ATE373820T1 - Probenhalter für die röntgenfluoreszenzanalyse mit einem dünnen flüssigkeitsabsorbierenden element - Google Patents

Probenhalter für die röntgenfluoreszenzanalyse mit einem dünnen flüssigkeitsabsorbierenden element

Info

Publication number
ATE373820T1
ATE373820T1 AT04724859T AT04724859T ATE373820T1 AT E373820 T1 ATE373820 T1 AT E373820T1 AT 04724859 T AT04724859 T AT 04724859T AT 04724859 T AT04724859 T AT 04724859T AT E373820 T1 ATE373820 T1 AT E373820T1
Authority
AT
Austria
Prior art keywords
ray fluorescence
fluorescence analysis
sample
liquid
liquid sample
Prior art date
Application number
AT04724859T
Other languages
English (en)
Inventor
Takao Moriyama
Michiko Inoue
Original Assignee
Rigaku Ind Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rigaku Ind Corp filed Critical Rigaku Ind Corp
Application granted granted Critical
Publication of ATE373820T1 publication Critical patent/ATE373820T1/de

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/07Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Sampling And Sample Adjustment (AREA)
AT04724859T 2003-08-01 2004-03-31 Probenhalter für die röntgenfluoreszenzanalyse mit einem dünnen flüssigkeitsabsorbierenden element ATE373820T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003285041 2003-08-01

Publications (1)

Publication Number Publication Date
ATE373820T1 true ATE373820T1 (de) 2007-10-15

Family

ID=34113861

Family Applications (1)

Application Number Title Priority Date Filing Date
AT04724859T ATE373820T1 (de) 2003-08-01 2004-03-31 Probenhalter für die röntgenfluoreszenzanalyse mit einem dünnen flüssigkeitsabsorbierenden element

Country Status (10)

Country Link
US (1) US7016463B2 (de)
EP (1) EP1650559B1 (de)
JP (1) JP3793829B2 (de)
KR (1) KR100713742B1 (de)
CN (1) CN100552443C (de)
AT (1) ATE373820T1 (de)
BR (1) BRPI0406196B1 (de)
DE (1) DE602004009082T2 (de)
RU (1) RU2308024C2 (de)
WO (1) WO2005012889A1 (de)

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7539282B2 (en) * 2005-04-07 2009-05-26 Cooper Environmental Services Llc XRF analyzer
JP4537367B2 (ja) * 2006-11-09 2010-09-01 株式会社リガク 全反射蛍光x線分析用試料点滴基板および全反射蛍光x線分析装置ならびに全反射蛍光x線分析方法
DE102007039000B4 (de) * 2007-05-21 2009-01-22 Terrachem Gmbh Analysenlabor Verfahren für die Probenpräparation flüssiger oder pastöser Stoffe zur Messung mittels Röntgenfluoreszenz und dafür geeigneter Probenkörper
JP5059520B2 (ja) * 2007-08-27 2012-10-24 株式会社リガク 試料乾燥装置
JP4838821B2 (ja) * 2008-03-18 2011-12-14 株式会社リガク 蛍光x線分析用試料保持具ならびにそれを用いる蛍光x線分析方法および装置
JP5938708B2 (ja) * 2011-10-17 2016-06-22 株式会社リガク 蛍光x線分析用の較正試料ならびにそれを備える蛍光x線分析装置およびそれを用いる蛍光x線分析方法
JP2015152388A (ja) * 2014-02-13 2015-08-24 株式会社日立ハイテクサイエンス X線分析用サンプルホルダ及びサンプル設置用治具
JP6498491B2 (ja) * 2015-03-27 2019-04-10 中部電力株式会社 溶液中に含まれる金属成分の簡易濃度分析方法
EP3078964B1 (de) * 2015-04-09 2017-05-24 Honeywell International Inc. Sensoren der relativen feuchtigkeit und verfahren
JP2016223836A (ja) * 2015-05-28 2016-12-28 王子ホールディングス株式会社 高塩試料中の金属の分析方法
CN104880477B (zh) * 2015-06-19 2017-12-01 金川集团股份有限公司 一种混合铜精矿多元素的x荧光联测分析法
JP6421724B2 (ja) * 2015-08-27 2018-11-14 住友金属鉱山株式会社 蛍光x線分析装置を用いた試料溶液の定量分析方法
JP6746436B2 (ja) * 2016-08-30 2020-08-26 日本電子株式会社 分析方法
CN106290438B (zh) * 2016-09-13 2019-04-12 中钢集团马鞍山矿山研究院有限公司 一种x射线荧光光谱熔融法测定萤石中氟化钙含量的方法
CN106338534B (zh) * 2016-09-13 2019-04-12 中钢集团马鞍山矿山研究院有限公司 采用x射线荧光光谱仪快速测定萤石中氟化钙含量的方法
SE540371C2 (en) * 2017-02-06 2018-08-21 Orexplore Ab A sample holder for holding a drill core sample or drill cuttings, an apparatus and system comprising the holder
US10989677B2 (en) * 2017-03-07 2021-04-27 Rigaku Corporation Sample collecting device, sample collecting method, and fluorescent x-ray analysis apparatus using the same
CN108709901B (zh) * 2018-08-10 2025-01-07 中国原子能科学研究院 一种用于全反射x光荧光光谱仪直接测量滤膜载大气颗粒的压环装置
KR102470128B1 (ko) * 2019-05-15 2022-11-22 주식회사 엘지화학 전지의 xrd 측정용 스테이지 장치
RU205232U1 (ru) * 2020-12-03 2021-07-05 Федеральное государственное бюджетное образовательное учреждение высшего образования «Московский государственный университет имени М.В.Ломоносова» (МГУ) Держатель образцов для регистрации спектров рентгеновского поглощения в инертной атмосфере
RU203691U1 (ru) * 2020-12-25 2021-04-15 федеральное государственное автономное образовательное учреждение высшего образования "Санкт-Петербургский политехнический университет Петра Великого" (ФГАОУ ВО "СПбПУ") Держатель образца для проведения рентгеноструктурных измерений в широком температурном диапазоне, с возможностью одновременного приложения к образцу одноосной деформации растяжения и электрического поля
RU205420U1 (ru) * 2020-12-30 2021-07-14 Федеральное государственное бюджетное образовательное учреждение высшего образования "Московский государственный университет имени М.В.Ломоносова" (МГУ) Держатель образцов для регистрации спектров рентгеновского поглощения в инертной атмосфере
CN113447510B (zh) * 2021-06-25 2022-07-05 宁夏大学 一种水质中微量元素含量的原位连续检测装置
CN115931942A (zh) * 2022-12-08 2023-04-07 中国铝业股份有限公司 一种x射线荧光光谱测定样品及其制备方法
JP7716116B2 (ja) * 2023-03-31 2025-07-31 株式会社リガク 試料パウチセル及び蛍光x線分析方法
CN116626006A (zh) * 2023-06-02 2023-08-22 杭州奥盛仪器有限公司 样本检测分析装置及方法

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5958344A (ja) * 1982-09-28 1984-04-04 Shimadzu Corp けい光x線分析供試用ろ紙
US4587666A (en) * 1984-05-03 1986-05-06 Angelo M. Torrisi System and a method for mounting film to a sample holder for X-ray spectroscopic fluorescence analysis
US4595561A (en) * 1984-11-19 1986-06-17 Martin Marietta Corporation Liquid sample holder
SU1763958A1 (ru) * 1990-07-05 1992-09-23 Московский Геологоразведочный Институт Им.Серго Орджоникидзе Держатель образца дл проведени рентгенофлуоресцентного анализа жидких проб
RU2035725C1 (ru) * 1991-12-09 1995-05-20 Владимир Яковлевич Борходоев Кювета для рентгенофлуоресцентного анализа
JPH0755733A (ja) * 1993-08-18 1995-03-03 Rigaku Ind Co 蛍光x線分析用の試料保持坦体および蛍光x線分析方法
US5544218A (en) * 1994-10-28 1996-08-06 Moxtek, Inc. Thin film sample support
RU2105283C1 (ru) * 1995-11-30 1998-02-20 Товарищество с ограниченной ответственностью Инновационное предприятие "ТЕТРАН" Способ подготовки проб для рентгеноспектрального флуоресцентного анализа
US5958345A (en) * 1997-03-14 1999-09-28 Moxtek, Inc. Thin film sample support
US6391578B2 (en) * 1997-04-09 2002-05-21 3M Innovative Properties Company Method and devices for partitioning biological sample liquids into microvolumes
JP2003050115A (ja) * 2001-08-07 2003-02-21 Seiko Instruments Inc X線膜厚計
JP2003090810A (ja) * 2001-09-19 2003-03-28 Shimadzu Corp 蛍光x線分析用点滴フイルムおよび蛍光x線分析方法

Also Published As

Publication number Publication date
JP3793829B2 (ja) 2006-07-05
KR20060002731A (ko) 2006-01-09
CN100552443C (zh) 2009-10-21
BRPI0406196A (pt) 2005-08-09
KR100713742B1 (ko) 2007-05-02
DE602004009082D1 (de) 2007-10-31
EP1650559A4 (de) 2006-08-23
BRPI0406196B1 (pt) 2015-09-01
WO2005012889A1 (ja) 2005-02-10
EP1650559A1 (de) 2006-04-26
RU2308024C2 (ru) 2007-10-10
EP1650559B1 (de) 2007-09-19
JPWO2005012889A1 (ja) 2006-09-21
CN1820195A (zh) 2006-08-16
US20050232393A1 (en) 2005-10-20
DE602004009082T2 (de) 2008-01-24
RU2005110658A (ru) 2005-09-10
US7016463B2 (en) 2006-03-21

Similar Documents

Publication Publication Date Title
ATE373820T1 (de) Probenhalter für die röntgenfluoreszenzanalyse mit einem dünnen flüssigkeitsabsorbierenden element
CN103547925B (zh) 用于分子或粒子的超灵敏探测的系统、装置以及方法
KR101982331B1 (ko) 샘플 특히 혈액샘플을 분석하기 위한 장치와 시스템 및 그 사용 방법
AU2016323072B2 (en) Device and system for collecting and analyzing vapor condensate, particularly exhaled breath condensate, as well as method of using the same
US3736042A (en) Microscope slide assembly
US20020019062A1 (en) Assay devices
WO2007072472A3 (en) Systems and methods for analyzing and manipulating biological samples
Lin et al. Development of a nanoparticle-labeled microfluidic immunoassay for detection of pathogenic microorganisms
EP1857804A3 (de) Vorrichtung zur Analyse von Partikeln in Urin und Verfahren dafür
ATE417297T1 (de) Vorrichtung und verfahren zur untersuchung chemischer und/ oder biologischer proben sowie objektivaufsatz
JPH09105708A (ja) 液体保持具とその製造方法
CN105344391B (zh) 一种布芯片重力/毛细流动化学发光方法
US20150260656A1 (en) Method for detecting analytes
AU1785499A (en) Method and biosensor for detecting antigen
DE50015232D1 (de) Verfahren und Vorrichtung zur Kontrolle der Flüssigkeitsaufnahme einer Testschicht eines Analyseelementes
EP0807816A4 (de) Verfahren zur untersuchung einer substanz durch kontrolle der chemilumineszenzdosis
JP2000230912A (ja) X線分析用試料ホルダおよびx線分析装置
EP1742054A4 (de) Biochip-produktionsverfahren, biochip, biochip-analysevorrichtung, biochip-analyseverfahren
ES2109404T3 (es) Elemento analitico para el analisis de una muestra liquida.
JP2002107313A (ja) X線分析用試料ホルダおよびx線分析装置
KR960018583A (ko) 면역 분석법
CN111366725A (zh) 增强检测信号的检测方法、装置及试片
TWI300477B (en) Sample retainer for x-ray fluorescence analysis, x-ray fluorescence analyzing method using the same and x-ray fluorescence spectrometer therefor
HK40042539A (en) Systems, devices, and methods for ultra-sensitive detection of molecules or particles
ES2085412T3 (es) Un instrumento y un metodo para medir la actividad de una enzima o la actividad de una sustancia que inhibe la reaccion enzimatica.

Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties