DK1676124T3 - Inspektionsanordning for objekter med sfærisk overflade - Google Patents

Inspektionsanordning for objekter med sfærisk overflade

Info

Publication number
DK1676124T3
DK1676124T3 DK04774958T DK04774958T DK1676124T3 DK 1676124 T3 DK1676124 T3 DK 1676124T3 DK 04774958 T DK04774958 T DK 04774958T DK 04774958 T DK04774958 T DK 04774958T DK 1676124 T3 DK1676124 T3 DK 1676124T3
Authority
DK
Denmark
Prior art keywords
objects
spherical surface
inspection device
surface inspection
supporting surface
Prior art date
Application number
DK04774958T
Other languages
Danish (da)
English (en)
Inventor
Soest Robert Van
Original Assignee
Staalkat Int Bv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Staalkat Int Bv filed Critical Staalkat Int Bv
Application granted granted Critical
Publication of DK1676124T3 publication Critical patent/DK1676124T3/da

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/02—Food
    • G01N33/025—Fruits or vegetables
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/951—Balls
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/02—Food
    • G01N33/08—Eggs, e.g. by candling
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/061—Sources
    • G01N2201/06126—Large diffuse sources

Landscapes

  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Engineering & Computer Science (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Sorting Of Articles (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DK04774958T 2003-10-24 2004-09-21 Inspektionsanordning for objekter med sfærisk overflade DK1676124T3 (da)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
NL1024619A NL1024619C2 (nl) 2003-10-24 2003-10-24 Inrichting voor het inspecteren van objecten.
PCT/NL2004/000655 WO2005045406A1 (en) 2003-10-24 2004-09-21 Inspection device for objects with a spherical surface

Publications (1)

Publication Number Publication Date
DK1676124T3 true DK1676124T3 (da) 2009-02-23

Family

ID=34568022

Family Applications (1)

Application Number Title Priority Date Filing Date
DK04774958T DK1676124T3 (da) 2003-10-24 2004-09-21 Inspektionsanordning for objekter med sfærisk overflade

Country Status (8)

Country Link
US (1) US7474392B2 (de)
EP (1) EP1676124B1 (de)
JP (1) JP4823913B2 (de)
AT (1) ATE414272T1 (de)
DE (1) DE602004017767D1 (de)
DK (1) DK1676124T3 (de)
NL (1) NL1024619C2 (de)
WO (1) WO2005045406A1 (de)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100922115B1 (ko) * 2005-01-18 2009-10-16 엠브렉스, 인코포레이티드 난 플랫에서 난의 존재를 검출하기 위한 방법 및 장치
DE102005017957A1 (de) * 2005-04-18 2006-10-26 Khs Ag Inspektionsvorrichtung
CA2546758C (en) * 2006-05-12 2009-07-07 Alberta Research Council Inc. A system and a method for detecting a damaged or missing machine part
GB2451076A (en) * 2007-07-16 2009-01-21 Illinois Tool Works Inspection apparatus and method using penetrating radiation
CN102016496A (zh) 2008-02-04 2011-04-13 Fps食品加工系统股份有限公司 用于探测蛋表面上的污物和其他瑕疵的带有软件控制的图像系统
JP5218373B2 (ja) * 2009-10-26 2013-06-26 株式会社サタケ 色彩選別機
US9239321B2 (en) 2010-03-24 2016-01-19 Fps Food Processing Systems, B.V. Advanced egg breaking system
JP5563372B2 (ja) * 2010-05-20 2014-07-30 第一実業ビスウィル株式会社 外観検査装置
CN103168707A (zh) * 2011-12-21 2013-06-26 郑经伟 洗蛋检测机
PL2870471T3 (pl) 2012-07-05 2019-01-31 Moba Group B.V. Sposób i urządzenie do wykrywania pęknięć w skorupkach jaj
ES2468395B1 (es) * 2012-11-16 2014-12-16 Citrodiagnosis Selectiva S.L. Máquina automática para la inspección, detección y separación de frutos en fresco en su valoración cualitativa relativa al podrido y defectos externos
JP6363831B2 (ja) * 2013-10-29 2018-07-25 ニシハツ産業株式会社 乾海苔処理ライン
JP2015094644A (ja) * 2013-11-12 2015-05-18 株式会社クボタ 卵の外観検査装置および方法
WO2015080669A1 (en) * 2013-11-29 2015-06-04 K-One Industries Pte Ltd Flexible vision inspector
ITUA20161769A1 (it) * 2016-03-17 2017-09-17 Sortec S R L Uno strumento di controllo ottico
US10902281B2 (en) 2018-03-22 2021-01-26 Rota Technologies LLC Debris detection system and method
WO2022186339A1 (ja) * 2021-03-04 2022-09-09 四国計測工業株式会社 検卵装置
JP7493541B2 (ja) * 2022-01-31 2024-05-31 アンリツ株式会社 検査装置
JP2025130816A (ja) * 2024-02-28 2025-09-09 株式会社リコー 測定装置および測定方法

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US1947142A (en) * 1933-08-22 1934-02-13 Walter J Ward Inspection apparatus
JPS5677739A (en) * 1979-11-30 1981-06-26 Ushio Inc Illuminating device for surface inspection of body of automobile
JPS5870150A (ja) * 1981-10-22 1983-04-26 Fuji Electric Co Ltd 光学検査装置用照明器
NL8900037A (nl) * 1989-01-06 1990-08-01 Heuft Qualiplus Bv Inrichting voor het inspecteren van massagoed.
JPH0357263A (ja) * 1989-07-25 1991-03-12 Seiko Instr Inc 半導体装置の製造方法
KR920702905A (ko) * 1989-11-10 1992-12-17 원본미기재 달걀 등급선별방법 및 그 장치
JP3052320B2 (ja) * 1990-02-01 2000-06-12 井関農機株式会社 青果物の傷総面積算出装置
US5201576A (en) * 1992-04-30 1993-04-13 Simco/Ramic Corporation Shadowless spherical illumination system for use in an article inspection system
US5461417A (en) * 1993-02-16 1995-10-24 Northeast Robotics, Inc. Continuous diffuse illumination method and apparatus
JP2738300B2 (ja) * 1994-06-20 1998-04-08 白柳式撰果機株式会社 塊状青果物のカメラ選別機に用いる間接照明型多面撮影装置
JPH08184563A (ja) * 1994-12-29 1996-07-16 Techno Ishii:Kk 果菜物検査装置
JP3496209B2 (ja) * 1995-05-12 2004-02-09 日本精工株式会社 ベアリングの転動体欠落検査装置
JPH10279060A (ja) * 1997-04-08 1998-10-20 Ishii Ind Co Ltd 物品搬送装置
JPH11101689A (ja) * 1997-09-25 1999-04-13 Sofuto Waaku Su Kk 果菜類の検査装置
US6192263B1 (en) 1998-09-01 2001-02-20 General Electric Company Phase-sensitive inversion recovery method of MR imaging
JP3057263U (ja) * 1998-09-04 1999-04-09 株式会社安西総合研究所 色彩選別機
JP2000283926A (ja) * 1999-03-30 2000-10-13 Kubota Corp 撮像装置及び品質検査装置
JP2001108625A (ja) * 1999-10-06 2001-04-20 Nireco Corp 青果物外観検査装置
JP2002090301A (ja) * 2000-09-18 2002-03-27 Kubota Corp 農産物の内部品質計測装置
JP3566215B2 (ja) * 2001-01-17 2004-09-15 株式会社宝計機製作所 農作物の搬送処理装置

Also Published As

Publication number Publication date
US20070030669A1 (en) 2007-02-08
NL1024619C2 (nl) 2005-04-27
JP4823913B2 (ja) 2011-11-24
DE602004017767D1 (de) 2008-12-24
EP1676124A1 (de) 2006-07-05
JP2007509341A (ja) 2007-04-12
EP1676124B1 (de) 2008-11-12
US7474392B2 (en) 2009-01-06
ATE414272T1 (de) 2008-11-15
WO2005045406A1 (en) 2005-05-19

Similar Documents

Publication Publication Date Title
DK1676124T3 (da) Inspektionsanordning for objekter med sfærisk overflade
ATE504824T1 (de) Optisches inspektionsverfahren und vorrichtung mit abnehmbaren einsatzteilen
CY1106298T1 (el) Διαταξη αποθηκευσης νepου για την καλλιεργεια επιφανειας με γκαζον
DE69223505D1 (de) Eingebaute beleuchtungsvorrichtung fur prufung mit laufzeitintegration
DE50213922D1 (de) Messgerät
NO20040121L (no) Apparat for avbildning fra flere vinkler
ATE454589T1 (de) Vorrichtung zum beleuchten einer allgemein flachen fläche
FR2857094B1 (fr) Dispositif de recherche et de detection de defaut de pieces par endoscopie
DE59915032D1 (de) Prüfmodul zum prüfen von optischen teilen auf fehler
HUP9901915A2 (hu) Eljárás és berendezés szájnyílással rendelkező tartály vizsgálatára
DE602007007579D1 (de) Elektrisch modulierbar erweiterte lichtquelle und messeinrichtung zur charakterisierung eines eine s
WO2010030512A3 (en) Apparatus and method for optically converting a three-dimensional object into a two-dimensional planar image
FR2813391B1 (fr) Procede et appareil de mesure en transmission de la structure geometrique d'un composant optique
ATE438846T1 (de) Inspektionsvorrichtung für flaschen
CA2283519A1 (en) Device for detecting diffusely scattered impurities in transparent receptacles
ATE353152T1 (de) Leseverfahren und -vorrichtung für reliefmarkierungen in einem durchsichtigen oder durchscheinenden behälter
DE69925002D1 (de) Küvette für optische inspektion von ophtalmischen linsen
ATE348324T1 (de) Mechanische materialprüfung
DE60221385D1 (de) Toxizitätsmonitor
TW200608154A (en) Illuminating device, exposure device, and exposure method
BR0208660A (pt) Método e dispositivo para avaliação de superfìcie
ATE413620T1 (de) Beleuchtungsmodul zur evaneszenten beleuchtung und mikroskop
NO20053039D0 (no) Anordning ved oppdrettsanlegg i vann.
WO2009021207A3 (en) Apparatus and method for wafer edge exclusion measurement
WO2006005809A8 (en) An illumination system for a microscope