ATE467900T1 - Verfahren und vorrichtung zur herstellung eines montageverbunds aus mindestens zwei elektronischen mikrochips - Google Patents
Verfahren und vorrichtung zur herstellung eines montageverbunds aus mindestens zwei elektronischen mikrochipsInfo
- Publication number
- ATE467900T1 ATE467900T1 AT09354009T AT09354009T ATE467900T1 AT E467900 T1 ATE467900 T1 AT E467900T1 AT 09354009 T AT09354009 T AT 09354009T AT 09354009 T AT09354009 T AT 09354009T AT E467900 T1 ATE467900 T1 AT E467900T1
- Authority
- AT
- Austria
- Prior art keywords
- chips
- producing
- groove
- flexible film
- assembly composite
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/74—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W44/00—Electrical arrangements for controlling or matching impedance
- H10W44/20—Electrical arrangements for controlling or matching impedance at high-frequency [HF] or radio frequency [RF]
- H10W44/241—Electrical arrangements for controlling or matching impedance at high-frequency [HF] or radio frequency [RF] for passive devices or passive elements
- H10W44/248—Electrical arrangements for controlling or matching impedance at high-frequency [HF] or radio frequency [RF] for passive devices or passive elements for antennas
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/0711—Apparatus therefor
- H10W72/07141—Means for applying energy, e.g. ovens or lasers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/075—Connecting or disconnecting of bond wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/075—Connecting or disconnecting of bond wires
- H10W72/07502—Connecting or disconnecting of bond wires using an auxiliary member
- H10W72/07504—Connecting or disconnecting of bond wires using an auxiliary member the auxiliary member being temporary, e.g. a sacrificial coating
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/075—Connecting or disconnecting of bond wires
- H10W72/07551—Connecting or disconnecting of bond wires characterised by changes in properties of the bond wires during the connecting
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/551—Materials of bond wires
- H10W72/552—Materials of bond wires comprising metals or metalloids, e.g. silver
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/551—Materials of bond wires
- H10W72/552—Materials of bond wires comprising metals or metalloids, e.g. silver
- H10W72/5522—Materials of bond wires comprising metals or metalloids, e.g. silver comprising gold [Au]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/931—Shapes of bond pads
Landscapes
- Wire Bonding (AREA)
- Dicing (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Lining Or Joining Of Plastics Or The Like (AREA)
- Die Bonding (AREA)
- Coupling Device And Connection With Printed Circuit (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR0801234A FR2928491A1 (fr) | 2008-03-06 | 2008-03-06 | Procede et dispositif de fabrication d'un assemblage d'au moins deux puces microelectroniques |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE467900T1 true ATE467900T1 (de) | 2010-05-15 |
Family
ID=39864710
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT09354009T ATE467900T1 (de) | 2008-03-06 | 2009-02-20 | Verfahren und vorrichtung zur herstellung eines montageverbunds aus mindestens zwei elektronischen mikrochips |
Country Status (9)
| Country | Link |
|---|---|
| US (2) | US8723312B2 (de) |
| EP (2) | EP2250667B1 (de) |
| JP (2) | JP5341114B2 (de) |
| CN (2) | CN101960585B (de) |
| AT (1) | ATE467900T1 (de) |
| DE (1) | DE602009000024D1 (de) |
| ES (1) | ES2346274T3 (de) |
| FR (1) | FR2928491A1 (de) |
| WO (1) | WO2009112644A1 (de) |
Families Citing this family (52)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2928491A1 (fr) * | 2008-03-06 | 2009-09-11 | Commissariat Energie Atomique | Procede et dispositif de fabrication d'un assemblage d'au moins deux puces microelectroniques |
| FR2937464B1 (fr) * | 2008-10-21 | 2011-02-25 | Commissariat Energie Atomique | Assemblage d'une puce microelectronique a rainure avec un element filaire sous forme de toron et procede d'assemblage |
| FR2954588B1 (fr) * | 2009-12-23 | 2014-07-25 | Commissariat Energie Atomique | Procede d'assemblage d'au moins une puce avec un element filaire, puce electronique a element de liaison deformable, procede de fabrication d'une pluralite de puces, et assemblage d'au moins une puce avec un element filaire |
| FR2955972B1 (fr) * | 2010-02-03 | 2012-03-09 | Commissariat Energie Atomique | Procede d'assemblage d'au moins une puce avec un tissu incluant un dispositif a puce |
| FR2960339B1 (fr) * | 2010-05-18 | 2012-05-18 | Commissariat Energie Atomique | Procede de realisation d'elements a puce munis de rainures d'insertion de fils |
| EP2390194B1 (de) | 2010-05-25 | 2019-12-25 | Commissariat à l'Énergie Atomique et aux Énergies Alternatives | Vorrichtung zum Verbinden von Chipgeräten mit Drähten |
| FR2961947B1 (fr) * | 2010-06-24 | 2013-03-15 | Commissariat Energie Atomique | Incorporation d'elements a puce dans un fil guipe |
| FR2961949B1 (fr) | 2010-06-24 | 2012-08-03 | Commissariat Energie Atomique | Elements a puce assembles sur des fils presentant une amorce de rupture |
| FR2964786B1 (fr) * | 2010-09-09 | 2013-03-15 | Commissariat Energie Atomique | Procédé de réalisation d'éléments a puce munis de rainures d'insertion de fils |
| FR2995721B1 (fr) * | 2012-09-17 | 2014-11-21 | Commissariat Energie Atomique | Capot pour dispositif a rainure et a puce, dispositif equipe du capot, assemblage du dispositif avec un element filaire et procede de fabrication |
| FR3013147B1 (fr) * | 2013-11-08 | 2017-05-12 | Commissariat Energie Atomique | Procede de fabrication d'un organe electriquement conducteur pour composant electronique presentant une extremite munie d'une cavite |
| US9560737B2 (en) | 2015-03-04 | 2017-01-31 | International Business Machines Corporation | Electronic package with heat transfer element(s) |
| US10426037B2 (en) | 2015-07-15 | 2019-09-24 | International Business Machines Corporation | Circuitized structure with 3-dimensional configuration |
| US9894749B2 (en) | 2015-09-25 | 2018-02-13 | International Business Machines Corporation | Tamper-respondent assemblies with bond protection |
| US10098235B2 (en) | 2015-09-25 | 2018-10-09 | International Business Machines Corporation | Tamper-respondent assemblies with region(s) of increased susceptibility to damage |
| US10172239B2 (en) | 2015-09-25 | 2019-01-01 | International Business Machines Corporation | Tamper-respondent sensors with formed flexible layer(s) |
| US10175064B2 (en) | 2015-09-25 | 2019-01-08 | International Business Machines Corporation | Circuit boards and electronic packages with embedded tamper-respondent sensor |
| US9911012B2 (en) | 2015-09-25 | 2018-03-06 | International Business Machines Corporation | Overlapping, discrete tamper-respondent sensors |
| US9924591B2 (en) | 2015-09-25 | 2018-03-20 | International Business Machines Corporation | Tamper-respondent assemblies |
| US9591776B1 (en) | 2015-09-25 | 2017-03-07 | International Business Machines Corporation | Enclosure with inner tamper-respondent sensor(s) |
| US9578764B1 (en) | 2015-09-25 | 2017-02-21 | International Business Machines Corporation | Enclosure with inner tamper-respondent sensor(s) and physical security element(s) |
| US10143090B2 (en) | 2015-10-19 | 2018-11-27 | International Business Machines Corporation | Circuit layouts of tamper-respondent sensors |
| US9978231B2 (en) | 2015-10-21 | 2018-05-22 | International Business Machines Corporation | Tamper-respondent assembly with protective wrap(s) over tamper-respondent sensor(s) |
| US9913389B2 (en) | 2015-12-01 | 2018-03-06 | International Business Corporation Corporation | Tamper-respondent assembly with vent structure |
| US9555606B1 (en) | 2015-12-09 | 2017-01-31 | International Business Machines Corporation | Applying pressure to adhesive using CTE mismatch between components |
| US10327343B2 (en) | 2015-12-09 | 2019-06-18 | International Business Machines Corporation | Applying pressure to adhesive using CTE mismatch between components |
| US9554477B1 (en) | 2015-12-18 | 2017-01-24 | International Business Machines Corporation | Tamper-respondent assemblies with enclosure-to-board protection |
| US9916744B2 (en) | 2016-02-25 | 2018-03-13 | International Business Machines Corporation | Multi-layer stack with embedded tamper-detect protection |
| US9904811B2 (en) | 2016-04-27 | 2018-02-27 | International Business Machines Corporation | Tamper-proof electronic packages with two-phase dielectric fluid |
| US9881880B2 (en) | 2016-05-13 | 2018-01-30 | International Business Machines Corporation | Tamper-proof electronic packages with stressed glass component substrate(s) |
| US9913370B2 (en) | 2016-05-13 | 2018-03-06 | International Business Machines Corporation | Tamper-proof electronic packages formed with stressed glass |
| US9858776B1 (en) | 2016-06-28 | 2018-01-02 | International Business Machines Corporation | Tamper-respondent assembly with nonlinearity monitoring |
| FR3053527B1 (fr) | 2016-06-29 | 2018-08-10 | Safran Electronics & Defense | Procede de marquage inviolable et tracable d'un assemblage de deux elements |
| US10321589B2 (en) | 2016-09-19 | 2019-06-11 | International Business Machines Corporation | Tamper-respondent assembly with sensor connection adapter |
| US10271424B2 (en) | 2016-09-26 | 2019-04-23 | International Business Machines Corporation | Tamper-respondent assemblies with in situ vent structure(s) |
| US10299372B2 (en) | 2016-09-26 | 2019-05-21 | International Business Machines Corporation | Vented tamper-respondent assemblies |
| US9999124B2 (en) | 2016-11-02 | 2018-06-12 | International Business Machines Corporation | Tamper-respondent assemblies with trace regions of increased susceptibility to breaking |
| FR3058579B1 (fr) * | 2016-11-07 | 2018-11-16 | Commissariat A L'energie Atomique Et Aux Energies Alternatives | Dispositif d'emission reception radiofrequence |
| FR3062237B1 (fr) | 2017-01-23 | 2020-05-01 | Commissariat A L'energie Atomique Et Aux Energies Alternatives | Procede de realisation d’une puce a circuit integre et puce a circuit integre. |
| FR3062515B1 (fr) * | 2017-01-30 | 2019-11-01 | Primo1D | Procede d'insertion d'un fil dans une rainure d'une puce de semi-conducteur, et equipement pour la mise en œuvre d’un tel procede. |
| US10327329B2 (en) | 2017-02-13 | 2019-06-18 | International Business Machines Corporation | Tamper-respondent assembly with flexible tamper-detect sensor(s) overlying in-situ-formed tamper-detect sensor |
| FR3065578B1 (fr) | 2017-04-19 | 2019-05-03 | Primo1D | Procede d'assemblage d'une puce microelectronique sur un element filaire |
| FR3065579B1 (fr) | 2017-04-19 | 2019-05-03 | Primo1D | Dispositif d'emission reception radiofrequence |
| FR3069962B1 (fr) | 2017-08-01 | 2020-09-25 | Primo1D | Antenne a plaque pour coupler un terminal d’emission-reception a un dispositif rfid |
| FR3076071B1 (fr) * | 2017-12-21 | 2019-11-15 | Commissariat A L'energie Atomique Et Aux Energies Alternatives | Procede de fabrication d’une puce a circuit integre et puce a circuit integre |
| US10306753B1 (en) | 2018-02-22 | 2019-05-28 | International Business Machines Corporation | Enclosure-to-board interface with tamper-detect circuit(s) |
| FR3078980B1 (fr) | 2018-03-14 | 2021-06-11 | Primo1D | Fil guipe compose d’une ame principale et d’au moins un fils de couverture et comprenant au moins un element filaire conducteur relie electriquement a au moins une puce electronique |
| US11122682B2 (en) | 2018-04-04 | 2021-09-14 | International Business Machines Corporation | Tamper-respondent sensors with liquid crystal polymer layers |
| FR3083643B1 (fr) | 2018-07-04 | 2023-01-13 | Commissariat Energie Atomique | Procede de realisation d'un dispositif electronique |
| CN112098768B (zh) * | 2019-05-30 | 2022-04-29 | 上海新微技术研发中心有限公司 | 硅光芯片的测试方法及设备 |
| FR3103630B1 (fr) | 2019-11-22 | 2022-06-03 | Primo1D | Puce fonctionnelle adaptee pour etre assemblee a des elements filaires, et procede de fabrication d’une telle puce |
| FR3150613B1 (fr) | 2023-06-30 | 2025-12-12 | Primo1D | Dispositif d'émission-réception radiofréquence comprenant un fil conducteur formant antenne enroule en spires |
Family Cites Families (29)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01283939A (ja) * | 1988-05-11 | 1989-11-15 | Hitachi Ltd | 半導体チップおよび基板並びにこれらによって構成される電子装置 |
| US5591941A (en) * | 1993-10-28 | 1997-01-07 | International Business Machines Corporation | Solder ball interconnected assembly |
| CA2156795C (en) * | 1994-08-31 | 1999-08-17 | Yuzo Shimada | An electronic device assembly and a manufacturing method of the same |
| US5903059A (en) * | 1995-11-21 | 1999-05-11 | International Business Machines Corporation | Microconnectors |
| JPH10214919A (ja) * | 1997-01-29 | 1998-08-11 | New Japan Radio Co Ltd | マルチチップモジュールの製造方法 |
| DE19737978C2 (de) * | 1997-08-30 | 1999-09-16 | Bayer Ag | Elektrochromer Spiegel |
| US6214716B1 (en) * | 1998-09-30 | 2001-04-10 | Micron Technology, Inc. | Semiconductor substrate-based BGA interconnection and methods of farication same |
| US6351028B1 (en) * | 1999-02-08 | 2002-02-26 | Micron Technology, Inc. | Multiple die stack apparatus employing T-shaped interposer elements |
| DE19907168C1 (de) * | 1999-02-19 | 2000-08-10 | Micronas Intermetall Gmbh | Schichtanordnung sowie Verfahren zu deren Herstellung |
| US6285081B1 (en) * | 1999-07-13 | 2001-09-04 | Micron Technology, Inc. | Deflectable interconnect |
| JP2002176069A (ja) * | 2000-12-06 | 2002-06-21 | Nec Corp | 電気的接続端子の構造とその製造方法 |
| GB0108950D0 (en) | 2001-04-10 | 2001-05-30 | Leonard Philip N | Personal computer systems |
| US7332819B2 (en) * | 2002-01-09 | 2008-02-19 | Micron Technology, Inc. | Stacked die in die BGA package |
| JP3507059B2 (ja) * | 2002-06-27 | 2004-03-15 | 沖電気工業株式会社 | 積層マルチチップパッケージ |
| JP3753984B2 (ja) * | 2002-01-09 | 2006-03-08 | シャープ株式会社 | 非接触通信機器用モジュール及びその製造方法 |
| US6930032B2 (en) * | 2002-05-14 | 2005-08-16 | Freescale Semiconductor, Inc. | Under bump metallurgy structural design for high reliability bumped packages |
| JP2004265888A (ja) * | 2003-01-16 | 2004-09-24 | Sony Corp | 半導体装置及びその製造方法 |
| JP4979376B2 (ja) * | 2003-05-06 | 2012-07-18 | ジェンテックス コーポレイション | 車両用バックミラー要素及びこれらの要素を組み込むアセンブリ |
| JP3994924B2 (ja) * | 2003-06-02 | 2007-10-24 | セイコーエプソン株式会社 | 回路基板の製造方法 |
| JP3994923B2 (ja) * | 2003-06-02 | 2007-10-24 | セイコーエプソン株式会社 | 半導体装置の製造方法 |
| US20050104225A1 (en) * | 2003-11-19 | 2005-05-19 | Yuan-Chang Huang | Conductive bumps with insulating sidewalls and method for fabricating |
| US7716823B2 (en) * | 2004-04-08 | 2010-05-18 | Hewlett-Packard Development Company, L.P. | Bonding an interconnect to a circuit device and related devices |
| US6932136B1 (en) * | 2004-04-08 | 2005-08-23 | National Semiconductor Corporation | Post singulation die separation apparatus and method for bulk feeding operation |
| JP4522960B2 (ja) * | 2005-03-17 | 2010-08-11 | エルジー イノテック カンパニー リミテッド | 半導体製造用接着テープの製造装置及びその製造方法 |
| FR2905518B1 (fr) * | 2006-08-29 | 2008-12-26 | Commissariat Energie Atomique | Puce microelectronique a faces laterales munies de rainures et procede de fabrication |
| FR2928491A1 (fr) * | 2008-03-06 | 2009-09-11 | Commissariat Energie Atomique | Procede et dispositif de fabrication d'un assemblage d'au moins deux puces microelectroniques |
| FR2937464B1 (fr) * | 2008-10-21 | 2011-02-25 | Commissariat Energie Atomique | Assemblage d'une puce microelectronique a rainure avec un element filaire sous forme de toron et procede d'assemblage |
| FR2960339B1 (fr) * | 2010-05-18 | 2012-05-18 | Commissariat Energie Atomique | Procede de realisation d'elements a puce munis de rainures d'insertion de fils |
| FR2964786B1 (fr) * | 2010-09-09 | 2013-03-15 | Commissariat Energie Atomique | Procédé de réalisation d'éléments a puce munis de rainures d'insertion de fils |
-
2008
- 2008-03-06 FR FR0801234A patent/FR2928491A1/fr not_active Withdrawn
- 2008-10-21 WO PCT/FR2008/001476 patent/WO2009112644A1/fr not_active Ceased
- 2008-10-21 US US12/919,512 patent/US8723312B2/en active Active
- 2008-10-21 EP EP08873297.9A patent/EP2250667B1/de not_active Not-in-force
- 2008-10-21 CN CN200880127846.4A patent/CN101960585B/zh not_active Expired - Fee Related
- 2008-10-21 JP JP2010549171A patent/JP5341114B2/ja not_active Expired - Fee Related
-
2009
- 2009-02-19 US US12/379,357 patent/US8012795B2/en not_active Expired - Fee Related
- 2009-02-20 ES ES09354009T patent/ES2346274T3/es active Active
- 2009-02-20 DE DE602009000024T patent/DE602009000024D1/de active Active
- 2009-02-20 AT AT09354009T patent/ATE467900T1/de active
- 2009-02-20 EP EP09354009A patent/EP2099060B1/de active Active
- 2009-03-05 JP JP2009052290A patent/JP5378011B2/ja not_active Expired - Fee Related
- 2009-03-06 CN CN2009101346129A patent/CN101527269B/zh not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| US20090227069A1 (en) | 2009-09-10 |
| JP5378011B2 (ja) | 2013-12-25 |
| US8012795B2 (en) | 2011-09-06 |
| JP2009218590A (ja) | 2009-09-24 |
| DE602009000024D1 (de) | 2010-06-24 |
| EP2250667A1 (de) | 2010-11-17 |
| ES2346274T3 (es) | 2010-10-13 |
| US20110001237A1 (en) | 2011-01-06 |
| WO2009112644A1 (fr) | 2009-09-17 |
| JP2011513980A (ja) | 2011-04-28 |
| US8723312B2 (en) | 2014-05-13 |
| CN101960585B (zh) | 2014-07-16 |
| FR2928491A1 (fr) | 2009-09-11 |
| EP2250667B1 (de) | 2013-04-24 |
| EP2099060A1 (de) | 2009-09-09 |
| EP2099060B1 (de) | 2010-05-12 |
| CN101960585A (zh) | 2011-01-26 |
| CN101527269A (zh) | 2009-09-09 |
| JP5341114B2 (ja) | 2013-11-13 |
| CN101527269B (zh) | 2012-07-25 |
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