ATE407753T1 - Verfahren zum nassreinigen von einer oberfläche, insbesondere von einem material wie silizium- germanium - Google Patents

Verfahren zum nassreinigen von einer oberfläche, insbesondere von einem material wie silizium- germanium

Info

Publication number
ATE407753T1
ATE407753T1 AT04107061T AT04107061T ATE407753T1 AT E407753 T1 ATE407753 T1 AT E407753T1 AT 04107061 T AT04107061 T AT 04107061T AT 04107061 T AT04107061 T AT 04107061T AT E407753 T1 ATE407753 T1 AT E407753T1
Authority
AT
Austria
Prior art keywords
minutes
deionized water
silicon
rinsing
germanium
Prior art date
Application number
AT04107061T
Other languages
English (en)
Inventor
Alexandra Abbadie
Pascal Besson
Marie-Noelle Semeria
Original Assignee
Commissariat Energie Atomique
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat Energie Atomique filed Critical Commissariat Energie Atomique
Application granted granted Critical
Publication of ATE407753T1 publication Critical patent/ATE407753T1/de

Links

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B08—CLEANING
    • B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
    • B08B3/04—Cleaning involving contact with liquid
    • B08B3/08—Cleaning involving contact with liquid the liquid having chemical or dissolving effect
    • C—CHEMISTRY; METALLURGY
    • C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
    • C11D7/02—Inorganic compounds
    • C11D7/04—Water-soluble compounds
    • C11D7/08—Acids
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P70/00—Cleaning of wafers, substrates or parts of devices
    • H10P70/10—Cleaning before device manufacture, i.e. Begin-Of-Line process
    • H10P70/15—Cleaning before device manufacture, i.e. Begin-Of-Line process by wet cleaning only
    • C—CHEMISTRY; METALLURGY
    • C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D2111/00—Cleaning compositions characterised by the objects to be cleaned; Cleaning compositions characterised by non-standard cleaning or washing processes
    • C11D2111/10—Objects to be cleaned
    • C11D2111/14—Hard surfaces
    • C11D2111/22—Electronic devices, e.g. PCBs or semiconductors
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S134/00—Cleaning and liquid contact with solids
    • Y10S134/902—Semiconductor wafer

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Inorganic Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Oil, Petroleum & Natural Gas (AREA)
  • Wood Science & Technology (AREA)
  • Organic Chemistry (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
AT04107061T 2003-12-31 2004-12-30 Verfahren zum nassreinigen von einer oberfläche, insbesondere von einem material wie silizium- germanium ATE407753T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR0351239A FR2864457B1 (fr) 2003-12-31 2003-12-31 Procede de nettoyage par voie humide d'une surface notamment en un materiau de type silicium germanium.

Publications (1)

Publication Number Publication Date
ATE407753T1 true ATE407753T1 (de) 2008-09-15

Family

ID=34566400

Family Applications (1)

Application Number Title Priority Date Filing Date
AT04107061T ATE407753T1 (de) 2003-12-31 2004-12-30 Verfahren zum nassreinigen von einer oberfläche, insbesondere von einem material wie silizium- germanium

Country Status (6)

Country Link
US (2) US7250085B2 (de)
EP (1) EP1550517B1 (de)
JP (1) JP4667860B2 (de)
AT (1) ATE407753T1 (de)
DE (1) DE602004016451D1 (de)
FR (1) FR2864457B1 (de)

Families Citing this family (65)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20110018105A1 (en) * 2005-05-17 2011-01-27 Sumitomo Electric Industries, Ltd. Nitride-based compound semiconductor device, compound semiconductor device, and method of producing the devices
JP2006352075A (ja) * 2005-05-17 2006-12-28 Sumitomo Electric Ind Ltd 窒化物系化合物半導体および化合物半導体の洗浄方法、これらの製造方法および基板
KR100641060B1 (ko) * 2005-07-22 2006-11-01 삼성전자주식회사 게이트 구조물의 제조 방법 및 이를 이용하는 반도체장치의 제조 방법
JP4203054B2 (ja) * 2005-08-16 2008-12-24 株式会社東芝 半導体膜の成膜方法
KR100706798B1 (ko) * 2005-09-28 2007-04-12 삼성전자주식회사 실리콘막과 실리콘 게르마늄막이 노출된 기판의 세정 방법및 이를 이용하는 반도체 제조 방법
KR100811267B1 (ko) * 2005-12-22 2008-03-07 주식회사 하이닉스반도체 반도체소자의 듀얼게이트 형성방법
US20070295357A1 (en) * 2006-06-27 2007-12-27 Lovejoy Michael L Removing metal using an oxidizing chemistry
JP4894390B2 (ja) * 2006-07-25 2012-03-14 信越半導体株式会社 半導体基板の製造方法
JP5029234B2 (ja) * 2006-09-06 2012-09-19 株式会社Ｓｕｍｃｏ エピタキシャルウェーハの製造方法
ATE469199T1 (de) * 2006-10-31 2010-06-15 Soitec Silicon On Insulator Verfahren zur charakterisierung von defekten auf silizium-oberflächen, ätzlösung für silizium- oberflächen und verfahren zur behandlung von silizium-oberflächen mit der ätzlösung
DE102007040851A1 (de) * 2007-08-29 2009-03-05 Wacker Chemie Ag Verfahren zum Reinigen von polykristallinem Silicium
KR100931196B1 (ko) * 2007-10-10 2009-12-10 주식회사 실트론 실리콘 웨이퍼 세정 방법
EP2058844A1 (de) * 2007-10-30 2009-05-13 Interuniversitair Microelektronica Centrum (IMEC) Herstellungsverfahren für eine Halbleitervorrichtung
EP2072994A1 (de) * 2007-12-21 2009-06-24 Soitec S.A. Verfahren zur Behandlung von Germaniumoberflächen und dabei verwendete Lösungen
EP2077576A1 (de) * 2008-01-04 2009-07-08 S.O.I.Tec Silicon on Insulator Technologies Verfahren zur Herstellung von gereinigten, für epitaxiales Wachstum geeigneten Substraten
US7955936B2 (en) * 2008-07-14 2011-06-07 Chartered Semiconductor Manufacturing Ltd. Semiconductor fabrication process including an SiGe rework method
US7972922B2 (en) * 2008-11-21 2011-07-05 Freescale Semiconductor, Inc. Method of forming a semiconductor layer
US20110079250A1 (en) * 2009-10-01 2011-04-07 Mt Systems, Inc. Post-texturing cleaning method for photovoltaic silicon substrates
EP2611741A4 (de) 2010-09-02 2016-10-05 Fujifilm Planar Solutions Llc Reinigungsverfahren und -system
US8466502B2 (en) 2011-03-24 2013-06-18 United Microelectronics Corp. Metal-gate CMOS device
US8445363B2 (en) 2011-04-21 2013-05-21 United Microelectronics Corp. Method of fabricating an epitaxial layer
US8324059B2 (en) 2011-04-25 2012-12-04 United Microelectronics Corp. Method of fabricating a semiconductor structure
US8426284B2 (en) 2011-05-11 2013-04-23 United Microelectronics Corp. Manufacturing method for semiconductor structure
US8481391B2 (en) 2011-05-18 2013-07-09 United Microelectronics Corp. Process for manufacturing stress-providing structure and semiconductor device with such stress-providing structure
US8431460B2 (en) 2011-05-27 2013-04-30 United Microelectronics Corp. Method for fabricating semiconductor device
US8716750B2 (en) 2011-07-25 2014-05-06 United Microelectronics Corp. Semiconductor device having epitaxial structures
US8575043B2 (en) 2011-07-26 2013-11-05 United Microelectronics Corp. Semiconductor device and manufacturing method thereof
US8647941B2 (en) 2011-08-17 2014-02-11 United Microelectronics Corp. Method of forming semiconductor device
US8674433B2 (en) 2011-08-24 2014-03-18 United Microelectronics Corp. Semiconductor process
US8476169B2 (en) 2011-10-17 2013-07-02 United Microelectronics Corp. Method of making strained silicon channel semiconductor structure
US8691659B2 (en) 2011-10-26 2014-04-08 United Microelectronics Corp. Method for forming void-free dielectric layer
US8754448B2 (en) 2011-11-01 2014-06-17 United Microelectronics Corp. Semiconductor device having epitaxial layer
US8647953B2 (en) 2011-11-17 2014-02-11 United Microelectronics Corp. Method for fabricating first and second epitaxial cap layers
US8709930B2 (en) 2011-11-25 2014-04-29 United Microelectronics Corp. Semiconductor process
US9238755B2 (en) 2011-11-25 2016-01-19 Fujima Incorporated Polishing composition
RU2483387C1 (ru) * 2011-12-14 2013-05-27 Федеральное государственное бюджетное учреждение науки Физико-технический институт им. А.Ф. Иоффе Российской академии наук Способ предэпитаксиальной обработки поверхности германиевой подложки
US9136348B2 (en) 2012-03-12 2015-09-15 United Microelectronics Corp. Semiconductor structure and fabrication method thereof
US9202914B2 (en) 2012-03-14 2015-12-01 United Microelectronics Corporation Semiconductor device and method for fabricating the same
US8664069B2 (en) 2012-04-05 2014-03-04 United Microelectronics Corp. Semiconductor structure and process thereof
US8866230B2 (en) 2012-04-26 2014-10-21 United Microelectronics Corp. Semiconductor devices
US8835243B2 (en) 2012-05-04 2014-09-16 United Microelectronics Corp. Semiconductor process
US8632691B2 (en) * 2012-05-18 2014-01-21 Peking University Interface treatment method for germanium-based device
US8951876B2 (en) 2012-06-20 2015-02-10 United Microelectronics Corp. Semiconductor device and manufacturing method thereof
US8796695B2 (en) 2012-06-22 2014-08-05 United Microelectronics Corp. Multi-gate field-effect transistor and process thereof
US8710632B2 (en) 2012-09-07 2014-04-29 United Microelectronics Corp. Compound semiconductor epitaxial structure and method for fabricating the same
US9117925B2 (en) 2013-01-31 2015-08-25 United Microelectronics Corp. Epitaxial process
DE102013002637B4 (de) * 2013-02-15 2026-05-07 Freiberger Compound Materials Gmbh Verfahren zur Herstellung eines Galliumarsenidsubstrats, Galliumarsenidsubstrat und Verwendung desselben
US8753902B1 (en) 2013-03-13 2014-06-17 United Microelectronics Corp. Method of controlling etching process for forming epitaxial structure
US9034705B2 (en) 2013-03-26 2015-05-19 United Microelectronics Corp. Method of forming semiconductor device
US9064893B2 (en) 2013-05-13 2015-06-23 United Microelectronics Corp. Gradient dopant of strained substrate manufacturing method of semiconductor device
US9076652B2 (en) 2013-05-27 2015-07-07 United Microelectronics Corp. Semiconductor process for modifying shape of recess
US8853060B1 (en) 2013-05-27 2014-10-07 United Microelectronics Corp. Epitaxial process
US8765546B1 (en) 2013-06-24 2014-07-01 United Microelectronics Corp. Method for fabricating fin-shaped field-effect transistor
US8895396B1 (en) 2013-07-11 2014-11-25 United Microelectronics Corp. Epitaxial Process of forming stress inducing epitaxial layers in source and drain regions of PMOS and NMOS structures
US8981487B2 (en) 2013-07-31 2015-03-17 United Microelectronics Corp. Fin-shaped field-effect transistor (FinFET)
KR102156059B1 (ko) * 2014-02-04 2020-09-15 엘지전자 주식회사 태양 전지의 제조 방법
TWI629719B (zh) * 2015-01-15 2018-07-11 聯華電子股份有限公司 多階段清除基材的方法
JP6327207B2 (ja) * 2015-06-11 2018-05-23 インターユニバーシティ マイクロエレクトロニクス センター Ｇｅ又はＳｉＧｅまたはゲルマニドの洗浄方法
US9899387B2 (en) 2015-11-16 2018-02-20 Taiwan Semiconductor Manufacturing Company, Ltd. Multi-gate device and method of fabrication thereof
US9793105B1 (en) 2016-08-02 2017-10-17 United Microelectronics Corporation Fabricating method of fin field effect transistor (FinFET)
US9679780B1 (en) 2016-09-28 2017-06-13 International Business Machines Corporation Polysilicon residue removal in nanosheet MOSFETs
US20190256986A1 (en) * 2016-12-05 2019-08-22 Interuniversity Microelectronics Centre Ge, sige or germanide washing method
RU2658105C1 (ru) * 2017-06-19 2018-06-19 Федеральное государственное бюджетное образовательное учреждение высшего образования "Казанский национальный исследовательский технический университет им. А.Н. Туполева - КАИ" (КНИТУ-КАИ) Способ предварительной подготовки поверхности кремниевой подложки к технологическим процессам
US10896816B2 (en) 2017-09-26 2021-01-19 International Business Machines Corporation Silicon residue removal in nanosheet transistors
CN116065160B (zh) * 2023-01-06 2023-11-17 江苏新成标准件有限公司 一种高强度螺栓原料表面酸化处理装置及处理方法

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3154814B2 (ja) * 1991-06-28 2001-04-09 株式会社東芝 半導体ウエハの洗浄方法および洗浄装置
JP3338134B2 (ja) * 1993-08-02 2002-10-28 株式会社東芝 半導体ウエハ処理方法
JP2857042B2 (ja) * 1993-10-19 1999-02-10 新日本製鐵株式会社 シリコン半導体およびシリコン酸化物の洗浄液
US6103627A (en) * 1996-02-21 2000-08-15 Micron Technology, Inc. Treatment of a surface having an exposed silicon/silica interface
US5903037A (en) * 1997-02-24 1999-05-11 Lucent Technologies Inc. GaAs-based MOSFET, and method of making same
JPH11114510A (ja) * 1997-10-17 1999-04-27 Tadahiro Omi 温純水を用いた物品の洗浄方法
JP4477704B2 (ja) * 1997-11-20 2010-06-09 アイメック 半導体基板表面からの有機汚染物の除去方法
CA2311766A1 (en) * 1997-11-28 1999-06-10 Nicole Herbots Long range ordered and epitaxial oxides including sio2, on si, sixge1-x, gaas and other semiconductors, material synthesis, and applications thereof
JPH11204478A (ja) * 1998-01-19 1999-07-30 Mitsubishi Electric Corp 半導体基板の洗浄方法およびその洗浄装置
US5932022A (en) * 1998-04-21 1999-08-03 Harris Corporation SC-2 based pre-thermal treatment wafer cleaning process
DE19853486A1 (de) * 1998-11-19 2000-05-31 Wacker Siltronic Halbleitermat Verfahren zur naßchemischen Behandlung von Halbleiterscheiben
JP4415067B2 (ja) * 1999-05-10 2010-02-17 富士通マイクロエレクトロニクス株式会社 物体の薬液による処理方法および薬液処理装置
JP2002217158A (ja) * 2001-01-15 2002-08-02 Hitachi Ltd 半導体装置の製造方法
US6837944B2 (en) * 2001-07-25 2005-01-04 Akrion Llc Cleaning and drying method and apparatus
US6544373B2 (en) * 2001-07-26 2003-04-08 United Microelectronics Corp. Polishing pad for a chemical mechanical polishing process
JP2003086554A (ja) * 2001-09-11 2003-03-20 Mitsubishi Heavy Ind Ltd 半導体基板の製造装置、及び、その製造方法
TW200411726A (en) * 2002-12-31 2004-07-01 Au Optronics Corp Method for cleaning silicon surface and method for producing thin film transistor using the cleaning method

Also Published As

Publication number Publication date
JP2005244179A (ja) 2005-09-08
FR2864457B1 (fr) 2006-12-08
US20050139231A1 (en) 2005-06-30
DE602004016451D1 (de) 2008-10-23
EP1550517B1 (de) 2008-09-10
US7250085B2 (en) 2007-07-31
FR2864457A1 (fr) 2005-07-01
EP1550517A1 (de) 2005-07-06
US20070256705A1 (en) 2007-11-08
JP4667860B2 (ja) 2011-04-13
US7641738B2 (en) 2010-01-05

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