ATE440301T1 - Laserscan-mikroskop und mikroskopisches überwachungsverfahren - Google Patents

Laserscan-mikroskop und mikroskopisches überwachungsverfahren

Info

Publication number
ATE440301T1
ATE440301T1 AT07010054T AT07010054T ATE440301T1 AT E440301 T1 ATE440301 T1 AT E440301T1 AT 07010054 T AT07010054 T AT 07010054T AT 07010054 T AT07010054 T AT 07010054T AT E440301 T1 ATE440301 T1 AT E440301T1
Authority
AT
Austria
Prior art keywords
stimulation
laser beam
scanner
monitoring method
laser scan
Prior art date
Application number
AT07010054T
Other languages
English (en)
Inventor
Yusuke Yamashita
Akinori Araya
Original Assignee
Olympus Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Corp filed Critical Olympus Corp
Application granted granted Critical
Publication of ATE440301T1 publication Critical patent/ATE440301T1/de

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/002Scanning microscopes
    • G02B21/0024Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052Optical details of the image generation
    • G02B21/0076Optical details of the image generation arrangements using fluorescence or luminescence
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/002Scanning microscopes
    • G02B21/0024Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0036Scanning details, e.g. scanning stages
    • G02B21/0048Scanning details, e.g. scanning stages scanning mirrors, e.g. rotating or galvanomirrors, MEMS mirrors
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/002Scanning microscopes
    • G02B21/0024Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052Optical details of the image generation
    • G02B21/0064Optical details of the image generation multi-spectral or wavelength-selective arrangements, e.g. wavelength fan-out, chromatic profiling

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Microscoopes, Condenser (AREA)
AT07010054T 2006-05-29 2007-05-21 Laserscan-mikroskop und mikroskopisches überwachungsverfahren ATE440301T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006148258 2006-05-29

Publications (1)

Publication Number Publication Date
ATE440301T1 true ATE440301T1 (de) 2009-09-15

Family

ID=38353677

Family Applications (1)

Application Number Title Priority Date Filing Date
AT07010054T ATE440301T1 (de) 2006-05-29 2007-05-21 Laserscan-mikroskop und mikroskopisches überwachungsverfahren

Country Status (4)

Country Link
US (1) US7724426B2 (de)
EP (1) EP1862838B1 (de)
AT (1) ATE440301T1 (de)
DE (1) DE602007002008D1 (de)

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GB0617945D0 (en) 2006-09-12 2006-10-18 Ucl Business Plc Imaging apparatus and methods
TWI594828B (zh) * 2009-05-28 2017-08-11 伊雷克托科學工業股份有限公司 應用於雷射處理工件中的特徵的聲光偏轉器及相關雷射處理方法
JP5452180B2 (ja) * 2009-11-13 2014-03-26 オリンパス株式会社 顕微鏡装置
JP5591007B2 (ja) * 2009-11-20 2014-09-17 オリンパス株式会社 顕微鏡装置
GB201006679D0 (en) 2010-04-21 2010-06-09 Ucl Business Plc Methods and apparatus to control acousto-optic deflectors
US9946058B2 (en) * 2010-06-11 2018-04-17 Nikon Corporation Microscope apparatus and observation method
GB201106787D0 (en) 2011-04-20 2011-06-01 Ucl Business Plc Methods and apparatus to control acousto-optic deflectors
US9256009B2 (en) * 2011-09-22 2016-02-09 TAG Optics Inc. Tunable acoustic gradient index of refraction lens and system
US9579583B2 (en) * 2012-06-01 2017-02-28 Mattel, Inc. Transformable toy and launcher
EP2943778B1 (de) 2013-01-09 2020-10-28 The Regents of The University of California Vorrichtung und verfahren zur fluoreszenzbildgebung mit radiofrequenz-multiplex- anregung
JP6691053B2 (ja) 2014-03-18 2020-04-28 ザ リージェンツ オブ ザ ユニバーシティ オブ カリフォルニアThe Regents Of The University Of California 無線周波数多重化を用いた並行フローサイトメーター
JP5784790B2 (ja) * 2014-04-28 2015-09-24 オリンパス株式会社 蛍光観察装置
KR102600559B1 (ko) 2015-10-13 2023-11-10 벡톤 디킨슨 앤드 컴퍼니 다중모드 형광 이미징 유동 세포 계측 시스템
KR102527830B1 (ko) 2016-03-17 2023-05-02 벡톤 디킨슨 앤드 컴퍼니 고효율 형광 유세포 분석기를 사용하는 세포 선별
KR102381176B1 (ko) 2016-05-12 2022-04-01 비디 바이오사이언시스 개선된 이미지 해상도를 갖는 형광 이미징 유세포 분석법
CN109477785B (zh) 2016-09-13 2022-09-27 贝克顿·迪金森公司 具有光学均衡的流式细胞仪
CN110178069B (zh) 2016-11-12 2022-05-17 纽约市哥伦比亚大学理事会 显微镜设备、方法和系统
DE102017125688A1 (de) 2017-11-03 2019-05-09 Leica Microsystems Cms Gmbh Verfahren und Vorrichtung zum Abrastern einer Probe
US11231570B2 (en) * 2018-04-30 2022-01-25 University Of Central Florida Research Foundation, Inc. Highly inclined swept tile (HIST) imaging apparatus, methods, and applications
US11118903B2 (en) * 2018-10-17 2021-09-14 Kla Corporation Efficient illumination shaping for scatterometry overlay
JP7561822B2 (ja) 2019-07-10 2024-10-04 ベクトン・ディキンソン・アンド・カンパニー 細胞選別分類を調整するための再構成可能な集積回路
AU2021275676A1 (en) 2020-05-19 2022-12-08 Becton, Dickinson And Company Methods for modulating an intensity profile of a laser beam and systems for same
EP4172592B1 (de) 2020-06-26 2025-07-16 Becton, Dickinson and Company Doppelerregungsstrahlen zur bestrahlung einer probe in einem strömungsstrom und verfahren zur verwendung davon
CN117801946A (zh) * 2023-11-16 2024-04-02 天津大学 一种可联用多种电生理设备的光刺激系统及其使用方法

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JPS63175833A (ja) * 1987-01-16 1988-07-20 Kowa Co 光偏向装置
JPH05203878A (ja) * 1992-01-27 1993-08-13 Jeol Ltd 走査型レーザー顕微鏡
JP3917731B2 (ja) * 1996-11-21 2007-05-23 オリンパス株式会社 レーザ走査顕微鏡
JPH11218682A (ja) * 1998-01-30 1999-08-10 Fujitsu Ltd レーザ走査顕微鏡
IL140309A0 (en) * 2000-12-14 2002-02-10 Yeda Res & Dev Acousto-optic scanner with fast non-linear scan
DE20216583U1 (de) * 2001-12-20 2003-01-23 Leica Microsystems Heidelberg Gmbh, 68165 Mannheim Mikroskop und Durchflusszytometer
US7253950B2 (en) * 2003-07-17 2007-08-07 Olympus Corporation Scanning laser microscope
JP4468684B2 (ja) * 2003-12-05 2010-05-26 オリンパス株式会社 走査型共焦点顕微鏡装置
JP4729269B2 (ja) * 2004-06-01 2011-07-20 オリンパス株式会社 レーザ走査型顕微鏡
WO2006042130A2 (en) * 2004-10-06 2006-04-20 Baylor College Of Medicine High speed microscope with three-dimensional laser beam scanning

Also Published As

Publication number Publication date
DE602007002008D1 (de) 2009-10-01
EP1862838A3 (de) 2008-02-27
US20070272885A1 (en) 2007-11-29
EP1862838B1 (de) 2009-08-19
EP1862838A2 (de) 2007-12-05
US7724426B2 (en) 2010-05-25

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