ATE382869T1 - Testen integrierter schaltungen - Google Patents

Testen integrierter schaltungen

Info

Publication number
ATE382869T1
ATE382869T1 AT05718254T AT05718254T ATE382869T1 AT E382869 T1 ATE382869 T1 AT E382869T1 AT 05718254 T AT05718254 T AT 05718254T AT 05718254 T AT05718254 T AT 05718254T AT E382869 T1 ATE382869 T1 AT E382869T1
Authority
AT
Austria
Prior art keywords
radiation
dut
pathway
sensing element
adjacent
Prior art date
Application number
AT05718254T
Other languages
English (en)
Inventor
Peter Bergmann
Original Assignee
Melexis Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Melexis Nv filed Critical Melexis Nv
Application granted granted Critical
Publication of ATE382869T1 publication Critical patent/ATE382869T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G01R31/311—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of integrated circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Health & Medical Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Computer Hardware Design (AREA)
  • Toxicology (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Amplifiers (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
AT05718254T 2004-03-25 2005-03-23 Testen integrierter schaltungen ATE382869T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GBGB0406665.0A GB0406665D0 (en) 2004-03-25 2004-03-25 Testing intergrated circuits

Publications (1)

Publication Number Publication Date
ATE382869T1 true ATE382869T1 (de) 2008-01-15

Family

ID=32188632

Family Applications (1)

Application Number Title Priority Date Filing Date
AT05718254T ATE382869T1 (de) 2004-03-25 2005-03-23 Testen integrierter schaltungen

Country Status (6)

Country Link
US (1) US20090115440A1 (de)
EP (1) EP1728085B1 (de)
AT (1) ATE382869T1 (de)
DE (1) DE602005004136T2 (de)
GB (1) GB0406665D0 (de)
WO (1) WO2005093445A1 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2919402B1 (fr) * 2007-07-23 2009-10-30 Eads Europ Aeronautic Defence Procede de test d'une application logicielle.
US8878527B2 (en) 2010-11-29 2014-11-04 Amkor Technology, Inc. Magnetic field simulator for testing singulated or multi-site strip semiconductor device and method therefor
US9588173B2 (en) 2013-12-17 2017-03-07 Keyssa, Inc. Waveguides for capturing close-proximity electromagnetic radiation transmitted by wireless chips during testing on automated test equipment (ATE)
US9863976B2 (en) 2015-10-09 2018-01-09 Keyssa Systems, Inc. Module test socket for over the air testing of radio frequency integrated circuits
EP4092429B1 (de) * 2021-05-21 2024-10-23 Rohde & Schwarz GmbH & Co. KG Prüfsystem
JP7665778B2 (ja) 2022-04-14 2025-04-21 株式会社アドバンテスト 第１および第２のアンテナを使用して被試験デバイスおよび特徴付けデバイスとの結合を確立する自動試験機器構成要素、自動試験機器、および方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6285200B1 (en) * 1998-03-02 2001-09-04 Agilent Technologies, Inc. Apparatus and method for testing integrated circuit devices
US6985219B2 (en) * 2000-12-21 2006-01-10 Credence Systems Corporation Optical coupling for testing integrated circuits
US6765396B2 (en) * 2002-04-04 2004-07-20 Freescale Semiconductor, Inc. Method, apparatus and software for testing a device including both electrical and optical portions
US7129722B1 (en) * 2002-10-09 2006-10-31 Cypress Semiconductor Corp. Methods of improving reliability of an electro-optical module

Also Published As

Publication number Publication date
GB0406665D0 (en) 2004-04-28
EP1728085B1 (de) 2008-01-02
US20090115440A1 (en) 2009-05-07
DE602005004136T2 (de) 2008-12-24
WO2005093445A1 (en) 2005-10-06
DE602005004136D1 (de) 2008-02-14
EP1728085A1 (de) 2006-12-06

Similar Documents

Publication Publication Date Title
DE60315813D1 (de) Vorrichtung für eine schnittstelle zwischen elektronischen gehäusen und testgeräten
EP2135096A4 (de) Prüfung von elektronischen schaltungen unter verwendung einer aktiven integrierten prüfschaltung
WO2003100446A3 (en) High performance probe system for testing semiconductor wafers
ATE544055T1 (de) Plattenwellenleiter-raum- heterodynspektrometereinheit
ATE465419T1 (de) Prüfbare integrierte schaltung und ic- prüfverfahren
FR2824640B1 (fr) Couplage optique destine a tester des circuits integres
TW200704809A (en) Test equipment of semiconductor devices
DE602005004136D1 (de) Testen integrierter schaltungen
TW200506399A (en) Event based test method for debugging timing related failures in integrated circuits
ATE456058T1 (de) Verfahren und vorrichtung zum prüfen von sockeln in der schaltung
TW200602649A (en) Parallel calibration system for a test device
FI20030071A7 (fi) Kameramoduulin sijoittaminen kannettavaan laitteeseen
NO20033051L (no) Testmoduskrets for inngangs-/utgangskontinuitet
EP1605249A4 (de) Vorrichtung zur bestimmung einer immunochromatographie-probe und lichtquelle
ATE449993T1 (de) Kurzschlusserkennung mit stromspiegel
TW200601401A (en) Dut interface of semiconductor test apparatus
MY149802A (en) Device and method for testing electronic components
CA2595558A1 (en) Evacuation appliance
TW200716989A (en) Testing apparatus, fixture board and pin electronics card
DE202004015345U1 (de) Messeinrichtung für Stifte, insbesondere Steckerstifte
DK1688715T3 (da) Plombe til sikring af et apparat til måling af energiforbrug
TWI263786B (en) Vertical probe card with auxiliary for alignment
DE10394073D2 (de) Prüfadaptervorrichtung für Schaltungsplatinenprüfung
ATE366941T1 (de) Ic mit eingebauter karakteristikbestimmung
TWI265727B (en) Image sensor inspection system

Legal Events

Date Code Title Description
UEP Publication of translation of european patent specification

Ref document number: 1728085

Country of ref document: EP

REN Ceased due to non-payment of the annual fee