ATE449993T1 - Kurzschlusserkennung mit stromspiegel - Google Patents

Kurzschlusserkennung mit stromspiegel

Info

Publication number
ATE449993T1
ATE449993T1 AT04392030T AT04392030T ATE449993T1 AT E449993 T1 ATE449993 T1 AT E449993T1 AT 04392030 T AT04392030 T AT 04392030T AT 04392030 T AT04392030 T AT 04392030T AT E449993 T1 ATE449993 T1 AT E449993T1
Authority
AT
Austria
Prior art keywords
branch
current
comparator
measurement
biasing
Prior art date
Application number
AT04392030T
Other languages
English (en)
Inventor
Antonello Arigliano
Original Assignee
Dialog Semiconductor Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dialog Semiconductor Gmbh filed Critical Dialog Semiconductor Gmbh
Application granted granted Critical
Publication of ATE449993T1 publication Critical patent/ATE449993T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/52—Testing for short-circuits, leakage current or ground faults
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Road Signs Or Road Markings (AREA)
  • Mirrors, Picture Frames, Photograph Stands, And Related Fastening Devices (AREA)
  • Control Of Electrical Variables (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
AT04392030T 2004-06-14 2004-06-14 Kurzschlusserkennung mit stromspiegel ATE449993T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP04392030A EP1612635B1 (de) 2004-06-14 2004-06-14 Kurzschlusserkennung mit Stromspiegel

Publications (1)

Publication Number Publication Date
ATE449993T1 true ATE449993T1 (de) 2009-12-15

Family

ID=34931986

Family Applications (1)

Application Number Title Priority Date Filing Date
AT04392030T ATE449993T1 (de) 2004-06-14 2004-06-14 Kurzschlusserkennung mit stromspiegel

Country Status (5)

Country Link
US (1) US6967488B1 (de)
EP (1) EP1612635B1 (de)
AT (1) ATE449993T1 (de)
DE (1) DE602004024294D1 (de)
DK (1) DK1612635T3 (de)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070097572A1 (en) * 2005-10-28 2007-05-03 Caretta Integrated Circuits Protective circuit
EP1816483B1 (de) * 2006-02-03 2008-07-30 Siemens Aktiengesellschaft Schaltung zur Kurzschluss- bzw. Überstromerkennung
US7626360B2 (en) * 2006-08-11 2009-12-01 Cirrus Logic, Inc. Charge-pump biased battery protection circuit
US8953292B2 (en) * 2007-05-30 2015-02-10 Infineon Technologies Ag Bus interface and method for short-circuit detection
TWI448699B (zh) * 2011-11-18 2014-08-11 Richtek Technology Corp 短路偵測電路及短路偵測方法
US10436839B2 (en) 2017-10-23 2019-10-08 Nxp B.V. Method for identifying a fault at a device output and system therefor
US10782347B2 (en) 2017-10-23 2020-09-22 Nxp B.V. Method for identifying a fault at a device output and system therefor
US10838016B2 (en) * 2018-07-06 2020-11-17 Texas Instruments Incorporated Short detect scheme for an output pin
CN111555739B (zh) * 2020-05-20 2023-10-20 广州金升阳科技有限公司 一种信号隔离系统的解调方法及电路
US11372056B2 (en) * 2020-05-26 2022-06-28 Sandisk Technologies Llc Circuit for detecting pin-to-pin leaks of an integrated circuit package
CN114725897B (zh) * 2022-04-11 2022-11-29 北京伽略电子股份有限公司 用于开关电源的过流保护电路
CN116224011B (zh) * 2023-04-25 2023-07-21 苏州锴威特半导体股份有限公司 一种功率管过流检测电路

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57160372A (en) * 1981-03-27 1982-10-02 Toshiba Electric Equip Corp Transistor inverter device
US5696658A (en) * 1995-10-05 1997-12-09 Sgs-Thomson Microelectronics, Inc. Short circuit protection circuit for a low-side driver circuit
US5973569A (en) * 1998-02-25 1999-10-26 National Semiconductor Corporation Short-circuit protection and over-current modulation to maximize audio amplifier output power
TW529231B (en) 2000-09-28 2003-04-21 Fuji Electric Co Ltd Power supply circuit
JP4219567B2 (ja) 2001-04-03 2009-02-04 三菱電機株式会社 半導体装置
JP3693940B2 (ja) 2001-07-26 2005-09-14 シャープ株式会社 スイッチング電源装置
JP3800115B2 (ja) * 2002-03-25 2006-07-26 株式会社デンソー 過電流検出機能付き負荷駆動回路

Also Published As

Publication number Publication date
US20050275414A1 (en) 2005-12-15
US6967488B1 (en) 2005-11-22
DK1612635T3 (da) 2010-04-12
EP1612635B1 (de) 2009-11-25
EP1612635A1 (de) 2006-01-04
DE602004024294D1 (de) 2010-01-07

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