ATE41055T1 - Apparat zum messen einer dicke. - Google Patents

Apparat zum messen einer dicke.

Info

Publication number
ATE41055T1
ATE41055T1 AT82108258T AT82108258T ATE41055T1 AT E41055 T1 ATE41055 T1 AT E41055T1 AT 82108258 T AT82108258 T AT 82108258T AT 82108258 T AT82108258 T AT 82108258T AT E41055 T1 ATE41055 T1 AT E41055T1
Authority
AT
Austria
Prior art keywords
thickness
detector
standards
radiation
detector output
Prior art date
Application number
AT82108258T
Other languages
English (en)
Inventor
Dominique Gignoux
Russell Murray
Original Assignee
Data Measurement Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Data Measurement Corp filed Critical Data Measurement Corp
Application granted granted Critical
Publication of ATE41055T1 publication Critical patent/ATE41055T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G01B15/025—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness by measuring absorption

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
AT82108258T 1981-09-18 1982-09-08 Apparat zum messen einer dicke. ATE41055T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US06/303,574 US4574387A (en) 1981-09-18 1981-09-18 Apparatus and method for measuring thickness
EP82108258A EP0075190B1 (de) 1981-09-18 1982-09-08 Apparat zum Messen einer Dicke

Publications (1)

Publication Number Publication Date
ATE41055T1 true ATE41055T1 (de) 1989-03-15

Family

ID=23172718

Family Applications (1)

Application Number Title Priority Date Filing Date
AT82108258T ATE41055T1 (de) 1981-09-18 1982-09-08 Apparat zum messen einer dicke.

Country Status (5)

Country Link
US (1) US4574387A (de)
EP (1) EP0075190B1 (de)
JP (1) JPS5862508A (de)
AT (1) ATE41055T1 (de)
DE (1) DE3279479D1 (de)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4817021A (en) * 1985-01-24 1989-03-28 Commonwealth Scientific And Industrial Research Organisation Moisture and density determination
JPS61247918A (ja) * 1985-04-26 1986-11-05 Hochiki Corp アナログセンサの出力補正装置
GB8601176D0 (en) * 1986-01-17 1986-02-19 Infrared Eng Ltd Sensing
US5099504A (en) * 1987-03-31 1992-03-24 Adaptive Technologies, Inc. Thickness/density mesuring apparatus
US4928257A (en) * 1988-01-25 1990-05-22 Bethlehem Steel Corporation Method and apparatus for monitoring the thickness profile of a strip
US4912332A (en) * 1988-06-03 1990-03-27 Research And Development Institute, Inc. At Montana State University Non-destructive methods for detecting organic deposits and removing them
US5113358A (en) * 1990-03-28 1992-05-12 Barber-Colman Company Web caliper measuring system
US5379237A (en) * 1990-05-31 1995-01-03 Integrated Diagnostic Measurement Corporation Automated system for controlling the quality of regularly-shaped products during their manufacture
FR2666409B1 (fr) * 1990-09-05 1992-12-11 Siderurgie Fse Inst Rech Procede et dispositif de mesure de profil transversal d'epaisseur d'une bande metallique notamment en acier.
GB9105639D0 (en) * 1991-03-18 1991-05-01 Data Measurement Corp Dynamic alloy correction gauge
GB9113990D0 (en) * 1991-06-28 1991-08-14 Data Measurement Corp Means of calibrating x-ray gauging systems
US5446673A (en) * 1993-03-30 1995-08-29 General Electric Company System and method for finish machining an in-process part having an inaccessible interior cavity
DK175850B1 (da) * 2001-04-24 2005-03-29 Force Technology System og fremgangsmåde til måling af lagtykkelser af et flerlagsrör
US6596222B2 (en) 2001-08-20 2003-07-22 Thermtech Services, Inc. Carriage assembly for positioning and moving equipment relative to a wall
RU2262663C1 (ru) * 2004-07-05 2005-10-20 Закрытое акционерное общество Научно-исследовательский институт интроскопии Московского научно-производственного объединения "Спектр" Радиационный способ контроля толщины проката
FR2904421B1 (fr) * 2006-07-28 2008-10-31 Areva Np Sas Procede de caracterisation non destructif, notammenent pour les particules de combustible nucleaire pour reacteur a haute temperature
WO2010077407A2 (en) * 2008-10-08 2010-07-08 Fusion Research Technologies, Llc Thin film measurement technique
JP5847674B2 (ja) * 2012-09-10 2016-01-27 株式会社東芝 Ｘ線厚さ計
WO2014136194A1 (ja) 2013-03-04 2014-09-12 東京エレクトロン株式会社 Ｘ線非破壊検査装置
DE102014217594B4 (de) * 2014-09-03 2021-05-27 Mesacon Messelektronik Gmbh Dresden Verfahren und Vorrichtung zum Korrigieren einer Abweichung eines in einer Röntgenanlage gemessenen Dickenwerts einer Probe in Bezug zu einem Kalibrierwert
CN115962739A (zh) * 2023-02-06 2023-04-14 首钢京唐钢铁联合有限责任公司 X射线测厚仪的校准方法、装置、存储介质及电子设备
CN121252708B (zh) * 2025-12-05 2026-03-06 成都中核高通同位素股份有限公司 一种合金热轧板在线厚度测量方法及系统

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3334231A (en) * 1964-06-25 1967-08-01 Gen Electric Plate thickness measuring device with means to adjust source voltage in response to thickness variations
US3482098A (en) * 1967-10-10 1969-12-02 Bethlehem Steel Corp Temperature and composition compensator for radiation thickness gauges
US3486113A (en) * 1969-03-07 1969-12-23 Industrial Nucleonics Corp Standardization of measuring systems to provide a constant output signal response characteristic with a changeable input transducer signal response characteristic
US3683187A (en) * 1970-03-26 1972-08-08 Schlumberger Technology Corp Methods and apparatus for inspecting tubular goods using a continuous signal calibrating system
US3742217A (en) * 1971-01-18 1973-06-26 Lfe Corp Labor Electronics Inc Nuclear radiation gauge standardizing system
US4009376A (en) * 1972-02-15 1977-02-22 Sangamo Weston, Inc. Method and apparatus for measuring material thickness
US3844870A (en) * 1972-06-12 1974-10-29 Industrial Nucleonics Corp Process control system
US3936665A (en) * 1972-06-12 1976-02-03 Industrial Nucleonics Corporation Sheet material characteristic measuring, monitoring and controlling method and apparatus using data profile generated and evaluated by computer means
US3757122A (en) * 1972-10-30 1973-09-04 D Bossen Basis weight gauging apparatus system and method
JPS5922161B2 (ja) * 1974-05-13 1984-05-24 株式会社東芝 放射線厚み計
JPS533262A (en) * 1976-06-29 1978-01-12 Toshiba Corp Radiation thickness meter
SE401733B (sv) * 1976-12-06 1978-05-22 Atomenergi Ab Forfarande och apparat vid metning av plattjocklek
US4119846A (en) * 1977-02-03 1978-10-10 Sangamo Weston, Inc. Non-contacting gage apparatus and method
US4155009A (en) * 1977-04-07 1979-05-15 Unit Process Assemblies, Inc. Thickness measurement instrument with memory storage of multiple calibrations
JPS55114903A (en) * 1979-02-27 1980-09-04 Sumitomo Metal Ind Ltd Radiation thickness gauge
JPS5686303A (en) * 1979-12-18 1981-07-14 Toshiba Corp Measuring device for thickness of radiant ray
JPS56106107A (en) * 1980-01-29 1981-08-24 Toshiba Corp Radiation thickness measuring device
GB2114732B (en) * 1982-02-12 1985-10-02 Tokyo Shibaura Electric Co Non-contact radiation thickness gauge
US4510577A (en) * 1982-02-18 1985-04-09 Tokyo Shibaura Denki Kabushiki Kaisha Non-contact radiation thickness gauge

Also Published As

Publication number Publication date
JPS5862508A (ja) 1983-04-14
EP0075190B1 (de) 1989-03-01
EP0075190A2 (de) 1983-03-30
DE3279479D1 (en) 1989-04-06
US4574387A (en) 1986-03-04
EP0075190A3 (en) 1985-06-19

Similar Documents

Publication Publication Date Title
ATE41055T1 (de) Apparat zum messen einer dicke.
JPS53110553A (en) Measurement apparatus of gradients of curved faces
JPS5757246A (en) Detecting and measuring apparatus for flaw
ATE49295T1 (de) Optisch-elektronisches messverfahren, eine dafuer erforderliche einrichtung und deren verwendung.
JPS51122483A (en) Scanner type inspection device
JPS5646406A (en) Thickness measuring method for pipe wall of tubular material
JPS5332789A (en) Method and apparatus for measuring of stress of white color x-ray
EP0345562A3 (en) Method and apparatus for processing measuring data
JPS5249055A (en) Method of measuring surface roughness
JPS54130156A (en) Automatic measuring machine of screw elements
JPS6473239A (en) Gas concentration measurement for laser type gas sensor
GB1427752A (en) Method and apparatus for measuring material thickness
JPS522452A (en) Method and apparatus for measuring plate thickness
JPS5582006A (en) Measuring method for thickness
ES447125A1 (es) Un dispositivo para medir la absorcion de radiacion en una capa de un cuerpo.
EP0317339A3 (de) Verfahren und Apparat zur Messung des durch Korrosion und/oder Abtragung verursachten Materialverlustes
JPS542175A (en) Measuring apparatus of laser beam diameters
JPS5759110A (en) Measuring method for wall thickness of tubular material
ES406936A1 (es) Procedimiento y dispositivos para la medida de los defectosopticos de un cuerpo, en particular de vidrio plano.
JPS5213378A (en) Automatic measuring device for reflexibility distribution
JPS5391772A (en) Measurement apparatus
JPS53143289A (en) Semiconductor radiation measuring instrument
JPS524257A (en) Physical factor measuring system
Tseitalin Present State and Metrological Assurance in Thickness Gauging of Extra-Thin Coatings
JPS52142807A (en) Multiipurpose investigating and measuring tube and range checking apparatus for subsoil deformation

Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties