ATE442670T1 - Herstellungsmethode eines opto-elektronischen dünnfilmbauelementes - Google Patents

Herstellungsmethode eines opto-elektronischen dünnfilmbauelementes

Info

Publication number
ATE442670T1
ATE442670T1 AT99928916T AT99928916T ATE442670T1 AT E442670 T1 ATE442670 T1 AT E442670T1 AT 99928916 T AT99928916 T AT 99928916T AT 99928916 T AT99928916 T AT 99928916T AT E442670 T1 ATE442670 T1 AT E442670T1
Authority
AT
Austria
Prior art keywords
region
porous
opto
layer
thin film
Prior art date
Application number
AT99928916T
Other languages
English (en)
Inventor
Lieven Stalmans
Jef Poortmans
Matty Caymax
Khalid Said
Johan Nijs
Original Assignee
Imec
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from EP98870147A external-priority patent/EP0969522A1/de
Application filed by Imec filed Critical Imec
Application granted granted Critical
Publication of ATE442670T1 publication Critical patent/ATE442670T1/de

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F71/00Manufacture or treatment of devices covered by this subclass
    • H10F71/121The active layers comprising only Group IV materials
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F10/00Individual photovoltaic cells, e.g. solar cells
    • H10F10/10Individual photovoltaic cells, e.g. solar cells having potential barriers
    • H10F10/14Photovoltaic cells having only PN homojunction potential barriers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F10/00Individual photovoltaic cells, e.g. solar cells
    • H10F10/10Individual photovoltaic cells, e.g. solar cells having potential barriers
    • H10F10/16Photovoltaic cells having only PN heterojunction potential barriers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00Constructional details of devices covered by this subclass
    • H10F77/10Semiconductor bodies
    • H10F77/12Active materials
    • H10F77/122Active materials comprising only Group IV materials
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00Constructional details of devices covered by this subclass
    • H10F77/40Optical elements or arrangements
    • H10F77/42Optical elements or arrangements directly associated or integrated with photovoltaic cells, e.g. light-reflecting means or light-concentrating means
    • H10F77/48Back surface reflectors [BSR]
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00Constructional details of devices covered by this subclass
    • H10F77/40Optical elements or arrangements
    • H10F77/42Optical elements or arrangements directly associated or integrated with photovoltaic cells, e.g. light-reflecting means or light-concentrating means
    • H10F77/488Reflecting light-concentrating means, e.g. parabolic mirrors or concentrators using total internal reflection
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy
    • Y02E10/52PV systems with concentrators
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy
    • Y02E10/547Monocrystalline silicon PV cells
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50Manufacturing or production processes characterised by the final manufactured product

Landscapes

  • Photovoltaic Devices (AREA)
  • Light Receiving Elements (AREA)
  • Formation Of Insulating Films (AREA)
  • Apparatuses And Processes For Manufacturing Resistors (AREA)
AT99928916T 1998-07-03 1999-07-02 Herstellungsmethode eines opto-elektronischen dünnfilmbauelementes ATE442670T1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP98870147A EP0969522A1 (de) 1998-07-03 1998-07-03 Optoelektronisches Dünnfilm-Bauelement und dessen Herstellung
US9335298P 1998-07-20 1998-07-20
PCT/BE1999/000085 WO2000002259A1 (en) 1998-07-03 1999-07-02 A thin-film opto-electronic device and a method of making it

Publications (1)

Publication Number Publication Date
ATE442670T1 true ATE442670T1 (de) 2009-09-15

Family

ID=26152270

Family Applications (1)

Application Number Title Priority Date Filing Date
AT99928916T ATE442670T1 (de) 1998-07-03 1999-07-02 Herstellungsmethode eines opto-elektronischen dünnfilmbauelementes

Country Status (7)

Country Link
US (2) US6683367B1 (de)
EP (1) EP1103075B1 (de)
AT (1) ATE442670T1 (de)
AU (1) AU4593499A (de)
DE (1) DE69941398D1 (de)
ES (1) ES2333284T3 (de)
WO (1) WO2000002259A1 (de)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1341222A1 (de) * 2002-02-28 2003-09-03 Interuniversitair Micro-Elektronica Centrum Verfahren zur Herstellung einer Vorrichtung mit einer Halbleiterschicht auf einem Substrat mit nicht-angepasstem Gitter
US6955745B1 (en) * 2002-08-01 2005-10-18 University Of Florida Research Foundation, Inc. Method of spark-processing silicon and resulting materials
EP1398837A1 (de) * 2002-09-09 2004-03-17 Interuniversitair Microelektronica Centrum ( Imec) Photovoltaische Vorrichtung
US7022544B2 (en) * 2002-12-18 2006-04-04 International Business Machines Corporation High speed photodiode with a barrier layer for blocking or eliminating slow photonic carriers and method for forming same
US20060027459A1 (en) * 2004-05-28 2006-02-09 Lake Shore Cryotronics, Inc. Mesoporous silicon infrared filters and methods of making same
WO2006122774A1 (en) * 2005-05-17 2006-11-23 Interuniversitair Microelektronica Centrum Vzw Method for the production of photovoltaic cells
US20070262296A1 (en) * 2006-05-11 2007-11-15 Matthias Bauer Photodetectors employing germanium layers
US8174025B2 (en) * 2006-06-09 2012-05-08 Philips Lumileds Lighting Company, Llc Semiconductor light emitting device including porous layer
US20090181492A1 (en) * 2008-01-11 2009-07-16 Peter Nunan Nano-cleave a thin-film of silicon for solar cell fabrication
WO2009099071A1 (ja) * 2008-02-04 2009-08-13 The University Of Tokyo シリコン太陽電池
KR102061563B1 (ko) * 2013-08-06 2020-01-02 삼성전자주식회사 반도체 발광소자
JP6730820B2 (ja) 2016-03-10 2020-07-29 株式会社東芝 光検出器およびこれを用いたライダー装置
GB2597109B (en) * 2020-07-16 2023-05-10 Plessey Semiconductors Ltd Strain relaxation layer
US11817479B2 (en) 2021-09-29 2023-11-14 Globalfoundries U.S. Inc. Transistor with air gap under raised source/drain region in bulk semiconductor substrate
US12027582B2 (en) 2021-10-05 2024-07-02 Globalfoundries U.S. Inc. IC structure including porous semiconductor layer under trench isolation
US11677000B2 (en) 2021-10-07 2023-06-13 Globalfoundries U.S. Inc. IC structure including porous semiconductor layer under trench isolations adjacent source/drain regions
US12119352B2 (en) 2022-01-06 2024-10-15 Globalfoundries U.S. Inc. IC structure including porous semiconductor layer in bulk substrate adjacent trench isolation

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4806996A (en) 1986-04-10 1989-02-21 American Telephone And Telegraph Company, At&T Bell Laboratories Dislocation-free epitaxial layer on a lattice-mismatched porous or otherwise submicron patterned single crystal substrate
US4818337A (en) 1986-04-11 1989-04-04 University Of Delaware Thin active-layer solar cell with multiple internal reflections
JPS63182811A (ja) * 1987-01-26 1988-07-28 Seiko Instr & Electronics Ltd 化合物半導体のエピタキシヤル成長方法
US5057163A (en) * 1988-05-04 1991-10-15 Astropower, Inc. Deposited-silicon film solar cell
JPH0342818A (ja) * 1989-07-10 1991-02-25 Nippon Telegr & Teleph Corp <Ntt> 化合物半導体装置とその製造方法
JPH03235371A (ja) * 1990-02-10 1991-10-21 Sumitomo Electric Ind Ltd タンデム型太陽電池の製造方法
US5136351A (en) * 1990-03-30 1992-08-04 Sharp Kabushiki Kaisha Photovoltaic device with porous metal layer
US5285078A (en) * 1992-01-24 1994-02-08 Nippon Steel Corporation Light emitting element with employment of porous silicon and optical device utilizing light emitting element
JP3416163B2 (ja) * 1992-01-31 2003-06-16 キヤノン株式会社 半導体基板及びその作製方法
JP2860028B2 (ja) 1992-11-26 1999-02-24 株式会社フジクラ 紫外線検知装置及びその製造方法
DE4319413C2 (de) * 1993-06-14 1999-06-10 Forschungszentrum Juelich Gmbh Interferenzfilter oder dielektrischer Spiegel
US5397429A (en) * 1993-09-14 1995-03-14 University Of Florida Method of manufacturing photoluminescing porous silicon using spark erosion
US6107213A (en) * 1996-02-01 2000-08-22 Sony Corporation Method for making thin film semiconductor
US5981400A (en) * 1997-09-18 1999-11-09 Cornell Research Foundation, Inc. Compliant universal substrate for epitaxial growth
DE19743692A1 (de) * 1997-10-02 1999-04-08 Zae Bayern Multifunktionsschicht zur Verbesserung des Wirkungsgrades von kristallinen Dünnschicht Silizium Solarzellen

Also Published As

Publication number Publication date
US20040087056A1 (en) 2004-05-06
AU4593499A (en) 2000-01-24
US6815247B2 (en) 2004-11-09
EP1103075A1 (de) 2001-05-30
ES2333284T3 (es) 2010-02-18
EP1103075B1 (de) 2009-09-09
US6683367B1 (en) 2004-01-27
WO2000002259A1 (en) 2000-01-13
DE69941398D1 (de) 2009-10-22

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