ATE504946T1 - Verfahren zur herstellung von vertikal- kohlenstoff-nanoröhren-feldeffekttransistoren zur anordnung in arrays und dadurch gebildete feldeffekttransistoren und arrays - Google Patents
Verfahren zur herstellung von vertikal- kohlenstoff-nanoröhren-feldeffekttransistoren zur anordnung in arrays und dadurch gebildete feldeffekttransistoren und arraysInfo
- Publication number
- ATE504946T1 ATE504946T1 AT05707994T AT05707994T ATE504946T1 AT E504946 T1 ATE504946 T1 AT E504946T1 AT 05707994 T AT05707994 T AT 05707994T AT 05707994 T AT05707994 T AT 05707994T AT E504946 T1 ATE504946 T1 AT E504946T1
- Authority
- AT
- Austria
- Prior art keywords
- field effect
- carbon nanotube
- effect transistors
- arrays
- gate electrode
- Prior art date
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K10/00—Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having potential barriers
- H10K10/40—Organic transistors
- H10K10/46—Field-effect transistors, e.g. organic thin-film transistors [OTFT]
- H10K10/462—Insulated gate field-effect transistors [IGFETs]
- H10K10/491—Vertical transistors, e.g. vertical carbon nanotube field effect transistors [CNT-FETs]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P10/00—Bonding of wafers, substrates or parts of devices
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
- G11C13/02—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using elements whose operation depends upon chemical change
- G11C13/025—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using elements whose operation depends upon chemical change using fullerenes, e.g. C60, or nanotubes, e.g. carbon or silicon nanotubes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/01—Manufacture or treatment
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/40—FETs having zero-dimensional [0D], one-dimensional [1D] or two-dimensional [2D] charge carrier gas channels
- H10D30/43—FETs having zero-dimensional [0D], one-dimensional [1D] or two-dimensional [2D] charge carrier gas channels having one-dimensional [1D] charge carrier gas channels, e.g. quantum wire FETs or transistors having 1D quantum-confined channels
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
- H10D62/117—Shapes of semiconductor bodies
- H10D62/118—Nanostructure semiconductor bodies
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
- H10D62/117—Shapes of semiconductor bodies
- H10D62/118—Nanostructure semiconductor bodies
- H10D62/119—Nanowire, nanosheet or nanotube semiconductor bodies
- H10D62/121—Nanowire, nanosheet or nanotube semiconductor bodies oriented parallel to substrates
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
- H10D62/117—Shapes of semiconductor bodies
- H10D62/118—Nanostructure semiconductor bodies
- H10D62/119—Nanowire, nanosheet or nanotube semiconductor bodies
- H10D62/122—Nanowire, nanosheet or nanotube semiconductor bodies oriented at angles to substrates, e.g. perpendicular to substrates
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/80—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
- H10D62/81—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials of structures exhibiting quantum-confinement effects, e.g. single quantum wells; of structures having periodic or quasi-periodic potential variation
- H10D62/812—Single quantum well structures
- H10D62/813—Quantum wire structures
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K85/00—Organic materials used in the body or electrodes of devices covered by this subclass
- H10K85/20—Carbon compounds, e.g. carbon nanotubes or fullerenes
- H10K85/221—Carbon nanotubes
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/70—Nanostructure
- Y10S977/734—Fullerenes, i.e. graphene-based structures, such as nanohorns, nanococoons, nanoscrolls or fullerene-like structures, e.g. WS2 or MoS2 chalcogenide nanotubes, planar C3N4, etc.
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Nanotechnology (AREA)
- Materials Engineering (AREA)
- Theoretical Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Mathematical Physics (AREA)
- Thin Film Transistor (AREA)
- Semiconductor Memories (AREA)
- Carbon And Carbon Compounds (AREA)
- Electrodes Of Semiconductors (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/777,576 US7829883B2 (en) | 2004-02-12 | 2004-02-12 | Vertical carbon nanotube field effect transistors and arrays |
| PCT/EP2005/050591 WO2005078819A1 (en) | 2004-02-12 | 2005-02-10 | Methods of fabricating vertical carbon nanotube field effect transistors for arrangement in arrays and field effect transistors and arrays formed thereby |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE504946T1 true ATE504946T1 (de) | 2011-04-15 |
Family
ID=34838018
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT05707994T ATE504946T1 (de) | 2004-02-12 | 2005-02-10 | Verfahren zur herstellung von vertikal- kohlenstoff-nanoröhren-feldeffekttransistoren zur anordnung in arrays und dadurch gebildete feldeffekttransistoren und arrays |
Country Status (9)
| Country | Link |
|---|---|
| US (2) | US7829883B2 (de) |
| EP (1) | EP1714330B1 (de) |
| JP (1) | JP5089174B2 (de) |
| KR (1) | KR100992296B1 (de) |
| CN (1) | CN1943055B (de) |
| AT (1) | ATE504946T1 (de) |
| DE (1) | DE602005027316D1 (de) |
| TW (1) | TWI344662B (de) |
| WO (1) | WO2005078819A1 (de) |
Families Citing this family (32)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7038299B2 (en) | 2003-12-11 | 2006-05-02 | International Business Machines Corporation | Selective synthesis of semiconducting carbon nanotubes |
| US7374793B2 (en) * | 2003-12-11 | 2008-05-20 | International Business Machines Corporation | Methods and structures for promoting stable synthesis of carbon nanotubes |
| US20050167655A1 (en) * | 2004-01-29 | 2005-08-04 | International Business Machines Corporation | Vertical nanotube semiconductor device structures and methods of forming the same |
| US7211844B2 (en) | 2004-01-29 | 2007-05-01 | International Business Machines Corporation | Vertical field effect transistors incorporating semiconducting nanotubes grown in a spacer-defined passage |
| US7109546B2 (en) | 2004-06-29 | 2006-09-19 | International Business Machines Corporation | Horizontal memory gain cells |
| US7233071B2 (en) * | 2004-10-04 | 2007-06-19 | International Business Machines Corporation | Low-k dielectric layer based upon carbon nanostructures |
| DE102004049453A1 (de) * | 2004-10-11 | 2006-04-20 | Infineon Technologies Ag | Elektrischer Schaltkreis mit einer Nanostruktur und Verfahren zum Herstellen einer Kontaktierung einer Nanostruktur |
| TWI324773B (en) | 2005-05-09 | 2010-05-11 | Nantero Inc | Non-volatile shadow latch using a nanotube switch |
| US7479654B2 (en) | 2005-05-09 | 2009-01-20 | Nantero, Inc. | Memory arrays using nanotube articles with reprogrammable resistance |
| US7394687B2 (en) | 2005-05-09 | 2008-07-01 | Nantero, Inc. | Non-volatile-shadow latch using a nanotube switch |
| US7781862B2 (en) * | 2005-05-09 | 2010-08-24 | Nantero, Inc. | Two-terminal nanotube devices and systems and methods of making same |
| US8394664B2 (en) * | 2006-02-02 | 2013-03-12 | William Marsh Rice University | Electrical device fabrication from nanotube formations |
| WO2007092835A2 (en) * | 2006-02-07 | 2007-08-16 | William Marsh Rice University | Production de reseaux verticaux de nanotubes de carbone a petit diametre et paroi simple |
| US20070183189A1 (en) * | 2006-02-08 | 2007-08-09 | Thomas Nirschl | Memory having nanotube transistor access device |
| US7626190B2 (en) * | 2006-06-02 | 2009-12-01 | Infineon Technologies Ag | Memory device, in particular phase change random access memory device with transistor, and method for fabricating a memory device |
| CA2655340C (en) * | 2006-06-12 | 2016-10-25 | President And Fellows Of Harvard College | Nanosensors and related technologies |
| KR100803690B1 (ko) * | 2006-08-10 | 2008-02-20 | 삼성전자주식회사 | 전기적- 기계적 비휘발성 메모리 장치 및 그 제조 방법. |
| KR100781972B1 (ko) * | 2006-09-18 | 2007-12-06 | 삼성전자주식회사 | 메모리 소자 및 그의 제조방법 |
| US20080272361A1 (en) * | 2007-05-02 | 2008-11-06 | Atomate Corporation | High Density Nanotube Devices |
| KR101478540B1 (ko) | 2007-09-17 | 2015-01-02 | 삼성전자 주식회사 | 트랜지스터의 채널로 나노 물질을 이용하는 바이오 센서 및그 제조 방법 |
| US7892956B2 (en) * | 2007-09-24 | 2011-02-22 | International Business Machines Corporation | Methods of manufacture of vertical nanowire FET devices |
| US8395901B2 (en) * | 2007-11-13 | 2013-03-12 | William Marsh Rice University | Vertically-stacked electronic devices having conductive carbon films |
| JP5256850B2 (ja) * | 2008-05-29 | 2013-08-07 | ミツミ電機株式会社 | 電界効果トランジスタ及びその製造方法 |
| US8350360B1 (en) | 2009-08-28 | 2013-01-08 | Lockheed Martin Corporation | Four-terminal carbon nanotube capacitors |
| US8405189B1 (en) * | 2010-02-08 | 2013-03-26 | Lockheed Martin Corporation | Carbon nanotube (CNT) capacitors and devices integrated with CNT capacitors |
| EP2363958A1 (de) * | 2010-03-04 | 2011-09-07 | Thomson Licensing | Feldprogrammierbares Gate-Array |
| US8455365B2 (en) * | 2011-05-19 | 2013-06-04 | Dechao Guo | Self-aligned carbon electronics with embedded gate electrode |
| US8772782B2 (en) | 2011-11-23 | 2014-07-08 | International Business Machines Corporation | Transistor employing vertically stacked self-aligned carbon nanotubes |
| CN104576321A (zh) * | 2015-01-30 | 2015-04-29 | 京东方科技集团股份有限公司 | 一种电极结构、其制作方法、显示基板及显示装置 |
| CN107572504B (zh) * | 2016-07-05 | 2020-07-10 | 中国科学院金属研究所 | 一种柔性薄层碳覆盖碳纳米管垂直阵列的制备方法 |
| CN206067049U (zh) | 2016-07-29 | 2017-04-05 | 合肥鑫晟光电科技有限公司 | 膜材以及撕膜装置 |
| US11417729B2 (en) * | 2019-08-29 | 2022-08-16 | Taiwan Semiconductor Manufacturing Company, Ltd. | Transistors with channels formed of low-dimensional materials and method forming same |
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| US5514879A (en) * | 1990-11-20 | 1996-05-07 | Semiconductor Energy Laboratory Co., Ltd. | Gate insulated field effect transistors and method of manufacturing the same |
| JP3745392B2 (ja) * | 1994-05-26 | 2006-02-15 | 株式会社ルネサステクノロジ | 半導体装置 |
| US5796573A (en) | 1997-05-29 | 1998-08-18 | International Business Machines Corporation | Overhanging separator for self-defining stacked capacitor |
| US6250984B1 (en) * | 1999-01-25 | 2001-06-26 | Agere Systems Guardian Corp. | Article comprising enhanced nanotube emitter structure and process for fabricating article |
| JP3730476B2 (ja) * | 2000-03-31 | 2006-01-05 | 株式会社東芝 | 電界放出型冷陰極及びその製造方法 |
| SE520109C2 (sv) * | 2000-05-17 | 2003-05-27 | Ericsson Telefon Ab L M | Effekttransistorer för radiofrekvenser |
| KR100360476B1 (ko) * | 2000-06-27 | 2002-11-08 | 삼성전자 주식회사 | 탄소나노튜브를 이용한 나노 크기 수직 트랜지스터 및 그제조방법 |
| DE10036897C1 (de) * | 2000-07-28 | 2002-01-03 | Infineon Technologies Ag | Feldeffekttransistor, Schaltungsanordnung und Verfahren zum Herstellen eines Feldeffekttransistors |
| EP1331671B1 (de) | 2000-11-01 | 2007-01-24 | Japan Science and Technology Agency | Punktkontaktmatrix und elektronische Schaltung damit |
| US6423583B1 (en) * | 2001-01-03 | 2002-07-23 | International Business Machines Corporation | Methodology for electrically induced selective breakdown of nanotubes |
| US6440763B1 (en) * | 2001-03-22 | 2002-08-27 | The United States Of America As Represented By The Secretary Of The Navy | Methods for manufacture of self-aligned integrally gated nanofilament field emitter cell and array |
| JP4225716B2 (ja) * | 2001-09-11 | 2009-02-18 | 富士通株式会社 | 円筒状多層構造体による半導体装置 |
| US6525453B2 (en) * | 2001-05-02 | 2003-02-25 | Huang Chung Cheng | Field emitting display |
| US7084507B2 (en) * | 2001-05-02 | 2006-08-01 | Fujitsu Limited | Integrated circuit device and method of producing the same |
| US7073157B2 (en) | 2002-01-18 | 2006-07-04 | California Institute Of Technology | Array-based architecture for molecular electronics |
| EP1341184B1 (de) * | 2002-02-09 | 2005-09-14 | Samsung Electronics Co., Ltd. | Speicheranordnung mit kohlenstoffnanoröhre und Verfahren zur Herstellung der Speicheranordnung |
| EP1341183B1 (de) * | 2002-02-25 | 2008-12-03 | STMicroelectronics S.r.l. | Optisch lesbarer Molekularspeicher hergestellt mit Hilfe von Kohlenstoff-Nanoröhren und Verfahren zum Speichern von Information in diesem Molekularspeicher |
| US6515325B1 (en) * | 2002-03-06 | 2003-02-04 | Micron Technology, Inc. | Nanotube semiconductor devices and methods for making the same |
| US6891227B2 (en) * | 2002-03-20 | 2005-05-10 | International Business Machines Corporation | Self-aligned nanotube field effect transistor and method of fabricating same |
| US20030211724A1 (en) * | 2002-05-10 | 2003-11-13 | Texas Instruments Incorporated | Providing electrical conductivity between an active region and a conductive layer in a semiconductor device using carbon nanotubes |
| JP4416376B2 (ja) * | 2002-05-13 | 2010-02-17 | 富士通株式会社 | 半導体装置及びその製造方法 |
| US6830981B2 (en) * | 2002-07-02 | 2004-12-14 | Industrial Technology Research Institute | Vertical nanotube transistor and process for fabricating the same |
| US6979947B2 (en) * | 2002-07-09 | 2005-12-27 | Si Diamond Technology, Inc. | Nanotriode utilizing carbon nanotubes and fibers |
| CN1472814A (zh) * | 2002-08-01 | 2004-02-04 | �й���ѧԺ�����о��� | 基于碳纳米管单电子晶体管设计的单电子存储器及制法 |
| DE10250984A1 (de) | 2002-10-29 | 2004-05-19 | Hahn-Meitner-Institut Berlin Gmbh | Feldeffekttransistor sowie Verfahren zu seiner Herstellung |
| DE10250830B4 (de) | 2002-10-31 | 2015-02-26 | Qimonda Ag | Verfahren zum Herstellung eines Schaltkreis-Arrays |
| DE10250829B4 (de) * | 2002-10-31 | 2006-11-02 | Infineon Technologies Ag | Nichtflüchtige Speicherzelle, Speicherzellen-Anordnung und Verfahren zum Herstellen einer nichtflüchtigen Speicherzelle |
| JP4071601B2 (ja) * | 2002-11-11 | 2008-04-02 | 富士通株式会社 | 半導体装置 |
| KR100790859B1 (ko) | 2002-11-15 | 2008-01-03 | 삼성전자주식회사 | 수직 나노튜브를 이용한 비휘발성 메모리 소자 |
| KR100493166B1 (ko) | 2002-12-30 | 2005-06-02 | 삼성전자주식회사 | 수직나노튜브를 이용한 메모리 |
| US6933222B2 (en) * | 2003-01-02 | 2005-08-23 | Intel Corporation | Microcircuit fabrication and interconnection |
| WO2004105140A1 (ja) | 2003-05-22 | 2004-12-02 | Fujitsu Limited | 電界効果トランジスタ及びその製造方法 |
| JP4762522B2 (ja) * | 2003-10-28 | 2011-08-31 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
| US7374793B2 (en) | 2003-12-11 | 2008-05-20 | International Business Machines Corporation | Methods and structures for promoting stable synthesis of carbon nanotubes |
| US7038299B2 (en) | 2003-12-11 | 2006-05-02 | International Business Machines Corporation | Selective synthesis of semiconducting carbon nanotubes |
| US7211844B2 (en) | 2004-01-29 | 2007-05-01 | International Business Machines Corporation | Vertical field effect transistors incorporating semiconducting nanotubes grown in a spacer-defined passage |
| US20050167655A1 (en) | 2004-01-29 | 2005-08-04 | International Business Machines Corporation | Vertical nanotube semiconductor device structures and methods of forming the same |
-
2004
- 2004-02-12 US US10/777,576 patent/US7829883B2/en not_active Expired - Fee Related
-
2005
- 2005-02-04 TW TW094103739A patent/TWI344662B/zh not_active IP Right Cessation
- 2005-02-10 CN CN2005800046714A patent/CN1943055B/zh not_active Expired - Lifetime
- 2005-02-10 KR KR1020067015500A patent/KR100992296B1/ko not_active Expired - Fee Related
- 2005-02-10 WO PCT/EP2005/050591 patent/WO2005078819A1/en not_active Ceased
- 2005-02-10 JP JP2006552625A patent/JP5089174B2/ja not_active Expired - Fee Related
- 2005-02-10 AT AT05707994T patent/ATE504946T1/de not_active IP Right Cessation
- 2005-02-10 DE DE602005027316T patent/DE602005027316D1/de not_active Expired - Lifetime
- 2005-02-10 EP EP05707994A patent/EP1714330B1/de not_active Expired - Lifetime
-
2007
- 2007-10-29 US US11/926,627 patent/US7820502B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| KR100992296B1 (ko) | 2010-11-08 |
| TW200535896A (en) | 2005-11-01 |
| JP5089174B2 (ja) | 2012-12-05 |
| CN1943055B (zh) | 2011-02-23 |
| US7820502B2 (en) | 2010-10-26 |
| KR20060130154A (ko) | 2006-12-18 |
| TWI344662B (en) | 2011-07-01 |
| EP1714330A1 (de) | 2006-10-25 |
| WO2005078819A1 (en) | 2005-08-25 |
| JP2007523477A (ja) | 2007-08-16 |
| US20080044954A1 (en) | 2008-02-21 |
| DE602005027316D1 (de) | 2011-05-19 |
| US20050179029A1 (en) | 2005-08-18 |
| CN1943055A (zh) | 2007-04-04 |
| EP1714330B1 (de) | 2011-04-06 |
| US7829883B2 (en) | 2010-11-09 |
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