ATE510048T1 - Reinigungssystem vom schwefelsäurerezyklierungstyp und perschwefelsäure-dosierer vom schwefelsäurerezyklierungstyp - Google Patents
Reinigungssystem vom schwefelsäurerezyklierungstyp und perschwefelsäure-dosierer vom schwefelsäurerezyklierungstypInfo
- Publication number
- ATE510048T1 ATE510048T1 AT05783205T AT05783205T ATE510048T1 AT E510048 T1 ATE510048 T1 AT E510048T1 AT 05783205 T AT05783205 T AT 05783205T AT 05783205 T AT05783205 T AT 05783205T AT E510048 T1 ATE510048 T1 AT E510048T1
- Authority
- AT
- Austria
- Prior art keywords
- cleaning
- persulfuric acid
- sulfuric acid
- recycling type
- cleaning system
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23G—CLEANING OR DE-GREASING OF METALLIC MATERIAL BY CHEMICAL METHODS OTHER THAN ELECTROLYSIS
- C23G1/00—Cleaning or pickling metallic material with solutions or molten salts
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25B—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES FOR THE PRODUCTION OF COMPOUNDS OR NON-METALS; APPARATUS THEREFOR
- C25B1/00—Electrolytic production of inorganic compounds or non-metals
- C25B1/01—Products
- C25B1/28—Per-compounds
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
- B08B3/04—Cleaning involving contact with liquid
- B08B3/08—Cleaning involving contact with liquid the liquid having chemical or dissolving effect
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
- B08B3/04—Cleaning involving contact with liquid
- B08B3/10—Cleaning involving contact with liquid with additional treatment of the liquid or of the object being cleaned, e.g. by heat, by electricity or by vibration
- B08B3/14—Removing waste, e.g. labels, from cleaning liquid
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0402—Apparatus for fluid treatment
- H10P72/0406—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H10P72/0411—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H10P72/0416—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing with the semiconductor substrates being dipped in baths or vessels
-
- C—CHEMISTRY; METALLURGY
- C02—TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
- C02F—TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
- C02F2103/00—Nature of the water, waste water, sewage or sludge to be treated
- C02F2103/34—Nature of the water, waste water, sewage or sludge to be treated from industrial activities not provided for in groups C02F2103/12 - C02F2103/32
- C02F2103/346—Nature of the water, waste water, sewage or sludge to be treated from industrial activities not provided for in groups C02F2103/12 - C02F2103/32 from semiconductor processing, e.g. waste water from polishing of wafers
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Organic Chemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Inorganic Chemistry (AREA)
- Electrochemistry (AREA)
- Mechanical Engineering (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Electrolytic Production Of Non-Metals, Compounds, Apparatuses Therefor (AREA)
- Separation Using Semi-Permeable Membranes (AREA)
- Cleaning And De-Greasing Of Metallic Materials By Chemical Methods (AREA)
- Electrodes For Compound Or Non-Metal Manufacture (AREA)
- Detergent Compositions (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004271604 | 2004-09-17 | ||
| JP2005232825A JP4462146B2 (ja) | 2004-09-17 | 2005-08-11 | 硫酸リサイクル型洗浄システムおよび硫酸リサイクル型過硫酸供給装置 |
| PCT/JP2005/016916 WO2006030816A1 (ja) | 2004-09-17 | 2005-09-14 | 硫酸リサイクル型洗浄システムおよび硫酸リサイクル型過硫酸供給装置 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE510048T1 true ATE510048T1 (de) | 2011-06-15 |
Family
ID=36060067
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT05783205T ATE510048T1 (de) | 2004-09-17 | 2005-09-14 | Reinigungssystem vom schwefelsäurerezyklierungstyp und perschwefelsäure-dosierer vom schwefelsäurerezyklierungstyp |
Country Status (9)
| Country | Link |
|---|---|
| US (1) | US9593424B2 (de) |
| EP (1) | EP1801265B1 (de) |
| JP (1) | JP4462146B2 (de) |
| KR (1) | KR101222880B1 (de) |
| CN (1) | CN101061261B (de) |
| AT (1) | ATE510048T1 (de) |
| SG (1) | SG158142A1 (de) |
| TW (1) | TWI366611B (de) |
| WO (1) | WO2006030816A1 (de) |
Families Citing this family (59)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8046867B2 (en) | 2006-02-10 | 2011-11-01 | Tennant Company | Mobile surface cleaner having a sparging device |
| JP4605393B2 (ja) * | 2006-03-29 | 2011-01-05 | 栗田工業株式会社 | 電解ガス処理装置および硫酸リサイクル型洗浄システム |
| JP4623307B2 (ja) * | 2006-03-29 | 2011-02-02 | 栗田工業株式会社 | 電解セルおよび該電解セルを用いた硫酸リサイクル型洗浄システム |
| JP5087325B2 (ja) * | 2006-06-16 | 2012-12-05 | 株式会社東芝 | 洗浄システム及び洗浄方法 |
| JP4808551B2 (ja) * | 2006-06-16 | 2011-11-02 | クロリンエンジニアズ株式会社 | 過硫酸の製造方法 |
| TWI351446B (en) | 2006-06-16 | 2011-11-01 | Toshiba Kk | Cleaning system and cleaning method |
| JP4840582B2 (ja) * | 2006-08-25 | 2011-12-21 | 栗田工業株式会社 | 過硫酸洗浄システム |
| JP4644170B2 (ja) * | 2006-09-06 | 2011-03-02 | 栗田工業株式会社 | 基板処理装置および基板処理方法 |
| KR101262842B1 (ko) * | 2006-12-18 | 2013-05-09 | 주식회사 케이씨텍 | 습식처리장비의 약액 냉각장치 |
| JP5148889B2 (ja) | 2007-02-09 | 2013-02-20 | 株式会社東芝 | 洗浄方法及び電子デバイスの製造方法 |
| JP5605530B2 (ja) * | 2008-01-11 | 2014-10-15 | 栗田工業株式会社 | 電解方法 |
| JP5105081B2 (ja) * | 2008-04-08 | 2012-12-19 | 栗田工業株式会社 | 機能性溶液供給システムおよび機能性溶液供給方法 |
| KR100931063B1 (ko) * | 2008-05-14 | 2009-12-10 | 일성초음파산업 주식회사 | 광학 렌즈 성형 몰드용 세척장치 |
| JP5358303B2 (ja) * | 2008-06-30 | 2013-12-04 | クロリンエンジニアズ株式会社 | 電解硫酸による洗浄方法及び半導体装置の製造方法 |
| SG193885A1 (en) * | 2008-09-24 | 2013-10-30 | Kurita Water Ind Ltd | Diamond electrode and method for manufacturing diamond electrode |
| JP5592611B2 (ja) * | 2009-01-05 | 2014-09-17 | オルガノ株式会社 | 過硫酸製造装置及び過硫酸製造方法 |
| JP5660279B2 (ja) * | 2009-03-24 | 2015-01-28 | 栗田工業株式会社 | 機能性溶液供給システムおよび供給方法 |
| JP2012146690A (ja) * | 2009-03-31 | 2012-08-02 | Kurita Water Ind Ltd | 電子材料洗浄方法及び電子材料洗浄装置 |
| JP5148576B2 (ja) | 2009-09-25 | 2013-02-20 | 株式会社東芝 | 洗浄方法 |
| JP5066152B2 (ja) * | 2009-09-25 | 2012-11-07 | 株式会社東芝 | 洗浄システム |
| JP5499602B2 (ja) * | 2009-09-30 | 2014-05-21 | 栗田工業株式会社 | 有効酸化性物質の濃度測定方法 |
| JP5106523B2 (ja) * | 2009-12-16 | 2012-12-26 | 株式会社東芝 | エッチング処理方法、微細構造体の製造方法、およびエッチング処理装置 |
| JP2011192779A (ja) * | 2010-03-15 | 2011-09-29 | Kurita Water Ind Ltd | 電子材料の洗浄方法および洗浄システム |
| US20110237484A1 (en) | 2010-03-25 | 2011-09-29 | Basf Se | Electrochemical textile-washing process |
| WO2011155336A1 (ja) * | 2010-06-07 | 2011-12-15 | 栗田工業株式会社 | 洗浄システムおよび洗浄方法 |
| JP5668914B2 (ja) * | 2010-08-27 | 2015-02-12 | 栗田工業株式会社 | 洗浄方法および洗浄システム |
| JP5773132B2 (ja) * | 2011-02-23 | 2015-09-02 | 栗田工業株式会社 | 過硫酸濃度の測定方法、過硫酸濃度測定装置、及び過硫酸供給装置 |
| JP2012180538A (ja) * | 2011-02-28 | 2012-09-20 | Kurita Water Ind Ltd | 硫酸電解方法および硫酸電解装置 |
| JP5939373B2 (ja) * | 2011-03-24 | 2016-06-22 | 栗田工業株式会社 | 電子材料洗浄方法および洗浄装置 |
| US8992691B2 (en) * | 2011-04-05 | 2015-03-31 | International Business Machines Corporation | Partial solution replacement in recyclable persulfuric acid cleaning systems |
| EP2697730A4 (de) | 2011-04-15 | 2015-04-15 | Advanced Diamond Technologies Inc | Elektrochemisches system und verfahren zur vor-ort-erzeugung von oxidationsmitteln bei hoher stromdichte |
| EP2733724B1 (de) | 2011-07-11 | 2017-05-24 | Kurita Water Industries Ltd. | Verfahren zur reinigung von metallgate-halbleitern |
| CN102319688A (zh) * | 2011-07-11 | 2012-01-18 | 苏州赤诚洗净科技有限公司 | 硅料清洗装置 |
| DE102011080105A1 (de) * | 2011-07-29 | 2013-01-31 | Wacker Chemie Ag | Verfahren zur Reinigung von polykristallinen Siliciumbruchstücken |
| JP2015509763A (ja) * | 2012-01-26 | 2015-04-02 | テナント カンパニー | 熱的に強化された処理液を生成する装置および方法 |
| JP2014063920A (ja) * | 2012-09-21 | 2014-04-10 | Kurita Water Ind Ltd | 洗浄方法および洗浄装置 |
| JP5854230B2 (ja) * | 2012-12-13 | 2016-02-09 | 栗田工業株式会社 | 基板洗浄液および基板洗浄方法 |
| CN105452845B (zh) * | 2013-07-23 | 2019-03-29 | 栗田工业株式会社 | 总氧化性物质浓度的测定方法、基板清洗方法以及基板清洗系统 |
| JP5667674B1 (ja) * | 2013-08-20 | 2015-02-12 | サーモス株式会社 | 金属容器を洗浄する洗浄装置 |
| US10239772B2 (en) | 2015-05-28 | 2019-03-26 | Advanced Diamond Technologies, Inc. | Recycling loop method for preparation of high concentration ozone |
| US9665000B1 (en) * | 2015-11-16 | 2017-05-30 | Taiwan Semiconductor Manufacturing Company, Ltd. | Method and system for EUV mask cleaning with non-thermal solution |
| CN105585182A (zh) * | 2016-03-03 | 2016-05-18 | 金晨光 | 一种压舱水处理设备 |
| JP6750293B2 (ja) * | 2016-04-28 | 2020-09-02 | 栗田工業株式会社 | プラスチック表面の処理方法 |
| EP3529397A4 (de) | 2016-10-20 | 2020-06-24 | Advanced Diamond Technologies, Inc. | Ozongeneratoren, verfahren zur herstellung von ozongeneratoren und verfahren zur erzeugung von ozon |
| JP7146572B2 (ja) | 2018-02-23 | 2022-10-04 | キヤノン株式会社 | 基板の成膜方法、及び液体吐出ヘッドの製造方法 |
| CN108550519A (zh) * | 2018-06-08 | 2018-09-18 | 东莞市中图半导体科技有限公司 | 一种半导体晶片的清洗装置 |
| JP7072453B2 (ja) * | 2018-06-29 | 2022-05-20 | 東京エレクトロン株式会社 | 基板処理装置、および基板処理方法 |
| US11037805B2 (en) * | 2018-11-23 | 2021-06-15 | Nanya Technology Corporation | Wafer cleaning apparatus and method of cleaning wafer |
| KR102175129B1 (ko) | 2019-04-26 | 2020-11-05 | 주식회사 성창 | 전자 재료 세정 시스템 |
| WO2020217453A1 (ja) * | 2019-04-26 | 2020-10-29 | 神田 智一 | 洗浄液生成装置、洗浄・コーティング液生成装置 |
| CN111020643B (zh) * | 2019-12-30 | 2022-02-11 | 中国科学院青海盐湖研究所 | 一种双面光铜箔及其制备方法与装置 |
| JP7484389B2 (ja) * | 2020-04-28 | 2024-05-16 | 栗田工業株式会社 | 樹脂成形体のエッチング方法及び樹脂成形体用エッチング処理システム |
| JP7484407B2 (ja) * | 2020-05-18 | 2024-05-16 | 栗田工業株式会社 | 電解硫酸溶液製造システムの立上げ方法 |
| US11682567B2 (en) | 2020-06-30 | 2023-06-20 | Applied Materials, Inc. | Cleaning system with in-line SPM processing |
| JP6988977B1 (ja) * | 2020-10-07 | 2022-01-05 | 栗田工業株式会社 | 樹脂成形体のエッチング方法及び樹脂成形体のエッチング処理システム |
| JP7504940B2 (ja) * | 2022-03-09 | 2024-06-24 | 芝浦メカトロニクス株式会社 | 基板処理装置 |
| CN115628955A (zh) * | 2022-10-26 | 2023-01-20 | 广州广检技术发展有限公司 | 循环喷淋浓硫酸溶洗一体机 |
| WO2024155380A1 (en) * | 2023-01-18 | 2024-07-25 | Shyp Bv Pbc | Systems and methods for electrochemical generation of acid and base |
| JP7370113B1 (ja) | 2023-02-28 | 2023-10-27 | ミクロエース株式会社 | 基板処理方法 |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS49123098A (de) * | 1973-03-28 | 1974-11-25 | ||
| US4395312A (en) * | 1981-04-02 | 1983-07-26 | The Ohio State University Research Foundation | Method and apparatus for the analysis of solution adjacent an electrode |
| US4615776A (en) * | 1983-10-21 | 1986-10-07 | Shinko-Pfaudler Company | Electrolytic decontamination process and process for reproducing decontaminating electrolyte by electrodeposition and apparatuses therefore |
| US4855023A (en) * | 1986-10-06 | 1989-08-08 | Athens, Inc. | Method and apparatus for the continuous on-site chemical reprocessing of ultrapure liquids used in semiconductor wafer cleaning |
| JPH02159029A (ja) * | 1988-12-13 | 1990-06-19 | Matsushita Electric Ind Co Ltd | 薬液処理方法およびその装置 |
| JPH0320746A (ja) * | 1989-06-16 | 1991-01-29 | Matsushita Electron Corp | フォトレジスト膜の除去方法 |
| JP3383334B2 (ja) * | 1992-12-16 | 2003-03-04 | クロリンエンジニアズ株式会社 | 硫酸の再生利用方法 |
| US5399247A (en) * | 1993-12-22 | 1995-03-21 | Eastman Kodak Company | Method of electrolysis employing a doped diamond anode to oxidize solutes in wastewater |
| JP2743822B2 (ja) * | 1994-03-25 | 1998-04-22 | 日本電気株式会社 | 電解活性水処理装置 |
| DE69533245D1 (de) * | 1994-03-25 | 2004-08-19 | Nec Electronics Corp | Vorrichtung zur elektrolytischen Behandlung |
| US6562205B1 (en) * | 1997-03-31 | 2003-05-13 | Mitsubishi Denki Kabushiki Kaisha | High-temperature ultrapure water production apparatus and liquid medicine preparation apparatus equipped with the production apparatus |
| JP2000164550A (ja) | 1998-11-27 | 2000-06-16 | Dainippon Screen Mfg Co Ltd | 基板処理装置および基板処理方法 |
| BR0013008A (pt) * | 1999-08-05 | 2002-12-03 | Steris Inc | Método e sistema de descontaminação antimicrobiana de itens |
| DE19948184C2 (de) * | 1999-10-06 | 2001-08-09 | Fraunhofer Ges Forschung | Elektrochemische Herstellung von Peroxo-dischwefelsäure unter Einsatz von diamantbeschichteten Elektroden |
| JP2001192874A (ja) * | 1999-12-28 | 2001-07-17 | Permelec Electrode Ltd | 過硫酸溶解水の製造方法 |
| JP3635026B2 (ja) * | 2000-06-14 | 2005-03-30 | 株式会社サンテックシステム | 硫酸リサイクル装置 |
| US20030077491A1 (en) * | 2001-10-24 | 2003-04-24 | Lillis Mark A. | Weight sensing system, method for use thereof, and electrochemical system for use therewith |
| JP2003271218A (ja) * | 2002-03-15 | 2003-09-26 | Toshiba Corp | 半導体製造装置、半導体製造システム及び基板処理方法 |
| DE10219688A1 (de) * | 2002-05-02 | 2003-11-20 | Condias Gmbh | Verfahren und Vorrichtung zur oxidativen Behandlung von Oberflächen |
| JP2004174485A (ja) * | 2002-11-14 | 2004-06-24 | Sankyo Seiki Mfg Co Ltd | 超純水洗浄システム |
| US20050139487A1 (en) * | 2003-05-02 | 2005-06-30 | Fraunhofer-Gesellschaft Zur Forderung Der Angewandten Forschung E.V. | Method for the oxidative treatment of components comprised of or containing elementary silicon and/or substantially inorganic silicon compounds |
-
2005
- 2005-08-11 JP JP2005232825A patent/JP4462146B2/ja not_active Expired - Fee Related
- 2005-08-19 TW TW094128350A patent/TWI366611B/zh not_active IP Right Cessation
- 2005-09-14 CN CN2005800393762A patent/CN101061261B/zh not_active Expired - Lifetime
- 2005-09-14 WO PCT/JP2005/016916 patent/WO2006030816A1/ja not_active Ceased
- 2005-09-14 AT AT05783205T patent/ATE510048T1/de not_active IP Right Cessation
- 2005-09-14 EP EP05783205A patent/EP1801265B1/de not_active Expired - Lifetime
- 2005-09-14 KR KR1020077007934A patent/KR101222880B1/ko not_active Expired - Fee Related
- 2005-09-14 US US11/663,324 patent/US9593424B2/en active Active
- 2005-09-14 SG SG200908350-2A patent/SG158142A1/en unknown
Also Published As
| Publication number | Publication date |
|---|---|
| CN101061261B (zh) | 2010-09-01 |
| US9593424B2 (en) | 2017-03-14 |
| TW200610841A (en) | 2006-04-01 |
| WO2006030816A1 (ja) | 2006-03-23 |
| JP4462146B2 (ja) | 2010-05-12 |
| KR101222880B1 (ko) | 2013-01-17 |
| JP2006114880A (ja) | 2006-04-27 |
| EP1801265A1 (de) | 2007-06-27 |
| KR20070101219A (ko) | 2007-10-16 |
| US20080251108A1 (en) | 2008-10-16 |
| EP1801265A4 (de) | 2009-06-17 |
| EP1801265B1 (de) | 2011-05-18 |
| SG158142A1 (en) | 2010-01-29 |
| TWI366611B (en) | 2012-06-21 |
| CN101061261A (zh) | 2007-10-24 |
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