ATE450886T1 - Beleuchtungsapparat, methode zur justierung des beleuchtungsapparats, belichtungssystem und belichtungsverfahren - Google Patents
Beleuchtungsapparat, methode zur justierung des beleuchtungsapparats, belichtungssystem und belichtungsverfahrenInfo
- Publication number
- ATE450886T1 ATE450886T1 AT05768370T AT05768370T ATE450886T1 AT E450886 T1 ATE450886 T1 AT E450886T1 AT 05768370 T AT05768370 T AT 05768370T AT 05768370 T AT05768370 T AT 05768370T AT E450886 T1 ATE450886 T1 AT E450886T1
- Authority
- AT
- Austria
- Prior art keywords
- distribution
- illuminated
- pupil
- lighting apparatus
- adjusting
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70191—Optical correction elements, filters or phase plates for controlling intensity, wavelength, polarisation, phase or the like
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70091—Illumination settings, i.e. intensity distribution in the pupil plane or angular distribution in the field plane; On-axis or off-axis settings, e.g. annular, dipole or quadrupole settings; Partial coherence control, i.e. sigma or numerical aperture [NA]
- G03F7/70108—Off-axis setting using a light-guiding element, e.g. diffractive optical elements [DOEs] or light guides
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B19/00—Condensers, e.g. light collectors or similar non-imaging optics
- G02B19/0004—Condensers, e.g. light collectors or similar non-imaging optics characterised by the optical means employed
- G02B19/0009—Condensers, e.g. light collectors or similar non-imaging optics characterised by the optical means employed having refractive surfaces only
- G02B19/0014—Condensers, e.g. light collectors or similar non-imaging optics characterised by the optical means employed having refractive surfaces only at least one surface having optical power
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B19/00—Condensers, e.g. light collectors or similar non-imaging optics
- G02B19/0033—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use
- G02B19/0047—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use for use with a light source
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/18—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for optical projection, e.g. combination of mirror and condenser and objective
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70133—Measurement of illumination distribution, in pupil plane or field plane
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Microscoopes, Condenser (AREA)
- Light Sources And Details Of Projection-Printing Devices (AREA)
- Studio Devices (AREA)
- Exposure Control For Cameras (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004236913A JP4599936B2 (ja) | 2004-08-17 | 2004-08-17 | 照明光学装置、照明光学装置の調整方法、露光装置、および露光方法 |
| PCT/JP2005/014166 WO2006018972A1 (ja) | 2004-08-17 | 2005-08-03 | 照明光学装置、照明光学装置の調整方法、露光装置、および露光方法 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE450886T1 true ATE450886T1 (de) | 2009-12-15 |
Family
ID=35907362
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT05768370T ATE450886T1 (de) | 2004-08-17 | 2005-08-03 | Beleuchtungsapparat, methode zur justierung des beleuchtungsapparats, belichtungssystem und belichtungsverfahren |
Country Status (10)
| Country | Link |
|---|---|
| US (1) | US9235133B2 (de) |
| EP (1) | EP1798758B2 (de) |
| JP (1) | JP4599936B2 (de) |
| KR (2) | KR101251214B1 (de) |
| CN (1) | CN100539018C (de) |
| AT (1) | ATE450886T1 (de) |
| DE (1) | DE602005018082D1 (de) |
| IL (1) | IL181344A (de) |
| TW (2) | TWI493276B (de) |
| WO (1) | WO2006018972A1 (de) |
Families Citing this family (55)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP2157480B1 (de) * | 2003-04-09 | 2015-05-27 | Nikon Corporation | Belichtungsverfahren und -vorrichtung sowie Herstellungsverfahren für eine Vorrichtung |
| TWI609409B (zh) | 2003-10-28 | 2017-12-21 | 尼康股份有限公司 | 照明光學裝置、曝光裝置、曝光方法以及元件製造方法 |
| TWI519819B (zh) * | 2003-11-20 | 2016-02-01 | 尼康股份有限公司 | 光束變換元件、光學照明裝置、曝光裝置、以及曝光方法 |
| TWI395068B (zh) * | 2004-01-27 | 2013-05-01 | 尼康股份有限公司 | 光學系統、曝光裝置以及曝光方法 |
| TWI494972B (zh) | 2004-02-06 | 2015-08-01 | 尼康股份有限公司 | 偏光變換元件、光學照明裝置、曝光裝置以及曝光方法 |
| TWI453795B (zh) * | 2005-01-21 | 2014-09-21 | 尼康股份有限公司 | 照明光學裝置、曝光裝置、曝光方法以及元件製造方法 |
| US7324185B2 (en) | 2005-03-04 | 2008-01-29 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| US8248577B2 (en) | 2005-05-03 | 2012-08-21 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| EP3232270A3 (de) | 2005-05-12 | 2017-12-13 | Nikon Corporation | Optisches projektionssystem, belichtungsvorrichtung und belichtungsverfahren |
| EP2126636B1 (de) | 2007-01-30 | 2012-06-13 | Carl Zeiss SMT GmbH | Beleuchtungssystem einer mikrolithographischen projektionsbelichtungsvorrichtung |
| US7714984B2 (en) * | 2007-03-28 | 2010-05-11 | Asml Holding N.V. | Residual pupil asymmetry compensator for a lithography scanner |
| US8451427B2 (en) * | 2007-09-14 | 2013-05-28 | Nikon Corporation | Illumination optical system, exposure apparatus, optical element and manufacturing method thereof, and device manufacturing method |
| JP5267029B2 (ja) * | 2007-10-12 | 2013-08-21 | 株式会社ニコン | 照明光学装置、露光装置及びデバイスの製造方法 |
| SG10201602750RA (en) | 2007-10-16 | 2016-05-30 | Nikon Corp | Illumination Optical System, Exposure Apparatus, And Device Manufacturing Method |
| KR101562073B1 (ko) * | 2007-10-16 | 2015-10-21 | 가부시키가이샤 니콘 | 조명 광학 시스템, 노광 장치 및 디바이스 제조 방법 |
| US8379187B2 (en) | 2007-10-24 | 2013-02-19 | Nikon Corporation | Optical unit, illumination optical apparatus, exposure apparatus, and device manufacturing method |
| JP2010004008A (ja) * | 2007-10-31 | 2010-01-07 | Nikon Corp | 光学ユニット、照明光学装置、露光装置、露光方法、およびデバイス製造方法 |
| US9116346B2 (en) | 2007-11-06 | 2015-08-25 | Nikon Corporation | Illumination apparatus, illumination method, exposure apparatus, and device manufacturing method |
| DE102008007449A1 (de) | 2008-02-01 | 2009-08-13 | Carl Zeiss Smt Ag | Beleuchtungsoptik zur Beleuchtung eines Objektfeldes einer Projektionsbelichtungsanlage für die Mikrolithographie |
| US8908151B2 (en) * | 2008-02-14 | 2014-12-09 | Nikon Corporation | Illumination optical system, exposure apparatus, device manufacturing method, compensation filter, and exposure optical system |
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| JP5396885B2 (ja) * | 2009-01-29 | 2014-01-22 | 株式会社ニコン | 遮光ユニット、照明光学系、露光装置及びデバイスの製造方法 |
| DE102009006685A1 (de) * | 2009-01-29 | 2010-08-05 | Carl Zeiss Smt Ag | Beleuchtungssystem für die Mikro-Lithographie |
| JP2010182704A (ja) * | 2009-02-03 | 2010-08-19 | Nikon Corp | 補正ユニット、照明光学系、露光装置、およびデバイス製造方法 |
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| JP2011022529A (ja) * | 2009-07-21 | 2011-02-03 | Mejiro Precision:Kk | 光源装置及び露光装置 |
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| TWI684788B (zh) | 2011-06-13 | 2020-02-11 | 日商尼康股份有限公司 | 照明光學系統、曝光裝置以及元件製造方法 |
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| US9732934B2 (en) | 2011-10-28 | 2017-08-15 | Nikon Corporation | Illumination device for optimizing polarization in an illumination pupil |
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| TWI387855B (zh) | 2003-11-13 | 2013-03-01 | 尼康股份有限公司 | A variable slit device, a lighting device, an exposure device, an exposure method, and an element manufacturing method |
| WO2005059617A2 (en) | 2003-12-15 | 2005-06-30 | Carl Zeiss Smt Ag | Projection objective having a high aperture and a planar end surface |
| US7030958B2 (en) | 2003-12-31 | 2006-04-18 | Asml Netherlands B.V. | Optical attenuator device, radiation system and lithographic apparatus therewith and device manufacturing method |
| JP4913041B2 (ja) | 2004-06-04 | 2012-04-11 | カール・ツァイス・エスエムティー・ゲーエムベーハー | 強度変化の補償を伴う投影系及びそのための補償素子 |
| US7283209B2 (en) * | 2004-07-09 | 2007-10-16 | Carl Zeiss Smt Ag | Illumination system for microlithography |
| DE102004063314A1 (de) | 2004-12-23 | 2006-07-13 | Carl Zeiss Smt Ag | Filtereinrichtung für die Kompensation einer asymmetrischen Pupillenausleuchtung |
| EP2126636B1 (de) | 2007-01-30 | 2012-06-13 | Carl Zeiss SMT GmbH | Beleuchtungssystem einer mikrolithographischen projektionsbelichtungsvorrichtung |
| US7843549B2 (en) | 2007-05-23 | 2010-11-30 | Asml Holding N.V. | Light attenuating filter for correcting field dependent ellipticity and uniformity |
-
2004
- 2004-08-17 JP JP2004236913A patent/JP4599936B2/ja not_active Expired - Fee Related
-
2005
- 2005-08-03 EP EP05768370.8A patent/EP1798758B2/de not_active Expired - Lifetime
- 2005-08-03 DE DE602005018082T patent/DE602005018082D1/de not_active Expired - Lifetime
- 2005-08-03 KR KR1020077003972A patent/KR101251214B1/ko not_active Expired - Fee Related
- 2005-08-03 AT AT05768370T patent/ATE450886T1/de not_active IP Right Cessation
- 2005-08-03 KR KR1020127022531A patent/KR101285056B1/ko not_active Expired - Fee Related
- 2005-08-03 US US11/660,387 patent/US9235133B2/en active Active
- 2005-08-03 CN CNB2005800276769A patent/CN100539018C/zh not_active Expired - Lifetime
- 2005-08-03 WO PCT/JP2005/014166 patent/WO2006018972A1/ja not_active Ceased
- 2005-08-10 TW TW101128475A patent/TWI493276B/zh not_active IP Right Cessation
- 2005-08-10 TW TW094127123A patent/TWI390331B/zh not_active IP Right Cessation
-
2007
- 2007-02-14 IL IL181344A patent/IL181344A/en active IP Right Grant
Also Published As
| Publication number | Publication date |
|---|---|
| EP1798758A1 (de) | 2007-06-20 |
| IL181344A0 (en) | 2007-07-04 |
| TW201300936A (zh) | 2013-01-01 |
| TWI493276B (zh) | 2015-07-21 |
| JP2006059834A (ja) | 2006-03-02 |
| KR20120101599A (ko) | 2012-09-13 |
| KR20070041582A (ko) | 2007-04-18 |
| CN101006552A (zh) | 2007-07-25 |
| KR101251214B1 (ko) | 2013-04-08 |
| DE602005018082D1 (de) | 2010-01-14 |
| CN100539018C (zh) | 2009-09-09 |
| US9235133B2 (en) | 2016-01-12 |
| IL181344A (en) | 2015-07-30 |
| WO2006018972A1 (ja) | 2006-02-23 |
| EP1798758B1 (de) | 2009-12-02 |
| EP1798758B2 (de) | 2019-03-13 |
| JP4599936B2 (ja) | 2010-12-15 |
| TWI390331B (zh) | 2013-03-21 |
| TW200609656A (en) | 2006-03-16 |
| US20080030707A1 (en) | 2008-02-07 |
| HK1106064A1 (zh) | 2008-02-29 |
| KR101285056B1 (ko) | 2013-07-10 |
| EP1798758A4 (de) | 2008-06-25 |
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| RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |