ATE410699T1 - Jtag-testanordnung - Google Patents

Jtag-testanordnung

Info

Publication number
ATE410699T1
ATE410699T1 AT03811403T AT03811403T ATE410699T1 AT E410699 T1 ATE410699 T1 AT E410699T1 AT 03811403 T AT03811403 T AT 03811403T AT 03811403 T AT03811403 T AT 03811403T AT E410699 T1 ATE410699 T1 AT E410699T1
Authority
AT
Austria
Prior art keywords
test
device under
data
transmission
asynchronous
Prior art date
Application number
AT03811403T
Other languages
English (en)
Inventor
Ilkka Reis
Mikko Simonen
Original Assignee
Jtag Technologies Bv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jtag Technologies Bv filed Critical Jtag Technologies Bv
Application granted granted Critical
Publication of ATE410699T1 publication Critical patent/ATE410699T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318555—Control logic
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318572—Input/Output interfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/3025—Wireless interface with the DUT

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
  • Investigating Or Analyzing Non-Biological Materials By The Use Of Chemical Means (AREA)
  • Maintenance And Management Of Digital Transmission (AREA)
  • Pharmaceuticals Containing Other Organic And Inorganic Compounds (AREA)
  • Luminescent Compositions (AREA)
  • Measuring Or Testing Involving Enzymes Or Micro-Organisms (AREA)
AT03811403T 2002-11-21 2003-11-20 Jtag-testanordnung ATE410699T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FI20020469U FI5706U1 (fi) 2002-11-21 2002-11-21 JTAG-testilaitteisto ja -testausjärjestelmä

Publications (1)

Publication Number Publication Date
ATE410699T1 true ATE410699T1 (de) 2008-10-15

Family

ID=8563515

Family Applications (1)

Application Number Title Priority Date Filing Date
AT03811403T ATE410699T1 (de) 2002-11-21 2003-11-20 Jtag-testanordnung

Country Status (11)

Country Link
US (1) US7536616B2 (de)
EP (1) EP1573345B1 (de)
JP (1) JP3114958U (de)
AT (1) ATE410699T1 (de)
AU (1) AU2003302037A1 (de)
DE (1) DE60324020D1 (de)
DK (1) DK1573345T3 (de)
ES (1) ES2314287T3 (de)
FI (1) FI5706U1 (de)
PT (1) PT1573345E (de)
WO (1) WO2004046741A1 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8373429B2 (en) 2006-03-07 2013-02-12 Steven Slupsky Method and apparatus for interrogating an electronic component
KR101387085B1 (ko) 2006-03-07 2014-04-18 스캐니메트릭스 인크. 전자 구성요소에 문의하기 위한 방법 및 장치
CN100507588C (zh) * 2006-06-09 2009-07-01 华为技术有限公司 一种JTAG Bridge的接口时序设计方法及其实现装置
US7804724B2 (en) * 2007-05-02 2010-09-28 Alcatel Lucent Method and apparatus for boundary scan programming of memory devices
CA2623257A1 (en) 2008-02-29 2009-08-29 Scanimetrics Inc. Method and apparatus for interrogating an electronic component
JP6278300B2 (ja) * 2012-10-19 2018-02-14 株式会社ローラン リモート操作システム、無線通信ユニット、及びリモートデバッグシステム
US10404609B2 (en) * 2017-12-14 2019-09-03 Litepoint Corporation Method for delaying signal transmissions from a device under test (DUT) by transmitting congestive communication channel signals
DE102021122253B3 (de) 2021-08-27 2023-02-16 Göpel electronic GmbH Instrument zur autarken ausführung von prüfsequenzen nach jtag-standard

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5983017A (en) 1996-11-12 1999-11-09 Lsi Logic Corporation Virtual monitor debugging method and apparatus
EP1145159A3 (de) 1998-09-30 2002-07-10 Cadence Design Systems, Inc. Blockbasiertes entwurfsverfahren
US6418545B1 (en) 1999-06-04 2002-07-09 Koninklijke Philips Electronics N.V. System and method to reduce scan test pins on an integrated circuit
US6725391B2 (en) * 2000-03-02 2004-04-20 Texas Instruments Incorporated Clock modes for a debug port with on the fly clock switching
US6754852B2 (en) * 2000-03-02 2004-06-22 Texas Instruments Incorporated Debug trigger builder
JP5356635B2 (ja) * 2000-04-11 2013-12-04 アナログ デバイセス インコーポレーテッド 非侵入式アプリケーション・コード・プロファイリングの方法および装置
FI113590B (fi) 2000-09-13 2004-05-14 Nokia Corp Menetelmä suunnattujen antennikeilojen muodostamiseksi ja menetelmän toteuttava radiolähetin
FI110724B (fi) * 2000-09-14 2003-03-14 Patria New Technologies Oy JTAG-testausjärjestely
US6735514B2 (en) * 2000-10-16 2004-05-11 Stmicroelectronics S.R.L. Control device for a vehicle engine
US6691270B2 (en) * 2000-12-22 2004-02-10 Arm Limited Integrated circuit and method of operation of such a circuit employing serial test scan chains
US6996158B2 (en) * 2001-02-22 2006-02-07 Freescale Semiconductors, Inc. Signal detection using a CDMA receiver
FI121936B (fi) 2002-03-14 2011-06-15 Metso Paper Inc Jauhemaisten partikkelien siirto
US7149927B2 (en) * 2002-04-19 2006-12-12 Hewlett-Packard Development Company, L.P. Use of SMBus to provide JTAG support
US7017081B2 (en) * 2002-09-27 2006-03-21 Lucent Technologies Inc. Methods and systems for remotely controlling a test access port of a target device
US7444546B2 (en) * 2003-04-17 2008-10-28 Arm Limited On-board diagnostic circuit for an integrated circuit
WO2005022390A1 (ja) * 2003-08-28 2005-03-10 Renesas Technology Corp. マイクロコンピュータ及びシステムプログラムの開発方法

Also Published As

Publication number Publication date
JP3114958U (ja) 2005-11-04
AU2003302037A1 (en) 2004-06-15
US20060206280A1 (en) 2006-09-14
EP1573345B1 (de) 2008-10-08
ES2314287T3 (es) 2009-03-16
FIU20020469U0 (fi) 2002-11-21
EP1573345A1 (de) 2005-09-14
DE60324020D1 (de) 2008-11-20
PT1573345E (pt) 2008-12-12
FI5706U1 (fi) 2003-02-26
WO2004046741A1 (en) 2004-06-03
WO2004046741A8 (en) 2004-08-05
DK1573345T3 (da) 2009-01-26
US7536616B2 (en) 2009-05-19

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