ATE414272T1 - Inspektionsvorrichtung für objekte mit einer sphärischen oberfläche - Google Patents

Inspektionsvorrichtung für objekte mit einer sphärischen oberfläche

Info

Publication number
ATE414272T1
ATE414272T1 AT04774958T AT04774958T ATE414272T1 AT E414272 T1 ATE414272 T1 AT E414272T1 AT 04774958 T AT04774958 T AT 04774958T AT 04774958 T AT04774958 T AT 04774958T AT E414272 T1 ATE414272 T1 AT E414272T1
Authority
AT
Austria
Prior art keywords
objects
spherical surface
inspection device
supporting surface
box
Prior art date
Application number
AT04774958T
Other languages
English (en)
Inventor
Soest Robert Van
Original Assignee
Staalkat Int Bv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Staalkat Int Bv filed Critical Staalkat Int Bv
Application granted granted Critical
Publication of ATE414272T1 publication Critical patent/ATE414272T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/02—Food
    • G01N33/025—Fruits or vegetables
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/951—Balls
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/02—Food
    • G01N33/08—Eggs, e.g. by candling
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/061—Sources
    • G01N2201/06126—Large diffuse sources

Landscapes

  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Engineering & Computer Science (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Sorting Of Articles (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
AT04774958T 2003-10-24 2004-09-21 Inspektionsvorrichtung für objekte mit einer sphärischen oberfläche ATE414272T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL1024619A NL1024619C2 (nl) 2003-10-24 2003-10-24 Inrichting voor het inspecteren van objecten.

Publications (1)

Publication Number Publication Date
ATE414272T1 true ATE414272T1 (de) 2008-11-15

Family

ID=34568022

Family Applications (1)

Application Number Title Priority Date Filing Date
AT04774958T ATE414272T1 (de) 2003-10-24 2004-09-21 Inspektionsvorrichtung für objekte mit einer sphärischen oberfläche

Country Status (8)

Country Link
US (1) US7474392B2 (de)
EP (1) EP1676124B1 (de)
JP (1) JP4823913B2 (de)
AT (1) ATE414272T1 (de)
DE (1) DE602004017767D1 (de)
DK (1) DK1676124T3 (de)
NL (1) NL1024619C2 (de)
WO (1) WO2005045406A1 (de)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2595027A1 (en) * 2005-01-18 2006-07-27 Embrex, Inc. Methods and apparatus for detecting the presence of eggs in an egg flat
DE102005017957A1 (de) * 2005-04-18 2006-10-26 Khs Ag Inspektionsvorrichtung
CA2546758C (en) * 2006-05-12 2009-07-07 Alberta Research Council Inc. A system and a method for detecting a damaged or missing machine part
GB2451076A (en) * 2007-07-16 2009-01-21 Illinois Tool Works Inspection apparatus and method using penetrating radiation
KR20100121638A (ko) 2008-02-04 2010-11-18 에프피에스 푸드 프로세싱 시스템즈 비.브이. 계란 표면 상의 오염물 및 기타 결점을 검출하기 위한 소프트웨어 컨트롤을 포함하는 비전 시스템
JP5218373B2 (ja) * 2009-10-26 2013-06-26 株式会社サタケ 色彩選別機
WO2011119825A2 (en) 2010-03-24 2011-09-29 Fps Food Processing Systems, B.V. Advanced egg breaking system
JP5563372B2 (ja) * 2010-05-20 2014-07-30 第一実業ビスウィル株式会社 外観検査装置
CN103168707A (zh) * 2011-12-21 2013-06-26 郑经伟 洗蛋检测机
CN104662420B (zh) 2012-07-05 2017-02-22 墨巴集团有限公司 用于检测蛋壳中的裂缝的方法和装置
ES2468395B1 (es) * 2012-11-16 2014-12-16 Citrodiagnosis Selectiva S.L. Máquina automática para la inspección, detección y separación de frutos en fresco en su valoración cualitativa relativa al podrido y defectos externos
JP6363831B2 (ja) * 2013-10-29 2018-07-25 ニシハツ産業株式会社 乾海苔処理ライン
JP2015094644A (ja) * 2013-11-12 2015-05-18 株式会社クボタ 卵の外観検査装置および方法
WO2015080669A1 (en) * 2013-11-29 2015-06-04 K-One Industries Pte Ltd Flexible vision inspector
ITUA20161769A1 (it) * 2016-03-17 2017-09-17 Sortec S R L Uno strumento di controllo ottico
US10902281B2 (en) 2018-03-22 2021-01-26 Rota Technologies LLC Debris detection system and method
KR20230153397A (ko) * 2021-03-04 2023-11-06 시코쿠 케이소쿠 코교 가부시키가이샤 검란 장치
JP7493541B2 (ja) * 2022-01-31 2024-05-31 アンリツ株式会社 検査装置
JP2025130816A (ja) * 2024-02-28 2025-09-09 株式会社リコー 測定装置および測定方法

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US1947142A (en) * 1933-08-22 1934-02-13 Walter J Ward Inspection apparatus
JPS5677739A (en) * 1979-11-30 1981-06-26 Ushio Inc Illuminating device for surface inspection of body of automobile
JPS5870150A (ja) * 1981-10-22 1983-04-26 Fuji Electric Co Ltd 光学検査装置用照明器
NL8900037A (nl) * 1989-01-06 1990-08-01 Heuft Qualiplus Bv Inrichting voor het inspecteren van massagoed.
JPH0357263A (ja) * 1989-07-25 1991-03-12 Seiko Instr Inc 半導体装置の製造方法
US5321491A (en) * 1989-11-10 1994-06-14 Ovascan Pty. Ltd. Method and apparatus for grading shell eggs
JP3052320B2 (ja) * 1990-02-01 2000-06-12 井関農機株式会社 青果物の傷総面積算出装置
US5201576A (en) * 1992-04-30 1993-04-13 Simco/Ramic Corporation Shadowless spherical illumination system for use in an article inspection system
US5461417A (en) * 1993-02-16 1995-10-24 Northeast Robotics, Inc. Continuous diffuse illumination method and apparatus
JP2738300B2 (ja) * 1994-06-20 1998-04-08 白柳式撰果機株式会社 塊状青果物のカメラ選別機に用いる間接照明型多面撮影装置
JPH08184563A (ja) * 1994-12-29 1996-07-16 Techno Ishii:Kk 果菜物検査装置
JP3496209B2 (ja) * 1995-05-12 2004-02-09 日本精工株式会社 ベアリングの転動体欠落検査装置
JPH10279060A (ja) * 1997-04-08 1998-10-20 Ishii Ind Co Ltd 物品搬送装置
JPH11101689A (ja) * 1997-09-25 1999-04-13 Sofuto Waaku Su Kk 果菜類の検査装置
US6192263B1 (en) 1998-09-01 2001-02-20 General Electric Company Phase-sensitive inversion recovery method of MR imaging
JP3057263U (ja) * 1998-09-04 1999-04-09 株式会社安西総合研究所 色彩選別機
JP2000283926A (ja) * 1999-03-30 2000-10-13 Kubota Corp 撮像装置及び品質検査装置
JP2001108625A (ja) * 1999-10-06 2001-04-20 Nireco Corp 青果物外観検査装置
JP2002090301A (ja) * 2000-09-18 2002-03-27 Kubota Corp 農産物の内部品質計測装置
JP3566215B2 (ja) * 2001-01-17 2004-09-15 株式会社宝計機製作所 農作物の搬送処理装置

Also Published As

Publication number Publication date
DK1676124T3 (da) 2009-02-23
NL1024619C2 (nl) 2005-04-27
US7474392B2 (en) 2009-01-06
WO2005045406A1 (en) 2005-05-19
EP1676124B1 (de) 2008-11-12
JP2007509341A (ja) 2007-04-12
EP1676124A1 (de) 2006-07-05
US20070030669A1 (en) 2007-02-08
DE602004017767D1 (de) 2008-12-24
JP4823913B2 (ja) 2011-11-24

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