ATE385857T1 - Verfahren und vorichtung zur kontrolle der schichtdicke - Google Patents
Verfahren und vorichtung zur kontrolle der schichtdickeInfo
- Publication number
- ATE385857T1 ATE385857T1 AT03773410T AT03773410T ATE385857T1 AT E385857 T1 ATE385857 T1 AT E385857T1 AT 03773410 T AT03773410 T AT 03773410T AT 03773410 T AT03773410 T AT 03773410T AT E385857 T1 ATE385857 T1 AT E385857T1
- Authority
- AT
- Austria
- Prior art keywords
- control
- layer thickness
- substrate
- datastorage
- distributing
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0448—Apparatus for applying a liquid, a resin, an ink or the like
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C—APPARATUS FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C11/00—Component parts, details or accessories not specifically provided for in groups B05C1/00 - B05C9/00
- B05C11/02—Apparatus for spreading or distributing liquids or other fluent materials already applied to a surface ; Controlling means therefor; Control of the thickness of a coating by spreading or distributing liquids or other fluent materials already applied to the coated surface
- B05C11/08—Spreading liquid or other fluent material by manipulating the work, e.g. tilting
Landscapes
- Application Of Or Painting With Fluid Materials (AREA)
- Coating Apparatus (AREA)
- Manufacturing Optical Record Carriers (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Extrusion Moulding Of Plastics Or The Like (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US43134602P | 2002-12-05 | 2002-12-05 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE385857T1 true ATE385857T1 (de) | 2008-03-15 |
Family
ID=32469606
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT03773410T ATE385857T1 (de) | 2002-12-05 | 2003-12-02 | Verfahren und vorichtung zur kontrolle der schichtdicke |
Country Status (9)
| Country | Link |
|---|---|
| US (1) | US8062705B2 (de) |
| EP (1) | EP1569759B1 (de) |
| JP (1) | JP5199531B2 (de) |
| CN (1) | CN100553794C (de) |
| AT (1) | ATE385857T1 (de) |
| AU (1) | AU2003281895A1 (de) |
| DE (1) | DE60319129T2 (de) |
| TW (1) | TWI306784B (de) |
| WO (1) | WO2004050261A1 (de) |
Families Citing this family (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| AU2003274611A1 (en) * | 2003-01-14 | 2004-08-10 | Koninklijke Philips Electronics N.V. | Method of manufacturing an optical data storage medium, optical data storage medium and apparatus for performing said method |
| JP3988834B2 (ja) | 2004-06-03 | 2007-10-10 | 芝浦メカトロニクス株式会社 | 樹脂層形成方法及び樹脂層形成装置、ディスク及びディスク製造方法 |
| DE102005017178A1 (de) * | 2005-04-13 | 2006-10-19 | Bühler AG | Verfahren zur Herstellung eines gefüllten Verzehrproduktes |
| US20070105400A1 (en) * | 2005-11-08 | 2007-05-10 | Unaxis Balzers Ag | Method and apparatus for control of layer thicknesses |
| DE102006061585B4 (de) * | 2006-08-23 | 2013-11-28 | Singulus Technologies Ag | Verfahren und Vorrichtung zur Rotationsbeschichtung von Substraten |
| JP5262117B2 (ja) * | 2007-04-11 | 2013-08-14 | 株式会社リコー | スピンコート装置及びその温度制御方法、並びに光ディスク製造装置及び光ディスク製造方法 |
| US20120301998A1 (en) * | 2009-12-28 | 2012-11-29 | Takahiro Hashimoto | Method for manufacturing solar cell |
| CN103295936B (zh) | 2012-02-29 | 2016-01-13 | 斯克林集团公司 | 基板处理装置及基板处理方法 |
| CN104205305B (zh) | 2012-03-23 | 2017-03-08 | 斯克林集团公司 | 基板处理装置以及加热器清洗方法 |
| JP5946401B2 (ja) * | 2012-12-07 | 2016-07-06 | 株式会社ディスコ | 保護膜の被覆方法 |
| JP6242057B2 (ja) * | 2013-02-15 | 2017-12-06 | 株式会社Screenホールディングス | 基板処理装置 |
| US9360755B2 (en) * | 2013-03-14 | 2016-06-07 | Taiwan Semiconductor Manufacturing Company Limited | Thickening phase for spin coating process |
| JP6271304B2 (ja) | 2013-03-29 | 2018-01-31 | 芝浦メカトロニクス株式会社 | 基板処理装置及び基板処理方法 |
| US9248466B2 (en) * | 2013-05-10 | 2016-02-02 | Infineon Technologies Ag | Application of fluids to substrates |
| JP6319705B2 (ja) * | 2013-12-14 | 2018-05-09 | 木村 光照 | スピンコータ |
| JP6440111B2 (ja) * | 2014-08-14 | 2018-12-19 | 株式会社Screenホールディングス | 基板処理方法 |
| US10421867B2 (en) | 2015-03-16 | 2019-09-24 | Taiwan Semiconductor Manufacturing Company, Ltd. | Priming material for substrate coating |
Family Cites Families (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5155336A (en) * | 1990-01-19 | 1992-10-13 | Applied Materials, Inc. | Rapid thermal heating apparatus and method |
| US5580607A (en) * | 1991-07-26 | 1996-12-03 | Tokyo Electron Limited | Coating apparatus and method |
| JPH05259061A (ja) * | 1992-03-10 | 1993-10-08 | Kawasaki Steel Corp | 半導体基板のスピンコーティング方法および装置 |
| JPH05259062A (ja) * | 1992-03-10 | 1993-10-08 | Kawasaki Steel Corp | 半導体基板のスピンコーティング方法 |
| KR100370728B1 (ko) * | 1994-10-27 | 2003-04-07 | 실리콘 밸리 그룹, 인크. | 기판을균일하게코팅하는방법및장치 |
| JPH1012536A (ja) * | 1996-06-27 | 1998-01-16 | Dainippon Screen Mfg Co Ltd | 基板熱処理装置 |
| JP3405439B2 (ja) * | 1996-11-05 | 2003-05-12 | 株式会社荏原製作所 | 固体表面の清浄化方法 |
| KR100246964B1 (ko) * | 1996-11-28 | 2000-03-15 | 윤종용 | 반도체 스피너장비 |
| US5916368A (en) * | 1997-02-27 | 1999-06-29 | The Fairchild Corporation | Method and apparatus for temperature controlled spin-coating systems |
| JPH10261579A (ja) * | 1997-03-21 | 1998-09-29 | Matsushita Electron Corp | レジスト塗布装置及びレジスト塗布方法 |
| DE19742126A1 (de) * | 1997-09-24 | 1999-03-25 | Siemens Ag | Tragbarer Datenträger mit Aktivierungsschalter |
| US6300600B1 (en) * | 1998-08-12 | 2001-10-09 | Silicon Valley Group, Inc. | Hot wall rapid thermal processor |
| US6254936B1 (en) * | 1998-09-14 | 2001-07-03 | Silicon Valley Group, Inc. | Environment exchange control for material on a wafer surface |
| US6174651B1 (en) * | 1999-01-14 | 2001-01-16 | Steag Rtp Systems, Inc. | Method for depositing atomized materials onto a substrate utilizing light exposure for heating |
| US6322626B1 (en) * | 1999-06-08 | 2001-11-27 | Micron Technology, Inc. | Apparatus for controlling a temperature of a microelectronics substrate |
| JP2001068490A (ja) * | 1999-08-27 | 2001-03-16 | Sony Corp | 回転塗布装置および回転塗布方法 |
-
2003
- 2003-12-02 JP JP2004555946A patent/JP5199531B2/ja not_active Expired - Fee Related
- 2003-12-02 CN CNB2003801051316A patent/CN100553794C/zh not_active Expired - Fee Related
- 2003-12-02 DE DE60319129T patent/DE60319129T2/de not_active Expired - Lifetime
- 2003-12-02 AU AU2003281895A patent/AU2003281895A1/en not_active Abandoned
- 2003-12-02 WO PCT/CH2003/000791 patent/WO2004050261A1/en not_active Ceased
- 2003-12-02 US US10/725,795 patent/US8062705B2/en not_active Expired - Fee Related
- 2003-12-02 AT AT03773410T patent/ATE385857T1/de not_active IP Right Cessation
- 2003-12-02 EP EP03773410A patent/EP1569759B1/de not_active Expired - Lifetime
- 2003-12-05 TW TW092134345A patent/TWI306784B/zh not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| JP5199531B2 (ja) | 2013-05-15 |
| CN1720106A (zh) | 2006-01-11 |
| AU2003281895A1 (en) | 2004-06-23 |
| US8062705B2 (en) | 2011-11-22 |
| DE60319129D1 (de) | 2008-03-27 |
| DE60319129T2 (de) | 2009-03-05 |
| CN100553794C (zh) | 2009-10-28 |
| WO2004050261A1 (en) | 2004-06-17 |
| JP2006508787A (ja) | 2006-03-16 |
| TW200420355A (en) | 2004-10-16 |
| EP1569759B1 (de) | 2008-02-13 |
| TWI306784B (en) | 2009-03-01 |
| EP1569759A1 (de) | 2005-09-07 |
| US20040137751A1 (en) | 2004-07-15 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |