE60314164D1 (de) 2007-07-12
EP1553622B1 (de) 2007-05-30
US7131851B2 (en) 2006-11-07
KR100714327B1 (ko) 2007-05-04
KR20050027251A (ko) 2005-03-18
CN100369226C (zh) 2008-02-13
TW200408816A (en) 2004-06-01
CN1675756A (zh) 2005-09-28
AU2003254854A1 (en) 2004-02-25

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