ATE450886T1 - Beleuchtungsapparat, methode zur justierung des beleuchtungsapparats, belichtungssystem und belichtungsverfahren - Google Patents

Beleuchtungsapparat, methode zur justierung des beleuchtungsapparats, belichtungssystem und belichtungsverfahren

Info

Publication number
ATE450886T1
ATE450886T1 AT05768370T AT05768370T ATE450886T1 AT E450886 T1 ATE450886 T1 AT E450886T1 AT 05768370 T AT05768370 T AT 05768370T AT 05768370 T AT05768370 T AT 05768370T AT E450886 T1 ATE450886 T1 AT E450886T1
Authority
AT
Austria
Prior art keywords
distribution
illuminated
pupil
lighting apparatus
adjusting
Prior art date
Application number
AT05768370T
Other languages
English (en)
Inventor
Hirohisa Tanaka
Koji Shigematsu
Original Assignee
Nikon Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=35907362&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=ATE450886(T1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Nikon Corp filed Critical Nikon Corp
Application granted granted Critical
Publication of ATE450886T1 publication Critical patent/ATE450886T1/de

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70058Mask illumination systems
    • G03F7/70191Optical correction elements, filters or phase plates for controlling intensity, wavelength, polarisation, phase or the like
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70058Mask illumination systems
    • G03F7/70091Illumination settings, i.e. intensity distribution in the pupil plane or angular distribution in the field plane; On-axis or off-axis settings, e.g. annular, dipole or quadrupole settings; Partial coherence control, i.e. sigma or numerical aperture [NA]
    • G03F7/70108Off-axis setting using a light-guiding element, e.g. diffractive optical elements [DOEs] or light guides
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B19/00Condensers, e.g. light collectors or similar non-imaging optics
    • G02B19/0004Condensers, e.g. light collectors or similar non-imaging optics characterised by the optical means employed
    • G02B19/0009Condensers, e.g. light collectors or similar non-imaging optics characterised by the optical means employed having refractive surfaces only
    • G02B19/0014Condensers, e.g. light collectors or similar non-imaging optics characterised by the optical means employed having refractive surfaces only at least one surface having optical power
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B19/00Condensers, e.g. light collectors or similar non-imaging optics
    • G02B19/0033Condensers, e.g. light collectors or similar non-imaging optics characterised by the use
    • G02B19/0047Condensers, e.g. light collectors or similar non-imaging optics characterised by the use for use with a light source
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/18Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for optical projection, e.g. combination of mirror and condenser and objective
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70058Mask illumination systems
    • G03F7/70133Measurement of illumination distribution, in pupil plane or field plane

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Microscoopes, Condenser (AREA)
  • Light Sources And Details Of Projection-Printing Devices (AREA)
  • Studio Devices (AREA)
  • Exposure Control For Cameras (AREA)
AT05768370T 2004-08-17 2005-08-03 Beleuchtungsapparat, methode zur justierung des beleuchtungsapparats, belichtungssystem und belichtungsverfahren ATE450886T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2004236913A JP4599936B2 (ja) 2004-08-17 2004-08-17 照明光学装置、照明光学装置の調整方法、露光装置、および露光方法
PCT/JP2005/014166 WO2006018972A1 (ja) 2004-08-17 2005-08-03 照明光学装置、照明光学装置の調整方法、露光装置、および露光方法

Publications (1)

Publication Number Publication Date
ATE450886T1 true ATE450886T1 (de) 2009-12-15

Family

ID=35907362

Family Applications (1)

Application Number Title Priority Date Filing Date
AT05768370T ATE450886T1 (de) 2004-08-17 2005-08-03 Beleuchtungsapparat, methode zur justierung des beleuchtungsapparats, belichtungssystem und belichtungsverfahren

Country Status (10)

Country Link
US (1) US9235133B2 (de)
EP (1) EP1798758B2 (de)
JP (1) JP4599936B2 (de)
KR (2) KR101251214B1 (de)
CN (1) CN100539018C (de)
AT (1) ATE450886T1 (de)
DE (1) DE602005018082D1 (de)
IL (1) IL181344A (de)
TW (2) TWI493276B (de)
WO (1) WO2006018972A1 (de)

Families Citing this family (55)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2157480B1 (de) * 2003-04-09 2015-05-27 Nikon Corporation Belichtungsverfahren und -vorrichtung sowie Herstellungsverfahren für eine Vorrichtung
TWI609409B (zh) 2003-10-28 2017-12-21 尼康股份有限公司 照明光學裝置、曝光裝置、曝光方法以及元件製造方法
TWI519819B (zh) * 2003-11-20 2016-02-01 尼康股份有限公司 光束變換元件、光學照明裝置、曝光裝置、以及曝光方法
TWI395068B (zh) * 2004-01-27 2013-05-01 尼康股份有限公司 光學系統、曝光裝置以及曝光方法
TWI494972B (zh) 2004-02-06 2015-08-01 尼康股份有限公司 偏光變換元件、光學照明裝置、曝光裝置以及曝光方法
TWI453795B (zh) * 2005-01-21 2014-09-21 尼康股份有限公司 照明光學裝置、曝光裝置、曝光方法以及元件製造方法
US7324185B2 (en) 2005-03-04 2008-01-29 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US8248577B2 (en) 2005-05-03 2012-08-21 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
EP3232270A3 (de) 2005-05-12 2017-12-13 Nikon Corporation Optisches projektionssystem, belichtungsvorrichtung und belichtungsverfahren
EP2126636B1 (de) 2007-01-30 2012-06-13 Carl Zeiss SMT GmbH Beleuchtungssystem einer mikrolithographischen projektionsbelichtungsvorrichtung
US7714984B2 (en) * 2007-03-28 2010-05-11 Asml Holding N.V. Residual pupil asymmetry compensator for a lithography scanner
US8451427B2 (en) * 2007-09-14 2013-05-28 Nikon Corporation Illumination optical system, exposure apparatus, optical element and manufacturing method thereof, and device manufacturing method
JP5267029B2 (ja) * 2007-10-12 2013-08-21 株式会社ニコン 照明光学装置、露光装置及びデバイスの製造方法
SG10201602750RA (en) 2007-10-16 2016-05-30 Nikon Corp Illumination Optical System, Exposure Apparatus, And Device Manufacturing Method
KR101562073B1 (ko) * 2007-10-16 2015-10-21 가부시키가이샤 니콘 조명 광학 시스템, 노광 장치 및 디바이스 제조 방법
US8379187B2 (en) 2007-10-24 2013-02-19 Nikon Corporation Optical unit, illumination optical apparatus, exposure apparatus, and device manufacturing method
JP2010004008A (ja) * 2007-10-31 2010-01-07 Nikon Corp 光学ユニット、照明光学装置、露光装置、露光方法、およびデバイス製造方法
US9116346B2 (en) 2007-11-06 2015-08-25 Nikon Corporation Illumination apparatus, illumination method, exposure apparatus, and device manufacturing method
DE102008007449A1 (de) 2008-02-01 2009-08-13 Carl Zeiss Smt Ag Beleuchtungsoptik zur Beleuchtung eines Objektfeldes einer Projektionsbelichtungsanlage für die Mikrolithographie
US8908151B2 (en) * 2008-02-14 2014-12-09 Nikon Corporation Illumination optical system, exposure apparatus, device manufacturing method, compensation filter, and exposure optical system
US20090257043A1 (en) * 2008-04-14 2009-10-15 Nikon Corporation Illumination optical system, exposure apparatus, device manufacturing method, and exposure optical system
KR101695034B1 (ko) 2008-05-28 2017-01-10 가부시키가이샤 니콘 공간 광 변조기의 검사 장치, 조명 광학계, 노광 장치, 검사 방법, 조명 광학계의 조정 방법, 조명 방법, 노광 방법, 및 디바이스 제조 방법
JP5763534B2 (ja) * 2008-06-30 2015-08-12 コーニング インコーポレイテッド マイクロリソグラフィック投影システムのためのテレセントリシティ補正素子
DE102009025362A1 (de) 2008-08-01 2010-02-04 Carl Zeiss Smt Ag Variabel einstellbare Streuscheibe für Projektionsbelichtungsanlage
JPWO2010024106A1 (ja) * 2008-08-28 2012-01-26 株式会社ニコン 照明光学系、露光装置、およびデバイス製造方法
JP5391641B2 (ja) * 2008-10-20 2014-01-15 株式会社ニコン フィルタ装置、照明装置、露光装置、及びデバイス製造方法
JP5365641B2 (ja) * 2008-12-24 2013-12-11 株式会社ニコン 照明光学系、露光装置及びデバイスの製造方法
JP5541164B2 (ja) * 2008-12-24 2014-07-09 株式会社ニコン 照明光学系、露光装置及びデバイスの製造方法
JP5187631B2 (ja) * 2008-12-30 2013-04-24 株式会社ニコン 補正ユニット、照明光学系、露光装置、およびデバイス製造方法
JP5187632B2 (ja) * 2008-12-30 2013-04-24 株式会社ニコン 補正ユニット、照明光学系、露光装置、およびデバイス製造方法
JP5396885B2 (ja) * 2009-01-29 2014-01-22 株式会社ニコン 遮光ユニット、照明光学系、露光装置及びデバイスの製造方法
DE102009006685A1 (de) * 2009-01-29 2010-08-05 Carl Zeiss Smt Ag Beleuchtungssystem für die Mikro-Lithographie
JP2010182704A (ja) * 2009-02-03 2010-08-19 Nikon Corp 補正ユニット、照明光学系、露光装置、およびデバイス製造方法
JP5473350B2 (ja) * 2009-02-13 2014-04-16 キヤノン株式会社 照明光学系、露光装置及びデバイスの製造方法
JP2011022529A (ja) * 2009-07-21 2011-02-03 Mejiro Precision:Kk 光源装置及び露光装置
CN101988631A (zh) * 2009-07-31 2011-03-23 深圳市光峰光电技术有限公司 Led舞台灯光照明设备及其改善颜色均匀性的方法
JP2011040618A (ja) * 2009-08-12 2011-02-24 Nikon Corp 回折光学素子、照明光学系、露光装置、デバイスの製造方法、及び回折光学素子の設計方法
US20110037962A1 (en) 2009-08-17 2011-02-17 Nikon Corporation Polarization converting unit, illumination optical system, exposure apparatus, and device manufacturing method
WO2011078070A1 (ja) 2009-12-23 2011-06-30 株式会社ニコン 空間光変調ユニット、照明光学系、露光装置、およびデバイス製造方法
JP5842808B2 (ja) 2010-02-20 2016-01-13 株式会社ニコン 瞳強度分布を調整する方法
US20110205519A1 (en) * 2010-02-25 2011-08-25 Nikon Corporation Polarization converting unit, illumination optical system, exposure apparatus, and device manufacturing method
US9389519B2 (en) * 2010-02-25 2016-07-12 Nikon Corporation Measuring method and measuring apparatus of pupil transmittance distribution, exposure method and exposure apparatus, and device manufacturing method
CN101807009A (zh) * 2010-03-15 2010-08-18 上海微电子装备有限公司 一种照明均匀性补偿装置及具有该装置的光刻机
US8699000B2 (en) 2010-12-23 2014-04-15 Asml Netherlands B.V. Illumination system for a lithographic apparatus
WO2012169089A1 (ja) 2011-06-07 2012-12-13 株式会社ニコン 照明光学系、露光装置、デバイス製造方法、および偏光ユニット
TWI684788B (zh) 2011-06-13 2020-02-11 日商尼康股份有限公司 照明光學系統、曝光裝置以及元件製造方法
KR102170875B1 (ko) 2011-10-24 2020-10-28 가부시키가이샤 니콘 조명 광학계, 노광 장치, 및 디바이스 제조 방법
US9732934B2 (en) 2011-10-28 2017-08-15 Nikon Corporation Illumination device for optimizing polarization in an illumination pupil
CN104395985B (zh) * 2012-05-02 2018-01-30 株式会社尼康 光瞳亮度分布的评价方法和改善方法、照明光学系统及其调整方法、曝光装置、曝光方法以及器件制造方法
JP6260847B2 (ja) * 2013-02-23 2018-01-17 株式会社ニコン 露光方法及び装置、並びにデバイス製造方法
US9594240B2 (en) 2013-12-06 2017-03-14 Samsung Electronics Co., Ltd. Lighting apparatus, and optical inspection apparatus and optical microscope using the lighting apparatus
CN109426091B (zh) 2017-08-31 2021-01-29 京东方科技集团股份有限公司 曝光装置、曝光方法及光刻方法
WO2021246430A1 (ja) * 2020-06-03 2021-12-09 興和株式会社 撮像装置
JP7680878B2 (ja) * 2021-05-07 2025-05-21 キヤノン株式会社 照明光学系、露光装置、および物品の製造方法
DE102021120952B3 (de) * 2021-08-11 2022-11-10 Carl Zeiss Smt Gmbh Verfahren zur Korrektur eines Telezentriefehlers einer Abbildungsvorrichtung und Maskeninspektionsmikroskop

Family Cites Families (46)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2928277B2 (ja) 1989-08-03 1999-08-03 株式会社日立製作所 投影露光方法及びその装置
JPH03216658A (ja) 1990-01-22 1991-09-24 Hitachi Ltd マスクパターン投影像のシミュレーション方法
US6252647B1 (en) * 1990-11-15 2001-06-26 Nikon Corporation Projection exposure apparatus
JPH0567558A (ja) * 1991-09-06 1993-03-19 Nikon Corp 露光方法
JPH06124873A (ja) 1992-10-09 1994-05-06 Canon Inc 液浸式投影露光装置
JP3008744B2 (ja) 1993-08-26 2000-02-14 キヤノン株式会社 投影露光装置及びそれを用いた半導体素子の製造方法
JPH08179237A (ja) * 1994-12-26 1996-07-12 Nikon Corp 照明光学装置
JP3232473B2 (ja) * 1996-01-10 2001-11-26 キヤノン株式会社 投影露光装置及びそれを用いたデバイスの製造方法
JP3991166B2 (ja) * 1996-10-25 2007-10-17 株式会社ニコン 照明光学装置および該照明光学装置を備えた露光装置
JP4310816B2 (ja) * 1997-03-14 2009-08-12 株式会社ニコン 照明装置、投影露光装置、デバイスの製造方法、及び投影露光装置の調整方法
JP3747566B2 (ja) 1997-04-23 2006-02-22 株式会社ニコン 液浸型露光装置
JP3101613B2 (ja) 1998-01-30 2000-10-23 キヤノン株式会社 照明光学装置及び投影露光装置
DE19809395A1 (de) * 1998-03-05 1999-09-09 Zeiss Carl Fa Beleuchtungssystem und REMA-Objektiv mit Linsenverschiebung und Betriebsverfahren dafür
AU2747999A (en) 1998-03-26 1999-10-18 Nikon Corporation Projection exposure method and system
US6404499B1 (en) * 1998-04-21 2002-06-11 Asml Netherlands B.V. Lithography apparatus with filters for optimizing uniformity of an image
EP0952491A3 (de) 1998-04-21 2001-05-09 Asm Lithography B.V. Lithographischer Apparat
US6281967B1 (en) * 2000-03-15 2001-08-28 Nikon Corporation Illumination apparatus, exposure apparatus and exposure method
JP2000277421A (ja) * 1999-03-26 2000-10-06 Nikon Corp 照明装置
JP2001060546A (ja) 1999-08-20 2001-03-06 Nikon Corp 露光方法及び露光装置
US6995930B2 (en) 1999-12-29 2006-02-07 Carl Zeiss Smt Ag Catadioptric projection objective with geometric beam splitting
JP2002100561A (ja) * 2000-07-19 2002-04-05 Nikon Corp 露光方法及び装置、並びにデバイス製造方法
KR20010085493A (ko) * 2000-02-25 2001-09-07 시마무라 기로 노광장치, 그 조정방법, 및 상기 노광장치를 이용한디바이스 제조방법
US6704090B2 (en) 2000-05-11 2004-03-09 Nikon Corporation Exposure method and exposure apparatus
TW498408B (en) * 2000-07-05 2002-08-11 Asm Lithography Bv Lithographic apparatus, device manufacturing method, and device manufactured thereby
WO2002031570A1 (en) 2000-10-10 2002-04-18 Nikon Corporation Method of evaluating imaging performance
WO2003023832A1 (en) * 2001-09-07 2003-03-20 Nikon Corporation Exposure method and system, and device production method
JP4923370B2 (ja) * 2001-09-18 2012-04-25 株式会社ニコン 照明光学系、露光装置、及びマイクロデバイスの製造方法
JP2003257812A (ja) 2002-02-27 2003-09-12 Nikon Corp 結像光学系の評価方法、結像光学系の調整方法、露光装置および露光方法
DE10218989A1 (de) 2002-04-24 2003-11-06 Zeiss Carl Smt Ag Projektionsverfahren und Projektionssystem mit optischer Filterung
JP4324957B2 (ja) * 2002-05-27 2009-09-02 株式会社ニコン 照明光学装置、露光装置および露光方法
JP2005536775A (ja) 2002-08-23 2005-12-02 株式会社ニコン 投影光学系、フォトリソグラフィ方法および露光装置、並びに露光装置を用いた方法
JP4077288B2 (ja) 2002-09-30 2008-04-16 株式会社東芝 フォトマスクの設計方法およびプログラム
JP4135471B2 (ja) 2002-10-31 2008-08-20 Dic株式会社 エポキシ樹脂組成物およびその硬化物
EP1429190B1 (de) * 2002-12-10 2012-05-09 Canon Kabushiki Kaisha Belichtungsapparat und -verfahren
JP2004266259A (ja) * 2003-02-10 2004-09-24 Nikon Corp 照明光学装置、露光装置および露光方法
EP2157480B1 (de) * 2003-04-09 2015-05-27 Nikon Corporation Belichtungsverfahren und -vorrichtung sowie Herstellungsverfahren für eine Vorrichtung
EP2672307A3 (de) 2003-05-06 2014-07-23 Nikon Corporation Optisches Projektionssystem, Belichtungsvorrichtung und Belichtungsverfahren
US7348575B2 (en) 2003-05-06 2008-03-25 Nikon Corporation Projection optical system, exposure apparatus, and exposure method
TWI387855B (zh) 2003-11-13 2013-03-01 尼康股份有限公司 A variable slit device, a lighting device, an exposure device, an exposure method, and an element manufacturing method
WO2005059617A2 (en) 2003-12-15 2005-06-30 Carl Zeiss Smt Ag Projection objective having a high aperture and a planar end surface
US7030958B2 (en) 2003-12-31 2006-04-18 Asml Netherlands B.V. Optical attenuator device, radiation system and lithographic apparatus therewith and device manufacturing method
JP4913041B2 (ja) 2004-06-04 2012-04-11 カール・ツァイス・エスエムティー・ゲーエムベーハー 強度変化の補償を伴う投影系及びそのための補償素子
US7283209B2 (en) * 2004-07-09 2007-10-16 Carl Zeiss Smt Ag Illumination system for microlithography
DE102004063314A1 (de) 2004-12-23 2006-07-13 Carl Zeiss Smt Ag Filtereinrichtung für die Kompensation einer asymmetrischen Pupillenausleuchtung
EP2126636B1 (de) 2007-01-30 2012-06-13 Carl Zeiss SMT GmbH Beleuchtungssystem einer mikrolithographischen projektionsbelichtungsvorrichtung
US7843549B2 (en) 2007-05-23 2010-11-30 Asml Holding N.V. Light attenuating filter for correcting field dependent ellipticity and uniformity

Also Published As

Publication number Publication date
EP1798758A1 (de) 2007-06-20
IL181344A0 (en) 2007-07-04
TW201300936A (zh) 2013-01-01
TWI493276B (zh) 2015-07-21
JP2006059834A (ja) 2006-03-02
KR20120101599A (ko) 2012-09-13
KR20070041582A (ko) 2007-04-18
CN101006552A (zh) 2007-07-25
KR101251214B1 (ko) 2013-04-08
DE602005018082D1 (de) 2010-01-14
CN100539018C (zh) 2009-09-09
US9235133B2 (en) 2016-01-12
IL181344A (en) 2015-07-30
WO2006018972A1 (ja) 2006-02-23
EP1798758B1 (de) 2009-12-02
EP1798758B2 (de) 2019-03-13
JP4599936B2 (ja) 2010-12-15
TWI390331B (zh) 2013-03-21
TW200609656A (en) 2006-03-16
US20080030707A1 (en) 2008-02-07
HK1106064A1 (zh) 2008-02-29
KR101285056B1 (ko) 2013-07-10
EP1798758A4 (de) 2008-06-25

Similar Documents

Publication Publication Date Title
ATE450886T1 (de) Beleuchtungsapparat, methode zur justierung des beleuchtungsapparats, belichtungssystem und belichtungsverfahren
WO2005026843A3 (en) Illumination system for a microlithography projection exposure installation
WO2009035129A3 (en) Illumination optical system, exposure apparatus, optical element and manufacturing method thereof, and device manufacturing method
EP1336898A3 (de) Belichtungsapparat und Belichtungsverfahren, und dieselbe verwendendes Verfahren zur Herstellung von Vorrichtungen
ATE532105T1 (de) Beleuchtungsmethode
EP2259138A3 (de) Optisches Beleuchtungssystem und Belichtungsapparat
TW200511392A (en) Illumination optical system and exposure apparatus using the same
ATE540424T1 (de) Optisches beleuchtungsgerät, belichtungsgerät und belichtungsverfahren
TW200745772A (en) Exposure apparatus and device manufacturing method
EP1584863A3 (de) Beleuchtungseinrichtung mit Linse und Herstellverfahren für eine solche
EP1435542A4 (de) Illuminator und projektionsanzeige und ansteuerverfahren dafür
JO3220B1 (ar) طريقة ونظام وجهاز لتوزيع الضوء بشكل عالي التحكم من تركيبة ضوء تستخدم مصادر ضوء متعددة (اجهزة دايود باعثه للضوء)
EP1582923A3 (de) Verarbeitungsapparat
PT774615E (pt) Equipamentos de iluminacao e molduras
TW200500980A (en) Area light device and display device using the device
TW200741328A (en) Illumination optical apparatus, projection exposure apparatus, projection optical system, and device manufacturing method
TW200625027A (en) Illumination system for a microlithographic projection exposure apparatus
WO2005085955A3 (de) Transmissionsfiltervorrichtung
WO2005078522A3 (en) Illumination system for a microlithographic projection exposure apparatus
DE60219404D1 (de) Beleuchtungsvorrichtung
GB2443778A (en) Improvements relating to lighting
WO2001073677A3 (en) Illumination system for use in imaging moving articles
WO2009078224A1 (ja) 照明光学系、露光装置、およびデバイス製造方法
WO2005015310A3 (en) Illumination system for a microlithographic projection exposure apparatus
ATE527814T1 (de) Vorrichtung und verfahren zum zeilenförmigen beleuchten eines objektes mittels leds und eines elliptischen spiegels

Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties