ATE382869T1 - Testen integrierter schaltungen - Google Patents

Testen integrierter schaltungen

Info

Publication number
ATE382869T1
ATE382869T1 AT05718254T AT05718254T ATE382869T1 AT E382869 T1 ATE382869 T1 AT E382869T1 AT 05718254 T AT05718254 T AT 05718254T AT 05718254 T AT05718254 T AT 05718254T AT E382869 T1 ATE382869 T1 AT E382869T1
Authority
AT
Austria
Prior art keywords
radiation
dut
pathway
sensing element
adjacent
Prior art date
Application number
AT05718254T
Other languages
English (en)
Inventor
Peter Bergmann
Original Assignee
Melexis Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Melexis Nv filed Critical Melexis Nv
Application granted granted Critical
Publication of ATE382869T1 publication Critical patent/ATE382869T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G01R31/311—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of integrated circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Health & Medical Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Computer Hardware Design (AREA)
  • Toxicology (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Amplifiers (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Tests Of Electronic Circuits (AREA)
AT05718254T 2004-03-25 2005-03-23 Testen integrierter schaltungen ATE382869T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GBGB0406665.0A GB0406665D0 (en) 2004-03-25 2004-03-25 Testing intergrated circuits

Publications (1)

Publication Number Publication Date
ATE382869T1 true ATE382869T1 (de) 2008-01-15

Family

ID=32188632

Family Applications (1)

Application Number Title Priority Date Filing Date
AT05718254T ATE382869T1 (de) 2004-03-25 2005-03-23 Testen integrierter schaltungen

Country Status (6)

Country Link
US (1) US20090115440A1 (de)
EP (1) EP1728085B1 (de)
AT (1) ATE382869T1 (de)
DE (1) DE602005004136T2 (de)
GB (1) GB0406665D0 (de)
WO (1) WO2005093445A1 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2919402B1 (fr) * 2007-07-23 2009-10-30 Eads Europ Aeronautic Defence Procede de test d'une application logicielle.
US8878527B2 (en) 2010-11-29 2014-11-04 Amkor Technology, Inc. Magnetic field simulator for testing singulated or multi-site strip semiconductor device and method therefor
US9588173B2 (en) 2013-12-17 2017-03-07 Keyssa, Inc. Waveguides for capturing close-proximity electromagnetic radiation transmitted by wireless chips during testing on automated test equipment (ATE)
US9863976B2 (en) 2015-10-09 2018-01-09 Keyssa Systems, Inc. Module test socket for over the air testing of radio frequency integrated circuits
EP4092429B1 (de) * 2021-05-21 2024-10-23 Rohde & Schwarz GmbH & Co. KG Prüfsystem
WO2023198296A1 (en) 2022-04-14 2023-10-19 Advantest Corporation Automated test equipment component, automated test equipment and method for establishing a coupling with a device under test and with a characterizing device using a first and second antenna

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6285200B1 (en) * 1998-03-02 2001-09-04 Agilent Technologies, Inc. Apparatus and method for testing integrated circuit devices
US6985219B2 (en) * 2000-12-21 2006-01-10 Credence Systems Corporation Optical coupling for testing integrated circuits
US6765396B2 (en) * 2002-04-04 2004-07-20 Freescale Semiconductor, Inc. Method, apparatus and software for testing a device including both electrical and optical portions
US7129722B1 (en) * 2002-10-09 2006-10-31 Cypress Semiconductor Corp. Methods of improving reliability of an electro-optical module

Also Published As

Publication number Publication date
DE602005004136D1 (de) 2008-02-14
EP1728085A1 (de) 2006-12-06
WO2005093445A1 (en) 2005-10-06
EP1728085B1 (de) 2008-01-02
GB0406665D0 (en) 2004-04-28
DE602005004136T2 (de) 2008-12-24
US20090115440A1 (en) 2009-05-07

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