DK1573345T3 - JTAG afprövningsarrangement - Google Patents

JTAG afprövningsarrangement

Info

Publication number
DK1573345T3
DK1573345T3 DK03811403T DK03811403T DK1573345T3 DK 1573345 T3 DK1573345 T3 DK 1573345T3 DK 03811403 T DK03811403 T DK 03811403T DK 03811403 T DK03811403 T DK 03811403T DK 1573345 T3 DK1573345 T3 DK 1573345T3
Authority
DK
Denmark
Prior art keywords
test
device under
data
transmission
asynchronous
Prior art date
Application number
DK03811403T
Other languages
Danish (da)
English (en)
Inventor
Ilkka Reis
Mikko Simonen
Original Assignee
Jtag Technologies Bv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jtag Technologies Bv filed Critical Jtag Technologies Bv
Application granted granted Critical
Publication of DK1573345T3 publication Critical patent/DK1573345T3/da

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318555—Control logic
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318572—Input/Output interfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/3025—Wireless interface with the DUT

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
  • Investigating Or Analyzing Non-Biological Materials By The Use Of Chemical Means (AREA)
  • Maintenance And Management Of Digital Transmission (AREA)
  • Pharmaceuticals Containing Other Organic And Inorganic Compounds (AREA)
  • Luminescent Compositions (AREA)
  • Measuring Or Testing Involving Enzymes Or Micro-Organisms (AREA)
DK03811403T 2002-11-21 2003-11-20 JTAG afprövningsarrangement DK1573345T3 (da)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI20020469U FI5706U1 (fi) 2002-11-21 2002-11-21 JTAG-testilaitteisto ja -testausjärjestelmä
PCT/FI2003/000893 WO2004046741A1 (en) 2002-11-21 2003-11-20 Jtag testing arrangement

Publications (1)

Publication Number Publication Date
DK1573345T3 true DK1573345T3 (da) 2009-01-26

Family

ID=8563515

Family Applications (1)

Application Number Title Priority Date Filing Date
DK03811403T DK1573345T3 (da) 2002-11-21 2003-11-20 JTAG afprövningsarrangement

Country Status (11)

Country Link
US (1) US7536616B2 (de)
EP (1) EP1573345B1 (de)
JP (1) JP3114958U (de)
AT (1) ATE410699T1 (de)
AU (1) AU2003302037A1 (de)
DE (1) DE60324020D1 (de)
DK (1) DK1573345T3 (de)
ES (1) ES2314287T3 (de)
FI (1) FI5706U1 (de)
PT (1) PT1573345E (de)
WO (1) WO2004046741A1 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007101345A1 (en) * 2006-03-07 2007-09-13 Scanimetrics Inc. Method and apparatus for interrogating an electronic component
US8373429B2 (en) 2006-03-07 2013-02-12 Steven Slupsky Method and apparatus for interrogating an electronic component
CN100507588C (zh) * 2006-06-09 2009-07-01 华为技术有限公司 一种JTAG Bridge的接口时序设计方法及其实现装置
US7804724B2 (en) * 2007-05-02 2010-09-28 Alcatel Lucent Method and apparatus for boundary scan programming of memory devices
CA2623257A1 (en) 2008-02-29 2009-08-29 Scanimetrics Inc. Method and apparatus for interrogating an electronic component
JP6278300B2 (ja) * 2012-10-19 2018-02-14 株式会社ローラン リモート操作システム、無線通信ユニット、及びリモートデバッグシステム
US10404609B2 (en) * 2017-12-14 2019-09-03 Litepoint Corporation Method for delaying signal transmissions from a device under test (DUT) by transmitting congestive communication channel signals
DE102021122253B3 (de) 2021-08-27 2023-02-16 Göpel electronic GmbH Instrument zur autarken ausführung von prüfsequenzen nach jtag-standard

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5983017A (en) * 1996-11-12 1999-11-09 Lsi Logic Corporation Virtual monitor debugging method and apparatus
KR100846089B1 (ko) 1998-09-30 2008-07-14 카덴스 디자인 시스템즈 인크 설계 블록들 사이에 다수의 글루 로직 엘리먼트들을 분배하는 방법 및 글루 로직 분배 효율을 증가시키는 방법
US6418545B1 (en) 1999-06-04 2002-07-09 Koninklijke Philips Electronics N.V. System and method to reduce scan test pins on an integrated circuit
US6754852B2 (en) * 2000-03-02 2004-06-22 Texas Instruments Incorporated Debug trigger builder
US6868376B2 (en) * 2000-03-02 2005-03-15 Texas Instruments Incorporated Debug bi-phase export and data recovery
US6718286B2 (en) * 2000-04-11 2004-04-06 Analog Devices, Inc. Non-intrusive application code profiling method and apparatus
FI113590B (fi) 2000-09-13 2004-05-14 Nokia Corp Menetelmä suunnattujen antennikeilojen muodostamiseksi ja menetelmän toteuttava radiolähetin
FI110724B (fi) 2000-09-14 2003-03-14 Patria New Technologies Oy JTAG-testausjärjestely
US6735514B2 (en) * 2000-10-16 2004-05-11 Stmicroelectronics S.R.L. Control device for a vehicle engine
US6691270B2 (en) * 2000-12-22 2004-02-10 Arm Limited Integrated circuit and method of operation of such a circuit employing serial test scan chains
US6996158B2 (en) * 2001-02-22 2006-02-07 Freescale Semiconductors, Inc. Signal detection using a CDMA receiver
FI121936B (fi) 2002-03-14 2011-06-15 Metso Paper Inc Jauhemaisten partikkelien siirto
US7149927B2 (en) * 2002-04-19 2006-12-12 Hewlett-Packard Development Company, L.P. Use of SMBus to provide JTAG support
US7017081B2 (en) * 2002-09-27 2006-03-21 Lucent Technologies Inc. Methods and systems for remotely controlling a test access port of a target device
US7444546B2 (en) * 2003-04-17 2008-10-28 Arm Limited On-board diagnostic circuit for an integrated circuit
WO2005022390A1 (ja) * 2003-08-28 2005-03-10 Renesas Technology Corp. マイクロコンピュータ及びシステムプログラムの開発方法

Also Published As

Publication number Publication date
DE60324020D1 (de) 2008-11-20
PT1573345E (pt) 2008-12-12
ES2314287T3 (es) 2009-03-16
WO2004046741A8 (en) 2004-08-05
EP1573345B1 (de) 2008-10-08
FI5706U1 (fi) 2003-02-26
JP3114958U (ja) 2005-11-04
WO2004046741A1 (en) 2004-06-03
FIU20020469U0 (fi) 2002-11-21
US20060206280A1 (en) 2006-09-14
ATE410699T1 (de) 2008-10-15
AU2003302037A1 (en) 2004-06-15
US7536616B2 (en) 2009-05-19
EP1573345A1 (de) 2005-09-14

Similar Documents

Publication Publication Date Title
AU2002253978A1 (en) Network documentation system with electronic modules
TW200506596A (en) Transfer of error-analysis and statistical data in a fibre channel input/output system
GB2419055A (en) Optical and electrical channel feedback in optical transceiver module
EP1489511A3 (de) Hierarchisches, Netzwerk basiertes Emulationssystem
WO2007096848A3 (en) Interface for mobile devices and methods
AU2003209413A1 (en) Systems and methods for documenting networks with electronic modules in ports and devices
AU2002235385A1 (en) A method and apparatus for automatically determining an appropriate transmission method in a network
DE60110514D1 (de) Jtag Testanordnung
WO2005107134A3 (en) Systems and methods for managing a network
SE0103535D0 (sv) A system of intelligent devices, a method for providing such a system and a computer data signal
RU2009140976A (ru) Способ и устройство управления каналами связи для обменов данными с борта летательного аппарата
TW200801552A (en) Ultra low pin count interface for die testing
DE602004019409D1 (de) Paketschnittstellensystem
WO2007007164A3 (en) Optimized rfid/nfc ber testing
GB2422270B (en) Real time electronic communications system and method
WO2008048883A3 (en) Facilitating transmissions in a plurality of protocols
DK1573345T3 (da) JTAG afprövningsarrangement
TWI366964B (en) Portable electronic instrument including at least one input/output terminal for establishing a communication with an electronic unit arranged within said instrument
TW200742461A (en) Method for switching communication networks
US7610422B2 (en) Isolation and transmission of digital signals in intended direction
TW200707256A (en) Main board using selective displacement for Input/Output connection interface
WO2005066813A3 (en) Pass through debug port on a high speed asynchronous link
ATE375041T1 (de) Techniken zum testen der integrität übertragener signale
SG155161A1 (en) Devices and methods for routeing a unit of data in a network
TW200704014A (en) Network device for secure packet dispatching via port isolation