ATE374950T1 - Automatische testmustererzeugung - Google Patents

Automatische testmustererzeugung

Info

Publication number
ATE374950T1
ATE374950T1 AT04733892T AT04733892T ATE374950T1 AT E374950 T1 ATE374950 T1 AT E374950T1 AT 04733892 T AT04733892 T AT 04733892T AT 04733892 T AT04733892 T AT 04733892T AT E374950 T1 ATE374950 T1 AT E374950T1
Authority
AT
Austria
Prior art keywords
code words
test pattern
pattern generation
automatic test
test patterns
Prior art date
Application number
AT04733892T
Other languages
English (en)
Inventor
Erik Marinissen
Hubertus Vermeulen
Hendrik Hollmann
Original Assignee
Koninkl Philips Electronics Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninkl Philips Electronics Nv filed Critical Koninkl Philips Electronics Nv
Application granted granted Critical
Publication of ATE374950T1 publication Critical patent/ATE374950T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318371—Methodologies therefor, e.g. algorithms, procedures

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Holo Graphy (AREA)
  • Magnetic Heads (AREA)
  • Developing Agents For Electrophotography (AREA)
AT04733892T 2003-05-23 2004-05-19 Automatische testmustererzeugung ATE374950T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP03076585A EP1480048A1 (de) 2003-05-23 2003-05-23 Automatische Testmuster-Erzeugung

Publications (1)

Publication Number Publication Date
ATE374950T1 true ATE374950T1 (de) 2007-10-15

Family

ID=33041023

Family Applications (1)

Application Number Title Priority Date Filing Date
AT04733892T ATE374950T1 (de) 2003-05-23 2004-05-19 Automatische testmustererzeugung

Country Status (7)

Country Link
US (1) US7475317B2 (de)
EP (2) EP1480048A1 (de)
JP (1) JP2007501408A (de)
CN (1) CN100492041C (de)
AT (1) ATE374950T1 (de)
DE (1) DE602004009309T2 (de)
WO (1) WO2004104608A1 (de)

Families Citing this family (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9437328B2 (en) * 2012-11-30 2016-09-06 Silicon Motion Inc. Apparatus and method for applying at-speed functional test with lower-speed tester
US9361538B2 (en) * 2012-12-26 2016-06-07 Microsoft Technology Licensing, Llc Real time photometric edge description
US10991001B2 (en) 2013-03-13 2021-04-27 Eversight, Inc. Systems and methods for intelligent promotion design with promotion scoring
US10846736B2 (en) 2013-03-13 2020-11-24 Eversight, Inc. Linkage to reduce errors in online promotion testing
US11138628B2 (en) 2013-03-13 2021-10-05 Eversight, Inc. Promotion offer language and methods thereof
US9940639B2 (en) * 2013-03-13 2018-04-10 Eversight, Inc. Automated and optimal promotional experimental test designs incorporating constraints
US10915912B2 (en) 2013-03-13 2021-02-09 Eversight, Inc. Systems and methods for price testing and optimization in brick and mortar retailers
US10909561B2 (en) 2013-03-13 2021-02-02 Eversight, Inc. Systems and methods for democratized coupon redemption
US10636052B2 (en) 2013-03-13 2020-04-28 Eversight, Inc. Automatic mass scale online promotion testing
US20220207548A1 (en) 2013-03-13 2022-06-30 Eversight, Inc. Systems and methods for contract based offer generation
US10706438B2 (en) 2013-03-13 2020-07-07 Eversight, Inc. Systems and methods for generating and recommending promotions in a design matrix
US11270325B2 (en) 2013-03-13 2022-03-08 Eversight, Inc. Systems and methods for collaborative offer generation
US11288696B2 (en) 2013-03-13 2022-03-29 Eversight, Inc. Systems and methods for efficient promotion experimentation for load to card
US10176491B2 (en) 2013-03-13 2019-01-08 Eversight, Inc. Highly scalable internet-based randomized experiment methods and apparatus for obtaining insights from test promotion results
US10984441B2 (en) 2013-03-13 2021-04-20 Eversight, Inc. Systems and methods for intelligent promotion design with promotion selection
US11068929B2 (en) 2013-03-13 2021-07-20 Eversight, Inc. Highly scalable internet-based controlled experiment methods and apparatus for obtaining insights from test promotion results
US10445763B2 (en) 2013-03-13 2019-10-15 Eversight, Inc. Automated promotion forecasting and methods therefor
US10789609B2 (en) 2013-03-13 2020-09-29 Eversight, Inc. Systems and methods for automated promotion to profile matching
US9984387B2 (en) 2013-03-13 2018-05-29 Eversight, Inc. Architecture and methods for promotion optimization
US9940640B2 (en) 2013-03-13 2018-04-10 Eversight, Inc. Automated event correlation to improve promotional testing
US10438230B2 (en) * 2013-03-13 2019-10-08 Eversight, Inc. Adaptive experimentation and optimization in automated promotional testing
US10140629B2 (en) 2013-03-13 2018-11-27 Eversight, Inc. Automated behavioral economics patterns in promotion testing and methods therefor
US10438231B2 (en) 2013-03-13 2019-10-08 Eversight, Inc. Automatic offer generation using concept generator apparatus and methods therefor
US11288698B2 (en) 2013-03-13 2022-03-29 Eversight, Inc. Architecture and methods for generating intelligent offers with dynamic base prices
US9274172B2 (en) * 2013-10-17 2016-03-01 International Business Machines Corporation Selective test pattern processor
US10460339B2 (en) 2015-03-03 2019-10-29 Eversight, Inc. Highly scalable internet-based parallel experiment methods and apparatus for obtaining insights from test promotion results
US11941659B2 (en) 2017-05-16 2024-03-26 Maplebear Inc. Systems and methods for intelligent promotion design with promotion scoring
CN109490753B (zh) * 2018-11-13 2020-12-08 吉林大学 一种结合极小碰集约简集成电路测试模式集的方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4857774A (en) * 1986-09-19 1989-08-15 Actel Corporation Testing apparatus and diagnostic method for use with programmable interconnect architecture
US5636229A (en) * 1992-11-18 1997-06-03 U.S. Philips Corporation Method for generating test patterns to detect an electric shortcircuit, a method for testing electric circuitry while using test patterns so generated, and a tester device for testing electric circuitry with such test patterns
TW473728B (en) * 1999-07-22 2002-01-21 Koninkl Philips Electronics Nv A method for testing a memory array and a memory-based device so testable with a fault response signalizing mode for when finding predetermined correspondence between fault patterns signalizing one such fault pattern only in the form of a compressed resp
TW583405B (en) * 2002-12-23 2004-04-11 Via Tech Inc Signal detection method suitable for integrated circuit chip

Also Published As

Publication number Publication date
JP2007501408A (ja) 2007-01-25
CN100492041C (zh) 2009-05-27
DE602004009309T2 (de) 2008-06-26
US20060259835A1 (en) 2006-11-16
EP1629290B1 (de) 2007-10-03
US7475317B2 (en) 2009-01-06
EP1629290A1 (de) 2006-03-01
WO2004104608A1 (en) 2004-12-02
CN1795395A (zh) 2006-06-28
DE602004009309D1 (de) 2007-11-15
EP1480048A1 (de) 2004-11-24

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