ATE414801T1 - Metallisches material für elektronisches bauteil, elektronisches bauteil, elektronische einrichtung,verfahren zur bearbeitung von metallischem material, verfahren zur herstellung von elektronischem bauteil und elektronisches optisches bauteil - Google Patents

Metallisches material für elektronisches bauteil, elektronisches bauteil, elektronische einrichtung,verfahren zur bearbeitung von metallischem material, verfahren zur herstellung von elektronischem bauteil und elektronisches optisches bauteil

Info

Publication number
ATE414801T1
ATE414801T1 AT03794198T AT03794198T ATE414801T1 AT E414801 T1 ATE414801 T1 AT E414801T1 AT 03794198 T AT03794198 T AT 03794198T AT 03794198 T AT03794198 T AT 03794198T AT E414801 T1 ATE414801 T1 AT E414801T1
Authority
AT
Austria
Prior art keywords
electronic
electronic component
component
metallic material
metallic film
Prior art date
Application number
AT03794198T
Other languages
English (en)
Inventor
Takashi Ueno
Original Assignee
Dept Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=31973037&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=ATE414801(T1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Dept Corp filed Critical Dept Corp
Application granted granted Critical
Publication of ATE414801T1 publication Critical patent/ATE414801T1/de

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C22METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22CALLOYS
    • C22C9/00Alloys based on copper
    • CCHEMISTRY; METALLURGY
    • C22METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22CALLOYS
    • C22C9/00Alloys based on copper
    • C22C9/01Alloys based on copper with aluminium as the next major constituent
    • CCHEMISTRY; METALLURGY
    • C22METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22CALLOYS
    • C22C9/00Alloys based on copper
    • C22C9/06Alloys based on copper with nickel or cobalt as the next major constituent
    • CCHEMISTRY; METALLURGY
    • C22METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22CALLOYS
    • C22C9/00Alloys based on copper
    • C22C9/10Alloys based on copper with silicon as the next major constituent
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W20/00Interconnections in chips, wafers or substrates
    • H10W20/40Interconnections external to wafers or substrates, e.g. back-end-of-line [BEOL] metallisations or vias connecting to gate electrodes
    • H10W20/41Interconnections external to wafers or substrates, e.g. back-end-of-line [BEOL] metallisations or vias connecting to gate electrodes characterised by their conductive parts
    • H10W20/44Conductive materials thereof
    • H10W20/4403Conductive materials thereof based on metals, e.g. alloys, metal silicides
    • H10W20/4421Conductive materials thereof based on metals, e.g. alloys, metal silicides the principal metal being copper
    • H10W20/4424Copper alloys
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W70/00Package substrates; Interposers; Redistribution layers [RDL]
    • H10W70/60Insulating or insulated package substrates; Interposers; Redistribution layers
    • H10W70/62Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their interconnections
    • H10W70/66Conductive materials thereof
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/09Use of materials for the conductive, e.g. metallic pattern

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Conductive Materials (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Parts Printed On Printed Circuit Boards (AREA)
  • Liquid Crystal (AREA)
  • Electrodes Of Semiconductors (AREA)
  • Physical Vapour Deposition (AREA)
  • Led Device Packages (AREA)
  • Adornments (AREA)
  • Electrochromic Elements, Electrophoresis, Or Variable Reflection Or Absorption Elements (AREA)
  • Electroluminescent Light Sources (AREA)
  • Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
  • Ceramic Capacitors (AREA)
AT03794198T 2002-09-04 2003-09-03 Metallisches material für elektronisches bauteil, elektronisches bauteil, elektronische einrichtung,verfahren zur bearbeitung von metallischem material, verfahren zur herstellung von elektronischem bauteil und elektronisches optisches bauteil ATE414801T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002258690A JP3754011B2 (ja) 2002-09-04 2002-09-04 電子部品用金属材料、電子部品、電子機器、金属材料の加工方法、電子部品の製造方法及び電子光学部品

Publications (1)

Publication Number Publication Date
ATE414801T1 true ATE414801T1 (de) 2008-12-15

Family

ID=31973037

Family Applications (1)

Application Number Title Priority Date Filing Date
AT03794198T ATE414801T1 (de) 2002-09-04 2003-09-03 Metallisches material für elektronisches bauteil, elektronisches bauteil, elektronische einrichtung,verfahren zur bearbeitung von metallischem material, verfahren zur herstellung von elektronischem bauteil und elektronisches optisches bauteil

Country Status (10)

Country Link
US (1) US20040187984A1 (de)
EP (4) EP1559801B1 (de)
JP (1) JP3754011B2 (de)
KR (1) KR100673401B1 (de)
CN (1) CN1318626C (de)
AT (1) ATE414801T1 (de)
CA (3) CA2669987A1 (de)
DE (1) DE60324830D1 (de)
TW (1) TWI253475B (de)
WO (1) WO2004022803A1 (de)

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JP4913902B2 (ja) * 2008-08-05 2012-04-11 古河電気工業株式会社 電気・電子部品用銅合金材料の製造方法
JP5571887B2 (ja) 2008-08-19 2014-08-13 アルティアム サービシズ リミテッド エルエルシー 液晶表示装置及びその製造方法
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US8895978B2 (en) 2010-07-02 2014-11-25 Advanced Interconnect Materials, Llc Semiconductor device
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CN103298967B (zh) 2010-12-08 2016-07-06 盖伦国际公司 硬且低摩擦的氮化物涂层
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CN102978431B (zh) * 2012-11-07 2014-07-30 江苏金源锻造股份有限公司 一种用于引线支架的铜铁合金的制造方法
CN102978432B (zh) * 2012-11-07 2014-12-10 江苏金源锻造股份有限公司 一种用于半导体器件的引线支架
CN102978429B (zh) * 2012-11-07 2014-12-10 江苏金源锻造股份有限公司 一种制造支架的铜合金
EP2941105B1 (de) * 2013-05-13 2022-02-16 ULVAC, Inc. Montagevorrichtung und herstellungsverfahren des gleichen
US20160336918A1 (en) * 2014-01-15 2016-11-17 Epcos Ag Electroacoustic filter and method of manufacturing an electroacoustic filter
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Also Published As

Publication number Publication date
DE60324830D1 (de) 2009-01-02
US20040187984A1 (en) 2004-09-30
EP1559801A4 (de) 2005-11-30
JP3754011B2 (ja) 2006-03-08
EP1559801A1 (de) 2005-08-03
KR20050083668A (ko) 2005-08-26
WO2004022803A1 (ja) 2004-03-18
CN1318626C (zh) 2007-05-30
EP1559801B1 (de) 2008-11-19
CA2497395A1 (en) 2004-03-18
CA2670068A1 (en) 2004-03-18
EP1956104A1 (de) 2008-08-13
JP2004091907A (ja) 2004-03-25
TWI253475B (en) 2006-04-21
EP1918391A3 (de) 2009-01-07
EP1918391A2 (de) 2008-05-07
EP1953250A1 (de) 2008-08-06
TW200404905A (en) 2004-04-01
CA2669987A1 (en) 2004-03-18
KR100673401B1 (ko) 2007-01-24
CN1678765A (zh) 2005-10-05

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