ATE497605T1 - Nichtlineare magnetfeldsensoren und stromsensoren - Google Patents

Nichtlineare magnetfeldsensoren und stromsensoren

Info

Publication number
ATE497605T1
ATE497605T1 AT05789059T AT05789059T ATE497605T1 AT E497605 T1 ATE497605 T1 AT E497605T1 AT 05789059 T AT05789059 T AT 05789059T AT 05789059 T AT05789059 T AT 05789059T AT E497605 T1 ATE497605 T1 AT E497605T1
Authority
AT
Austria
Prior art keywords
magnetic field
sensor
sensors
current
linear magnetic
Prior art date
Application number
AT05789059T
Other languages
English (en)
Inventor
Le Kim Phan
Jaap Ruigrok
Original Assignee
Nxp Bv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nxp Bv filed Critical Nxp Bv
Application granted granted Critical
Publication of ATE497605T1 publication Critical patent/ATE497605T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/20—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using galvano-magnetic devices, e.g. Hall-effect devices, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/07—Hall effect devices
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y25/00—Nanomagnetism, e.g. magnetoimpedance, anisotropic magnetoresistance, giant magnetoresistance or tunneling magnetoresistance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/20—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using galvano-magnetic devices, e.g. Hall-effect devices, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices
    • G01R15/202—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using galvano-magnetic devices, e.g. Hall-effect devices, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices using Hall-effect devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/20—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using galvano-magnetic devices, e.g. Hall-effect devices, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices
    • G01R15/205—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using galvano-magnetic devices, e.g. Hall-effect devices, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices using magneto-resistance devices, e.g. field plates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/20—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using galvano-magnetic devices, e.g. Hall-effect devices, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices
    • G01R15/207—Constructional details independent of the type of device used
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/09—Magnetoresistive devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/09—Magnetoresistive devices
    • G01R33/093—Magnetoresistive devices using multilayer structures, e.g. giant magnetoresistance sensors

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Nanotechnology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Measuring Magnetic Variables (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
AT05789059T 2004-10-11 2005-10-10 Nichtlineare magnetfeldsensoren und stromsensoren ATE497605T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP04104963 2004-10-11
PCT/IB2005/053306 WO2006040719A1 (en) 2004-10-11 2005-10-10 Non-linear magnetic field sensors and current sensors

Publications (1)

Publication Number Publication Date
ATE497605T1 true ATE497605T1 (de) 2011-02-15

Family

ID=35791807

Family Applications (1)

Application Number Title Priority Date Filing Date
AT05789059T ATE497605T1 (de) 2004-10-11 2005-10-10 Nichtlineare magnetfeldsensoren und stromsensoren

Country Status (9)

Country Link
US (1) US8395382B2 (de)
EP (1) EP1802988B1 (de)
JP (1) JP2008516225A (de)
KR (1) KR20070072576A (de)
CN (1) CN101076737B (de)
AT (1) ATE497605T1 (de)
DE (1) DE602005026217D1 (de)
TW (1) TW200630632A (de)
WO (1) WO2006040719A1 (de)

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FR2936062B1 (fr) * 2008-09-12 2010-10-01 Electricfil Automotive Capteur de courant en boucle ouverte a large gamme
US10057952B2 (en) * 2010-12-15 2018-08-21 Cree, Inc. Lighting apparatus using a non-linear current sensor and methods of operation thereof
TWI457582B (zh) * 2011-01-20 2014-10-21 Tatung Co 平面式磁場探測棒
JP5747564B2 (ja) * 2011-03-03 2015-07-15 株式会社リコー 電流センサ
US8963536B2 (en) * 2011-04-14 2015-02-24 Infineon Technologies Ag Current sensors, systems and methods for sensing current in a conductor
TWI411787B (zh) * 2011-05-25 2013-10-11 Asahi Kasei Microdevices Corp Current sensor
JP6007479B2 (ja) * 2011-11-14 2016-10-12 株式会社リコー 電流センサ
KR20130093394A (ko) 2012-02-14 2013-08-22 삼성전자주식회사 멀티 모드 스위칭 전류를 사용하여 기입 동작을 수행하는 저항성 메모리 장치, 이를 포함하는 메모리 시스템 및 저항성 메모리 장치의 데이터 기입 방법
US9588134B2 (en) 2012-05-10 2017-03-07 Infineon Technologies Ag Increased dynamic range sensor
ITRM20120253A1 (it) * 2012-05-31 2013-12-01 Valeriano Bonuglia Sonda transducercard x-icca-m0-1000 per corrente continua e alternata ad effetto hall con controllo termico
DE102014100668B4 (de) * 2014-01-21 2017-12-14 Comexio Gmbh Strommesseinrichtung
KR102214798B1 (ko) 2014-02-05 2021-02-10 삼성전자주식회사 패키지 기판 및 이를 포함하는 반도체 패키지
US10048090B2 (en) * 2014-06-10 2018-08-14 Hamilton Sundstrand Corporation Direct position measurement for aircraft flight control surfaces
WO2016047782A1 (ja) * 2014-09-26 2016-03-31 旭化成エレクトロニクス株式会社 磁気センサ
KR102235609B1 (ko) 2014-12-08 2021-04-02 삼성전자주식회사 Mram 기반의 프레임 버퍼링 장치, 그 장치를 포함하는 디스플레이 구동 장치 및 디스플레이 장치
JP6352195B2 (ja) * 2015-01-14 2018-07-04 Tdk株式会社 磁気センサ
JP6465725B2 (ja) * 2015-04-13 2019-02-06 三菱電機株式会社 電流検出装置およびこれを用いた磁界検出装置
CN104991206B (zh) * 2015-05-05 2018-03-30 东北大学 一种基于表面等离子体共振技术的磁场测量方法
US10359478B2 (en) * 2015-05-15 2019-07-23 Panasonic Intellectual Property Management Co., Ltd. Magnetic sensor
CN107615079B (zh) * 2015-07-01 2019-11-12 株式会社村田制作所 电流传感器
TWI561830B (en) 2015-07-21 2016-12-11 Ind Tech Res Inst Non-contact type three-phase three-wire power cable measurement device and measurement method thereof
JP6618618B2 (ja) * 2016-06-06 2019-12-11 アルプスアルパイン株式会社 磁気検出装置
JP6508163B2 (ja) 2016-10-31 2019-05-08 横河電機株式会社 電流測定装置
JP6988138B2 (ja) * 2017-04-10 2022-01-05 昭和電工マテリアルズ株式会社 デバイス状態検知装置、電源システムおよび自動車
JP6661570B2 (ja) * 2017-05-11 2020-03-11 矢崎総業株式会社 磁界検出センサ
CN111198342B (zh) * 2020-01-10 2021-07-06 江苏多维科技有限公司 一种谐波增宽线性范围的磁电阻传感器
US11187764B2 (en) 2020-03-20 2021-11-30 Allegro Microsystems, Llc Layout of magnetoresistance element
DE102020108880B4 (de) * 2020-03-31 2024-05-08 Infineon Technologies Ag Sensorvorrichtungen mit Bypassstrompfad und zugehörige Herstellungsverfahren
DE102020208311A1 (de) 2020-07-02 2022-01-05 Robert Bosch Gesellschaft mit beschränkter Haftung Sensoranordnung und Verfahren zum Messen eines elektrischen Stroms
DE102020214072A1 (de) * 2020-11-10 2022-05-12 Robert Bosch Gesellschaft mit beschränkter Haftung Vorrichtung zur Bestimmung eines durch einen Stromleiter fließenden Stroms sowie ein elektrisches System mit solch einer Vorrichtung
EP4130772B1 (de) 2021-08-05 2025-07-23 Allegro MicroSystems, LLC Magnetoresistives element mit kompensiertem temperaturkoeffizienten von tmr
US12248039B2 (en) 2023-08-08 2025-03-11 Allegro Microsystems, Llc Interleaving sub-arrays of magnetoresistance elements based on reference directions to compensate for bridge offset

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Also Published As

Publication number Publication date
JP2008516225A (ja) 2008-05-15
CN101076737B (zh) 2010-06-16
WO2006040719A1 (en) 2006-04-20
EP1802988B1 (de) 2011-02-02
US20090302837A1 (en) 2009-12-10
KR20070072576A (ko) 2007-07-04
DE602005026217D1 (de) 2011-03-17
EP1802988A1 (de) 2007-07-04
CN101076737A (zh) 2007-11-21
TW200630632A (en) 2006-09-01
US8395382B2 (en) 2013-03-12

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