ATE515078T1 - Anisotroper leitfähiger verbinder und herstellungsverfahren dafür und untersuchungseinheit für eine schaltungseinrichtung - Google Patents

Anisotroper leitfähiger verbinder und herstellungsverfahren dafür und untersuchungseinheit für eine schaltungseinrichtung

Info

Publication number
ATE515078T1
ATE515078T1 AT04702422T AT04702422T ATE515078T1 AT E515078 T1 ATE515078 T1 AT E515078T1 AT 04702422 T AT04702422 T AT 04702422T AT 04702422 T AT04702422 T AT 04702422T AT E515078 T1 ATE515078 T1 AT E515078T1
Authority
AT
Austria
Prior art keywords
anisotropically conductive
conductive connector
anisotropically
film
insulating
Prior art date
Application number
AT04702422T
Other languages
English (en)
Inventor
Daisuke Yamada
Kiyoshi Kimura
Original Assignee
Jsr Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jsr Corp filed Critical Jsr Corp
Application granted granted Critical
Publication of ATE515078T1 publication Critical patent/ATE515078T1/de

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/03—Contact members characterised by the material, e.g. plating, or coating materials
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R11/00—Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts
    • H01R11/01—Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts characterised by the form or arrangement of the conductive interconnection between the connecting locations
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/49—Method of mechanical manufacture
    • Y10T29/49002—Electrical device making
    • Y10T29/49117—Conductor or circuit manufacturing
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/53—Means to assemble or disassemble
    • Y10T29/5313—Means to assemble electrical device
    • Y10T29/53196—Means to apply magnetic force directly to position or hold work part

Landscapes

  • Non-Insulated Conductors (AREA)
  • Manufacturing Of Electrical Connectors (AREA)
  • Measuring Leads Or Probes (AREA)
AT04702422T 2003-01-17 2004-01-15 Anisotroper leitfähiger verbinder und herstellungsverfahren dafür und untersuchungseinheit für eine schaltungseinrichtung ATE515078T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2003010075 2003-01-17
PCT/JP2004/000238 WO2004066449A1 (ja) 2003-01-17 2004-01-15 異方導電性コネクターおよびその製造方法並びに回路装置の検査装置

Publications (1)

Publication Number Publication Date
ATE515078T1 true ATE515078T1 (de) 2011-07-15

Family

ID=32767237

Family Applications (1)

Application Number Title Priority Date Filing Date
AT04702422T ATE515078T1 (de) 2003-01-17 2004-01-15 Anisotroper leitfähiger verbinder und herstellungsverfahren dafür und untersuchungseinheit für eine schaltungseinrichtung

Country Status (7)

Country Link
US (1) US7190180B2 (de)
EP (1) EP1585197B1 (de)
KR (1) KR100574315B1 (de)
CN (1) CN100397711C (de)
AT (1) ATE515078T1 (de)
TW (1) TWI239683B (de)
WO (1) WO2004066449A1 (de)

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US7190180B2 (en) 2003-01-17 2007-03-13 Jsr Corporation Anisotropic conductive connector and production method therefor and inspection unit for circuit device
US8518304B1 (en) 2003-03-31 2013-08-27 The Research Foundation Of State University Of New York Nano-structure enhancements for anisotropic conductive material and thermal interposers
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KR101051217B1 (ko) * 2003-06-12 2011-07-21 제이에스알 가부시끼가이샤 이방 도전성 커넥터 장치 및 그 제조 방법 및 회로 장치의검사 장치
US20060177971A1 (en) * 2004-01-13 2006-08-10 Jsr Corporation Anisotropically conductive connector, production process thereof and application product thereof
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JP2006294527A (ja) * 2005-04-14 2006-10-26 Nec Corp コネクタ及びその製造方法
US7408367B2 (en) * 2005-06-22 2008-08-05 Paricon Technologies Corporation Micro Kelvin probes and micro Kelvin probe methodology with concentric pad structures
US7397255B2 (en) * 2005-06-22 2008-07-08 Paricon Technology Corporation Micro Kelvin probes and micro Kelvin probe methodology
US7922497B2 (en) * 2005-10-11 2011-04-12 Jsr Corporation Anisotropic conductive connector and inspection equipment of circuit device
KR101359065B1 (ko) 2006-04-11 2014-02-05 제이에스알 가부시끼가이샤 이방 도전성 커넥터 및 이방 도전성 커넥터 장치
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DE102006059429A1 (de) * 2006-12-15 2008-06-26 Atg Luther & Maelzer Gmbh Modul für eine Prüfvorrichtung zum Testen von Leiterplatten
US7939945B2 (en) 2008-04-30 2011-05-10 Intel Corporation Electrically conductive fluid interconnects for integrated circuit devices
ITMI20081023A1 (it) * 2008-06-04 2009-12-05 Eles Semiconductor Equipment Spa Test di dispositivi elettronici con schede senza zoccoli basate su bloccaggio magnetico
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JP2011086880A (ja) * 2009-10-19 2011-04-28 Advantest Corp 電子部品実装装置および電子部品の実装方法
KR101110002B1 (ko) * 2011-06-22 2012-01-31 이정구 반도체 소자 테스트용 탄성 콘택터 및 그 제조방법
CN102436874B (zh) * 2011-09-17 2013-01-02 山西金开源实业有限公司 各向异性导电薄膜生产设备
TW201325335A (zh) * 2011-10-29 2013-06-16 西瑪奈米技術以色列有限公司 經圖案化基材上之導電網路
KR101266124B1 (ko) * 2012-04-03 2013-05-27 주식회사 아이에스시 고밀도 도전부를 가지는 테스트용 소켓 및 그 제조방법
US8845363B2 (en) * 2012-09-07 2014-09-30 Apple Inc. Reinforcing bars in I/O connectors
US20140205851A1 (en) * 2013-01-23 2014-07-24 Ravindranath V. Mahajan Magnetic contacts for electronics applications
US9872390B1 (en) * 2016-08-17 2018-01-16 Microsoft Technology Licensing, Llc Flexible interconnect
JP2018073577A (ja) * 2016-10-27 2018-05-10 株式会社エンプラス 異方導電性シート及びその製造方法
US20180159239A1 (en) * 2016-12-07 2018-06-07 Wafer Llc Low loss electrical transmission mechanism and antenna using same
JP7405337B2 (ja) * 2018-10-11 2023-12-26 積水ポリマテック株式会社 電気接続シート、及び端子付きガラス板構造
CN111175644A (zh) * 2020-02-28 2020-05-19 南京金五环电子科技有限公司 一种电路板测试辅助装置、测试系统和测试方法
KR102211358B1 (ko) * 2020-03-19 2021-02-03 (주)티에스이 테스트 소켓 및 이를 포함하는 테스트 장치와, 테스트 소켓의 제조방법
CN112490813B (zh) * 2020-11-24 2024-05-28 成都圣世达科技有限公司 Tcc组模式滤波电连接器制备方法及tcc组模式滤波电连接器
TWI858816B (zh) * 2023-07-14 2024-10-11 大陸商東莞唐虞電子有限公司 電連接器總成及其製造方法
US20260059646A1 (en) * 2024-08-21 2026-02-26 Hongqisheng Precision Electronics (Qinhuangdao) Co., Ltd. Circuit board and manufacturing method thereof

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US7190180B2 (en) 2003-01-17 2007-03-13 Jsr Corporation Anisotropic conductive connector and production method therefor and inspection unit for circuit device

Also Published As

Publication number Publication date
KR100574315B1 (ko) 2006-04-27
EP1585197B1 (de) 2011-06-29
US7190180B2 (en) 2007-03-13
WO2004066449A1 (ja) 2004-08-05
CN100397711C (zh) 2008-06-25
US20050258850A1 (en) 2005-11-24
EP1585197A1 (de) 2005-10-12
TWI239683B (en) 2005-09-11
KR20050034759A (ko) 2005-04-14
TW200425579A (en) 2004-11-16
CN1701468A (zh) 2005-11-23
EP1585197A4 (de) 2007-10-31

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